EP0933708A3 - Integrieter Speicher mit Fehlerkorrekturdaten in einer Betriebsart - Google Patents

Integrieter Speicher mit Fehlerkorrekturdaten in einer Betriebsart Download PDF

Info

Publication number
EP0933708A3
EP0933708A3 EP99101470A EP99101470A EP0933708A3 EP 0933708 A3 EP0933708 A3 EP 0933708A3 EP 99101470 A EP99101470 A EP 99101470A EP 99101470 A EP99101470 A EP 99101470A EP 0933708 A3 EP0933708 A3 EP 0933708A3
Authority
EP
European Patent Office
Prior art keywords
operating mode
featuring
error correcting
correcting data
integrated storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP99101470A
Other languages
English (en)
French (fr)
Other versions
EP0933708B1 (de
EP0933708A2 (de
Inventor
Roderick Dr. Mcconnel
Detlev Richter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Siemens AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG, Siemens Corp filed Critical Siemens AG
Publication of EP0933708A2 publication Critical patent/EP0933708A2/de
Publication of EP0933708A3 publication Critical patent/EP0933708A3/de
Application granted granted Critical
Publication of EP0933708B1 publication Critical patent/EP0933708B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52—Protection of memory contents; Detection of errors in memory contents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • G06F11/1052—Bypassing or disabling error detection or correction

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Detection And Correction Of Errors (AREA)

Abstract

Der integrierte Speicher weist eine erste und eine zweite Betriebsart sowie eine ersten Speicherbereich (1) und einen zweiten Speicherbereich (2) auf. Der erste Speicherbereich (1) dient in beiden Betriebsarten zum Speichern von Nutzdaten. Der zweite Speicherbereich (2) dient in der ersten, aber nicht in der zweiten Betriebsart zum Speichern von Fehlerkorrekturdaten für im ersten Speicherbereich zu speichernden Nutzdaten. Der Speicher weist also in der ersten Betriebsart eine Fehlerkorrekturfunktion auf, die in der zweiten Betriebsart deaktiviert ist.
EP99101470A 1998-02-02 1999-01-27 Integrierter Speicher mit Fehlerkorrekturdaten in einer Betriebsart Expired - Lifetime EP0933708B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19804035A DE19804035A1 (de) 1998-02-02 1998-02-02 Integrierter Speicher
DE19804035 1998-02-02

Publications (3)

Publication Number Publication Date
EP0933708A2 EP0933708A2 (de) 1999-08-04
EP0933708A3 true EP0933708A3 (de) 1999-12-15
EP0933708B1 EP0933708B1 (de) 2003-08-20

Family

ID=7856404

Family Applications (1)

Application Number Title Priority Date Filing Date
EP99101470A Expired - Lifetime EP0933708B1 (de) 1998-02-02 1999-01-27 Integrierter Speicher mit Fehlerkorrekturdaten in einer Betriebsart

Country Status (4)

Country Link
US (1) US6216248B1 (de)
EP (1) EP0933708B1 (de)
DE (2) DE19804035A1 (de)
TW (1) TW508581B (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7111224B1 (en) * 2001-02-28 2006-09-19 Xilinx, Inc. FPGA configuration memory with built-in error correction mechanism
US6785782B1 (en) * 2001-09-10 2004-08-31 Rambus Inc. Techniques for increasing bandwidth in port-per-module memory systems having mismatched memory modules
US6769050B1 (en) * 2001-09-10 2004-07-27 Rambus Inc. Techniques for increasing bandwidth in port-per-module memory systems having mismatched memory modules
US6636935B1 (en) * 2001-09-10 2003-10-21 Rambus Inc. Techniques for increasing bandwidth in port-per-module memory systems having mismatched memory modules
DE10145727B4 (de) * 2001-09-17 2013-07-11 Qimonda Ag Verfahren und Vorrichtung zum Verringern des Stromverbrauchs einer elektronischen Schaltung
US6904540B2 (en) 2001-10-29 2005-06-07 Hewlett-Packard Development Company, L.P. Targeted data protection
US20060218467A1 (en) * 2005-03-24 2006-09-28 Sibigtroth James M Memory having a portion that can be switched between use as data and use as error correction code (ECC)
US20080052598A1 (en) * 2006-08-09 2008-02-28 Aksamit Slavek P Memory multi-bit error correction and hot replace without mirroring
US9373377B2 (en) 2011-11-15 2016-06-21 Micron Technology, Inc. Apparatuses, integrated circuits, and methods for testmode security systems
KR20160017922A (ko) * 2014-08-07 2016-02-17 에스케이하이닉스 주식회사 반도체 메모리 장치
JP6527054B2 (ja) 2015-08-28 2019-06-05 東芝メモリ株式会社 メモリシステム
KR20170035103A (ko) * 2015-09-22 2017-03-30 삼성전자주식회사 반도체 메모리 장치 및 이를 포함하는 메모리 시스템
GB2578420B (en) * 2018-08-08 2023-03-29 Trw Ltd A sensing apparatus
US11340979B2 (en) * 2019-12-27 2022-05-24 Seagate Technology Llc Mitigation of solid state memory read failures with a testing procedure

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4528666A (en) * 1983-01-03 1985-07-09 Texas Instruments Incorporated Memory system with built in parity
EP0184737A2 (de) * 1984-12-04 1986-06-18 Kabushiki Kaisha Toshiba Halbleiterspeichergerät mit Fehlererkennung/Korrekturfunktion
US5493574A (en) * 1992-09-24 1996-02-20 Zilog, Inc. Power efficient RAM disk and a method of emulating a rotating memory disk

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4319356A (en) * 1979-12-19 1982-03-09 Ncr Corporation Self-correcting memory system
DE4329012A1 (de) * 1993-08-28 1995-03-02 Sel Alcatel Ag Verfahren und Vorrichtung zur Fehlerprüfung und zur Fehlerkorrektur in Speicherbausteinen
JPH10198608A (ja) * 1997-01-08 1998-07-31 Mitsubishi Electric Corp メモリカード

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4528666A (en) * 1983-01-03 1985-07-09 Texas Instruments Incorporated Memory system with built in parity
EP0184737A2 (de) * 1984-12-04 1986-06-18 Kabushiki Kaisha Toshiba Halbleiterspeichergerät mit Fehlererkennung/Korrekturfunktion
US5493574A (en) * 1992-09-24 1996-02-20 Zilog, Inc. Power efficient RAM disk and a method of emulating a rotating memory disk

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
HIDETO HIDAKA ET AL: "THE CACHE DRAM ARCHITECTURE: A DRAM WITH AN ON-CHIP CACHE MEMORY", IEEE MICRO, vol. 10, no. 2, 1 April 1990 (1990-04-01), pages 14 - 25, XP000116649, ISSN: 0272-1732 *

Also Published As

Publication number Publication date
TW508581B (en) 2002-11-01
DE19804035A1 (de) 1999-08-05
DE59906620D1 (de) 2003-09-25
EP0933708B1 (de) 2003-08-20
US6216248B1 (en) 2001-04-10
EP0933708A2 (de) 1999-08-04

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