DK407884D0 - Selvkompenserende hydrostatisk udfladning af halvledersubstrater - Google Patents

Selvkompenserende hydrostatisk udfladning af halvledersubstrater

Info

Publication number
DK407884D0
DK407884D0 DK407884A DK407884A DK407884D0 DK 407884 D0 DK407884 D0 DK 407884D0 DK 407884 A DK407884 A DK 407884A DK 407884 A DK407884 A DK 407884A DK 407884 D0 DK407884 D0 DK 407884D0
Authority
DK
Denmark
Prior art keywords
flats
self
semiconductor substrates
compensating hydrostatic
hydrostatic
Prior art date
Application number
DK407884A
Other languages
English (en)
Other versions
DK160113C (da
DK160113B (da
DK407884A (da
Inventor
Michael J Little
Roger H Brown
Uzi Efron
Clarence P Hoberg
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of DK407884D0 publication Critical patent/DK407884D0/da
Publication of DK407884A publication Critical patent/DK407884A/da
Publication of DK160113B publication Critical patent/DK160113B/da
Application granted granted Critical
Publication of DK160113C publication Critical patent/DK160113C/da

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12—Preparing bulk and homogeneous wafers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/50—Encapsulations or containers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Liquid Crystal (AREA)
  • Bipolar Transistors (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Light Receiving Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Drying Of Semiconductors (AREA)
DK407884A 1983-02-07 1984-08-27 Fremgangsmaade ved fremstilling af en halvleder struktur DK160113C (da)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US46444283 1983-02-07
US06/464,442 US4470856A (en) 1983-02-07 1983-02-07 Self-compensating hydrostatic flattening of semiconductor substrates
US8301989 1983-12-16
PCT/US1983/001989 WO1984003176A1 (en) 1983-02-07 1983-12-16 Self-compensating hydrostatic flattening of semiconductor substrates

Publications (4)

Publication Number Publication Date
DK407884D0 true DK407884D0 (da) 1984-08-27
DK407884A DK407884A (da) 1984-08-27
DK160113B DK160113B (da) 1991-01-28
DK160113C DK160113C (da) 1991-07-01

Family

ID=23843970

Family Applications (1)

Application Number Title Priority Date Filing Date
DK407884A DK160113C (da) 1983-02-07 1984-08-27 Fremgangsmaade ved fremstilling af en halvleder struktur

Country Status (8)

Country Link
US (1) US4470856A (da)
EP (1) EP0137790B1 (da)
JP (1) JPS60500554A (da)
AU (1) AU568629B2 (da)
CA (1) CA1202710A (da)
DE (1) DE3371446D1 (da)
DK (1) DK160113C (da)
WO (1) WO1984003176A1 (da)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4537827A (en) * 1983-02-07 1985-08-27 Hughes Aircraft Company Optically flat semiconductor baseplate structure
US4766426A (en) * 1985-02-14 1988-08-23 Matsushita Electric Industrial Co., Ltd. Display panel assembly having a plurality of film carrier tapes on each of which a semiconductor divice is mounted
GB2195465A (en) * 1986-09-29 1988-04-07 Atomic Energy Authority Uk Misalignment detection
US5160560A (en) * 1988-06-02 1992-11-03 Hughes Aircraft Company Method of producing optically flat surfaces on processed silicon wafers
JP3198779B2 (ja) * 1994-03-04 2001-08-13 株式会社デンソー 半導体圧力検出器の製造方法
TW281795B (da) * 1994-11-30 1996-07-21 Sharp Kk
US5721602A (en) * 1995-10-11 1998-02-24 International Business Machines Corporation Mechanical packaging and thermal management of flat mirror arrays
US5932045A (en) * 1997-06-02 1999-08-03 Lucent Technologies Inc. Method for fabricating a multilayer optical article
JP2001344710A (ja) * 2000-06-05 2001-12-14 Tdk Corp ウエハの平面度制御方法及び薄膜磁気ヘッドの製造方法
US20030017424A1 (en) * 2001-07-18 2003-01-23 Miri Park Method and apparatus for fabricating complex grating structures
US6721076B2 (en) 2001-08-03 2004-04-13 Inphase Technologies, Inc. System and method for reflective holographic storage with associated multiplexing techniques
US7112359B2 (en) 2001-08-22 2006-09-26 Inphase Technologies, Inc. Method and apparatus for multilayer optical articles
US6999237B2 (en) * 2001-09-12 2006-02-14 Lightmaster Systems, Inc. Method and apparatus for configuration and assembly of a video projection light management system
US20030151832A1 (en) * 2002-01-14 2003-08-14 Arthur Berman Method and apparatus for enclosing optical assemblies
US7001541B2 (en) * 2001-09-14 2006-02-21 Inphase Technologies, Inc. Method for forming multiply patterned optical articles
US6825960B2 (en) * 2002-01-15 2004-11-30 Inphase Technologies, Inc. System and method for bitwise readout holographic ROM
JP4038679B2 (ja) * 2003-05-13 2008-01-30 住友電気工業株式会社 半導体レーザーバーの固定用治具
EP1522550A3 (de) * 2003-10-09 2010-10-13 Weidmann Plastics Technology AG Verfahren zum fremdstofffreien Fugen zweier Werkstücke sowie nach diesem Verfahren gefugtes Werkstück
US20070082179A1 (en) * 2005-10-07 2007-04-12 Wade James J Method and apparatus for forming optical articles
JP5074291B2 (ja) * 2008-05-15 2012-11-14 浜松ホトニクス株式会社 分光モジュール
JP5970330B2 (ja) * 2012-10-17 2016-08-17 株式会社アマダホールディングス 金型測長装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB820027A (en) * 1956-06-08 1959-09-16 Radiation Ltd Means for shaping sheet metal articles
US3229224A (en) * 1963-07-03 1966-01-11 Gen Time Corp Apparatus for maintaining parallelism and distance between two objects
US3510374A (en) * 1964-04-20 1970-05-05 Industrial Nucleonics Corp Method and control apparatus for regulating apparatuses
US3573455A (en) * 1968-09-13 1971-04-06 Ibm Examination of articles by x-rays
US3681958A (en) * 1970-10-15 1972-08-08 Grumman Aerospace Corp High pressure forming press
US3751956A (en) * 1971-09-27 1973-08-14 I P Spa Sa Fluid-dynamic press for the cold forming of sheet metal
US3802065A (en) * 1972-03-16 1974-04-09 Gen Electric Method and structure for mounting semiconductor chips
US3843401A (en) * 1972-07-14 1974-10-22 Texas Instruments Inc Bismuth masking technique for use on injection laser diodes as means of uniformity evaluation and spontaneous control and product
US3914969A (en) * 1973-04-18 1975-10-28 Nasa Apparatus for forming dished ion thruster grids
JPS5382278A (en) * 1976-12-28 1978-07-20 Toshiba Corp Production of semiconductor device
KR0130554B1 (ko) * 1984-03-19 1998-04-11 유젠 웬닝거 합성수지 매트릭스 및 이에 분산된 액정으로 이루어진 광변조제와 그 제조방법
AU576219B2 (en) * 1985-02-18 1988-08-18 Stc Plc Dynamic hologram recording

Also Published As

Publication number Publication date
AU2434984A (en) 1984-08-30
DK160113C (da) 1991-07-01
DE3371446D1 (en) 1987-06-11
JPS60500554A (ja) 1985-04-18
AU568629B2 (en) 1988-01-07
US4470856A (en) 1984-09-11
DK160113B (da) 1991-01-28
CA1202710A (en) 1986-04-01
EP0137790A1 (en) 1985-04-24
DK407884A (da) 1984-08-27
WO1984003176A1 (en) 1984-08-16
EP0137790B1 (en) 1987-05-06

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Legal Events

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PUP Patent expired