EP1174770A3 - Lithographischer Apparat - Google Patents

Lithographischer Apparat Download PDF

Info

Publication number
EP1174770A3
EP1174770A3 EP01305989A EP01305989A EP1174770A3 EP 1174770 A3 EP1174770 A3 EP 1174770A3 EP 01305989 A EP01305989 A EP 01305989A EP 01305989 A EP01305989 A EP 01305989A EP 1174770 A3 EP1174770 A3 EP 1174770A3
Authority
EP
European Patent Office
Prior art keywords
actuator
reflector
radiation
multilayer
lithographic apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP01305989A
Other languages
English (en)
French (fr)
Other versions
EP1174770A2 (de
Inventor
Antonius Johannes Josephus Van Dijsseldonk
Erik Roelof Loopstra
Dominicus Jacobus Petrus Adrianus Franken
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ASML Netherlands BV
Original Assignee
ASML Netherlands BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ASML Netherlands BV filed Critical ASML Netherlands BV
Priority to EP01305989A priority Critical patent/EP1174770A3/de
Publication of EP1174770A2 publication Critical patent/EP1174770A2/de
Publication of EP1174770A3 publication Critical patent/EP1174770A3/de
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70141—Illumination system adjustment, e.g. adjustments during exposure or alignment during assembly of illumination system
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0825—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a flexible sheet or membrane, e.g. for varying the focus
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G02B7/182—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors
    • G02B7/185—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors with means for adjusting the shape of the mirror surface
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70258—Projection system adjustments, e.g. adjustments during exposure or alignment during assembly of projection system
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70258—Projection system adjustments, e.g. adjustments during exposure or alignment during assembly of projection system
    • G03F7/70266—Adaptive optics, e.g. deformable optical elements for wavefront control, e.g. for aberration adjustment or correction

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
EP01305989A 2000-07-13 2001-07-11 Lithographischer Apparat Ceased EP1174770A3 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP01305989A EP1174770A3 (de) 2000-07-13 2001-07-11 Lithographischer Apparat

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP00305958 2000-07-13
EP00305958 2000-07-13
EP01305989A EP1174770A3 (de) 2000-07-13 2001-07-11 Lithographischer Apparat

Publications (2)

Publication Number Publication Date
EP1174770A2 EP1174770A2 (de) 2002-01-23
EP1174770A3 true EP1174770A3 (de) 2004-05-19

Family

ID=26073236

Family Applications (1)

Application Number Title Priority Date Filing Date
EP01305989A Ceased EP1174770A3 (de) 2000-07-13 2001-07-11 Lithographischer Apparat

Country Status (1)

Country Link
EP (1) EP1174770A3 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3919599B2 (ja) * 2002-05-17 2007-05-30 キヤノン株式会社 光学素子、当該光学素子を有する光源装置及び露光装置
DE102005056914A1 (de) 2005-11-29 2007-05-31 Carl Zeiss Smt Ag Projektionsbelichtungsystem
DE102007019570A1 (de) 2007-04-25 2008-10-30 Carl Zeiss Smt Ag Spiegelanordnung, Kontaktierungsanordnung und optisches System
AU2010252752A1 (en) * 2009-05-29 2011-12-01 Bae Systems Plc Self-deformable mirrors and the support thereof
EP2258656A1 (de) * 2009-05-29 2010-12-08 BAE Systems PLC Selbstverformbare Spiegel und deren Halterung
NL2004753C2 (en) * 2010-05-20 2011-11-22 Univ Eindhoven Tech Mirror system and lithographic projection device comprising such a mirror system.
CN106909031B (zh) * 2017-03-29 2018-04-06 合肥京东方显示技术有限公司 曝光设备及曝光系统
CN109932804B (zh) * 2019-03-04 2021-06-01 杭州电子科技大学 一种小口径轻型反射镜的柔性记忆合金支撑装置
DE102021200790A1 (de) * 2021-01-28 2022-07-28 Carl Zeiss Smt Gmbh Verfahren zum Betreiben eines optischen Systems, sowie Spiegel und optisches System
DE102024207651A1 (de) * 2024-08-12 2026-02-12 Carl Zeiss Smt Gmbh Verfahren zur Herstellung eines Mikrospiegelelements und mikro-elektro-mechanisches System

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5420436A (en) * 1992-11-27 1995-05-30 Hitachi, Ltd. Methods for measuring optical system, and method and apparatus for exposure using said measuring method
US5986795A (en) * 1998-06-15 1999-11-16 Chapman; Henry N. Deformable mirror for short wavelength applications
EP0961149A2 (de) * 1998-05-29 1999-12-01 Carl Zeiss Katadioptrisches Projektionsobjektiv mit adaptivem Spiegel und Projektionsbelichtungsverfahren

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5420436A (en) * 1992-11-27 1995-05-30 Hitachi, Ltd. Methods for measuring optical system, and method and apparatus for exposure using said measuring method
EP0961149A2 (de) * 1998-05-29 1999-12-01 Carl Zeiss Katadioptrisches Projektionsobjektiv mit adaptivem Spiegel und Projektionsbelichtungsverfahren
US5986795A (en) * 1998-06-15 1999-11-16 Chapman; Henry N. Deformable mirror for short wavelength applications

Also Published As

Publication number Publication date
EP1174770A2 (de) 2002-01-23

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