EP1085332A3 - Integrierte Halbleiterschaltung, Flüssigkristallvorrichtung, elektronisches Gerät und Verfahren zur integrierten Halbleiterschaltungsprüfung - Google Patents

Integrierte Halbleiterschaltung, Flüssigkristallvorrichtung, elektronisches Gerät und Verfahren zur integrierten Halbleiterschaltungsprüfung Download PDF

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Publication number
EP1085332A3
EP1085332A3 EP00114945A EP00114945A EP1085332A3 EP 1085332 A3 EP1085332 A3 EP 1085332A3 EP 00114945 A EP00114945 A EP 00114945A EP 00114945 A EP00114945 A EP 00114945A EP 1085332 A3 EP1085332 A3 EP 1085332A3
Authority
EP
European Patent Office
Prior art keywords
reset signal
semiconductor integrated
integrated circuit
circuit
pulse width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP00114945A
Other languages
English (en)
French (fr)
Other versions
EP1085332B1 (de
EP1085332A2 (de
Inventor
Shigeki Seiko Epson Corporation Aoki
Haruo Seiko Epson Corporation Kamijo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of EP1085332A2 publication Critical patent/EP1085332A2/de
Publication of EP1085332A3 publication Critical patent/EP1085332A3/de
Application granted granted Critical
Publication of EP1085332B1 publication Critical patent/EP1085332B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/24—Resetting means
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
EP00114945A 1999-07-23 2000-07-19 Integrierte Halbleiterschaltung, Flüssigkristallvorrichtung, elektronisches Gerät und Verfahren zur integrierten Halbleiterschaltungsregelung Expired - Lifetime EP1085332B1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP20931499U 1999-07-23
JP20931499 1999-07-23
JP2000170271 2000-06-07
JP2000170271 2000-06-07

Publications (3)

Publication Number Publication Date
EP1085332A2 EP1085332A2 (de) 2001-03-21
EP1085332A3 true EP1085332A3 (de) 2002-05-08
EP1085332B1 EP1085332B1 (de) 2007-06-27

Family

ID=26517371

Family Applications (1)

Application Number Title Priority Date Filing Date
EP00114945A Expired - Lifetime EP1085332B1 (de) 1999-07-23 2000-07-19 Integrierte Halbleiterschaltung, Flüssigkristallvorrichtung, elektronisches Gerät und Verfahren zur integrierten Halbleiterschaltungsregelung

Country Status (5)

Country Link
EP (1) EP1085332B1 (de)
KR (1) KR100383341B1 (de)
CN (2) CN1266755C (de)
AT (1) ATE365923T1 (de)
DE (1) DE60035318T2 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109841253A (zh) * 2017-11-28 2019-06-04 华邦电子股份有限公司 半导体存储装置及其复位方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030084020A (ko) * 2002-04-24 2003-11-01 삼성전자주식회사 액정 표시 장치 및 그 구동 방법
CN100526902C (zh) * 2003-03-25 2009-08-12 株式会社半导体能源研究所 半导体装置的检查电路及检查方法
US9014438B2 (en) 2005-08-17 2015-04-21 Koninklijke Philips N.V. Method and apparatus featuring simple click style interactions according to a clinical task workflow
KR101167201B1 (ko) * 2010-11-10 2012-07-24 매그나칩 반도체 유한회사 다이렉트 모드를 갖는 디지털 ｐｗｍ 방식에서 디밍 신호를 이용한 ｄｃ－ｄｃ 컨버터용 ｐｗｍ 신호 생성회로 및 이를 이용한 ｌｅｄ 구동회로
CN102540055B (zh) * 2011-12-22 2015-07-29 深圳创维数字技术有限公司 一种检测逻辑电平极限值的方法及装置
CN102769272A (zh) * 2012-07-18 2012-11-07 北京三一自动化技术有限责任公司 功率变换器的故障锁存及复位系统和功率变换器

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5418487A (en) * 1992-09-04 1995-05-23 Benchmarg Microelectronics, Inc. Fuse state sense circuit
US5619469A (en) * 1995-05-26 1997-04-08 Lg Semicon Co., Ltd. Fuse redundancy circuitry for a semiconductor memory device
DE19920603A1 (de) * 1998-10-27 2000-05-04 Fujitsu Ltd Verfahren und Schaltung zum Bestimmen der Redundanz einer Halbleiterspeichervorrichtung

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5418487A (en) * 1992-09-04 1995-05-23 Benchmarg Microelectronics, Inc. Fuse state sense circuit
US5619469A (en) * 1995-05-26 1997-04-08 Lg Semicon Co., Ltd. Fuse redundancy circuitry for a semiconductor memory device
DE19920603A1 (de) * 1998-10-27 2000-05-04 Fujitsu Ltd Verfahren und Schaltung zum Bestimmen der Redundanz einer Halbleiterspeichervorrichtung

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109841253A (zh) * 2017-11-28 2019-06-04 华邦电子股份有限公司 半导体存储装置及其复位方法

Also Published As

Publication number Publication date
CN1266755C (zh) 2006-07-26
KR100383341B1 (ko) 2003-05-12
CN1282108A (zh) 2001-01-31
DE60035318D1 (de) 2007-08-09
ATE365923T1 (de) 2007-07-15
CN1145213C (zh) 2004-04-07
KR20010015398A (ko) 2001-02-26
CN1516255A (zh) 2004-07-28
EP1085332B1 (de) 2007-06-27
EP1085332A2 (de) 2001-03-21
DE60035318T2 (de) 2008-02-07

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