EE200600042A - Pindepaksusetalonide kalibreerimise meetod - Google Patents
Pindepaksusetalonide kalibreerimise meetodInfo
- Publication number
- EE200600042A EE200600042A EEP200600042A EEP200600042A EE200600042A EE 200600042 A EE200600042 A EE 200600042A EE P200600042 A EEP200600042 A EE P200600042A EE P200600042 A EEP200600042 A EE P200600042A EE 200600042 A EE200600042 A EE 200600042A
- Authority
- EE
- Estonia
- Prior art keywords
- calibration method
- surface thickness
- thickness standards
- standards
- calibration
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EEP200600042A EE05164B1 (et) | 2006-12-22 | 2006-12-22 | Pindepaksusetalonide kalibreerimise meetod |
| DE102007062966A DE102007062966A1 (de) | 2006-12-22 | 2007-12-21 | Methode zur Kalibrierung von Schichtdickennormalen |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EEP200600042A EE05164B1 (et) | 2006-12-22 | 2006-12-22 | Pindepaksusetalonide kalibreerimise meetod |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EE200600042A true EE200600042A (et) | 2008-08-15 |
| EE05164B1 EE05164B1 (et) | 2009-04-15 |
Family
ID=39432117
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EEP200600042A EE05164B1 (et) | 2006-12-22 | 2006-12-22 | Pindepaksusetalonide kalibreerimise meetod |
Country Status (2)
| Country | Link |
|---|---|
| DE (1) | DE102007062966A1 (et) |
| EE (1) | EE05164B1 (et) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102010020116A1 (de) * | 2010-05-10 | 2011-11-10 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Verfahren und Vorrichtung zur Messung der Dicke dünner Schichten an großflächigen Messoberflächen |
-
2006
- 2006-12-22 EE EEP200600042A patent/EE05164B1/et not_active IP Right Cessation
-
2007
- 2007-12-21 DE DE102007062966A patent/DE102007062966A1/de not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| DE102007062966A1 (de) | 2008-06-26 |
| EE05164B1 (et) | 2009-04-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| KB4A | Valid patent at the end of a year |
Effective date: 20101231 |
|
| MM4A | Lapsed by not paying the annual fees |
Effective date: 20131222 |