EP0506358A3 - Détecteur de tension optique à échantillonnage - Google Patents
Détecteur de tension optique à échantillonnage Download PDFInfo
- Publication number
- EP0506358A3 EP0506358A3 EP19920302558 EP92302558A EP0506358A3 EP 0506358 A3 EP0506358 A3 EP 0506358A3 EP 19920302558 EP19920302558 EP 19920302558 EP 92302558 A EP92302558 A EP 92302558A EP 0506358 A3 EP0506358 A3 EP 0506358A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- optical modulator
- sampling
- type optical
- voltage detector
- input
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 title abstract 4
- 230000010287 polarization Effects 0.000 abstract 2
- 239000013078 crystal Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/22—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-emitting devices, e.g. LED, optocouplers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measurement Of Current Or Voltage (AREA)
- Tests Of Electronic Circuits (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP86244/91 | 1991-03-26 | ||
| JP3086244A JP2742473B2 (ja) | 1991-03-26 | 1991-03-26 | 高速電圧測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| EP0506358A2 EP0506358A2 (fr) | 1992-09-30 |
| EP0506358A3 true EP0506358A3 (fr) | 1992-12-09 |
| EP0506358B1 EP0506358B1 (fr) | 1995-11-29 |
Family
ID=13881402
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP92302558A Expired - Lifetime EP0506358B1 (fr) | 1991-03-26 | 1992-03-25 | Détecteur de tension optique à échantillonnage |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5384638A (fr) |
| EP (1) | EP0506358B1 (fr) |
| JP (1) | JP2742473B2 (fr) |
| DE (1) | DE69206297T2 (fr) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3500216B2 (ja) * | 1995-02-07 | 2004-02-23 | 浜松ホトニクス株式会社 | 電圧測定装置 |
| JP3500215B2 (ja) * | 1995-02-07 | 2004-02-23 | 浜松ホトニクス株式会社 | 電圧測定装置 |
| US5734263A (en) * | 1996-02-06 | 1998-03-31 | Eaton Corporaton | Electro-optic voltage transducer with extended range and temperature compensation |
| US6303926B1 (en) | 1998-07-07 | 2001-10-16 | Advantest Corporation | Optical sampler |
| JP5682212B2 (ja) * | 2010-10-06 | 2015-03-11 | ソニー株式会社 | 量子暗号通信装置と量子暗号通信方法および量子暗号通信システム |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0299427A2 (fr) * | 1987-07-13 | 1989-01-18 | Hamamatsu Photonics K.K. | Détecteur de tension |
| GB2212265A (en) * | 1987-11-05 | 1989-07-19 | Hamamatsu Photonics Kk | A voltage detector |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3700334A (en) * | 1970-11-13 | 1972-10-24 | Nasa | Interferometer-polarimeter |
| US4446425A (en) * | 1982-02-12 | 1984-05-01 | The University Of Rochester | Measurement of electrical signals with picosecond resolution |
| US4618819A (en) * | 1984-03-27 | 1986-10-21 | The University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
| NL8600022A (nl) * | 1986-01-08 | 1987-08-03 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleiderinrichting waarbij een doteringselement vanuit zijn oxide in een halfgeleiderlichaam wordt gediffundeerd. |
| US5029273A (en) * | 1990-02-02 | 1991-07-02 | The University Of British Columbia | Integrated optics Pockels cell voltage sensor |
-
1991
- 1991-03-26 JP JP3086244A patent/JP2742473B2/ja not_active Expired - Fee Related
-
1992
- 1992-03-25 EP EP92302558A patent/EP0506358B1/fr not_active Expired - Lifetime
- 1992-03-25 DE DE69206297T patent/DE69206297T2/de not_active Expired - Fee Related
- 1992-03-26 US US07/858,279 patent/US5384638A/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0299427A2 (fr) * | 1987-07-13 | 1989-01-18 | Hamamatsu Photonics K.K. | Détecteur de tension |
| GB2212265A (en) * | 1987-11-05 | 1989-07-19 | Hamamatsu Photonics Kk | A voltage detector |
Non-Patent Citations (1)
| Title |
|---|
| IEEE JOURNAL OF QUANTUM ELECTRONICS vol. QE-22, no. 1, January 1986, NEW YORK US pages 69 - 78 VALDMANIS & MOUROU 'SUBPICOSECOND ELECTROOPTIC SAMPLING...' * |
Also Published As
| Publication number | Publication date |
|---|---|
| DE69206297T2 (de) | 1996-06-27 |
| DE69206297D1 (de) | 1996-01-11 |
| US5384638A (en) | 1995-01-24 |
| EP0506358A2 (fr) | 1992-09-30 |
| EP0506358B1 (fr) | 1995-11-29 |
| JPH04296666A (ja) | 1992-10-21 |
| JP2742473B2 (ja) | 1998-04-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
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| AK | Designated contracting states |
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| PUAL | Search report despatched |
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| 17P | Request for examination filed |
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|
| 17Q | First examination report despatched |
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|
| GRAA | (expected) grant |
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| STAA | Information on the status of an ep patent application or granted ep patent |
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