EP0213283A1 - Dispositif pour l'examen de pièces de monnaie - Google Patents

Dispositif pour l'examen de pièces de monnaie Download PDF

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Publication number
EP0213283A1
EP0213283A1 EP86107405A EP86107405A EP0213283A1 EP 0213283 A1 EP0213283 A1 EP 0213283A1 EP 86107405 A EP86107405 A EP 86107405A EP 86107405 A EP86107405 A EP 86107405A EP 0213283 A1 EP0213283 A1 EP 0213283A1
Authority
EP
European Patent Office
Prior art keywords
coin
amplifier
signal
coils
coins
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP86107405A
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German (de)
English (en)
Other versions
EP0213283B1 (fr
Inventor
Bernhard Trummer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ascom Autelca AG
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Autelca AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Autelca AG filed Critical Autelca AG
Priority to AT86107405T priority Critical patent/ATE50654T1/de
Publication of EP0213283A1 publication Critical patent/EP0213283A1/fr
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Publication of EP0213283B1 publication Critical patent/EP0213283B1/fr
Anticipated expiration legal-status Critical
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    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/02—Testing the dimensions, e.g. thickness, diameter; Testing the deformation
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/005—Testing the surface pattern, e.g. relief
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/08—Testing the magnetic or electric properties

Definitions

  • the invention relates to a device for coin testing.
  • the object is achieved to create a device of this type, which makes it possible to test several coin properties precisely within narrow tolerances, has a low, short-term power consumption, takes up little space, so It is feasible that it corrects the influence of changes in the properties of its components on the test results itself, and requires little adjustment work in their manufacture and maintenance.
  • the advantages achieved by the invention are essentially to be seen in the fact that all oscillators are formed with one and the same amplifier, so that only one amplifier has to be compared when manufacturing the device and when maintaining it, and only when checking several coin properties the feed current of this single amplifier flows.
  • the supply current duration can be very short in that, after a part of a test signal of a coin characteristic that is sufficient for evaluation, the switching device connects the oscillation circuit provided for the subsequent test of another coin characteristic to the amplifier, if the evaluation of the test signal does not already result in a coin return signal.
  • the switching device automatically follows the chronological sequence in which the coin to be tested influences different coils one after the other, so that these coils can be arranged very close to one another.
  • the coils of oscillation circuits for testing the same or different coin properties can also be arranged in such a way that the coin to be tested influences them at the same time, the oscillation circuits with these coils being periodically alternately excited, ie being briefly connected to the amplifier several times by the switching device.
  • the simultaneous influence is made possible by the fact that each oscillation circuit has only one coil, on the end face of which the coin passes.
  • test signals for the different coin properties are formed from the oscillator vibrations by one and the same demodulator with a subsequent analog-digital converter
  • changes (drift) of properties of the components of the demodulator and of the analog components that are inevitable in the long run and have an undesirable influence on the test signals have Digital converter has the same effect on all test signals. This enables an automatic correction in the evaluation device, so that the drift when dimensioning the tolerance ranges of the test criteria (with their over or under If the evaluation device triggers a coin return signal), can be ignored. This enables a very critical and nevertheless reliable test.
  • a particularly stable amplifier circuit for the oscillator in which neither feedback coils nor coil taps are necessary, together with an embodiment of the switching device in which, despite the use of semiconductor switches, the entire resonant circuit voltage is at the amplifier input, a rapidly responding, threshold-free demodulator, the type of Correction of drift phenomena, a special coil arrangement for checking the minting of the coin, with which the minting pattern can also be checked in addition to the embossing depth, and a special coil arrangement and signal evaluation for checking the diameter of the coin, thanks to which a high resolution capability in a large diameter range is achieved.
  • FIG. 1 shows an overview circuit diagram of a device for coin testing, the basic structure of which consists of the following assemblies: six oscillation circuits 1-6, the oscillation circuit coils 7-12 of which are arranged on a coin guide (FIGS. 2 and 3) in such a way that they are influenced in part by the coin to be tested, in order to test several coin properties, in part simultaneously and in part; an amplifier 14 (FIG. 4) and a switching device, for example 42, 43, by means of which each of the oscillation circuits 1-6 can be connected individually to the amplifier 14 to form an oscillator which, in accordance with the influence of the respective oscillation circuit coil, for example 7, by means of the testing coin provides amplitude-modulated (and also frequency-influenced) high-frequency test signals.
  • an amplitude demodulator 19 for the high-frequency test signals which provides an analog test signal which is characteristic of the coin to be tested influencing the respective resonant circuit coil and thus of the coin property in question, which is converted into a digital test signal in an analog-digital converter 20; an evaluation device 22 with read-only memory 23, in which the digital test signals are compared with test criteria stored in read-only memory 23, and a coin acceptance signal is triggered on a line 25 when all the test signals received from a coin meet the criteria stored for one of the coins to be accepted, and one Coin return signal is triggered on a line 26 if all the test signals of one and the same coin do not meet the criteria stored for one of the coins to be accepted; a control device 28, which controls the switching device 16, 17 in such a way that the oscillation circuits 1-6 one after the other in the order in which their coils 7-12 are influenced by the coin to be tested, and oscillation circuits (1, 2 and 4 , 5, 6), the coils (7, 8 or 10, 11, 12) of which are influenced simultaneously
  • the evaluation device 22 and the control device 28 are combined to form a data processing device (microprocessor CPU) to which the read-only memory (EPROM) 23 is assigned.
  • microprocessor CPU microprocessor CPU
  • EPROM read-only memory
  • the coin guide according to FIGS. 2 and 3 has a steep guide surface 31, on which the coins rolling on a runway 32 with a gradient slide with their entire front and rear sides, so that a certain, small distance between the coin and the one behind it Guide surface 31 arranged resonance circuit coils 7-11 is ensured.
  • the oscillation circles 1 to 6 are intended for the testing of several coin properties as follows: The oscillation circles 1 and 2 with the coils 7 and 8 for the embossing, the oscillation circles 3 and 4 with the coils 9 and 10 for the diameter, the oscillation circuit 5 with the coil 11 for the alloy and the oscillation circuit 6 with the coil 12 for the thickness the coin.
  • the resonant circuit coils 7-12 are arranged in such a way that the coin to be tested first influences the coils 7 and 8 simultaneously, then the coil 9 individually and then the coils 10, 11 and 12 simultaneously.
  • the coil 10 is arranged on the guide surface 31 above the coil 11 and the coil 12 coaxially to the coil 11 opposite this.
  • the switching device 16, 17 first connects the oscillating circuits 1 and 2 (coils 7 and 8) periodically alternately (for example 0.5 to 1 ms each) when checking the coin properties.
  • the oscillating circuits 1, 2 and 6 In the absence of a coin, the oscillating circuits 1, 2 and 6 have a natural frequency of 247 kHz, the oscillating circuits 3 and 4 have a natural frequency of 230 kHz and the oscillating circuit 5 has a lower natural frequency of 120 kHz, at which the field of the coil 11 goes deeper into the coin body penetrates, whereby the influence of the electrical and magnetic properties of the coin alloy on the test signal is greater and the influence of the embossing depth is smaller.
  • the damping of the oscillation circuits 1-6 are against levels, e.g. 36, adjusted so that the high-frequency voltage of the oscillator with each of the oscillation circuits 1-6 has the same amplitude in the absence of a coin, e.g. peak-to-peak value 2.5 V.
  • the amplifier 14 is a non-inverting amplifier with a gain of one.
  • the switching device 16, 17 has two jointly controllable semiconductor switches for each of the oscillation circuits 1-6, through which one the input 39 and through the other the output 40 of the amplifier 14 can be individually connected to each of the oscillation circuits 1-6.
  • the oscillation circuit 1 can be connected to the amplifier input 39 by the semiconductor switch 42 and to the amplifier output 40 by the semiconductor switch 43.
  • both these semiconductor switches assigned to one of the oscillation circuits 1-6, for example 42 and 43, and the semiconductor switches 45 and 46 mentioned below are parts of two analog switches 16 and 17 of the type customary for the time-division multiplex method of transmission technology, their control logic is designated with 48 and 49, respectively.
  • the use of two separate switches, e.g. 42 and 43, has the following reason: If a single semiconductor switch were used, the amplifier input voltage would not be the same as the resonant circuit voltage, but would be influenced by the temperature-dependent forward voltage drop at this switch, which changes due to drift phenomena. This would impair the stability (in particular amplitude stability) of the oscillator.
  • the amplifier input voltage is practically exactly the same as the resonant circuit voltage; because the forward voltage drop at the one, for example 42, of these two semiconductor switches, that connects the oscillation circuit, eg 1, to the amplifier input 39 is negligible because of the very weak amplifier input current.
  • the non-constant forward resistance of the semiconductor switch a high stability of the oscillator is achieved.
  • the amplifier 14 is a stabilized differential amplifier with a first and a second transistor 51 and 52 in an emitter circuit.
  • the same partial voltages of two DC voltage dividers 57, 58 and 59, 60 are present at the inputs 54 and 55 of this amplifier circuit.
  • Relative to the output 62 (collector of the second transistor 52), 54 (base of the first transistor 51) is the non-inverting input.
  • the resonant circuit voltage is superimposed on this input in that the oscillating circuit 1 is connected to this input 54 through the semiconductor switch 43 and a capacitor 63 bridging the resistor 57.
  • the output 62 is also connected to the oscillation circuit 1 by the semiconductor switch 42.
  • a pulse shaper 64 which delivers pulses with the frequency of the oscillator vibrations to the evaluation device 22, which uses these pulses as an additional test signal, in particular, for example, when testing the coin alloy, in order to influence the oscillator as little as possible, to the other output 66 (collector of the first transistor 51).
  • a constant current source 67 is used to stabilize the amplifier in conjunction with a current mirror 68 which is connected between the interconnected emitters of transistors 51 and 52 and a fixed negative reference potential (for example -5V).
  • a resistor 69 in series with the constant current source 67 supplies a constant (negative) reference voltage, which is amplified by an amplifier 71 and is inverted, the voltage U ref at the output 72 of this amplifier 71 being practically independent of the load.
  • the amplitude demodulator 19 has a first constant current source 75, which supplies a charging current represented by an arrow 76 of, for example, 0.33 mA in the forward direction of a diode 77 to a capacitor 78.
  • the constant current source 75 is controlled by a comparator 79 such that the charging current 76 flows when the instantaneous value of the high-frequency voltage is greater than the capacitor voltage.
  • a second constant current source 82 supplies a discharge current, represented by an arrow 83, of 0.004 mA, for example, directly to the capacitor 78.
  • the second constant current source 82 is controlled by a second comparator 84 so that the discharge current 83 flows when the capacitor voltage has the polarity corresponding to the charge current 76 Has.
  • the comparator 84 can also be omitted, so that the discharge current 83 flows continuously. If the instantaneous value of the high-frequency voltage is less than the voltage at the capacitor 78, the current of the constant current source 75 opposite to the direction of the arrow 76 flows through the diode 85.
  • the currents 76 and 83 of the constant current sources 75 and 82 are possibly by means of two transistors 87 and 88 Changes in the reference voltage on the output line 72 of the amplifier 71 (FIG.
  • the output signal (voltage of the capacitor 78) of the demodulator 19 is amplified in an amplifier 89 and converted in the analog-digital converter 20 into a corresponding digital signal.
  • the semiconductor switches 45 and 46 are temporarily closed in succession before the coin check (immediately after a coin detector responds).
  • a first voltage U ref 1 and then a second voltage U ref 2 are applied to the input of the amplitude demodulator 19.
  • These voltages are obtained by one or two voltage dividers (not shown) from the voltage U ref on the output line of the amplifier 71 (FIG.
  • U ref 1 to a first digital signal in a lowermost part of the signal range of the analog-digital Converter 20 and U ref 2 leads to a second digital signal in an uppermost part of the signal range of the analog-to-digital converter 20.
  • U ref 2 is somewhat smaller than the oscillator amplitude with an oscillation circuit not influenced by a coin and U ref 1 is of an order of magnitude smaller than U ref 2 .
  • the evaluation device 22 data processing device, microprocessor CPU
  • the subtractor forms the difference between the value of the first signal and the first setpoint.
  • the dividing unit forms the quotient of the value of the second signal and the second setpoint.
  • the coils 7 and 8 for checking the minting of the coin are pot core coils, the pot core end face of which is significantly smaller than the area of the smallest coin to be accepted. They are arranged in succession at such a distance from the runway 32 of the coin guide and at such a mutual distance in the direction of coin movement 34 (FIG. 7) that they are influenced by all of the coins to be accepted for a time sufficient to generate an evaluable test signal. Since the oscillation circuits 1 and 2 with the coils 7 and 8 are periodically alternately connected to the amplifier 14 to form an oscillator, the test signal for the coinage consists of two partial signals P 1 and P 2 interleaved with one another in the time-division multiplex method (FIG.
  • the test signal P1, P2 contains much more information about the coinage than a in usually by influencing a single coil generated test signal.
  • the limits of the range between which the signal maxima and minima lie are stored in the memory 23 for each coin to be accepted as test criteria for the depth of the coinage.
  • the evaluation device 22 checks whether the area in which the minima and maxima of the test signal parts P 1 and P 2 lie corresponds to one of the areas stored as criteria for one of the coins to be accepted. If this is the case, the coin being tested has the embossing depth of this coin to be accepted.
  • the greater information content of the test signal P 1, P 2 obtained with the two coils 7 and 8, which is characteristic of the embossing, also makes it possible to store typical criteria of the coins to be accepted for the embossing pattern (writing or numerical and image embossing) and for testing, e.g. to be used in addition to the depth of the embossing. These criteria must be saved for both sides of each coin because they are different for the two sides of the coin and it is not possible to predict which side of the coin will face the coils 7 and 8 when it is checked. It may be expedient to arrange the coils 7 and 8 at different distances from the runway 32 of the coin guide.
  • the coils 9 and 10 for checking the diameter of the coin have pot cores, the diameter of which is considerably larger than the diameter of the coils 7 and 8. At the pot cores of the coils 9 and 10, two segments lying opposite one another are cut off in order to reduce their dimension in the direction of coin movement 34 and thus the duration of their influence and the length of the measuring section on the coin guide. These coils 9 and 10 are arranged in succession in the direction of the coin 34 so that the highest point of the pole core of the coil 9 and the lowest point of the pole core of the coil 10 have the same distance from the runway 32 of the coin guide.
  • the test signal consists of two consecutive partial signals d1 and d2 for coins in a lower part of the diameter range or D1 and D2 for coins in an upper part of the diameter range, with d1 and D1 on influencing the coil 9, d2 and D2 are based on influencing the coil 10.
  • d1 has a pronounced minimum that is clearly related to the coin diameter (great slope of the signal value as a function of the diameter of the coin), while d2 has a much less pronounced, less meaningful minimum (small slope of the signal value as a function of the diameter of the coin).
  • the minimum of d 1 is evaluated for the test.
  • D 1 has a wide range of a minimum which is only insignificantly influenced by the coin diameter, while D 2 has a pronounced minimum, much more influenced by the coin diameter.
  • the minimum of D2 is evaluated for the test.
  • the evaluation device 22 determines the minima of these test signals by differentiating them. Criteria for the coin diameter are an upper and a lower limit of the minimum of the first and second partial signals for each of the coins to be accepted. If the first or second partial signal d 1 or D 2 of the coin to be checked lies between the limits stored for one of the coins to be accepted, then the coin has the diameter of this coin to be accepted.
  • the coil 11 intended for checking the coin alloy and the coil 12 provided for checking the coin thickness are pot core coils, the pot core diameter of which are dimensioned and are arranged at such a distance from the runway 32 that they also differ from that of the coins to be accepted, which has the smallest diameter, being influenced in its entire pole area for a sufficient time to generate an evaluable test signal.
  • the distance of the coil 12 from the guide surface 31 of the coin track is only slightly larger than the thickness of the thickest of the coins to be accepted.
  • the test signal L obtained for the alloy of the coin metal when the coil 11 is influenced by the coin to be tested has a constant signal part between two minima.
  • the criteria for each of the coins to be accepted are stored in the memory 23.
  • One these two minima arise when the edge of the coin enters the field of the coil 11, and the other occurs when the edge of the coin leaves the field of the coil 11 again, one zone of the coin acting as a conductor moved (limited in the field) in the high-frequency field of the coil 11 . If the coin has an edge zone made of one and a middle part made of another alloy, this affects the two minima and the constant, middle signal part.
  • these minima and this central signal part can be used as distinguishing features of different coins of this type and of coins made of only one alloy and of coins with a central hole by storing corresponding criteria in the memory 23 and comparing them with these parts of the signal L.
  • the oscillation circuit 5 must be excited not only while the entire pole region of its coil 11 is being influenced by the coin to be tested, but also connected to the amplifier 14 when the coin edge reaches or leaves the pole region.
  • the oscillation circuit 3 is excited only in a region of maximum influence on its coil 9. It would also suffice to excite the oscillation circuit 4 only in an area of maximum influence on its coil 10 and at the same time to excite the oscillation circuit 6.
  • the test signal S for the thickness of the coin obtained when the coil 12 is influenced by the coin to be tested also has a constant signal part between two minima, for which the criteria with which this signal part is evaluated during the evaluation are stored in the memory 23 for each of the coins to be accepted of the signal S is compared.
  • the two minima are irrelevant.
  • the mentioned minima occur for the reason mentioned also with the signals P1 and P2, but come because of the small ratio of the diameter of the coils 7 and 8 to The coin diameter (e.g. 4 mm) and the coin speed (e.g. 0.5 m / s) are only valid for a short time, but could also be used in the minting test.
  • the oscillation circuits 3 and 4 are not yet or no longer excited when the coin edge enters and exits the field of the coil 9 or 10, as further below in connection with the switching of the analog switches 16 and 17 from the oscillation circuits 1 and 2 to the oscillation circuit 3 from the oscillation circuit 3 to the oscillation circuits 4, 5 and 6.
  • the decisive minimum for the signal evaluation of d 1 and D 2 and possibly the minima of, for example, L are determined by the evaluation device 22 by differentiating these signals.
  • the middle, constant part of the signals L and S runs in an area in the middle of which the minimum of D2 (time t3) lies. Accordingly, the amount that these signals have at this point in time (or shortly thereafter) is evaluated in the evaluation device 22.
  • Criteria for the alloy and for the thickness of the coin are an upper and a lower limit of the constant, middle signal part of L and S (and possibly the minima of the signal L). If the signal part in question lies between the limits stored for the alloy or thickness of one of the coins to be accepted, the coin to be tested has the alloy or thickness of this coin to be accepted.
  • the switching of the device from one test process to the next test process or to the following simultaneous test processes is triggered by the coin to be tested itself.
  • the evaluation device 22 (by means of the control device 28) sends a signal to the control logic 48 and 49 of the analog switches 16 and 17, by means of which the semiconductor switches associated with the oscillation circuit 3 with the coil 9 are closed, so that the amplifier 14 forms an oscillator with the oscillation circuit 3 .
  • Its oscillating circuit coil 9 is now influenced by the coin to be checked.
  • the evaluation device 22 causes the oscillating circuits 4, 5 and 6 to be repeatedly repeatedly connected individually to the amplifier 14 to form an oscillator.
  • the coin influenced the coils 10, 11 and 12 of these oscillation circuits 4, 5 and 6 simultaneously.
  • the second partial signal d2 or D2 for checking the diameter by influencing the coil 11, the signal L for checking the alloy and by influencing the coil 12, the signal S for checking the thickness of the coin.
  • the device could also be designed in such a way that the analog switches 16 and 17 connect the oscillation circuits 1 to 6 to the amplifier 14 in a cycle which is repeated over and over again during the coin check in order to form an oscillator.
  • this leads to a longer test duration - just like a possible sequence of the test procedures according to a fixed time program, which requires a certain coin speed.
  • the evaluation device 22 determines that a test signal or partial signal of a test signal does not correspond to any of the criteria stored for the relevant coin characteristic of the coins to be accepted, or several signals (obtained from one and the same coin) do not correspond to the signals to be accepted for the relevant characteristics of one and the same If the coin meets stored criteria, it triggers the coin return signal on line 26. If all of the test signals obtained for the different coin properties correspond to the criteria stored for these properties of one and the same, acceptable coin, the evaluation device 22 triggers the coin acceptance signal on the line 25. After a coin acceptance or coin return signal, the device returns to its idle state. In the case of a coin return signal at time t 1 or t 2, there is no control signal for switching to the next or the next test processes.
  • the device can also be designed such that the frequency response determines the test signals.
  • the exemplary embodiment can also be expanded such that when checking at least one of the coin properties, e.g. of the alloy, it is checked whether the frequency of the oscillator vibrations influenced by the coin corresponds to the criteria stored therefor.
  • the design of the coils 8 to 12, the arrangement of the coils 8 and 9 as well as the arrangement of the coils 9 and 10 with respect to one another, the test signals, their evaluation and the criteria used here can also be used without the time-division multiplex principle.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Coins (AREA)
  • Detergent Compositions (AREA)
  • Control Of Vending Devices And Auxiliary Devices For Vending Devices (AREA)
  • Photoreceptors In Electrophotography (AREA)
EP86107405A 1985-07-26 1986-05-31 Dispositif pour l'examen de pièces de monnaie Expired - Lifetime EP0213283B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT86107405T ATE50654T1 (de) 1985-07-26 1986-05-31 Einrichtung zur muenzenpruefung.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH3254/85A CH667546A5 (de) 1985-07-26 1985-07-26 Einrichtung zur muenzenpruefung.
CH3254/85 1985-07-26

Publications (2)

Publication Number Publication Date
EP0213283A1 true EP0213283A1 (fr) 1987-03-11
EP0213283B1 EP0213283B1 (fr) 1990-02-28

Family

ID=4251994

Family Applications (3)

Application Number Title Priority Date Filing Date
EP86107405A Expired - Lifetime EP0213283B1 (fr) 1985-07-26 1986-05-31 Dispositif pour l'examen de pièces de monnaie
EP86904068A Pending EP0231220A1 (fr) 1985-07-26 1986-07-25 Dispositif de controle de pieces de monnaie
EP86904067A Ceased EP0231219A1 (fr) 1985-07-26 1986-07-25 Dispositif de controle de pieces de monnaie

Family Applications After (2)

Application Number Title Priority Date Filing Date
EP86904068A Pending EP0231220A1 (fr) 1985-07-26 1986-07-25 Dispositif de controle de pieces de monnaie
EP86904067A Ceased EP0231219A1 (fr) 1985-07-26 1986-07-25 Dispositif de controle de pieces de monnaie

Country Status (8)

Country Link
US (2) US4742903A (fr)
EP (3) EP0213283B1 (fr)
AT (1) ATE50654T1 (fr)
CA (1) CA1250919A (fr)
CH (1) CH667546A5 (fr)
DE (1) DE3669215D1 (fr)
WO (2) WO1987000661A1 (fr)
YU (1) YU128886A (fr)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0364079A3 (fr) * 1988-10-11 1990-11-22 Unidynamics Corporation Dispositif et méthode pour la validation de pièces de monnaie
EP0367921A3 (fr) * 1988-11-07 1990-12-27 Ascom Autelca Ag Dispositif de contrôle de pièces de monnaie
WO1991002334A1 (fr) * 1989-07-28 1991-02-21 Mars Incorporated Unite de validation de pieces de monnaie
EP0508560A3 (en) * 1991-04-11 1995-08-23 Act Soft Hardware Method and device for checking coins
EP0704825A1 (fr) * 1994-09-21 1996-04-03 Landis & Gyr Technology Innovation AG Dispositif pour déterminer l'authenticité de pièces de monnaie, de jetons et d'autres objets métalliques plats
US6398001B1 (en) 1997-02-24 2002-06-04 Mars Incorporated Coin validator

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JPH0786939B2 (ja) * 1988-05-27 1995-09-20 株式会社日本コンラックス 硬貨識別装置
JP2767278B2 (ja) * 1989-04-10 1998-06-18 株式会社日本コンラックス 硬貨選別装置
GB2243238B (en) * 1990-04-20 1994-06-01 Tetrel Ltd Coin validators
DE4101157A1 (de) * 1991-01-14 1992-07-16 Trenner D Wh Muenzpruefer Vorrichtung zur pruefung von muenzen oder dergleichen metallischen scheiben
EP0500367A3 (en) * 1991-02-20 1993-07-21 Telkor (Proprietary) Limited Coil arrangement and static measuring device
US5220614A (en) * 1991-02-22 1993-06-15 Professional Coin Grading Service, Inc. Automated coin grading system
GB2253297B (en) * 1991-02-27 1994-11-16 Mars Inc Coin validation
US5615760A (en) * 1991-04-18 1997-04-01 Mars Incorporated Method and apparatus for validating money
DE4121033C2 (de) * 1991-06-26 1994-10-27 Nat Rejectors Gmbh Elektronischer Münzprüfer
US5191957A (en) * 1991-06-28 1993-03-09 Protel, Inc. Coin discrimination method
US5568854A (en) * 1991-06-28 1996-10-29 Protel, Inc. Coin discrimination method
US5293979A (en) * 1991-12-10 1994-03-15 Coin Acceptors, Inc. Coin detection and validation means
GB2266804B (en) * 1992-05-06 1996-03-27 Mars Inc Coin validator
US5379875A (en) * 1992-07-17 1995-01-10 Eb Metal Industries, Inc. Coin discriminator and acceptor arrangement
JP3170147B2 (ja) * 1993-08-19 2001-05-28 ローレルバンクマシン株式会社 硬貨判別装置
US5433310A (en) * 1994-01-04 1995-07-18 Coin Mechanisms, Inc. Coin discriminator with offset null coils
CA2113492A1 (fr) * 1994-01-14 1995-07-15 Donald W. Church Appareil et methode servant a identifier les jetons metalliques et les pieces de monnaie
US5630494A (en) * 1995-03-07 1997-05-20 Cummins-Allison Corp. Coin discrimination sensor and coin handling system
CA2173428A1 (fr) 1995-04-06 1996-10-07 Donald W. Church Parametre electronique
US5579887A (en) * 1995-06-15 1996-12-03 Coin Acceptors, Inc. Coin detection apparatus
DE19548233C2 (de) * 1995-12-21 1998-03-12 Nat Rejectors Gmbh Elektronischer Münzprüfer
SK283245B6 (sk) * 1996-03-19 2003-04-01 Ipm International S. A. Zariadenie na kontrolu mincí
ES2175441T3 (es) * 1996-07-29 2002-11-16 Qvex Inc Procedimiento y aparato de validacion de monedas.
WO1998014910A1 (fr) * 1996-09-30 1998-04-09 Coin Mechanisms, Inc. Procede et dispositif de differenciation pour pieces de monnaie
KR100296694B1 (ko) * 1997-05-21 2001-08-07 오까다 마사하루 화폐선별방법및장치
GB2331614A (en) * 1997-11-19 1999-05-26 Tetrel Ltd Inductive coin validation system
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US3328720A (en) * 1965-07-15 1967-06-27 Westinghouse Electric Corp Dual mode oscillator circuits
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EP0364079A3 (fr) * 1988-10-11 1990-11-22 Unidynamics Corporation Dispositif et méthode pour la validation de pièces de monnaie
EP0367921A3 (fr) * 1988-11-07 1990-12-27 Ascom Autelca Ag Dispositif de contrôle de pièces de monnaie
WO1991002334A1 (fr) * 1989-07-28 1991-02-21 Mars Incorporated Unite de validation de pieces de monnaie
US5337877A (en) * 1989-07-28 1994-08-16 Mars, Inc. Coin validators
EP0508560A3 (en) * 1991-04-11 1995-08-23 Act Soft Hardware Method and device for checking coins
EP0704825A1 (fr) * 1994-09-21 1996-04-03 Landis & Gyr Technology Innovation AG Dispositif pour déterminer l'authenticité de pièces de monnaie, de jetons et d'autres objets métalliques plats
US6398001B1 (en) 1997-02-24 2002-06-04 Mars Incorporated Coin validator

Also Published As

Publication number Publication date
US4742903A (en) 1988-05-10
US4819780A (en) 1989-04-11
EP0213283B1 (fr) 1990-02-28
WO1987000662A1 (fr) 1987-01-29
ATE50654T1 (de) 1990-03-15
DE3669215D1 (de) 1990-04-05
WO1987000661A1 (fr) 1987-01-29
CH667546A5 (de) 1988-10-14
CA1250919A (fr) 1989-03-07
EP0231220A1 (fr) 1987-08-12
YU128886A (en) 1989-12-31
EP0231219A1 (fr) 1987-08-12

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