EP0006459A2 - Usage d'un procédé d'électroformage pour la fabrication des composants flat-pack - Google Patents
Usage d'un procédé d'électroformage pour la fabrication des composants flat-pack Download PDFInfo
- Publication number
- EP0006459A2 EP0006459A2 EP79101647A EP79101647A EP0006459A2 EP 0006459 A2 EP0006459 A2 EP 0006459A2 EP 79101647 A EP79101647 A EP 79101647A EP 79101647 A EP79101647 A EP 79101647A EP 0006459 A2 EP0006459 A2 EP 0006459A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- resist
- exposure
- mask
- substrate
- inclination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/06—Surface treatment of glass, not in the form of fibres or filaments, by coating with metals
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/10—Moulds; Masks; Masterforms
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/201—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by an oblique exposure; characterised by the use of plural sources; characterised by the rotation of the optical device; characterised by a relative movement of the optical device, the light source, the sensitive system or the mask
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2218/00—Methods for coating glass
- C03C2218/30—Aspects of methods for coating glass not covered above
- C03C2218/32—After-treatment
- C03C2218/328—Partly or completely removing a coating
- C03C2218/33—Partly or completely removing a coating by etching
Definitions
- the invention relates to a method for the production of precision flat parts, such as masks, stencils, screens, nozzle plates with the smallest window openings and contour details with a large material thickness as well as high demands on contour shaping and constancy of the dimensions.
- the fineness of the details of a flat part is limited by the resolution of the photoresist (photoresist or photo film).
- the thickness of the flat part is limited by the resist thickness, the resist thickness and resist resolution correlating so that increasing thickness causes decreasing resolution.
- the object of the invention is to implement the electroplating process described at the beginning with the simplest possible means and to increase the resolution of the resist.
- This task is loaded by the fact that on a flat, fully translucent support, for. B. a glass pane, with a thin one-sided metallization in this metallization on usual. Way z. B. etching or lifting a desired flat part pattern is generated, which serves as a template and that a photoresist applied to the template side is exposed by the carrier and developed in a known manner and furthermore the spaces not covered with resist are filled by galvanic metal deposition.
- the exposure of the resist in the conventional method by means of a mask, which is placed over the carrier and resist, is replaced in the method according to the invention by exposure by the glass carrier, so that light only enters the resist on the areas not covered by the template .
- the carrier is also an exposure mask.
- the structure receives full light intensity at its base. As a result, it has maximum adhesion.
- Conventional exposure results in underexposure on the substrate, that is to say adhesion decreases with increasing resist height. Underexposure also results in a rejuvenation of the resist structure and thus an additional reduction in the size of the base.
- minimal light reflection occurs when exiting the resist in the method according to the invention if a matt black base is used and additionally. with dry resists - peel off the protective film before exposure. In the conventional method, the reflection on the metallic support significantly reduces the resolution.
- flanks with - seen in cross section - inconsistent course are generated by exposing the resist twice or more with different light sources. This can be for certain hole shapes in the flat part, e.g. B. for nozzle openings, may be desired.
- correspondingly inclined resist structures are produced during the exposure by one or more defined inclination of the substrate against the incident light. In this way, it is possible in a targeted manner. To produce flat parts with inclined edges. Resist structures can also be produced by continuously changing the substrate inclination during exposure about one or more axes of rotation perpendicular to the incident light.
- inclination of the substrate (carrier) against the incident light and uniform rotation about an axis perpendicular to the substrate during exposure results in rotationally symmetrical structures with surface lines inclined to the substrate.
- inclined contours are desired for nozzle openings or stencils (lift-out bevels), which are easy to produce with the method according to the invention.
- a further advantage of the method is that the resist is exposed through the glass support to produce the coarse mask, the fine mask serving as an exposure mask.
- the known methods of assigning a coarse and fine mask to one another by optical alignment require considerable effort and often result in inaccuracies. This is remedied by the invention; Position errors are excluded.
- the development of the invention for relatively strong flat parts consists in the fact that exposure is carried out on two sides, once through the stencil, and the second time using a conventional mask through an applied mask.
- the mask is placed on the resist and aligned with the template using a registration system (e.g. stops).
- a registration system e.g. stops.
- metals are used as the plating material which are easy to separate from the template material.
- the galvanoplastic can be removed without damaging the template.
- the removal of the electroplating can be made possible. In this way it is achieved that a template can be used several times.
- a further embodiment of the method according to the invention for producing resist structures is that the templates are subsequently removed. Structures of this kind are used particularly in integrated optics.
- Figure 1 shows a conventional method
- Figure 2 shows the inventive method.
- a negative photoresist 2 is applied to a metallic carrier 1 in FIG.
- This photo layer is covered with an exposure mask 3 and exposed to the UV radiation 4 of a copying machine.
- the light incident through the transparent spots 5, 6 triggers polymerization reactions in the areas below the photoresist, which create a latent image.
- the non-exposed parts are detached so that only resist residues 7 (FIG. 1b) remain on the carrier plate 1 in the form of the desired contour limitation of the flat part. It can also be seen from FIG. 1b that structure 5 was no longer dissolved.
- B. a nickel film 8 electrodeposited.
- a carrier plate 9 made of glass with a metallization 10 can be seen.
- This consists, for. B. from a titanium adhesive layer on which copper is evaporated.
- Metallization becomes photolithographic and generates the desired flat part pattern using etching, which serves as a template.
- Thin photoresist layers 11 achieve high resolution and thus high quality of the stencil.
- the template can also be produced using the known lifting technique.
- part b of FIG. 2 the photoresist layer 11 has been removed and a photo film 12 has been applied as a resist to the stencil. In this case, the exposure takes place through the glass support in the direction of the arrows 13. From part c of FIG. 2 it can be seen that both structures have dissolved Corresponding resist structures 14 and 15 have remained.
- the plating is designated by 16.
- the galvanoplastic or the carrier can be detached in this process step.
- the spaces between the resist structure can instead of electroplating also by pouring z. B. filled with plastic.
- the resulting flat part is separated from the carrier in the same way as the galvanoplastic. If material is applied in thicknesses greater than the height of the resist structure, then plates with surface reliefs can be created, such as those used for. B. needed in printing technology.
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Metallurgy (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electrochemistry (AREA)
- Geochemistry & Mineralogy (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Electroplating Methods And Accessories (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2828625 | 1978-06-29 | ||
| DE2828625A DE2828625C2 (de) | 1978-06-29 | 1978-06-29 | Verfahren zur galvanoplastischen Herstellung von Präzisionsflachteilen |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| EP0006459A2 true EP0006459A2 (fr) | 1980-01-09 |
| EP0006459A3 EP0006459A3 (en) | 1980-01-23 |
| EP0006459B1 EP0006459B1 (fr) | 1982-06-09 |
Family
ID=6043130
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP79101647A Expired EP0006459B1 (fr) | 1978-06-29 | 1979-05-29 | Usage d'un procédé d'électroformage pour la fabrication des composants flat-pack |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4264714A (fr) |
| EP (1) | EP0006459B1 (fr) |
| JP (1) | JPS557799A (fr) |
| BR (1) | BR7904111A (fr) |
| CS (1) | CS215019B2 (fr) |
| DE (1) | DE2828625C2 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0163130A3 (en) * | 1984-04-30 | 1986-05-07 | Ppg Industries, Inc. | Electroforming method and mandrel |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2933570C3 (de) * | 1979-08-18 | 1982-02-25 | Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe | Verfahren zum Herstellen von Trenndüsenelementen |
| DE3115116A1 (de) * | 1980-05-07 | 1982-02-04 | The Perkin-Elmer Corp., 06856 Norwalk, Conn. | Verfahren zur herstellung eines maskensubstrats zur anwendung bei der roentgenstrahlen-lithographie |
| US4404060A (en) * | 1981-05-08 | 1983-09-13 | Siemens Aktiengesellschaft | Method for producing insulating ring zones by galvanic and etch technologies at orifice areas of through-holes in a plate |
| JPS5848055A (ja) * | 1981-09-17 | 1983-03-19 | Mizuho Shoji Kk | 彫刻機用原版の製造方法 |
| DE3151290C2 (de) * | 1981-12-24 | 1986-08-14 | Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar | Lamelle für lichtoptische Verschlüsse optischer Geräte |
| DE3315665A1 (de) * | 1983-04-29 | 1984-10-31 | Siemens AG, 1000 Berlin und 8000 München | Herstellung von galvanoplastischen flachteilen mit totationsunsymmetrischen, kegelfoermigen strukturen |
| DE3401963A1 (de) * | 1984-01-20 | 1985-07-25 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur herstellung von fotoresiststrukturen mit gestuften flanken |
| US4490217A (en) * | 1984-02-24 | 1984-12-25 | Armstrong World Industries, Inc. | Method of making a stencil plate |
| DE3842354A1 (de) * | 1988-12-16 | 1990-06-21 | Kernforschungsz Karlsruhe | Verfahren zur lithographischen herstellung von galvanisch abformbaren mikrostrukturen mit dreieckigem oder trapezfoermigem querschnitt |
| US5560837A (en) * | 1994-11-08 | 1996-10-01 | Hewlett-Packard Company | Method of making ink-jet component |
| DE69712654T2 (de) * | 1996-02-22 | 2002-09-05 | Seiko Epson Corp., Tokio/Tokyo | Tintenstrahlaufzeichnungskopf, Tintenstrahlaufzeichnungsgerät damit versehen und Herstellungsverfahren eines Tintenstrahlaufzeichnungskopfes |
| US6179978B1 (en) | 1999-02-12 | 2001-01-30 | Eastman Kodak Company | Mandrel for forming a nozzle plate having a non-wetting surface of uniform thickness and an orifice wall of tapered contour, and method of making the mandrel |
| US6350558B1 (en) | 1999-10-05 | 2002-02-26 | Rainer Gocksch | Method of making decorative panels |
| KR20020000813A (ko) * | 2000-03-22 | 2002-01-05 | 마치오 나카지마 | 구멍 구조체 및 구멍 구조체의 제조 방법 |
| US7025865B2 (en) * | 2000-09-26 | 2006-04-11 | Eastman Kodak Company | Method for producing metal mask and metal mask |
| JP2002245947A (ja) * | 2000-12-15 | 2002-08-30 | Canon Inc | 細線を有する基板及びその製造方法及び電子源基板及び画像表示装置 |
| JP4582494B2 (ja) * | 2003-12-10 | 2010-11-17 | ウシオ電機株式会社 | コンタクト露光装置 |
| JP2007245364A (ja) * | 2006-03-13 | 2007-09-27 | Fujifilm Corp | ノズルプレートの製造方法及び液滴吐出ヘッド並びに画像形成装置 |
| JP4911682B2 (ja) | 2006-07-20 | 2012-04-04 | 富士フイルム株式会社 | 露光装置 |
| US7828417B2 (en) * | 2007-04-23 | 2010-11-09 | Hewlett-Packard Development Company, L.P. | Microfluidic device and a fluid ejection device incorporating the same |
| US7749883B2 (en) | 2007-09-20 | 2010-07-06 | Fry's Metals, Inc. | Electroformed stencils for solar cell front side metallization |
| EP2658719B1 (fr) * | 2010-12-28 | 2018-08-29 | Stamford Devices Limited | Plaque d'ouverture photodéfinie et son procédé de production |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2559389A (en) * | 1942-04-02 | 1951-07-03 | Keuffel & Esser Co | Method of producing precision images |
| US3507654A (en) * | 1966-12-29 | 1970-04-21 | Corning Glass Works | Stencil screen and method |
| US3703450A (en) * | 1971-04-01 | 1972-11-21 | Dynamics Res Corp | Method of making precision conductive mesh patterns |
| SU484816A1 (ru) * | 1972-06-16 | 1976-08-05 | Предприятие П/Я А-1631 | Способ изготовлени цветных фотошаблонов |
| US3900359A (en) * | 1973-02-26 | 1975-08-19 | Dynamics Res Corp | Method and apparatus for television tube shadow mask |
| JPS51117033A (en) * | 1975-04-07 | 1976-10-14 | Hitachi Ltd | Photograph processing method |
| JPS52106805A (en) * | 1976-03-04 | 1977-09-07 | Toagosei Chem Ind Co Ltd | Stabilization of 1,1,1-trichloroethane |
| FR2356975A1 (fr) * | 1976-06-30 | 1978-01-27 | Ibm | Procede d'impression photolithographique du type a contact permettant d'obtenir des profils a resolution elevee et appareil utilisant un tel procede |
| JPS5357973A (en) * | 1976-11-05 | 1978-05-25 | Mitsubishi Electric Corp | Preparation of photo mask |
| US4115120A (en) * | 1977-09-29 | 1978-09-19 | International Business Machines Corporation | Method of forming thin film patterns by differential pre-baking of resist |
-
1978
- 1978-06-29 DE DE2828625A patent/DE2828625C2/de not_active Expired
-
1979
- 1979-05-29 EP EP79101647A patent/EP0006459B1/fr not_active Expired
- 1979-06-01 CS CS793795A patent/CS215019B2/cs unknown
- 1979-06-11 US US06/047,475 patent/US4264714A/en not_active Expired - Lifetime
- 1979-06-28 BR BR7904111A patent/BR7904111A/pt unknown
- 1979-06-29 JP JP8253779A patent/JPS557799A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0163130A3 (en) * | 1984-04-30 | 1986-05-07 | Ppg Industries, Inc. | Electroforming method and mandrel |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0006459B1 (fr) | 1982-06-09 |
| CS215019B2 (en) | 1982-06-25 |
| US4264714A (en) | 1981-04-28 |
| BR7904111A (pt) | 1980-03-11 |
| EP0006459A3 (en) | 1980-01-23 |
| JPS557799A (en) | 1980-01-19 |
| JPH0232619B2 (fr) | 1990-07-23 |
| DE2828625C2 (de) | 1980-06-19 |
| DE2828625B1 (de) | 1979-09-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE2828625C2 (de) | Verfahren zur galvanoplastischen Herstellung von Präzisionsflachteilen | |
| DE3326781C2 (fr) | ||
| DE3783897T2 (de) | Verfahren zur herstellung von matrizen fuer plattierungsverfahren. | |
| DE3150109C2 (fr) | ||
| DE69322970T2 (de) | Herstellung und benutzung einer siebdruckschablone mit erhöhten kanten | |
| DE69533653T2 (de) | Pastendruckverfahren | |
| DE1804785C3 (de) | Verwendung einer Auftragswalze, deren Oberfläche mit elastisch deformierbaren Vertiefungen oder Gewinden der Oberfläche versehen ist, zum Aufbringen einer viskosen Überzugsmasse auf die Oberfläche eines mit durchgehenden Löchern versehenen flachen Substrats | |
| EP0141389A2 (fr) | Procédé pour la fabrication de réserves structurées selon une image et réserve à sec pour ce procédé | |
| DE3524196C3 (de) | Lithografiemaske | |
| EP0104685B1 (fr) | Procédé pour la fabrication d'un masque pour réaliser des images texturées,dans une couche photorésistante par lithographie aux rayons X | |
| DE2322874A1 (de) | Verfahren zum photobedrucken einer platte | |
| DE4243750C2 (de) | Verfahren zur Herstellung einer Druckform für den Tiefdruck, Siebdruck, Flexodruck oder Offsetdruck | |
| DE2415487B2 (de) | Verfahren zur herstellung von leiterplatten nach dem photoaetzverfahren | |
| EP0141335B1 (fr) | Procédé pour la fabrication d'un masque pour rayon X avec couche métallique de support | |
| EP0007447A1 (fr) | Procédé de fabrication de surfaces microperforées et application du procédé | |
| DE2050285C3 (de) | Verfahren zum Herstellen von Siebdruckschablonen aus Metall | |
| EP0036595A1 (fr) | Procédé de fabrication d'écrans de soie pour sérigraphie par voie électrolytique | |
| DE2626851C3 (de) | Verfahren zur Herstellung von Masken für die Röntgenlithographie | |
| DE1145458B (de) | Verfahren zur Herstellung von metallischen Aufdampf- und Legierungsmasken fuer Halbleiteranordnungen | |
| DE3120964A1 (de) | Kontaktbelichtungsverfahren | |
| EP3523696B1 (fr) | Plaque composite dotée d'une couche barrière et procédé de fabrication d'une plaque haute pression | |
| DE69508705T2 (de) | Stiftfreie Dünnschicht für eine permanente Form für eine Düsenöffnungsplatte | |
| DE3889448T2 (de) | Photomusterbare Mehrschichtstruktur. | |
| EP0124064A1 (fr) | Procédé d'électroformage de pièces planes à structure conique sans symétrie de rotation | |
| DE3148775C2 (de) | Verfahren zur Herstellung einer Schlitzplatte für Kodierer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
| AK | Designated contracting states |
Designated state(s): BE FR GB IT NL |
|
| AK | Designated contracting states |
Designated state(s): BE FR GB IT NL |
|
| 17P | Request for examination filed | ||
| ITF | It: translation for a ep patent filed | ||
| GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
| AK | Designated contracting states |
Designated state(s): BE FR GB IT NL |
|
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 19890522 Year of fee payment: 11 |
|
| ITTA | It: last paid annual fee | ||
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: NL Payment date: 19900531 Year of fee payment: 12 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Effective date: 19910131 |
|
| REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST |
|
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 19910423 Year of fee payment: 13 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: NL Effective date: 19911201 |
|
| NLV4 | Nl: lapsed or anulled due to non-payment of the annual fee | ||
| PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: BE Payment date: 19920522 Year of fee payment: 14 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Effective date: 19920529 |
|
| GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 19920529 |
|
| PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: BE Effective date: 19930531 |
|
| BERE | Be: lapsed |
Owner name: SIEMENS A.G. BERLIN UND MUNCHEN Effective date: 19930531 |
|
| PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |