EP0169903A4 - Messgerät für numerische werte unter verwendung einer oszilloskopvorrichtung. - Google Patents

Messgerät für numerische werte unter verwendung einer oszilloskopvorrichtung.

Info

Publication number
EP0169903A4
EP0169903A4 EP19830900972 EP83900972A EP0169903A4 EP 0169903 A4 EP0169903 A4 EP 0169903A4 EP 19830900972 EP19830900972 EP 19830900972 EP 83900972 A EP83900972 A EP 83900972A EP 0169903 A4 EP0169903 A4 EP 0169903A4
Authority
EP
European Patent Office
Prior art keywords
numerical values
oscilloscope
measuring device
measuring
oscilloscope device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP19830900972
Other languages
English (en)
French (fr)
Other versions
EP0169903B1 (de
EP0169903A1 (de
Inventor
Yukio Ogura
Seiji Nasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Construction Machinery Co Ltd
Hitachi Industry and Control Solutions Co Ltd
Original Assignee
Hitachi Engineering Co Ltd Ibaraki
Hitachi Construction Machinery Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Engineering Co Ltd Ibaraki, Hitachi Construction Machinery Co Ltd filed Critical Hitachi Engineering Co Ltd Ibaraki
Publication of EP0169903A1 publication Critical patent/EP0169903A1/de
Publication of EP0169903A4 publication Critical patent/EP0169903A4/de
Application granted granted Critical
Publication of EP0169903B1 publication Critical patent/EP0169903B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G01N29/0627—Cathode-ray tube displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4463—Signal correction, e.g. distance amplitude correction [DAC], distance gain size [DGS], noise filtering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/033—Pointing devices displaced or positioned by the user, e.g. mice, trackballs, pens or joysticks; Accessories therefor
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/048—Interaction techniques based on graphical user interfaces [GUI]
    • G06F3/0487—Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser
    • G06F3/0488—Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser using a touch-screen or digitiser, e.g. input of commands through traced gestures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Human Computer Interaction (AREA)
  • Signal Processing (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
EP83900972A 1983-03-28 1983-03-28 Messgerät für numerische werte unter verwendung einer oszilloskopvorrichtung Expired - Lifetime EP0169903B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1983/000094 WO1984003944A1 (fr) 1983-03-28 1983-03-28 Instrument de mesure d'une valeur numerique utilisant un oscilloscope

Publications (3)

Publication Number Publication Date
EP0169903A1 EP0169903A1 (de) 1986-02-05
EP0169903A4 true EP0169903A4 (de) 1988-04-06
EP0169903B1 EP0169903B1 (de) 1991-01-16

Family

ID=13789972

Family Applications (1)

Application Number Title Priority Date Filing Date
EP83900972A Expired - Lifetime EP0169903B1 (de) 1983-03-28 1983-03-28 Messgerät für numerische werte unter verwendung einer oszilloskopvorrichtung

Country Status (6)

Country Link
US (1) US4695833A (de)
EP (1) EP0169903B1 (de)
JP (1) JPH07111422B2 (de)
AU (2) AU563882B2 (de)
DE (1) DE3382127D1 (de)
WO (1) WO1984003944A1 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4821030A (en) * 1986-12-19 1989-04-11 Tektronix, Inc. Touchscreen feedback system
US4755811A (en) * 1987-03-24 1988-07-05 Tektronix, Inc. Touch controlled zoom of waveform displays
US4754329A (en) * 1987-04-13 1988-06-28 Tektronix, Inc. Focusing and screen calibration method for display screen coupled to video camera
FR2623997A1 (fr) * 1987-12-04 1989-06-09 Cgr Ultrasonic Dispositif d'imagerie medicale comprenant des moyens d'affichage d'images numerisees
US4924175A (en) * 1988-02-29 1990-05-08 Clinton James R Apparatus for displaying analog signatures of an electronic component
US4911014A (en) * 1988-07-22 1990-03-27 Akademiet For De Tekniske Videnskaber, Svejsecentralen Method of analyzing and evaluating the results of an ultrasonic examination
US5220522A (en) * 1989-05-09 1993-06-15 Ansan Industries, Ltd. Peripheral data acquisition, monitor, and control device for a personal computer
US5386360A (en) * 1989-05-09 1995-01-31 Ansan Industries Ltd. Peripheral data acquisition, monitor, and adaptive control system via personal computer
US5099444A (en) * 1989-05-09 1992-03-24 Ansan Industries, Ltd. Peripheral data acquisition transmission and control device
US5400246A (en) * 1989-05-09 1995-03-21 Ansan Industries, Ltd. Peripheral data acquisition, monitor, and adaptive control system via personal computer
US5321420A (en) * 1991-04-26 1994-06-14 Motorola, Inc. Operator interface for an electronic measurement system
KR970002567A (ko) * 1995-06-19 1997-01-28 윤종용 멀티 입력 장치
US6067080A (en) * 1997-02-21 2000-05-23 Electronics For Imaging Retrofittable apparatus for converting a substantially planar surface into an electronic data capture device
US6326565B1 (en) 1997-02-28 2001-12-04 Electronics For Imaging, Inc. Marking device for electronic presentation board
US6292177B1 (en) 1997-03-05 2001-09-18 Tidenet, Inc. Marking device for electronic presentation board
US6442213B1 (en) 1997-04-22 2002-08-27 Silicon Laboratories Inc. Digital isolation system with hybrid circuit in ADC calibration loop
US5966532A (en) * 1997-07-10 1999-10-12 National Instruments Corporation Graphical code generation wizard for automatically creating graphical programs
US6151014A (en) * 1998-02-26 2000-11-21 Pagasus Technologies Ltd. Systems and processing algorithms for ultrasound time-of-flight digitizer systems
US6774890B2 (en) 2001-01-09 2004-08-10 Tektronix, Inc. Touch controlled zoom and pan of graphic displays
KR100632834B1 (ko) * 2001-12-21 2006-10-13 지멘스 악티엔게젤샤프트 움직임을 검출하여 디스플레이하기 위한 장치 및 상기 장치를 제어하기 위한 방법
US9367166B1 (en) * 2007-12-21 2016-06-14 Cypress Semiconductor Corporation System and method of visualizing capacitance sensing system operation
US8521457B2 (en) * 2008-10-20 2013-08-27 Olympus Ndt User designated measurement display system and method for NDT/NDI with high rate input data
DE102008055585B3 (de) * 2008-12-23 2010-04-29 Jiri Burda Modulares Heiz- und Beleuchtungssystem zum Aufbau von Leucht- und Heizelementen
JP5477357B2 (ja) * 2010-11-09 2014-04-23 株式会社デンソー 音場可視化システム
JP6589641B2 (ja) * 2016-01-06 2019-10-16 株式会社島津製作所 分析装置
CN110988139A (zh) * 2019-11-01 2020-04-10 中国船舶重工集团公司第七二五研究所 一种浮标底板与舢板焊接相控阵超声检测方法
USD987459S1 (en) 2021-04-26 2023-05-30 Yokogawa Electric Corporation Spectrum analyzer

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2474206A1 (fr) * 1980-01-22 1981-07-24 Anvar Appareil de transcription de graphismes
FR2511796A1 (fr) * 1981-08-24 1983-02-25 Interaction Syst Inc Dispositif d'affichage a detection de contact et procede de localisation d'un contact capacitif
EP0043201B1 (de) * 1980-06-16 1984-10-10 Forney International, Inc. Steuerungssystem für industriellen Prozess

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USB368361I5 (de) * 1967-10-31
JPS5177349A (en) * 1974-12-27 1976-07-05 Nippon Electron Optics Lab Deetasuchihyojihoho
JPS5335460A (en) * 1976-09-14 1978-04-01 Toshiba Corp Antenna
JPS548458U (de) * 1977-06-20 1979-01-20
JPS552765A (en) * 1978-06-23 1980-01-10 Natl Res Inst For Metals Production of hydrogen sulfide by electrolysis
JPS5531188U (de) * 1978-08-23 1980-02-28
US4396977A (en) * 1980-06-16 1983-08-02 Forney Engineering Company Industrial process control system
US4479197A (en) * 1980-11-25 1984-10-23 Hewlett-Packard Company Method and apparatus for selecting and setting the mode of operation for a mechanism
US4386232A (en) * 1981-06-16 1983-05-31 Foster Wheeler Energy Corporation Multiplexed touch sensitive screen system
JPS582651A (ja) * 1981-06-29 1983-01-08 Hitachi Ltd 距離振幅補正装置
DE3139570C2 (de) * 1981-10-05 1983-09-29 Krautkrämer GmbH, 5000 Köln Verfahren und Schaltungsvorrichtung zur Bestimmung und Darstellung von Maximalwerten der von Reflektoren in einem Prüfstück reflektierten Ultraschallsignale
US4578640A (en) * 1982-09-14 1986-03-25 Analogic Corporation Oscilloscope control
US4555699A (en) * 1983-01-10 1985-11-26 Bancware, Inc. Data-entry system
JP5335460B2 (ja) 2009-02-09 2013-11-06 キヤノン株式会社 画像記録装置、制御方法、及びプログラム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2474206A1 (fr) * 1980-01-22 1981-07-24 Anvar Appareil de transcription de graphismes
EP0043201B1 (de) * 1980-06-16 1984-10-10 Forney International, Inc. Steuerungssystem für industriellen Prozess
FR2511796A1 (fr) * 1981-08-24 1983-02-25 Interaction Syst Inc Dispositif d'affichage a detection de contact et procede de localisation d'un contact capacitif

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
IBM TECHNICAL DISCLOSURE BULLETIN, vol. 17, no. 7, December 1974, pages 2015-2017, New York, US; C.P. LUDEMAN: "Keyboard employing voltage distribution matrix position sensor" *

Also Published As

Publication number Publication date
US4695833A (en) 1987-09-22
AU1371784A (en) 1984-10-25
JPH07111422B1 (de) 1995-11-29
WO1984003944A1 (fr) 1984-10-11
JPH07111422B2 (ja) 1995-11-29
DE3382127D1 (de) 1991-02-21
EP0169903B1 (de) 1991-01-16
AU563882B2 (en) 1987-07-23
EP0169903A1 (de) 1986-02-05

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