EP1235063A3 - Reflektometer mit niedriger Kohärenz - Google Patents

Reflektometer mit niedriger Kohärenz Download PDF

Info

Publication number
EP1235063A3
EP1235063A3 EP02004405A EP02004405A EP1235063A3 EP 1235063 A3 EP1235063 A3 EP 1235063A3 EP 02004405 A EP02004405 A EP 02004405A EP 02004405 A EP02004405 A EP 02004405A EP 1235063 A3 EP1235063 A3 EP 1235063A3
Authority
EP
European Patent Office
Prior art keywords
light
photocoupler
local oscillator
splits
low
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP02004405A
Other languages
English (en)
French (fr)
Other versions
EP1235063A2 (de
Inventor
Fumio Akikuni
Shoichi Aoki
Tetsuo Yano
Tohru Mori
Kazumasa Takada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp, Yokogawa Electric Corp filed Critical Nippon Telegraph and Telephone Corp
Publication of EP1235063A2 publication Critical patent/EP1235063A2/de
Publication of EP1235063A3 publication Critical patent/EP1235063A3/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3181—Reflectometers dealing with polarisation

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
EP02004405A 2001-02-26 2002-02-26 Reflektometer mit niedriger Kohärenz Withdrawn EP1235063A3 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001050421A JP2002250675A (ja) 2001-02-26 2001-02-26 低コヒーレントリフレクトメータ
JP2001050421 2001-02-26

Publications (2)

Publication Number Publication Date
EP1235063A2 EP1235063A2 (de) 2002-08-28
EP1235063A3 true EP1235063A3 (de) 2006-04-05

Family

ID=18911376

Family Applications (1)

Application Number Title Priority Date Filing Date
EP02004405A Withdrawn EP1235063A3 (de) 2001-02-26 2002-02-26 Reflektometer mit niedriger Kohärenz

Country Status (3)

Country Link
US (1) US6775005B2 (de)
EP (1) EP1235063A3 (de)
JP (1) JP2002250675A (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3423680B2 (ja) * 2000-10-18 2003-07-07 安藤電気株式会社 低コヒーレントリフレクトメータ
US7116429B1 (en) * 2003-01-18 2006-10-03 Walecki Wojciech J Determining thickness of slabs of materials by inventors
US7728985B2 (en) * 2005-11-14 2010-06-01 Imalux Corporation Polarization-sensitive common path optical coherence reflectometry/tomography device
US9444218B1 (en) * 2013-05-10 2016-09-13 Oplink Communications, Inc. Compact WDM optical modules
CN103900798B (zh) * 2014-03-28 2016-06-29 哈尔滨工程大学 一种带有光程扫描在线校正的光学相干域偏振测量装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000016034A1 (en) * 1998-09-11 2000-03-23 Izatt Joseph A Interferometers for optical coherence domain reflectometry and optical coherence tomography using nonreciprocal optical elements
JP2000097856A (ja) * 1998-09-25 2000-04-07 Nippon Telegr & Teleph Corp <Ntt> 偏波無依存リフレクトメトリー及び偏波無依存リフレクトメータ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6201608B1 (en) * 1998-03-13 2001-03-13 Optical Biopsy Technologies, Inc. Method and apparatus for measuring optical reflectivity and imaging through a scattering medium

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000016034A1 (en) * 1998-09-11 2000-03-23 Izatt Joseph A Interferometers for optical coherence domain reflectometry and optical coherence tomography using nonreciprocal optical elements
JP2000097856A (ja) * 1998-09-25 2000-04-07 Nippon Telegr & Teleph Corp <Ntt> 偏波無依存リフレクトメトリー及び偏波無依存リフレクトメータ
US6476919B1 (en) * 1998-09-25 2002-11-05 Ando Electric Co., Ltd. Polarization-independent reflectometry and polarization-independent reflectometer

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 2000, no. 07 29 September 2000 (2000-09-29) *
RAO Y-J ET AL: "RECENT PROGRESS IN FIBRE OPTIC LOW-COHERENCE INTERFEROMETRY", July 1996, MEASUREMENT SCIENCE AND TECHNOLOGY, IOP, BRISTOL, GB, PAGE(S) 981-999, ISSN: 0957-0233, XP000632360 *

Also Published As

Publication number Publication date
EP1235063A2 (de) 2002-08-28
US6775005B2 (en) 2004-08-10
JP2002250675A (ja) 2002-09-06
US20020118363A1 (en) 2002-08-29

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