DK3431969T3 - Apparatur og fremgangsmåde til analyse af fejl i et rørformet element - Google Patents
Apparatur og fremgangsmåde til analyse af fejl i et rørformet element Download PDFInfo
- Publication number
- DK3431969T3 DK3431969T3 DK18183074.6T DK18183074T DK3431969T3 DK 3431969 T3 DK3431969 T3 DK 3431969T3 DK 18183074 T DK18183074 T DK 18183074T DK 3431969 T3 DK3431969 T3 DK 3431969T3
- Authority
- DK
- Denmark
- Prior art keywords
- tubular element
- analyzing defects
- analyzing
- defects
- tubular
- Prior art date
Links
- 230000007547 defect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3303—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object fixed; source and detector move
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/628—Specific applications or type of materials tubes, pipes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/646—Specific applications or type of materials flaws, defects
Landscapes
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Theoretical Computer Science (AREA)
- Engineering & Computer Science (AREA)
- Radiology & Medical Imaging (AREA)
- Pulmonology (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762533538P | 2017-07-17 | 2017-07-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DK3431969T3 true DK3431969T3 (da) | 2021-11-22 |
Family
ID=62947973
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK18183074.6T DK3431969T3 (da) | 2017-07-17 | 2018-07-12 | Apparatur og fremgangsmåde til analyse af fejl i et rørformet element |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10852258B2 (da) |
| EP (1) | EP3431969B1 (da) |
| CA (1) | CA3011066A1 (da) |
| DK (1) | DK3431969T3 (da) |
| ES (1) | ES2890858T3 (da) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111983176B (zh) * | 2020-08-26 | 2022-09-30 | 浙江双森金属科技股份有限公司 | 一种不锈钢管缺陷检测装置 |
| CN114508651A (zh) * | 2021-12-17 | 2022-05-17 | 安庆精诚石化检测有限公司 | 一种自适应管道探伤承载装置 |
| CN114441569B (zh) * | 2021-12-22 | 2024-06-25 | 江苏至上检测科技有限公司 | 一种焊缝射线检测装置及检测方法 |
| CN117124259A (zh) * | 2023-10-18 | 2023-11-28 | 广西壮族自治区特种设备检验研究院 | 一种压力管道无损检测辅助工具 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3445655A (en) * | 1966-08-18 | 1969-05-20 | Leonard O Curry | Apparatus for the support and movement of radiographic equipment on an elongated pipe |
| US3708662A (en) * | 1969-09-11 | 1973-01-02 | Toshio Kurokawa | X-ray photographing apparatus |
| US3650514A (en) * | 1969-11-07 | 1972-03-21 | Gerald A Stunkard | Self centering pipe working machine |
| US3938492A (en) * | 1973-09-05 | 1976-02-17 | Boyar Schultz Corporation | Over the wheel dresser |
| US3921440A (en) * | 1975-01-02 | 1975-11-25 | Air Prod & Chem | Ultrasonic pipe testing system |
| US4284895A (en) | 1978-02-21 | 1981-08-18 | Ira Lon Morgan | Method and apparatus for tomographic examination of an object by penetrating radiation |
| US5107121A (en) * | 1989-10-27 | 1992-04-21 | Trionix Research Laboratory, Inc. | Gantry and pallet assembly used in nuclear imaging |
| NL9002031A (nl) | 1990-09-14 | 1992-04-01 | Voskuilen Woudenberg Bv | Inrichting voor het bewerken van een uitwendig buisoppervlak. |
| TW439003B (en) | 1995-11-17 | 2001-06-07 | Semiconductor Energy Lab | Display device |
| US6272200B1 (en) * | 1999-07-28 | 2001-08-07 | Arch Development Corporation | Fourier and spline-based reconstruction of helical CT images |
| US6925145B2 (en) * | 2003-08-22 | 2005-08-02 | General Electric Company | High speed digital radiographic inspection of piping |
| US7003070B1 (en) * | 2004-08-03 | 2006-02-21 | William Barry Chen | Upright CT scanner |
| KR100687846B1 (ko) * | 2005-01-21 | 2007-02-27 | 경희대학교 산학협력단 | 국부 고해상도 엑스선 단층 영상 재구성 방법 및 국부고해상도 엑스선 단층 영상 재구성 장치 |
| US8141442B2 (en) | 2009-05-04 | 2012-03-27 | Westinghouse Electric Company Llc | Pipe scanner |
| KR101708262B1 (ko) * | 2010-11-27 | 2017-02-20 | 아이씨알씨오, 인코포레이티드 | 컴퓨터 단층 촬영 및 단층 영상 합성 시스템 |
-
2018
- 2018-07-06 US US16/029,210 patent/US10852258B2/en active Active
- 2018-07-11 CA CA3011066A patent/CA3011066A1/en active Pending
- 2018-07-12 ES ES18183074T patent/ES2890858T3/es active Active
- 2018-07-12 EP EP18183074.6A patent/EP3431969B1/en active Active
- 2018-07-12 DK DK18183074.6T patent/DK3431969T3/da active
Also Published As
| Publication number | Publication date |
|---|---|
| ES2890858T3 (es) | 2022-01-24 |
| US20190017944A1 (en) | 2019-01-17 |
| US10852258B2 (en) | 2020-12-01 |
| EP3431969A1 (en) | 2019-01-23 |
| CA3011066A1 (en) | 2019-01-17 |
| EP3431969B1 (en) | 2021-09-01 |
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