Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
  • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
  • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
  • G01N27/20—Investigating the presence of flaws
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
  • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
  • G01R31/18—Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
  • H01G4/00—Fixed capacitors; Processes of their manufacture
  • H01G4/30—Stacked capacitors
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
  • H01G4/00—Fixed capacitors; Processes of their manufacture
  • H01G4/30—Stacked capacitors
  • H01G4/306—Stacked capacitors made by thin film techniques

Landscapes

• Engineering & Computer Science (AREA)
• Power Engineering (AREA)
• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Manufacturing & Machinery (AREA)
• Microelectronics & Electronic Packaging (AREA)
• Chemical & Material Sciences (AREA)
• Biochemistry (AREA)
• Electrochemistry (AREA)
• Health & Medical Sciences (AREA)
• Life Sciences & Earth Sciences (AREA)
• Analytical Chemistry (AREA)
• Chemical Kinetics & Catalysis (AREA)
• General Health & Medical Sciences (AREA)
• Immunology (AREA)
• Pathology (AREA)
• Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
• Steroid Compounds (AREA)
• Medicines Containing Plant Substances (AREA)
• Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
• Testing Of Individual Semiconductor Devices (AREA)
• Testing Relating To Insulation (AREA)
• Testing Electric Properties And Detecting Electric Faults (AREA)
• Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Applications Claiming Priority (2)

Publications (2)

Family

ID=26282123

Family Applications (1)

Country Status (8)

Families Citing this family (6)

Family Cites Families (4)

• 1983
  • 1983-02-25 NO NO830659A patent/NO830659L/no unknown
  • 1983-02-28 DK DK98483A patent/DK98483A/da not_active Application Discontinuation
  • 1983-03-01 US US06/471,115 patent/US4583038A/en not_active Expired - Fee Related
  • 1983-03-02 JP JP58501297A patent/JPS59500288A/ja active Pending
  • 1983-03-02 EP EP83301113A patent/EP0096950B1/en not_active Expired
  • 1983-03-02 DE DE8383301113T patent/DE3363353D1/de not_active Expired
  • 1983-03-02 ES ES520238A patent/ES520238A0/es active Granted
  • 1983-03-02 WO PCT/GB1983/000063 patent/WO1983003143A1/en not_active Ceased

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