EP1433219A1 - Elektrisch abstimmbare bandpassfilter - Google Patents

Elektrisch abstimmbare bandpassfilter

Info

Publication number
EP1433219A1
EP1433219A1 EP02778409A EP02778409A EP1433219A1 EP 1433219 A1 EP1433219 A1 EP 1433219A1 EP 02778409 A EP02778409 A EP 02778409A EP 02778409 A EP02778409 A EP 02778409A EP 1433219 A1 EP1433219 A1 EP 1433219A1
Authority
EP
European Patent Office
Prior art keywords
resonator
bandpass filter
transfer function
tunable bandpass
filter according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP02778409A
Other languages
English (en)
French (fr)
Other versions
EP1433219B1 (de
Inventor
Stanley S. Toncich
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qualcomm Inc
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Priority to EP09177702.9A priority Critical patent/EP2164129B1/de
Priority to EP10185327.3A priority patent/EP2309586B1/de
Publication of EP1433219A1 publication Critical patent/EP1433219A1/de
Application granted granted Critical
Publication of EP1433219B1 publication Critical patent/EP1433219B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/20Frequency-selective devices, e.g. filters
    • H01P1/201Filters for transverse electromagnetic waves
    • H01P1/203Strip line filters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/20Frequency-selective devices, e.g. filters
    • H01P1/201Filters for transverse electromagnetic waves
    • H01P1/203Strip line filters
    • H01P1/20327Electromagnetic interstage coupling
    • H01P1/20336Comb or interdigital filters

Definitions

  • This invention relates generally to electronic filters. More specifically, this invention is directed to electrically tunable bandpass filters.
  • BPF tuned bandpass filters
  • IL low passband insertion loss
  • IL close-in rejection conflict.
  • Portions of the filter transfer function representing the edges of the passband have a finite slope (the passband cutoff is gradual rather than an ideal perfectly abrupt transition from 'pass' to 'no-pass'). The more sharp the cut off required, the higher the order of the filter must be. Higher order filters are more bulky and have a greater IL than lower order filters and may require extensive turning to meet specifications.
  • a tunable filter can be dynamically tuned to different frequency ranges within a specific band, and if sufficiently tunable, different frequency ranges within multiple bands.
  • Tunable filters have several advantages over non-tunable filters. For example, tunable filters need not have a broad passband if the passband is dynamically adjustable. A narrow transfer function with high close-in rejection can be implemented with a lower order filter than can a wide transfer function with similar close-in rejection. Therefore, unlike a fixed tuned BPF, a tunable filter can be of a lower order and still meet desired rejection specifications. Lower order tunable filters are smaller in size, have a lower profile, lower IL, and can be built using lower precision components using a simpler fabrication processes, which in turn lowers cost. In addition, one filter topology can be optimized to cover multiple bands if the tuning range is wide enough. Thus multiple filter designs are no longer needed. Also, split-band designs along with the associated switches become unnecessary.
  • Fig. 1 shows a typical implementation of a top coupled BPF 100.
  • One or more resonators 106 are coupled to an input 102 and an output 104 via capacitors 108.
  • the resonators are constructed and arranged so as to have a reactance that has at least one resonant frequency. At frequencies below 200 - 300 MHz. the resonators can be constructed from discrete components (i.e. separate capacitors and inductors). Tuning involves changing the resonant frequency of the reactance by changing the values of the discrete components. At higher frequencies a more distributed layout is required because the inherent reactances of all circuit components become more significant at higher frequencies. At higher frequencies, resonators utilizing a monoblock design are commonly used.
  • a high frequency resonator is essentially a transmission medium with impedance discontinuities at both of its ends. Reflections at these discontinuities causes energy to build up within the resonator, a fraction of which is released during each cycle.
  • a quality factor, Q is defined as the ratio of the energy stored within the resonator to that dissipated during one cycle. Due to boundary conditions that must be obeyed by the electric and magnetic fields, only signals with wavelengths that divide the length of the resonator by certain discrete multiples will be maximally reflected and constructively interfere. These correspond to the resonant frequencies. Typically, the resonator is made sufficiently short such that only one resonant frequency exists within the frequency range to be filtered. Signals at other frequencies are increasingly transmitted to ground as their frequency difference from the resonance frequency increases, resulting in significant signal attenuation outside the passband.
  • the wavelength at a particular frequency within a particular transmission medium is a function of the reactance of that medium.
  • the resonant frequency is changed by changing the length of the resonator as measured with respect to the wavelength of the signal such that the constructive interference underlying resonance occurs at the new resonance frequency.
  • Electrical tuning can be accomplished either by changing the functional dependence of the local wavelength on the frequency or by changing the electrical length of the resonator.
  • the wavelength dependence on frequency within a transmission medium is a function of the reactance of the medium.
  • This functional dependence of the wavelength is varied in YIG (Yttrium-Iron Garnet) resonators with the application of a variable magnetic field. But such resonators are expensive, require bulky magnetic field generating coils, and are unsuited for the low power, low profile, low cost requirements of mobile communication systems.
  • bulk f-e resonators may require the application of rather high control voltages considering the relatively large geometries involved.
  • electrical tuning can also be accomplished by changing the electrical length of the resonator. This is accomplished in the prior art via the use of varicaps in which one or more varactor diode is coupled to one end of the resonator. This arrangement electrically extends that end of the resonator because the capacitance of the varactor prevents that end from being either totally closed or totally open. Varactors provide a variable capacitance as a function of an applied dc voltage, and therefore changes the length of the resonator in response to changes in the voltage. But they are noisy, temperature dependent and have low Q's at UHF and above.
  • the invention is a tunable bandpass filter comprising: at least one resonator having a reactance with a resonant frequency, a ferroelectric f-e film having a dielectric constant with a value that changes with an applied electric field, and an electric field generating device for generating relatively constant electric fields of different strengths.
  • the ferroelectric film is electrically coupled to the resonator so that the reactance of the resonator and therefore the resonant frequency of the resonator and the passband of the filter depends on the dielectric constant of the ferroelectric film.
  • the electric field generating device is constructed and arranged to generate relatively constant electric fields within the ferroelectric film, thereby making the resonant frequency of the resonator and the passband of the filter a function of the strength of the relatively constant electric field.
  • Fig. 1 shows a typical implementation of a bandpass filter utilizing multiple coupled resonators.
  • Fig. 2 is a diagram of a microstrip resonator utilizing the f-e film.
  • Fig. 3 is a diagram of a first example of a stripline resonator utilizing the f-e film.
  • Fig. 4 is a diagram of a dielectric loaded waveguide resonator utilizing the f-e film.
  • Fig. 5 is a diagram of a second example of a stripline resonator utilizing the f-e film.
  • Fig. 6 is a diagram of an overlay capacitor coupled resonator utilizing the f-e film.
  • Fig. 7 is a diagram of an interdigitated filter topology.
  • Fig. 8 is a diagram of an interdigitated filter topology utilizing overlay capacitors.
  • Fig. 9 is a diagram of a combline filter topology utilizing overlay capacitors.
  • Fig. 10 is a table generally illustrating some of the design options, benefits and issues associated with a variety of f-e device designs.
  • the relative permittivity, ⁇ r which determines the dielectric constant of a dielectric may be varied in f-e materials under the application of a slowly varying ("near DC") electric field (E-field).
  • E-field a slowly varying electric field
  • the loss tangent of bulk f-e dielectrics is significant, that of applicable f-e thin or thick films fabricated on a wide range of microwave ceramics may be much better, approximating that of some commonly used microwave ceramics. Therefore, rather than use a varactor or bulk f-e dielectrics for electrical tuning, thin f-e films may be used to modify the local capacitance of the transmission medium and thereby provide an adjustable reactance that changes the resonant frequency of the resonator.
  • these f-e capacitors When properly designed and fabricated, these f-e capacitors may provide a higher capacitance and Q than varactors at frequencies above 1 GHz. They are available as thin or thick films and are ideal for tuning distributed or lumped element resonators. Their electrical properties from lot-to-lot are also more consistent than that of varactors.
  • Thin/thick f-e films are widely used in high temperature superconductivity work, and there are several hundred of such known materials. Film thicknesses on the order of 0.1 ⁇ m to 1 mm are typical. Barium strontium titanate, Ba x Sr ( ⁇ -X) Ti ⁇ 3 (BSTO) is the most popular for room temperature operation where x is preferably between 0.3 and 0.7. Their tuning speed is about 0.3 - 1.0 ⁇ s for an applied constant E-field, so they are not modulated by a rf signals. An applied dc voltage V dC is generally used to create the E-field. It is not uncommon to have films with ⁇ r / ⁇ V dc > 3. Fig.
  • FIG. 2 is an example of a microstrip resonator 200 comprised of a microstrip filament layer 202, a ground plane 204, and a dielectric substrate 206.
  • a f-e film layer 208 is positioned between the microstrip filament layer and the dielectric substrate.
  • the wavelength of a propagated signal is a function of the dielectric constant of the transmission medium of the resonator and is therefore a function of the relative permittivity of the f- e film 208.
  • a voltage applied by a dc voltage source 210 positively biases the microstrip filament 202 with respect to the ground plane 204, and creates an electric field (E-field) 212 across the f-e film that changes ⁇ of the film and therefore the resonant frequency of the resonator.
  • the voltage is controlled by external control signal 214.
  • Fig. 3 is a first example of a coplanar waveguide 300 comprised of a central conductor 302, two grounded outer conductors 304, a ground plane 322, and a dielectric substrate 306.
  • An f-e film layer 308 is positioned between the stripline conductors 302 and 304, and the dielectric substrate.
  • a voltage applied by the dc voltage source 310 positively biases the central conductor with respect to the two outer conductors and creates an electric field (E-field) 312 across the f-e film, but in this case the choice of bias arrangement is better than that of Fig. 2 because the E-field 312 is more concentrated within the f-e film and is therefore greater for the same voltage and substrate thickness.
  • the voltage is controlled by external control signal 314.
  • Fig. 4 is an example of a dielectric loaded waveguide (DLWG) resonator filter 400.
  • An input signal introduced via input port 416 resonates at the resonant frequency within a first half of the waveguide 424 and is coupled via 2 nd order aperture 420 to a second half of the waveguide 426, which having the same resonant frequency, combine to form a second order filter.
  • An output signal is taken via output port 418.
  • the body of the filter, formed on substrate 406, is comprised of a high ⁇ r dielectric 402.
  • An f-e film 408, shown mounted on the surfaces parallel to the x-y plane at the aperture, is overlaid by conducting planes 422.
  • a voltage applied between the two conducting planes 422 generates an E-field within the f-e film 408 that changes its reactance, resulting in a change of the resonant frequency within the waveguide.
  • the voltage applied by dc voltage source 410 is controlled by control signal 414.
  • the f-e film 408 and conducting planes 422 could also be mounted on the surfaces parallel to the x-y plane.
  • a DLWG resonator can provide a Q of about 1000 within the PCS band (i.e. around 2 GHz) with an I.L. of about 1.6 dB at a 3dB bandwidth of 10 MHz.
  • Fig. 5 shows a second example of a stripline resonator 600 comprised of a central conductor 602, two grounded outer conductors 604, and a dielectric substrate 606.
  • the f-e film 608 is mounted between the central conductor 602 and the dielectric substrate 606.
  • a dc voltage source 610 controlled by control signal 614 is applied between the central conductor 602 and the two outer conductors 604 so as to generate an E- field within the f-e film and thereby dynamically adjust the resonant frequency of the resonator 600.
  • a stripline resonator can provide a Q of about 750 within the PCS band with an I.L. of about 2.2 dB at a 3dB bandwidth of 6 MHz.
  • Filter tuning with f-e films can also be implemented according to a similar scheme as that described for tuning with varactors where tuning is accomplished by adjusting the effective electrical length of one end of the resonator.
  • the film is coupled to the transmission medium by mounting it as an overlay capacitor as illustrated for the overlay capacitor coupled resonator 700 shown in Fig. 6.
  • the basic resonator 701 which can be coaxial, stripline or microstrip, is mounted atop a ceramic substrate 706 with an underlying if ground plane 704.
  • An f-e film layer 708 of thickness d is positioned towards one end of the resonator and sandwiched between the resonator's grounded outer layer and an overlaid metal layer 722, thereby forming the overlay capacitor.
  • Coupling to such a resonator can be achieved by either electromagnetic coupling, capacitive coupling, or by a direct tap into and out of the resonator (or filter) structure.
  • F-e thin film layers of about 1 micro-meter seem to provide high dc R fields for a given (small) dc voltage.
  • both ends of the resonators inner conductor 702 can be grounded as shown.
  • a dc voltage source 710 controlled by control signal 714 generates the E-field used to adjust the capacitance of the overlay capacitor.
  • Direct f-2 thin film deposition can be done on some substrates, or with buffer layers on others.
  • the packaging of an f-3 device may eliminate the need for a substrate.
  • multiple resonators can be electrically coupled to obtain a higher order filter with a filter transfer function that, while centered about the same resonant frequency as that of the resonator, has a more abrupt cutoff and a flatter peak than each individual resonator's transfer function.
  • a number of different filter topologies utilizing different resonator types are possible.
  • Popular topologies utilizing stripline and microstrip resonators include interdigitated filters, combline filters, and edge coupled and hairpin filters.
  • Fig. 7 is the top view of an example of an interdigitated filter topology utilizing f-e film electrical tuning in which the wavelength-frequency relationship within the resonator is varied.
  • the input signal via transmission line 802 is electromagnetically coupled to each resonator in turn as it travels across the resonators (vertically in the figure), and is output via transmission line 806.
  • Each resonator has one capacitively loaded and one shorted end. The relative placement of which is alternated for adjacent filter.
  • the resonance frequency of the resonator is electrically adjusted as described above for f-e film electrical tuning utilizing the wavelength-frequency relationship adjustment.
  • Fig. 8 shows the same topology as that of Fig. 7 but with tuning achieved via the use of overlay capacitors 908 coupled to what would otherwise have been the open end of the resonators 904.
  • Fig. 9 is the top view of an example of a second order electromagnetically coupled planar combline filter topology utilizing overlay capacitors 1008.
  • the signal input via transmission line 1002 is electromagnetically coupled to each resonator in turn as it travels across the resonators 1004 (horizontally in the figure), and is outputted via transmission line 1006.
  • Such a filter may have a 10 mhz bandwidth in the PCS band. With a 20 mil thick MgO substrate, no buffer layer may be needed.
  • the structure of the resonators is not limited to that shown in Figs. 2-6. Any resonator structure where an f-e film is coupled to the transmission medium is contemplated by the invention.
  • the f-e film could be mounted on one or more outside surface of the coaxial or stripline resonator similarly to the arrangement shown in Fig. 4 for the DLWG resonator.
  • the f-e layers need not be limited to coupling apertures of the DLWG shown in Fig. 4.
  • f-e film can be deposited on the I/O (Input/Output) surfaces on the waveguide as well as on one or more surfaces on the outside.
  • Fig. 10 is a table generally illustrating some of the design options, benefits and issues associated with a variety of f-e device designs. Designs 3, 4, and 5 generally range from minimum insertion loss, maximum size to minimum size maximum insertion loss.

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
  • Networks Using Active Elements (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
EP02778409A 2001-09-27 2002-09-27 Elektrisch abstimmbare bandpassfilter Expired - Lifetime EP1433219B1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP09177702.9A EP2164129B1 (de) 2001-09-27 2002-09-27 Elektrisch abstimmbare Bandpassfilter
EP10185327.3A EP2309586B1 (de) 2001-09-27 2002-09-27 Elektrisch abstimmbare Bandpassfilter

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US32570101P 2001-09-27 2001-09-27
US325701P 2001-09-27
US41300902P 2002-09-23 2002-09-23
US413009P 2002-09-23
PCT/US2002/031118 WO2003028146A1 (en) 2001-09-27 2002-09-27 Electrically tunable bandpass filters

Related Child Applications (1)

Application Number Title Priority Date Filing Date
EP09177702.9 Division-Into 2009-12-02

Publications (2)

Publication Number Publication Date
EP1433219A1 true EP1433219A1 (de) 2004-06-30
EP1433219B1 EP1433219B1 (de) 2010-07-07

Family

ID=26985049

Family Applications (3)

Application Number Title Priority Date Filing Date
EP09177702.9A Expired - Lifetime EP2164129B1 (de) 2001-09-27 2002-09-27 Elektrisch abstimmbare Bandpassfilter
EP10185327.3A Expired - Lifetime EP2309586B1 (de) 2001-09-27 2002-09-27 Elektrisch abstimmbare Bandpassfilter
EP02778409A Expired - Lifetime EP1433219B1 (de) 2001-09-27 2002-09-27 Elektrisch abstimmbare bandpassfilter

Family Applications Before (2)

Application Number Title Priority Date Filing Date
EP09177702.9A Expired - Lifetime EP2164129B1 (de) 2001-09-27 2002-09-27 Elektrisch abstimmbare Bandpassfilter
EP10185327.3A Expired - Lifetime EP2309586B1 (de) 2001-09-27 2002-09-27 Elektrisch abstimmbare Bandpassfilter

Country Status (13)

Country Link
EP (3) EP2164129B1 (de)
JP (1) JP4071712B2 (de)
KR (2) KR101036117B1 (de)
CN (1) CN1592985A (de)
AT (1) ATE473528T1 (de)
BR (1) BR0212843A (de)
CA (1) CA2461886A1 (de)
DE (1) DE60236947D1 (de)
IL (1) IL161064A0 (de)
MX (1) MXPA04002907A (de)
NO (1) NO20041903L (de)
RU (1) RU2004112757A (de)
WO (1) WO2003028146A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100499257C (zh) * 2004-03-19 2009-06-10 华为技术有限公司 一种在不同应用中提供调谐谐振频率的能力的方法
CN100392910C (zh) * 2005-11-25 2008-06-04 中国科学院物理研究所 一种铁电薄膜可调带通滤波器
US8207907B2 (en) * 2006-02-16 2012-06-26 The Invention Science Fund I Llc Variable metamaterial apparatus
WO2010125806A1 (ja) * 2009-04-28 2010-11-04 日本電気株式会社 導波管フィルタ、通信アクセス装置
US20100295634A1 (en) 2009-05-20 2010-11-25 Tamrat Akale Tunable bandpass filter
JP6685643B2 (ja) * 2013-12-18 2020-04-22 スカイワークス ソリューションズ, インコーポレイテッドSkyworks Solutions, Inc. 同調可能な共振器システム、同調可能な共振器システムを含むフィルタリングシステム、および同調可能な共振器システムを形成する方法
RU189237U1 (ru) * 2018-02-07 2019-05-16 Федеральное государственное бюджетное научное учреждение "Федеральный исследовательский центр "Красноярский научный центр Сибирского отделения Российской академии наук" Сверхширокополосный полосковый фильтр
CN112864558B (zh) * 2021-02-23 2024-09-17 贵州民族大学 一种基于铁电膜的实时可控波导结构

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US325701A (en) 1885-09-08 sharpneck
US3192397A (en) * 1960-11-30 1965-06-29 Ibm Bistable circuit having an adjustable phase shifter responsive to output signal
DE3201064A1 (de) * 1982-01-15 1983-07-28 Hoechst Ag, 6230 Frankfurt "verfahren zur herstellung von natriumhydrogensulfat"
US5241291A (en) * 1991-07-05 1993-08-31 Motorola, Inc. Transmission line filter having a varactor for tuning a transmission zero
US5475350A (en) * 1992-09-29 1995-12-12 Matsushita Electric Industrial Co., Ltd. Frequency tunable resonator including a varactor
JPH08509103A (ja) * 1992-12-01 1996-09-24 スーパーコンダクティング・コア・テクノロジーズ・インコーポレーテッド 高温度超電導膜および強誘電性膜を含む同調可能マイクロ波装置
WO1994028592A1 (en) * 1993-05-27 1994-12-08 E.I. Du Pont De Nemours And Company High tc superconductor/ferroelectric tunable microwave circuits
FR2714217B1 (fr) * 1993-12-17 1996-01-26 Thomson Csf Filtre hyperfréquence à résonateurs couplés accordés par des capacités variables, à structure triplaque et à agilité de fréquence.
US5496795A (en) * 1994-08-16 1996-03-05 Das; Satyendranath High TC superconducting monolithic ferroelectric junable b and pass filter
US5496796A (en) * 1994-09-20 1996-03-05 Das; Satyendranath High Tc superconducting band reject ferroelectric filter (TFF)
US5617104A (en) 1995-03-28 1997-04-01 Das; Satyendranath High Tc superconducting tunable ferroelectric transmitting system
JPH10209714A (ja) * 1996-11-19 1998-08-07 Sharp Corp 電圧制御通過帯域可変フィルタおよびそれを用いる高周波回路モジュール
US5908811A (en) * 1997-03-03 1999-06-01 Das; Satyendranath High Tc superconducting ferroelectric tunable filters

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO03028146A1 *

Also Published As

Publication number Publication date
EP2309586B1 (de) 2014-01-01
KR20040037175A (ko) 2004-05-04
ATE473528T1 (de) 2010-07-15
EP2164129A1 (de) 2010-03-17
WO2003028146A1 (en) 2003-04-03
JP4071712B2 (ja) 2008-04-02
CA2461886A1 (en) 2003-04-03
CN1592985A (zh) 2005-03-09
MXPA04002907A (es) 2004-07-05
BR0212843A (pt) 2005-06-28
JP2006503445A (ja) 2006-01-26
RU2004112757A (ru) 2005-03-27
KR20090074274A (ko) 2009-07-06
DE60236947D1 (de) 2010-08-19
NO20041903L (no) 2004-06-15
IL161064A0 (en) 2004-08-31
KR101036117B1 (ko) 2011-05-23
EP2309586A1 (de) 2011-04-13
EP1433219B1 (de) 2010-07-07
KR101250060B1 (ko) 2013-04-03
EP2164129B1 (de) 2013-07-17

Similar Documents

Publication Publication Date Title
US7148770B2 (en) Electrically tunable bandpass filters
EP1145362B1 (de) Elektrisch abstimmbare filter mit dielektrischen varaktoren
US6097263A (en) Method and apparatus for electrically tuning a resonating device
JP4077322B2 (ja) チューナブル強誘電性フィルタ
KR100976339B1 (ko) 튜닝식 강유전체 필터
US6525630B1 (en) Microstrip tunable filters tuned by dielectric varactors
US5617104A (en) High Tc superconducting tunable ferroelectric transmitting system
US5496796A (en) High Tc superconducting band reject ferroelectric filter (TFF)
US20020093400A1 (en) Electronic tunable filters with dielectric varactors
WO2007059089A2 (en) Tunable mmic (monolithic microwave integrated circuit) waveguide resonators
US4121182A (en) Electrical tuning circuit
US5877123A (en) High TC superconducting ferroelectric tunable filters
US4837534A (en) Ceramic block filter with bidirectional tuning
EP2164129B1 (de) Elektrisch abstimmbare Bandpassfilter
US6545565B1 (en) Filter, antenna sharing device, and communication device
Schuster et al. Cross-coupled open-loop resonator bandpass filter with independently tunable center frequency and bandwidth
AU2002340073A1 (en) Electrically tunable bandpass filters
HK1156152A (en) Electrically tunable bandpass filters
Schuster et al. Reconfigurable Hairpin Filter with Tunable Center Frequency, Bandwidth and Transmission Zero
HK1073018A (en) Electrically tunable bandpass filters

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20040427

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LI LU MC NL PT SE SK TR

17Q First examination report despatched

Effective date: 20080221

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LI LU MC NL PT SE SK TR

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

REG Reference to a national code

Ref country code: CH

Ref legal event code: EP

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

REF Corresponds to:

Ref document number: 60236947

Country of ref document: DE

Date of ref document: 20100819

Kind code of ref document: P

REG Reference to a national code

Ref country code: NL

Ref legal event code: VDEP

Effective date: 20100707

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20100806

Year of fee payment: 9

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

Ref country code: NL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

Ref country code: AT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20101108

Ref country code: CY

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

Ref country code: BG

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20101007

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: BE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20101008

Ref country code: SE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

Ref country code: MC

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100930

REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: EE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

Ref country code: SK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

Ref country code: CZ

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

Ref country code: IT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

26N No opposition filed

Effective date: 20110408

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20101018

REG Reference to a national code

Ref country code: DE

Ref legal event code: R097

Ref document number: 60236947

Country of ref document: DE

Effective date: 20110408

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100930

Ref country code: IE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100927

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100930

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST

Effective date: 20120531

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20110930

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100927

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: TR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20100707

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20200812

Year of fee payment: 19

Ref country code: GB

Payment date: 20200828

Year of fee payment: 19

REG Reference to a national code

Ref country code: DE

Ref legal event code: R119

Ref document number: 60236947

Country of ref document: DE

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20210927

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20210927

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20220401