EP0321819B1 - Méthode d'analyse d'un mélange de gaz par spectrométrie de masse et spectromètre de masse utilisé dans ce but - Google Patents
Méthode d'analyse d'un mélange de gaz par spectrométrie de masse et spectromètre de masse utilisé dans ce but Download PDFInfo
- Publication number
- EP0321819B1 EP0321819B1 EP88120710A EP88120710A EP0321819B1 EP 0321819 B1 EP0321819 B1 EP 0321819B1 EP 88120710 A EP88120710 A EP 88120710A EP 88120710 A EP88120710 A EP 88120710A EP 0321819 B1 EP0321819 B1 EP 0321819B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- quistor
- annular electrode
- distance
- apex
- ion trap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title claims description 14
- 239000000203 mixture Substances 0.000 title claims description 8
- 238000004949 mass spectrometry Methods 0.000 title description 3
- 150000002500 ions Chemical class 0.000 claims description 37
- 238000005040 ion trap Methods 0.000 claims description 27
- 238000003860 storage Methods 0.000 claims description 4
- 238000011835 investigation Methods 0.000 claims 1
- 238000007789 sealing Methods 0.000 claims 1
- 238000001228 spectrum Methods 0.000 description 13
- 238000013016 damping Methods 0.000 description 5
- 238000010894 electron beam technology Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000006872 improvement Effects 0.000 description 4
- 230000006399 behavior Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 230000000903 blocking effect Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000004304 visual acuity Effects 0.000 description 2
- 208000026139 Memory disease Diseases 0.000 description 1
- CYTYCFOTNPOANT-UHFFFAOYSA-N Perchloroethylene Chemical compound ClC(Cl)=C(Cl)Cl CYTYCFOTNPOANT-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 150000001793 charged compounds Chemical group 0.000 description 1
- 238000005094 computer simulation Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000006984 memory degeneration Effects 0.000 description 1
- 230000037361 pathway Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229950011008 tetrachloroethylene Drugs 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/427—Ejection and selection methods
- H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency
Definitions
- the invention relates to a method for mass spectroscopic examination of a gas mixture using a mass spectrometer with an ion trap, which is designed as a quistor with a ring electrode and two end electrodes closing the chamber delimited by the ring electrode, of which end electrodes at least one with an extension of the axis of rotation of the ring electrode arranged perforation, in which method the following steps are carried out:
- the invention also relates to a mass spectrometer.
- a special property of the quistor is that the ions in the center of the RF field are not exposed to any field strength that could give them a movement component to leave the ion trap.
- a collision gas is admitted into the ion trap, the pressure of which is set in such a way that the ions are driven far enough from the center of the ion trap by the optimal number of impacts that they can leave the ion trap. Since this gas simultaneously increases the yield by damping the ion movement transverse to the direction of expulsion, it is also called "damping gas".
- the line shape is also affected by space charge effects if there are too many ions in the quistor. As a work by J.W. Eichelberger et al in "Analytical Chemistry" 59, page 2732, 1987, can be seen, this space charge effect even leads increasingly to scientific misinterpretations.
- the invention has for its object to further develop the method of the type mentioned in such a way that an improvement in the line shape and thus an improvement tion of the resolving power is achieved in the mass spectrometric examination of gas mixtures using such a mass spectrometer.
- the measure according to the invention not only shortens the time which the ions need to leave the trap, but also improves the line shape, increases sensitivity and detection capacity by improving the signal / noise ratio and reduces the influence of the space charge.
- the shortening of the time it takes for the ions to leave the ion trap allows an increase in the number of spectra recordings per unit of time, which again increases the sensitivity.
- the distance r o of the apex of the ring electrode from the center of the quistor has a value which ensures that the amplitude of the RF voltage applied to the ring electrode has the value largest mass of interest is still captured by means of the storage field
- the values r o and Q which are particularly important for the behavior of the quistor are preselected and the other values are determined taking into account the rules given, whereby for the choice of R e and R r there are freedoms that take into account other influencing factors, especially
- the quistor shown in FIG. 1 has a ring electrode 4 and two end electrodes 3, 5, each arranged on one side of the ring electrode, which terminate the chamber delimited by the ring electrode 4 on both sides of the ring electrode.
- the end electrodes 3 and 5 are each supported on the ring electrode 4 by ring-shaped insulators 7, 8.
- the ring-shaped insulators 7, 8 also form a tight connection between the outer sections of the ring electrode 4 and the end electrodes 3, 5.
- An inlet line 11 opens into the ring electrode 8 and makes it possible to introduce a damping gas into the ion trap.
- the lower end electrode 5 in FIG. 1 has a perforation 9 in the area of its center, through which ions can leave the quistor.
- a secondary electron multiplier 6 is arranged on the outside of the lower end electrode 5 and makes it possible to detect the ions leaving the quistor through the perforation 9.
- Both the ring electrode 4 and the end electrodes 3 and 5 have strictly hyperbolic surfaces, which means that their contours are hyperbolas in the cross section shown in FIG. 1.
- the asymptotic angle of both the ring electrode 4 and the hyperbola producing the end electrodes 3, 5 is 1: 1.360.
- the end electrodes 3, 5 are at ground potential, an RF voltage with a frequency of 1.0 MHz is applied to the ring electrode 4, which can be varied in the range from 0 V to 7.5 kV.
- the range of the charge / mass ratio of the ions that are captured and stored by the quistor, with a simple ionization includes ions with mass numbers 1 to 500 ⁇ , where u is the atomic mass unit. Accordingly, by changing the RF voltage in the range from 0 V to 7.5 kV, a mass range from 1 to 500 ⁇ can be covered in one scan.
- the device for generating an electron beam provided in the quistor according to FIG. 1 allows the ions to be generated in the quistor itself by in the ionization phase, the duration of which can be determined by means of the blocking lens 2, an electron beam from the hot cathode 1 through the opening 10 is focused in the quistor.
- Typical ionization times for an electron beam of 100 ⁇ A strength are in the range from 10 ⁇ s to 100 ms, depending on the concentration of the substance to be examined.
- the diagram according to FIG. 3 illustrates the time it takes for ions to leave the quistor and accordingly manifests itself as a line width as a function of the distance-related circular ratio Q.
- the three curves of the diagram according to FIG. 3 correspond to different scanning speeds speeds indicated at the bottom of Fig. 3. Damping gas was used under optimal pressure conditions. It is readily apparent that the release capability increases significantly for Q ⁇ 4,000.
- Fig. 4 shows the spectrum of the molecular ion group of tetrachloroethene for different values of the distance-related ratio circuit Q.
- the spectra were recorded as Dampfungsgas mbar with different scanning speeds over each 300 mass units using air at a pressure of 4.10- 4.
- the scan time was 100 ms each, while in the lower spectra b, d, and f the scan time was 20 ms each.
- the quistors used had the dimensions shown in the following table (in cm):
- Another advantage is that the influence of the space charge is significantly reduced for values of Q ⁇ 4.000. Even if the signal strengths were reduced by a factor of 100, no significant change in line shape and line width could be observed.
- the reason for the observable improvements is the occurrence of a resonance of the secular movement of the ions exactly at the instability limit, which accelerates the increase in the amplitude of the secular movement and thus increases the speed of the ion ejection.
- the ejection is therefore only partly due to the instability of the orbits and partly due to the additional energy absorption of the ions from the storing HF field, which is made possible by the resonance.
- a preferred embodiment therefore provides for the omission of the DC voltage field. In principle, however, it would also be possible to use a DC voltage field and to vary the DC voltage field in order to change the stability range.
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Claims (3)
caractérisé en ce que
caractérisé en ce que
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3743718 | 1987-12-23 | ||
| DE3743718 | 1987-12-23 |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| EP0321819A2 EP0321819A2 (fr) | 1989-06-28 |
| EP0321819A3 EP0321819A3 (en) | 1989-08-23 |
| EP0321819B1 true EP0321819B1 (fr) | 1993-04-21 |
| EP0321819B2 EP0321819B2 (fr) | 2002-06-19 |
Family
ID=6343365
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP88120710A Expired - Lifetime EP0321819B2 (fr) | 1987-12-23 | 1988-12-12 | Méthode d'analyse d'un mélange de gaz par spectrométrie de masse et spectromètre de masse utilisé dans ce but |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US5028777A (fr) |
| EP (1) | EP0321819B2 (fr) |
| DE (1) | DE3880456D1 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4324224C1 (de) * | 1993-07-20 | 1994-10-06 | Bruker Franzen Analytik Gmbh | Quadrupol-Ionenfallen mit schaltbaren Multipol-Anteilen |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5225141A (en) * | 1988-07-11 | 1993-07-06 | Milad Limited Partnership | Process for injection molding a hollow plastic article |
| US5206506A (en) * | 1991-02-12 | 1993-04-27 | Kirchner Nicholas J | Ion processing: control and analysis |
| US5182451A (en) * | 1991-04-30 | 1993-01-26 | Finnigan Corporation | Method of operating an ion trap mass spectrometer in a high resolution mode |
| DE4142870C2 (de) * | 1991-12-23 | 1995-03-16 | Bruker Franzen Analytik Gmbh | Verfahren für phasenrichtiges Messen der Ionen aus Ionenfallen-Massenspektrometern |
| DE4142871C1 (fr) * | 1991-12-23 | 1993-05-19 | Bruker - Franzen Analytik Gmbh, 2800 Bremen, De | |
| DE4316738C2 (de) * | 1993-05-19 | 1996-10-17 | Bruker Franzen Analytik Gmbh | Auswurf von Ionen aus Ionenfallen durch kombinierte elektrische Dipol- und Quadrupolfelder |
| US5420425A (en) * | 1994-05-27 | 1995-05-30 | Finnigan Corporation | Ion trap mass spectrometer system and method |
| US5572025A (en) * | 1995-05-25 | 1996-11-05 | The Johns Hopkins University, School Of Medicine | Method and apparatus for scanning an ion trap mass spectrometer in the resonance ejection mode |
| JP3648906B2 (ja) * | 1997-02-14 | 2005-05-18 | 株式会社日立製作所 | イオントラップ質量分析計を用いた分析装置 |
| DE19733834C1 (de) * | 1997-08-05 | 1999-03-04 | Bruker Franzen Analytik Gmbh | Axialsymmetrische Ionenfalle für massenspektrometrische Messungen |
| DE19751401B4 (de) | 1997-11-20 | 2007-03-01 | Bruker Daltonik Gmbh | Quadrupol-Hochfrequenz-Ionenfallen für Massenspektrometer |
| US6124592A (en) * | 1998-03-18 | 2000-09-26 | Technispan Llc | Ion mobility storage trap and method |
| US6239429B1 (en) | 1998-10-26 | 2001-05-29 | Mks Instruments, Inc. | Quadrupole mass spectrometer assembly |
| US6469298B1 (en) * | 1999-09-20 | 2002-10-22 | Ut-Battelle, Llc | Microscale ion trap mass spectrometer |
| DE10028914C1 (de) * | 2000-06-10 | 2002-01-17 | Bruker Daltonik Gmbh | Interne Detektion von Ionen in Quadrupol-Ionenfallen |
| US7019289B2 (en) * | 2003-01-31 | 2006-03-28 | Yang Wang | Ion trap mass spectrometry |
| US7034293B2 (en) * | 2004-05-26 | 2006-04-25 | Varian, Inc. | Linear ion trap apparatus and method utilizing an asymmetrical trapping field |
| US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
| US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
| US9171706B1 (en) * | 2014-11-06 | 2015-10-27 | Shimadzu Corporation | Mass analysis device and mass analysis method |
| CN110783165A (zh) * | 2019-11-01 | 2020-02-11 | 上海裕达实业有限公司 | 线性离子阱离子引入侧的端盖电极结构 |
| CN115047259B (zh) * | 2022-04-15 | 2022-12-06 | 安徽省太微量子科技有限公司 | 基于频率可调二维线性离子阱的颗粒荷质比测量方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3527939A (en) * | 1968-08-29 | 1970-09-08 | Gen Electric | Three-dimensional quadrupole mass spectrometer and gauge |
| US4540884A (en) * | 1982-12-29 | 1985-09-10 | Finnigan Corporation | Method of mass analyzing a sample by use of a quadrupole ion trap |
| US4650999A (en) * | 1984-10-22 | 1987-03-17 | Finnigan Corporation | Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap |
| EP0409362B1 (fr) * | 1985-05-24 | 1995-04-19 | Finnigan Corporation | Méthode de mise en oeuvre d'un piège à ions |
| DE3886922T2 (de) * | 1988-04-13 | 1994-04-28 | Bruker Franzen Analytik Gmbh | Methode zur Massenanalyse einer Probe mittels eines Quistors und zur Durchführung dieses Verfahrens entwickelter Quistor. |
-
1988
- 1988-12-12 DE DE8888120710T patent/DE3880456D1/de not_active Expired - Lifetime
- 1988-12-12 EP EP88120710A patent/EP0321819B2/fr not_active Expired - Lifetime
- 1988-12-16 US US07/285,741 patent/US5028777A/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4324224C1 (de) * | 1993-07-20 | 1994-10-06 | Bruker Franzen Analytik Gmbh | Quadrupol-Ionenfallen mit schaltbaren Multipol-Anteilen |
Also Published As
| Publication number | Publication date |
|---|---|
| US5028777A (en) | 1991-07-02 |
| EP0321819B2 (fr) | 2002-06-19 |
| EP0321819A2 (fr) | 1989-06-28 |
| EP0321819A3 (en) | 1989-08-23 |
| DE3880456D1 (de) | 1993-05-27 |
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