EP0942636A2 - Lötverbindungsverfahren einer Leiterplatte - Google Patents
Lötverbindungsverfahren einer Leiterplatte Download PDFInfo
- Publication number
- EP0942636A2 EP0942636A2 EP99301531A EP99301531A EP0942636A2 EP 0942636 A2 EP0942636 A2 EP 0942636A2 EP 99301531 A EP99301531 A EP 99301531A EP 99301531 A EP99301531 A EP 99301531A EP 0942636 A2 EP0942636 A2 EP 0942636A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- interconnection
- circuit board
- solder
- solder material
- assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/63—Vias, e.g. via plugs
- H10W70/635—Through-vias
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3431—Leadless components
- H05K3/3436—Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/346—Solder materials or compositions specially adapted therefor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/095—Conductive through-holes or vias
- H05K2201/09572—Solder filled plated through-hole in the final product
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10666—Plated through-hole for surface mounting on PCB
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10954—Other details of electrical connections
- H05K2201/10992—Using different connection materials, e.g. different solders, for the same connection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- This invention relates to electronic assembly technology and more specifically to solder interconnections used in fabricating multiple interconnect substrates and bonding them together.
- interconnection substrates includes several forms of electronic device supports including, e.g., epoxy boards and ceramic substrates. For convenience, reference herein to such supports will be to printed circuit boards as a generic term.
- solder can be in a variety of forms, e.g. bumps, balls, pads and other forms of thick layers including printed solder paste layers, and the term solder bump is used generically in this description to refer to any of these forms of solder bodies.
- Double circuit boards are standard parts used in the fabrication of multichip module or ball grid array components.
- the double sided boards are provided with through hole connections typically made by drilling holes through the board and plating the interior of the hole with a conductive metal, e.g. copper.
- Contact areas usually referred to as capture pads, are provided on both sides of the through hole to interconnect circuits runners on one side of the board with circuit runners on the other side. The contact areas are aligned to the through holes, or vice versa, as closely as the alignment tolerances permit but are typically significantly larger than the holes to ensure registration.
- the through hole sites consisting of the contact areas just described, are located along the edges of the printed circuit board in edge arrayed interconnection schemes, or may be located at any site on the printed circuit board in area array interconnection arrangements. In both cases the through hole sites are forbidden regions for solder bump interconnections between boards. This is due to the tendency of the solder to wick into the through hole when the solder bumps are melted during solder bump bonding. To avoid the wicking problem, solder bumps interconnections are typically offset laterally from the through hole, and a separate printed circuit interconnection is provided between the solder bump and the through hole. The interconnection efficiency is reduced in such arrangements, and the board area required for the added printed circuit features is increased.
- a technique for avoiding wicking of solder bumps into through holes on double sided circuit boards would allow the interconnect area to be more efficiently utilized, and would allow shorter interconnections and improved electrical efficiency.
- solder bump fabrication and bonding of double sided printed circuit boards wherein one or more solder bumps are located directly on plated through hole contacts.
- the problem of solder wicking is avoided by filling the plated through hole with a high melting solder prior to solder bump bonding.
- a conventional double sided printed circuit board 1 3 is shown solder bump bonded with solder bumps 26 to an interconnection substrate 20.
- the solder bumps are provided with conventional contact pads or UBM pads 25 and 27.
- the double sided board with through holes has copper printed circuits and the contact pads 25 are copper.
- Circuit board 13 has IC chip 1 1 bonded to the top side of the board with epoxy 12.
- the chip is electrically interconnected to circuit 17 on the board via wire bonds 18 .
- the chip is encapsulated with a standard plastic encapsulant 19.
- the board 13 is provided with through hole interconnections 14 which include plating 15 inside the through hole interconnecting an interconnection site on the top side of the circuit board with an interconnection site on the bottom side of the circuit board.
- the interconnection sites comprise contacts pads 16 surrounding the plated through holes.
- Circuits 21 are shown on the top side of the board. Circuits may also be provided on the bottom of the board (not shown). The circuits on the top side of the board are protected during the soldering operation by solder mask 22.
- the plated through holes 14 interconnect the chip 11 with substrate 20 via wire bonds 18, printed circuit section 17, plated through hole contact pads 16 and plating 15, printed circuit section 24 on the lower side of the double sided board 13, contacts 25, solder bumps 26 and contacts 27.
- the solder bumps are deliberately offset laterally from the region of the through holes to prevent wicking and preserve the integrity of the solder bumps.
- Printed circuit portion 24 is required therefore to interconnect the offset solder bumps 26 and through holes 14.
- Fig. 3 the double sided board 41 is shown solder bump bonded to substrate 42 with solder bumps 44 and 45.
- the solder bump 45 in Fig. 3 is co-located with through hole 43. The problem of wicking of the solder when the solder melts during bonding is evident, and distortion/destruction of the solder bump 45 results.
- the through hole can be covered, as shown in Fig. 4.
- a solder mask 46 can be used to cover through hole 43. The result, as shown, is that when the solder bump is heated to melt the solder and effect the bond, flux residues in the through hole vaporize, and air that is trapped in the "plugged" hole 43 expands, both of which contribute to "ballooning" of the solder bump and possibly blowout as shown in Fig. 4.
- the through holes are completely plugged, as shown at 51 in Fig. 5, with a high melting point solder. This effectively eliminates the problems described in connection with Figs. 3 and 4 and allows coincident positioning of solder bumps and through holes.
- the invention takes advantage of the phenomenon that causes the problem, i.e. wicking of solder into through holes.
- the invention deliberately wicks solder into the through holes, but the choice of a high melting point solder is the key to eliminating the problem. It is also evident that partial wicking of the high melting point solder will confer some benefits if it is wicked from the solder bump side of the through hole. Therefore the preferred technique is to apply the high melting point solder to the solder bumped side of the board. This ensures that in the event of only partial filling of the through hole the purpose of the invention will still be served.
- the through holes will completely fill due to the wetting properties of the solder, which allows solder bumps to be positioned over the through holes on the solder bumped side of the board, and allows soldered components or I/O pads to be positioned on, or closely to, through holes on the top side of the board. In this way the length of through hole interconnections is determined by the thickness of the board, i.e. the optimum interconnection length.
- the stated step of filling the plated through holes with solder is intended to mean blocking the hole cross section, which includes filling all, or a portion, of the hole depth.
- solder bumps can be formed by any suitable technique such as ball placement and solder paste printing.
- the thickness of a typical solder bump for this application is 5-30 mils.
- solder compositions that can be used successfully in the processes described above are: SOLDER A - BONDING SOLDER composition Sn Pb Bi solidus °C liquidus °C I 63 37 183 183 II 42 58 138 138 III 43 43 14 143 163 SOLDER B - THROUGH HOLE SOLDER composition Sn Pb Ag Sb solidus °C liquidus °C I 95 5 235 240 II 96.5 3.5 221 221 III 10 90 275 302
- the liquidus points of the bonding solders should be lower than the solidus points of the high melting solders for the through hole fill. It is preferred that the difference between solidus temperatures of the bonding solder be at least 20 °C, and more preferably at least 40 °C lower than the liquidus temperatures of the fill solder. It may be inferred from the tables that common bonding solders have liquidus temperatures below 190 °C.
- the high melting point compositions in the table have solidus temperatures above 220 °C. In general, for the purposes of the invention the high melting point solder will have a solidus temperature above 200°C.
- the double sided boards described here have through holes that extend completely through the board. Through hole interconnections are also used between levels in multilayer printed circuit boards, which are well known in the art and are a form of double sided board. This the term double sided board as used herein and in the appended claims is meant to apply to both single-level and multi-level boards.
- solder bodies used to attach and interconnect the substrates can be applied to either substrate or to both substrates.
- Solder bumps or balls are typically applied to one circuit board, e.g. in the BGA package of Fig. 5 the solder bodies are applied to the double sided circuit board.
- the through hole solder fill can be applied by standard print solder paste and reflow techniques. If applied by print solder paste and reflow it is preferably applied to the bottom side of the board as previously described.
- the through hole filling step can be performed after copper through hole plating, or at any stage of board assembly prior to applying the low melting bonding solder.
- the invention can be used with any double sided printed circuit board structure that uses through hole interconnections. It may be found most convenient to fill the through holes with higher melting point solder during manufacture of the boards, i.e. following drilling and through hole plating.
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Combinations Of Printed Boards (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US41157 | 1998-03-12 | ||
| US09/041,157 US6013877A (en) | 1998-03-12 | 1998-03-12 | Solder bonding printed circuit boards |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP0942636A2 true EP0942636A2 (de) | 1999-09-15 |
| EP0942636A3 EP0942636A3 (de) | 2001-03-14 |
Family
ID=21915051
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP99301531A Withdrawn EP0942636A3 (de) | 1998-03-12 | 1999-03-02 | Lötverbindungsverfahren einer Leiterplatte |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US6013877A (de) |
| EP (1) | EP0942636A3 (de) |
| JP (1) | JP3352970B2 (de) |
| KR (1) | KR19990077732A (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001078199A3 (en) * | 2000-04-11 | 2002-04-11 | Power One Inc | Printed circuit board assembly |
Families Citing this family (102)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10275966A (ja) * | 1997-01-30 | 1998-10-13 | Ibiden Co Ltd | プリント配線板及びその製造方法 |
| SG75841A1 (en) | 1998-05-02 | 2000-10-24 | Eriston Invest Pte Ltd | Flip chip assembly with via interconnection |
| US6406939B1 (en) | 1998-05-02 | 2002-06-18 | Charles W. C. Lin | Flip chip assembly with via interconnection |
| KR100302593B1 (ko) | 1998-10-24 | 2001-09-22 | 김영환 | 반도체패키지및그제조방법 |
| RU2134498C1 (ru) * | 1998-12-08 | 1999-08-10 | Таран Александр Иванович | Контактный узел |
| EP1845759A1 (de) * | 1998-12-16 | 2007-10-17 | Ibiden Co., Ltd. | Leiterverbindungsstift und Verpackungssubstrat |
| SG78324A1 (en) | 1998-12-17 | 2001-02-20 | Eriston Technologies Pte Ltd | Bumpless flip chip assembly with strips-in-via and plating |
| TW444236B (en) | 1998-12-17 | 2001-07-01 | Charles Wen Chyang Lin | Bumpless flip chip assembly with strips and via-fill |
| TW396462B (en) | 1998-12-17 | 2000-07-01 | Eriston Technologies Pte Ltd | Bumpless flip chip assembly with solder via |
| US6316737B1 (en) * | 1999-09-09 | 2001-11-13 | Vlt Corporation | Making a connection between a component and a circuit board |
| JP3664001B2 (ja) * | 1999-10-25 | 2005-06-22 | 株式会社村田製作所 | モジュール基板の製造方法 |
| US6274474B1 (en) * | 1999-10-25 | 2001-08-14 | International Business Machines Corporation | Method of forming BGA interconnections having mixed solder profiles |
| WO2001047013A1 (en) * | 1999-12-21 | 2001-06-28 | Advanced Micro Devices, Inc. | Organic packages with solders for reliable flip chip connections |
| US6350633B1 (en) | 2000-08-22 | 2002-02-26 | Charles W. C. Lin | Semiconductor chip assembly with simultaneously electroplated contact terminal and connection joint |
| US6402970B1 (en) | 2000-08-22 | 2002-06-11 | Charles W. C. Lin | Method of making a support circuit for a semiconductor chip assembly |
| US6551861B1 (en) | 2000-08-22 | 2003-04-22 | Charles W. C. Lin | Method of making a semiconductor chip assembly by joining the chip to a support circuit with an adhesive |
| US6562709B1 (en) | 2000-08-22 | 2003-05-13 | Charles W. C. Lin | Semiconductor chip assembly with simultaneously electroplated contact terminal and connection joint |
| US6403460B1 (en) | 2000-08-22 | 2002-06-11 | Charles W. C. Lin | Method of making a semiconductor chip assembly |
| US6562657B1 (en) | 2000-08-22 | 2003-05-13 | Charles W. C. Lin | Semiconductor chip assembly with simultaneously electrolessly plated contact terminal and connection joint |
| US6436734B1 (en) | 2000-08-22 | 2002-08-20 | Charles W. C. Lin | Method of making a support circuit for a semiconductor chip assembly |
| US6660626B1 (en) | 2000-08-22 | 2003-12-09 | Charles W. C. Lin | Semiconductor chip assembly with simultaneously electrolessly plated contact terminal and connection joint |
| US6350386B1 (en) | 2000-09-20 | 2002-02-26 | Charles W. C. Lin | Method of making a support circuit with a tapered through-hole for a semiconductor chip assembly |
| US6350632B1 (en) | 2000-09-20 | 2002-02-26 | Charles W. C. Lin | Semiconductor chip assembly with ball bond connection joint |
| US6511865B1 (en) | 2000-09-20 | 2003-01-28 | Charles W. C. Lin | Method for forming a ball bond connection joint on a conductive trace and conductive pad in a semiconductor chip assembly |
| US6448108B1 (en) | 2000-10-02 | 2002-09-10 | Charles W. C. Lin | Method of making a semiconductor chip assembly with a conductive trace subtractively formed before and after chip attachment |
| US6544813B1 (en) | 2000-10-02 | 2003-04-08 | Charles W. C. Lin | Method of making a semiconductor chip assembly with a conductive trace subtractively formed before and after chip attachment |
| US7132741B1 (en) | 2000-10-13 | 2006-11-07 | Bridge Semiconductor Corporation | Semiconductor chip assembly with carved bumped terminal |
| US6576539B1 (en) | 2000-10-13 | 2003-06-10 | Charles W.C. Lin | Semiconductor chip assembly with interlocked conductive trace |
| US7094676B1 (en) | 2000-10-13 | 2006-08-22 | Bridge Semiconductor Corporation | Semiconductor chip assembly with embedded metal pillar |
| US6949408B1 (en) | 2000-10-13 | 2005-09-27 | Bridge Semiconductor Corporation | Method of connecting a conductive trace and an insulative base to a semiconductor chip using multiple etch steps |
| US6440835B1 (en) | 2000-10-13 | 2002-08-27 | Charles W. C. Lin | Method of connecting a conductive trace to a semiconductor chip |
| US7262082B1 (en) | 2000-10-13 | 2007-08-28 | Bridge Semiconductor Corporation | Method of making a three-dimensional stacked semiconductor package with a metal pillar and a conductive interconnect in an encapsulant aperture |
| US7190080B1 (en) | 2000-10-13 | 2007-03-13 | Bridge Semiconductor Corporation | Semiconductor chip assembly with embedded metal pillar |
| US6548393B1 (en) | 2000-10-13 | 2003-04-15 | Charles W. C. Lin | Semiconductor chip assembly with hardened connection joint |
| US6492252B1 (en) | 2000-10-13 | 2002-12-10 | Bridge Semiconductor Corporation | Method of connecting a bumped conductive trace to a semiconductor chip |
| US6908788B1 (en) | 2000-10-13 | 2005-06-21 | Bridge Semiconductor Corporation | Method of connecting a conductive trace to a semiconductor chip using a metal base |
| US6699780B1 (en) | 2000-10-13 | 2004-03-02 | Bridge Semiconductor Corporation | Method of connecting a conductive trace to a semiconductor chip using plasma undercut etching |
| US7009297B1 (en) | 2000-10-13 | 2006-03-07 | Bridge Semiconductor Corporation | Semiconductor chip assembly with embedded metal particle |
| US7319265B1 (en) | 2000-10-13 | 2008-01-15 | Bridge Semiconductor Corporation | Semiconductor chip assembly with precision-formed metal pillar |
| US6984576B1 (en) | 2000-10-13 | 2006-01-10 | Bridge Semiconductor Corporation | Method of connecting an additively and subtractively formed conductive trace and an insulative base to a semiconductor chip |
| US6876072B1 (en) | 2000-10-13 | 2005-04-05 | Bridge Semiconductor Corporation | Semiconductor chip assembly with chip in substrate cavity |
| US6673710B1 (en) | 2000-10-13 | 2004-01-06 | Bridge Semiconductor Corporation | Method of connecting a conductive trace and an insulative base to a semiconductor chip |
| US6667229B1 (en) | 2000-10-13 | 2003-12-23 | Bridge Semiconductor Corporation | Method of connecting a bumped compliant conductive trace and an insulative base to a semiconductor chip |
| US6740576B1 (en) | 2000-10-13 | 2004-05-25 | Bridge Semiconductor Corporation | Method of making a contact terminal with a plated metal peripheral sidewall portion for a semiconductor chip assembly |
| US7075186B1 (en) | 2000-10-13 | 2006-07-11 | Bridge Semiconductor Corporation | Semiconductor chip assembly with interlocked contact terminal |
| US7264991B1 (en) | 2000-10-13 | 2007-09-04 | Bridge Semiconductor Corporation | Method of connecting a conductive trace to a semiconductor chip using conductive adhesive |
| US7071089B1 (en) | 2000-10-13 | 2006-07-04 | Bridge Semiconductor Corporation | Method of making a semiconductor chip assembly with a carved bumped terminal |
| US7129113B1 (en) | 2000-10-13 | 2006-10-31 | Bridge Semiconductor Corporation | Method of making a three-dimensional stacked semiconductor package with a metal pillar in an encapsulant aperture |
| US6872591B1 (en) | 2000-10-13 | 2005-03-29 | Bridge Semiconductor Corporation | Method of making a semiconductor chip assembly with a conductive trace and a substrate |
| US7129575B1 (en) | 2000-10-13 | 2006-10-31 | Bridge Semiconductor Corporation | Semiconductor chip assembly with bumped metal pillar |
| US7414319B2 (en) * | 2000-10-13 | 2008-08-19 | Bridge Semiconductor Corporation | Semiconductor chip assembly with metal containment wall and solder terminal |
| US6537851B1 (en) | 2000-10-13 | 2003-03-25 | Bridge Semiconductor Corporation | Method of connecting a bumped compliant conductive trace to a semiconductor chip |
| US6576493B1 (en) | 2000-10-13 | 2003-06-10 | Bridge Semiconductor Corporation | Method of connecting a conductive trace and an insulative base to a semiconductor chip using multiple etch steps |
| JP3420203B2 (ja) * | 2000-10-27 | 2003-06-23 | Necエレクトロニクス株式会社 | ハンダバンプの形成方法 |
| US6586744B1 (en) * | 2000-11-24 | 2003-07-01 | Marconi Medical Systems, Inc. | Method of cooling high density electronics |
| US6444489B1 (en) | 2000-12-15 | 2002-09-03 | Charles W. C. Lin | Semiconductor chip assembly with bumped molded substrate |
| US6653170B1 (en) | 2001-02-06 | 2003-11-25 | Charles W. C. Lin | Semiconductor chip assembly with elongated wire ball bonded to chip and electrolessly plated to support circuit |
| US20020127771A1 (en) * | 2001-03-12 | 2002-09-12 | Salman Akram | Multiple die package |
| SG95637A1 (en) * | 2001-03-15 | 2003-04-23 | Micron Technology Inc | Semiconductor/printed circuit board assembly, and computer system |
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1998
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- 1998-04-27 US US09/067,271 patent/US6100475A/en not_active Expired - Lifetime
-
1999
- 1999-03-02 EP EP99301531A patent/EP0942636A3/de not_active Withdrawn
- 1999-03-10 JP JP06412499A patent/JP3352970B2/ja not_active Expired - Fee Related
- 1999-03-10 KR KR1019990007851A patent/KR19990077732A/ko not_active Ceased
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001078199A3 (en) * | 2000-04-11 | 2002-04-11 | Power One Inc | Printed circuit board assembly |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH11330164A (ja) | 1999-11-30 |
| US6100475A (en) | 2000-08-08 |
| EP0942636A3 (de) | 2001-03-14 |
| JP3352970B2 (ja) | 2002-12-03 |
| US6013877A (en) | 2000-01-11 |
| KR19990077732A (ko) | 1999-10-25 |
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