EP1029237A1 - Palpeur pour essai par courants de foucault, procede de production d'un palpeur pour essai par courants de foucault, et procede d'essai par courants de foucault - Google Patents

Palpeur pour essai par courants de foucault, procede de production d'un palpeur pour essai par courants de foucault, et procede d'essai par courants de foucault

Info

Publication number
EP1029237A1
EP1029237A1 EP98962175A EP98962175A EP1029237A1 EP 1029237 A1 EP1029237 A1 EP 1029237A1 EP 98962175 A EP98962175 A EP 98962175A EP 98962175 A EP98962175 A EP 98962175A EP 1029237 A1 EP1029237 A1 EP 1029237A1
Authority
EP
European Patent Office
Prior art keywords
probe
film
test
test surface
eddy current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP98962175A
Other languages
German (de)
English (en)
Inventor
Erich Becker
Hans-Peter Lohmann
Gabriel Daalmans
Klaus Ludwig
Ludwig BÄR
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG, Siemens Corp filed Critical Siemens AG
Publication of EP1029237A1 publication Critical patent/EP1029237A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Definitions

  • Eddy current probe method of manufacturing an eddy current probe and eddy current test method
  • the invention relates to a probe for eddy current testing and a method for producing such a probe.
  • the invention further relates to an eddy current test method.
  • the object of the invention is to provide a probe for eddy current testing, with which a rapid eddy current test can be carried out and in which the lift-off effect is low. Further objects of the invention are the specification of a method for producing a probe and the specification of an eddy current test method.
  • the task aimed at specifying a probe is achieved by a probe for eddy current testing of a test object with a test surface, comprising a probe coil arrangement arranged in or on a film, comprising an excitation coil and a detector coil, and a film carrier with a film surface on which the Film is arranged, which film surface is adapted to the test surface or to a part of the test surface so that the film can be passed over the test surface without gaps.
  • a probe for eddy current testing of a test object with a test surface comprising a probe coil arrangement arranged in or on a film, comprising an excitation coil and a detector coil, and a film carrier with a film surface on which the Film is arranged, which film surface is adapted to the test surface or to a part of the test surface so that the film can be passed over the test surface without gaps.
  • the adaptation of the film surface to the test surface enables the probe to be guided in the test surface almost without lifting, so that essentially no lifting effect occurs.
  • the use of a probe coil arrangement in or on a film also enables the probe to be designed with a large probe area. This enables the test time to be kept short, since a large area is checked each time the probe is swept over the test surface.
  • the film carrier preferably consists of a flexible material, at least adjacent to the film surface.
  • the film surface can be adapted even better to the test surface by pressing the film carrier onto the test surface.
  • the excitation coil and the detector coil preferably have a mutual inductance of less than 1 nH, in particular less than 100 pH. Crosstalk from the excitation coil to the detector coil is kept low by this embodiment.
  • the excitation coil further preferably has a conductor cross section greater than 10 "3 mm 2.
  • the film is preferably at least partially provided with a thermally good and electrically poorly conductive cooling layer.
  • the film is preferably thermally well conductive and electrically poorly conductive
  • the measures mentioned serve to keep the heating low or to dissipate the resulting heat effectively and harmlessly. These measures make it possible, in particular, to conduct a high excitation current through the excitation coil.
  • a high excitation current is desirable for increasing A high excitation current results in losses due to the ohm resistance and thus heating.
  • the test surface has a roughness with an average roughness length
  • the probe coil arrangement preferably having an extension along a direction lying in the film which is considerably greater than the average roughness length. Lift-off effects caused by the roughness are averaged out.
  • the detector coil preferably has a greater extent in the film surface along a longitudinal direction than along a transverse direction perpendicular to the longitudinal direction. This configuration enables the detector coil to be more sensitive to elongated material defects, such as cracks, which are oriented along the longitudinal direction when the detector coil is moved transversely to the longitudinal direction.
  • the detector coil in the foil surface can be fitted into an imaginary square envelope line so that it touches all four sides of the envelope line. Due to the symmetry of such an embodiment, the sensitivity of the detector coil is independent of the orientation of elongated material defects.
  • the probe coil arrangement can preferably be read out by a readout unit, which readout unit contains a SQUID sensor.
  • the use of a SQUID sensor in particular increases the sensitivity or the signal-to-noise ratio of the measuring apparatus.
  • the probe coil arrangement is part of a flux transformer for transmitting the magnetic field to be measured to the highly sensitive SQUID sensor.
  • the test surface is preferably formed by the wall of a groove in the test object, to which wall the film surface is adapted.
  • a groove is usually difficult to access in an eddy current test with a conventional probe.
  • a groove can also be checked quickly and without any noteworthy disturbances due to the lifting effect. Eddy current testing can therefore be carried out easily and quickly, even with complex geometries such as those formed by a groove.
  • the test surface is further preferably part of the surface of a turbine blade with a foot part and a blade leaf leading edge, in particular part of the surface of the foot part or the surface of the blade leaf leading edge. edge.
  • the design of the probe enables a quick and efficient inspection of turbine blades for material defects.
  • the foot section and the airfoil leading edge of a turbine blade are exposed to heavy loads and must be checked regularly.
  • the adapted probe also enables a check outside the laboratory, for example directly at the turbine. Due to the possibility of a fast eddy current test, the expensive revision time can be kept short. Both gas and steam turbine blades or blades of turbine engines can be tested.
  • the probe coil arrangement is preferably designed as a photolithographically produced conductor arrangement. Particularly in the case of a gradiometric probe coil arrangement, that is to say in the case of a detector coil constructed from two coils wound in opposite directions, the probe coil arrangement produced photolithographically produces a good match between the two coils of the detector coil.
  • the object aimed at specifying a method for producing a probe is achieved by a method for producing a probe for eddy current testing of a test object with a test surface, in which a moldable material is added to the test surface without gaps so that one of the moldable materials Form of the test surface adapted foil carrier for a probe coil arrangement arranged in or on a foil is formed in this way.
  • the film is preferably nestled onto the test surface, the material poured over the film and cured. By pouring one onto the test surface a molded probe that is matched to the test surface is produced in a simple and quick manner.
  • the object aimed at specifying an eddy current test method is achieved by an eddy current test, in which a test object is tested with a test surface, a probe being guided over the test surface, and in which a probe coil arrangement arranged in or on a film is arranged on a film surface of a film carrier is and wherein the film surface is adapted to the test surface so that the film is passed without a gap over the test surface.
  • a probe 1 is shown in FIG. It is connected to measuring electronics 24 via lines 26A and 26B.
  • the measuring electronics 24 comprise a supply unit 25 which provides an alternating current.
  • the measuring electronics 24 also include a readout unit 15, in which a SQUID sensor 16 is provided in this example.
  • the probe 1 is approximately U-shaped in cross section. The narrow sides of a right-hand top surface IC are perpendicular to this, followed by two flat, U-shaped, mutually parallel surfaces 1A and IB with their broad sides. Between the side surfaces 1A and IB there is a film surface 9, bent along the edge of the side surfaces 1A and IB. The film surface 9 gives the probe a nose-like shape.
  • a film 4 is arranged symmetrically around the apex line 9A on the film surface 9.
  • the film 4 carries a probe coil arrangement 7. This consists of an excitation coil 5, which surrounds a detector coil 6.
  • the detector coil 6 is formed by a first coil 6A and a second coil 6B wound in the opposite direction to the coil 6A.
  • About half of the film carrier 8 measured from the apex line 9A consists of a flexible material 10.
  • the excitation coil 5 is connected to the supply unit 25 via the line 26A.
  • the detector coil 6 is connected to the readout unit 15 via the line 26B.
  • FIG. 2 schematically shows a perspective view of the foot part 21 of a turbine blade 20.
  • the foot part 21 has grooves 18 running parallel to one another, as a result of which the foot part 21 is embossed with a characteristic fir tree profile.
  • Each groove 18 has a groove wall 17.
  • An airfoil 22 adjoins the base part 21, only part of which is shown.
  • a probe is in one of the grooves 18 1 inserted. This is connected to lines 26 with a supply unit, not shown, and a readout unit, also not shown.
  • the probe 1 has a film carrier 8.
  • the film carrier 8 in turn has a film surface 9.
  • the film surface 9 is adapted to the test surface 3, here the groove wall 17.
  • a film 4 which is arranged on the film surface 9, bears against the groove wall 17 without any gaps.
  • a probe coil arrangement (see FIG. 1) is attached to the film 4.
  • the probe 1 When testing a groove 18 using an eddy current test method with the probe 1, the probe 1 is pulled through the groove 18.
  • the excitation coil 5 (see FIG. 1) is supplied with alternating current via the supply unit 25 (see FIG. 1). This alternating current induces an eddy current via its magnetic field in the groove wall 17. This eddy current in turn results in a magnetic field. This is measured with a detector coil 6 (see FIG. 1).
  • the detector coil 6 is read by the read-out unit (15) (see FIG. 1) and changes in the magnetic field measured by the detector coil 6 as a function of the location of the probe 1 in the groove 18 are shown. In this way, material defects can be localized quickly and easily, even with complex geometries.
  • FIG. 3 shows a cross section through four turns 5A of an excitation coil 5.
  • the excitation coil 5 is arranged on a film 4.
  • Each turn 5A of the excitation coil 5 is approximately rectangular in cross section.
  • the film 4 and the turns 5A of the excitation coil 5 are coated with a thermally well-conductive but electrically poorly conductive coating 11.
  • the film 4 can also consist of a thermally highly conductive material. In order to generate a sufficiently high measurement signal, it is desirable to conduct the highest possible current through the excitation coil 5. This has the consequence that due to of the ohm 'see resistance caused by the resulting losses to heat the excitation coil 5 and its surroundings, in particular the film 4. This can damage the film 4.
  • the cross sections of the windings 5A are chosen to be larger than 10 "3 mm 2.
  • the heat generated is also dissipated via the thermally highly conductive coating 11 and possibly via a thermally highly conductive film 4.
  • FIG. 4 shows a cross section through the test surface 3.
  • the test surface 3 has a roughness which manifests itself at different distances from points in the test surface 3 with respect to a plane 3A.
  • the mean value of these different distances 12A results in a mean roughness length 12. So that the roughness of the test surface 3 does not lead to an undesirable lifting effect in the eddy current test method, the probe coil arrangement is made considerably larger than the mean roughness length 12 in at least one direction during a measurement.
  • a detector coil 6 is shown in FIG. It is composed of two coils 6A and 6B wound in opposite directions.
  • the detector coil 6 has a greater extent in a longitudinal direction 13 than in a transverse direction 14 lying perpendicular to the longitudinal direction 13.
  • Such a detector coil 6 is moved along the transverse direction 14 in an eddy current test method and shows an increased sensitivity to material defects which are transverse extend to the transverse direction 14.
  • FIG. 6 and FIG. 7 show a detector coil 6, which can each be fitted into a square envelope line 30. Both a shamrock arrangement of the detector coil, as in FIG. 6, and a radially symmetrical detector coil 6
  • FIG. 7 show a sensitivity to one another that is essentially unchangeable with respect to the measuring direction. elongate material defects extending in different directions.
  • a method for producing a probe head 1 adapted to a test surface 3 is explained with reference to FIG.
  • a test object 2 is shown with a groove 18 that is approximately trapezoidal in cross section.
  • the groove wall 17 of the groove 18 forms the test surface 3.
  • Two side parts 31 and 32 are inserted into the groove 18 at a distance from each other along a cross section through the groove 18.
  • the two side parts 31, 32 enclose a film 4 with a probe coil arrangement (not shown), the film 4 nestling against the test surface 3, that is to say the groove wall 17.
  • a moldable material 23 is poured into the space between the side parts 31 and 32 up to about half the height of the groove 18.
  • the moldable material 23 is curable. After the moldable material 23 has hardened, a probe 1 is precisely adapted to the test surface 3 for an eddy current test.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

L'invention concerne un palpeur (1) pour essai par courants de foucault, dans lequel un agencement de bobines de sonde (7) est placé sur un film (4) d'un porte-film (8). Le porte-film (8) est adapté à la forme de l'objet devant subir l'essai. Ledit palpeur permet de réaliser un essai par courant de foucault rapide et avec peu de perturbation. L'invention concerne également un procédé permettant de produire un palpeur (1) pour essai par courants de foucault, ainsi qu'un procédé d'essai par courants de foucault.
EP98962175A 1997-11-04 1998-10-22 Palpeur pour essai par courants de foucault, procede de production d'un palpeur pour essai par courants de foucault, et procede d'essai par courants de foucault Withdrawn EP1029237A1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19748551 1997-11-04
DE19748551 1997-11-04
PCT/DE1998/003108 WO1999023484A1 (fr) 1997-11-04 1998-10-22 Palpeur pour essai par courants de foucault, procede de production d'un palpeur pour essai par courants de foucault, et procede d'essai par courants de foucault

Publications (1)

Publication Number Publication Date
EP1029237A1 true EP1029237A1 (fr) 2000-08-23

Family

ID=7847489

Family Applications (1)

Application Number Title Priority Date Filing Date
EP98962175A Withdrawn EP1029237A1 (fr) 1997-11-04 1998-10-22 Palpeur pour essai par courants de foucault, procede de production d'un palpeur pour essai par courants de foucault, et procede d'essai par courants de foucault

Country Status (4)

Country Link
US (1) US6452384B1 (fr)
EP (1) EP1029237A1 (fr)
JP (1) JP2001522046A (fr)
WO (1) WO1999023484A1 (fr)

Cited By (1)

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US8013599B2 (en) 2004-11-19 2011-09-06 General Electric Company Methods and apparatus for testing a component

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GB0106686D0 (en) * 2001-03-19 2001-05-09 Keating Michael Method and system for determining engraved area volume
EP1329730A1 (fr) * 2002-01-17 2003-07-23 Siemens Aktiengesellschaft Sonde de mesure sur substrat flexible
US20040004475A1 (en) * 2002-04-22 2004-01-08 Jentek Sensors, Inc. High throughput absolute flaw imaging
EP1496355A1 (fr) * 2003-07-09 2005-01-12 Siemens Aktiengesellschaft Sonde de mesure électrique, en particulier pour mesurer des courants de Foucault
US6943570B2 (en) * 2003-09-26 2005-09-13 Honeywell International, Inc. Device for detecting a crack on a turbine blade of an aircraft engine
DE102004006680B3 (de) * 2004-02-09 2006-01-12 Balluff Gmbh Sensorvorrichtung zur Prüfung von Oberflächen
EP1574850A1 (fr) * 2004-03-08 2005-09-14 Siemens Aktiengesellschaft Dispositif pour le contrôle non destructif de défauts profonds dans matériaux électro-conducteurs
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US8269489B2 (en) * 2008-11-25 2012-09-18 General Electric Company System and method for eddy current inspection of parts with complex geometries
US8378676B2 (en) * 2009-06-05 2013-02-19 Nuovo Pignone S.P.A. System and method for detecting corrosion pitting in gas turbines
CA2727513A1 (fr) * 2010-01-06 2011-07-06 Russell Nde Systems Inc. Sonde de mesure d'epaisseur
US9518851B2 (en) 2014-12-03 2016-12-13 General Electric Company Probes for inspection system for substantially round hole
JP7073617B2 (ja) * 2016-07-13 2022-05-24 株式会社Ihi 探触子、漏洩磁束探傷装置、および漏洩磁束探傷方法
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Also Published As

Publication number Publication date
US6452384B1 (en) 2002-09-17
WO1999023484A1 (fr) 1999-05-14
JP2001522046A (ja) 2001-11-13

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