DK54682A - Fremgangsmaade til undersoegelse af overfladekvaliteten af materialer i fast aggregatform og apparat til udoevelse af fremgangsmaaden - Google Patents

Fremgangsmaade til undersoegelse af overfladekvaliteten af materialer i fast aggregatform og apparat til udoevelse af fremgangsmaaden Download PDF

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Publication number
DK54682A
DK54682A DK54682A DK54682A DK54682A DK 54682 A DK54682 A DK 54682A DK 54682 A DK54682 A DK 54682A DK 54682 A DK54682 A DK 54682A DK 54682 A DK54682 A DK 54682A
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DK
Denmark
Prior art keywords
procedure
examining
exercising
materials
surface quality
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DK54682A
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English (en)
Inventor
M Luukkala
J Leino
Original Assignee
Valmet Oy
M Luukkala
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valmet Oy, M Luukkala filed Critical Valmet Oy
Publication of DK54682A publication Critical patent/DK54682A/da

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Radiation Pyrometers (AREA)

Description

Figure DK54682AD00011
SAMMENDRAG
En fremgangsmåde til undersøgelse af materialer i fast aggregatform, f.eks. metaller, med hensyn til deres overfladefejl, overfladerevner eller lignende, egenskaberne af belægninger eller overfladekvaliteten af papir. En særlig anvendelse af fremgangsmåden ifølge opfindelsen er måling af tykkelsen af det hærdede overfladelag af stål.
Af hensyn til at forhindre hurtig udligning af temperaturforskelle, der frembringes på materialets overflade er der på materialet (25) rettet en pulserende lysstråle (21) i bølgelængdeområdet for synligt lys, hvorved i det mindste en del af denne lysstråle (21) absorberes i overfladen af materialet (25) og forårsager forøgelse af materialets overfladetemperatur. Overfladen af materialet (25) , der er blevet opvarmet ved virkning af den frembragte, periodiske temperaturvariation udsender en pulserende, infra-rød stråling (26), som modtages med midler (27), der er følsomme for infra-rød stråling.
DK54682A 1980-06-10 1982-02-09 Fremgangsmaade til undersoegelse af overfladekvaliteten af materialer i fast aggregatform og apparat til udoevelse af fremgangsmaaden DK54682A (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI801850A FI63115C (fi) 1980-06-10 1980-06-10 Foerfarande foer undersoekning av ytkvaliteten av material i fasttillstaond och anordning foer genomfoerande av foerfarandet
PCT/FI1981/000044 WO1981003704A1 (en) 1980-06-10 1981-06-09 Procedure for examining the surface quality of materials in solid state of aggregation,and means for carrying out the procedure

Publications (1)

Publication Number Publication Date
DK54682A true DK54682A (da) 1982-02-09

Family

ID=8513553

Family Applications (1)

Application Number Title Priority Date Filing Date
DK54682A DK54682A (da) 1980-06-10 1982-02-09 Fremgangsmaade til undersoegelse af overfladekvaliteten af materialer i fast aggregatform og apparat til udoevelse af fremgangsmaaden

Country Status (9)

Country Link
EP (1) EP0053167B1 (da)
JP (1) JPS57500846A (da)
AU (1) AU546814B2 (da)
BR (1) BR8108642A (da)
CA (1) CA1164242A (da)
DK (1) DK54682A (da)
FI (1) FI63115C (da)
IT (1) IT1168095B (da)
WO (1) WO1981003704A1 (da)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI64465C (fi) * 1982-03-15 1983-11-10 Mauri Luukkala Foerfarande och apparat foer att maeta ytornas egenskaper av fasta tillstaondets materialer
FI64243C (fi) * 1982-06-17 1983-10-10 Mauri Luukkala Foerfarande och apparat foer maetning av tvaerbundenhetsgradeni plast
US4521118A (en) * 1982-07-26 1985-06-04 Therma-Wave, Inc. Method for detection of thermal waves with a laser probe
US4522510A (en) * 1982-07-26 1985-06-11 Therma-Wave, Inc. Thin film thickness measurement with thermal waves
US4481418A (en) * 1982-09-30 1984-11-06 Vanzetti Systems, Inc. Fiber optic scanning system for laser/thermal inspection
US4578584A (en) * 1984-01-23 1986-03-25 International Business Machines Corporation Thermal wave microscopy using areal infrared detection
FI850870A0 (fi) * 1985-03-04 1985-03-04 Labsystems Oy Foerfarande foer maetning av sedimentation.
DE3820862A1 (de) * 1988-06-21 1989-12-28 Soelter Hans Joachim Dipl Phys Verfahren und vorrichtung zur kontaktlosen untersuchung von oberflaechen und inneren strukturen eines festen pruefkoerpers
DE4030801C2 (de) * 1990-09-28 1998-02-05 Siemens Ag Meßanordnung zur berührungslosen Bestimmung der Dicke und/oder thermischen Eigenschaften von Folien und dünnen Oberflächenbeschichtungen
FR2682757A1 (fr) * 1991-10-21 1993-04-23 Inst Francais Du Petrole Dispositif et methode de controle non destructif et continu de l'epaisseur de profiles.
DE4206499C2 (de) * 1992-03-02 1994-03-10 Haeusler Gerd Verfahren und Vorrichtung zur Abstandsmessung
DE4343076C2 (de) * 1993-12-16 1997-04-03 Phototherm Dr Petry Gmbh Vorrichtung zum photothermischen Prüfen einer Oberfläche eines insbesondere bewegten Gegenstandes
WO1996021857A1 (de) † 1995-01-13 1996-07-18 Optikzentrum Nrw Gmbh Verfahren und vorrichtung zur bestimmung der schichtdicke, der leitfähigkeit und/oder der schichtkontaktgüte von auf substraten aufgetragenen schichten
US5709471A (en) * 1996-02-29 1998-01-20 The Aerospace Corporation Method for thermally testing with a laser the edge of a sapphire window
DE19808536A1 (de) * 1998-02-28 1999-09-02 Ramseier Rubigen Ag Verfahren und Vorrichtung zum Überwachen einer Ausgangsschichtdicke sowie Verwendung der Vorrichtung
GB2348279A (en) * 1999-03-20 2000-09-27 C A Technology Limited Coating thickness measurement by remote non-contact photothermal method
FI112881B (fi) * 1999-12-09 2004-01-30 Metso Paper Inc Menetelmä ja sovitelma päällystekerroksen profiilin määrittämiseksi
FI113088B (fi) * 2000-02-10 2004-02-27 Metso Automation Oy Menetelmä ja laite paperirainan lämpötilan mittaamiseksi
CN102353649A (zh) * 2011-06-30 2012-02-15 中国科学院长春光学精密机械与物理研究所 一种基于二元化光谱分技术的乙醇气体浓度遥测方法
DE102014212402A1 (de) * 2014-06-27 2015-12-31 Robert Bosch Gmbh Verfahren zum Herstellen eines Bauteilelements
CN110400311A (zh) * 2019-08-01 2019-11-01 中北大学 基于脉冲激光热成像的高温合金表面缺陷特征提取方法
LU101529B1 (de) * 2019-12-12 2021-06-15 Aim Systems Gmbh Vorrichtung und Verfahren zur Bestimmung einer Materialeigenschaft eines Prüfkörpers in einem oberflächennahen Prüfkörperbereich
CN111239154A (zh) * 2020-01-18 2020-06-05 哈尔滨工业大学 一种横向差动暗场共焦显微测量装置及其方法
CN215607953U (zh) 2020-02-03 2022-01-25 广州迪克医疗器械有限公司 带加热装置的空气消毒装置
CN113406009B (zh) * 2021-06-23 2023-07-04 电子科技大学 一种基于光声信号匹配滤波的金属材料热扩散率测量方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1315654A (en) * 1969-05-21 1973-05-02 Pilkington Brothers Ltd Detection of faults in transparent material using lasers
FR2247699A1 (en) * 1973-10-11 1975-05-09 Anvar Surface roughness measuring process - compares two different wavelength laser lighted images at third wavelength
GB1474191A (en) * 1974-01-21 1977-05-18 Nat Res Dev Measurement of surface roughness
JPS6036013B2 (ja) * 1977-09-30 1985-08-17 動力炉・核燃料開発事業団 金属表面の欠陥検査方法
DE2952885C2 (de) * 1978-06-20 1986-01-30 Sumitomo Metal Industries, Ltd., Osaka Vorrichtung zur berührungslosen Ultraschallfehlerprüfung

Also Published As

Publication number Publication date
IT8122247A1 (it) 1982-12-10
JPS57500846A (da) 1982-05-13
CA1164242A (en) 1984-03-27
AU7293981A (en) 1981-01-07
FI801850A7 (fi) 1981-12-11
WO1981003704A1 (en) 1981-12-24
FI63115C (fi) 1983-04-11
IT8122247A0 (it) 1981-06-10
BR8108642A (pt) 1982-04-27
EP0053167B1 (en) 1984-09-19
IT1168095B (it) 1987-05-20
FI63115B (fi) 1982-12-31
EP0053167A1 (en) 1982-06-09
AU546814B2 (en) 1985-09-19

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