EP1758814A4 - Verkapselung für elektro-mechanische-mikrosysteme und herstellungsverfahren dafür - Google Patents
Verkapselung für elektro-mechanische-mikrosysteme und herstellungsverfahren dafürInfo
- Publication number
- EP1758814A4 EP1758814A4 EP05725682A EP05725682A EP1758814A4 EP 1758814 A4 EP1758814 A4 EP 1758814A4 EP 05725682 A EP05725682 A EP 05725682A EP 05725682 A EP05725682 A EP 05725682A EP 1758814 A4 EP1758814 A4 EP 1758814A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- packaging
- methods
- mechanical systems
- making same
- microelectric mechanical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00261—Processes for packaging MEMS devices
- B81C1/00333—Aspects relating to packaging of MEMS devices, not covered by groups B81C1/00269 - B81C1/00325
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W76/00—Containers; Fillings or auxiliary members therefor; Seals
- H10W76/10—Containers or parts thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems ; Auxiliary parts of microstructural devices or systems
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
- B81C2201/0102—Surface micromachining
- B81C2201/0105—Sacrificial layer
- B81C2201/0108—Sacrificial polymer, ashing of organics
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2203/00—Forming microstructural systems
- B81C2203/01—Packaging MEMS
- B81C2203/0136—Growing or depositing of a covering layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2203/00—Forming microstructural systems
- B81C2203/01—Packaging MEMS
- B81C2203/0154—Moulding a cap over the MEMS device
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5449—Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Micromachines (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US55317804P | 2004-03-15 | 2004-03-15 | |
| PCT/US2005/008664 WO2005089348A2 (en) | 2004-03-15 | 2005-03-15 | Packaging for micro electro-mechanical systems and methods of fabricating thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP1758814A2 EP1758814A2 (de) | 2007-03-07 |
| EP1758814A4 true EP1758814A4 (de) | 2010-12-15 |
Family
ID=34994284
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP05725682A Withdrawn EP1758814A4 (de) | 2004-03-15 | 2005-03-15 | Verkapselung für elektro-mechanische-mikrosysteme und herstellungsverfahren dafür |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8476096B2 (de) |
| EP (1) | EP1758814A4 (de) |
| JP (1) | JP5133680B2 (de) |
| KR (1) | KR101335163B1 (de) |
| CN (1) | CN101094804B (de) |
| WO (1) | WO2005089348A2 (de) |
Families Citing this family (47)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007222956A (ja) * | 2006-02-21 | 2007-09-06 | Seiko Epson Corp | Memsデバイスおよびmemsデバイスの製造方法 |
| US8062497B2 (en) | 2006-03-28 | 2011-11-22 | Imec | Method for forming a hermetically sealed cavity |
| US7767484B2 (en) | 2006-05-31 | 2010-08-03 | Georgia Tech Research Corporation | Method for sealing and backside releasing of microelectromechanical systems |
| DE602007006335D1 (en) * | 2006-10-09 | 2010-06-17 | Nxp Bv | Resonator |
| US7847669B2 (en) * | 2006-12-06 | 2010-12-07 | Georgia Tech Research Corporation | Micro-electromechanical switched tunable inductor |
| WO2009073692A1 (en) * | 2007-12-03 | 2009-06-11 | Kolo Technologies, Inc. | Packaging and connecting electrostatic transducer arrays |
| EP2218094A1 (de) * | 2007-12-03 | 2010-08-18 | Kolo Technologies, Inc. | Waferdurchgangsverbindungen eines elektrostatischen wandlers und anordnung |
| JP2009141036A (ja) * | 2007-12-05 | 2009-06-25 | Hitachi Media Electoronics Co Ltd | パッケージ構造体 |
| WO2009147556A2 (en) * | 2008-05-27 | 2009-12-10 | Nxp B.V. | Microscopic structure packaging method and device with packaged microscopic structure |
| CN101633490B (zh) * | 2008-07-25 | 2014-06-04 | 亚太优势微系统股份有限公司 | 具有微帽盖的元件、模组及其晶圆级封装方法 |
| US8580596B2 (en) * | 2009-04-10 | 2013-11-12 | Nxp, B.V. | Front end micro cavity |
| EP2266919A1 (de) * | 2009-06-25 | 2010-12-29 | Nxp B.V. | MEMS-Vorrichtungen |
| DE102009029199A1 (de) * | 2009-09-04 | 2011-03-10 | Robert Bosch Gmbh | Stressentkoppelte Aufbautechnik für substratlose Mold-Packages |
| KR101650893B1 (ko) * | 2010-08-06 | 2016-08-25 | 스미토모 베이클리트 컴퍼니 리미티드 | 마이크로전자 어셈블리를 위한 폴리머 조성물 |
| TWI455265B (zh) * | 2010-11-01 | 2014-10-01 | 矽品精密工業股份有限公司 | 具微機電元件之封裝結構及其製法 |
| DE102011007604A1 (de) * | 2011-04-18 | 2012-10-18 | Robert Bosch Gmbh | Mikroelektromechanische Schalldetektionsvorrichtung sowie Verfahren zur Herstellung einer solchen |
| JP6034619B2 (ja) * | 2011-08-22 | 2016-11-30 | パナソニック株式会社 | Mems素子およびそれを用いた電気機器 |
| FR2980034B1 (fr) * | 2011-09-08 | 2014-07-04 | Commissariat Energie Atomique | Procede de realisation d'une structure a cavite fermee hermetiquement et sous atmosphere controlee |
| SG11201402261SA (en) * | 2011-12-07 | 2014-08-28 | Georgia Tech Res Inst | Packaging compatible wafer level capping of mems devices |
| EP2731130A1 (de) | 2012-11-12 | 2014-05-14 | Nxp B.V. | Hohlraumgehäuse für eine integrierte Schaltung |
| WO2015042700A1 (en) | 2013-09-24 | 2015-04-02 | Motion Engine Inc. | Mems components and method of wafer-level manufacturing thereof |
| WO2015003264A1 (en) | 2013-07-08 | 2015-01-15 | Motion Engine Inc. | Mems device and method of manufacturing |
| WO2015013827A1 (en) | 2013-08-02 | 2015-02-05 | Motion Engine Inc. | Mems motion sensor for sub-resonance angular rate sensing |
| JP6590812B2 (ja) | 2014-01-09 | 2019-10-16 | モーション・エンジン・インコーポレーテッド | 集積memsシステム |
| US9416003B2 (en) * | 2014-02-24 | 2016-08-16 | Freescale Semiconductor, Inc. | Semiconductor die with high pressure cavity |
| US9114976B1 (en) * | 2014-03-07 | 2015-08-25 | Taiwan Semiconductor Manufacturing Company Limited | Semiconductor arrangement with stress release configuration |
| CN104934295A (zh) * | 2014-03-18 | 2015-09-23 | 中芯国际集成电路制造(上海)有限公司 | 一种晶圆正面的保护方法 |
| CN104934331A (zh) * | 2014-03-18 | 2015-09-23 | 中芯国际集成电路制造(上海)有限公司 | 一种保护晶圆接合焊盘的方法 |
| EP3126065B1 (de) | 2014-03-31 | 2021-05-19 | Koninklijke Philips N.V. | Integrierter schaltungs-chip, ultraschallsonde, ultraschalldiagnosesystem und verfahren |
| WO2015154173A1 (en) | 2014-04-10 | 2015-10-15 | Motion Engine Inc. | Mems pressure sensor |
| US11674803B2 (en) | 2014-06-02 | 2023-06-13 | Motion Engine, Inc. | Multi-mass MEMS motion sensor |
| US9630835B2 (en) * | 2014-08-25 | 2017-04-25 | Texas Instruments Incorporated | Wafer level packaging of MEMS |
| CA3004760A1 (en) | 2014-12-09 | 2016-06-16 | Motion Engine Inc. | 3d mems magnetometer and associated methods |
| US20170314391A1 (en) * | 2014-12-30 | 2017-11-02 | Halliburton Energy Services, Inc. | Subterranean formation characterization using microelectromechanical system (mems) devices |
| GB2548030B (en) | 2014-12-30 | 2020-11-04 | Halliburton Energy Services Inc | Subterranean formation characterization using microelectromechanical system (MEMS) devices |
| WO2016112463A1 (en) | 2015-01-15 | 2016-07-21 | Motion Engine Inc. | 3d mems device with hermetic cavity |
| US9461005B2 (en) | 2015-02-12 | 2016-10-04 | Ampleon Netherlands B.V. | RF package with non-gaseous dielectric material |
| DE102015223399B4 (de) * | 2015-11-26 | 2018-11-08 | Robert Bosch Gmbh | Verfahren zum Verpacken mindestens eines Halbleiterbauteils und Halbleitervorrichtung |
| US9932224B2 (en) * | 2015-12-17 | 2018-04-03 | Globalfoundries Singapore Pte. Ltd. | Semiconductor devices with cavities and methods for fabricating semiconductor devices with cavities |
| US10870575B2 (en) * | 2018-06-29 | 2020-12-22 | Infineon Technologies Dresden GmbH & Co. KG | Stressed decoupled micro-electro-mechanical system sensor |
| DE102020102493A1 (de) | 2020-01-31 | 2021-08-05 | Tdk Corporation | Die mit Gehäuse und Montageverfahren |
| US11180366B2 (en) | 2020-03-23 | 2021-11-23 | General Electric Company | Methods for forming a MEMS device layer on an active device layer and devices formed thereby |
| CN112259528A (zh) * | 2020-09-28 | 2021-01-22 | 立讯电子科技(昆山)有限公司 | 具有双面选择性电磁屏蔽封装的sip结构及其制备方法 |
| KR102213908B1 (ko) | 2020-10-28 | 2021-02-08 | 주식회사 삼정이엔씨 | 오일 회수기능을 구비하는 수소가스 충전기용 저온 냉각시스템 |
| KR102231721B1 (ko) | 2020-10-28 | 2021-03-25 | 김승섭 | 전자식 냉각밸브를 구비한 수소가스 충전기용 냉각시스템 |
| KR102202439B1 (ko) | 2020-10-28 | 2021-01-13 | 김승섭 | 수소가스 충전건 결빙 방지장치 |
| KR102217530B1 (ko) | 2020-10-28 | 2021-02-19 | 주식회사 삼정이엔씨 | 수소가스 충전기용 냉각장치 제어시스템 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030183916A1 (en) * | 2002-03-27 | 2003-10-02 | John Heck | Packaging microelectromechanical systems |
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| US3639928A (en) * | 1970-11-27 | 1972-02-08 | Jefferson Chem Co Inc | Accelerator combination for epoxy curing |
| JP2508046B2 (ja) * | 1987-01-19 | 1996-06-19 | 株式会社島津製作所 | 液体試料導入装置 |
| US6136212A (en) | 1996-08-12 | 2000-10-24 | The Regents Of The University Of Michigan | Polymer-based micromachining for microfluidic devices |
| JP3846094B2 (ja) * | 1998-03-17 | 2006-11-15 | 株式会社デンソー | 半導体装置の製造方法 |
| US6159385A (en) * | 1998-05-08 | 2000-12-12 | Rockwell Technologies, Llc | Process for manufacture of micro electromechanical devices having high electrical isolation |
| JP2000124470A (ja) * | 1998-10-13 | 2000-04-28 | Toyota Central Res & Dev Lab Inc | 微小真空容器及びその製造方法 |
| US6596236B2 (en) * | 1999-01-15 | 2003-07-22 | Advanced Technology Materials, Inc. | Micro-machined thin film sensor arrays for the detection of H2 containing gases, and method of making and using the same |
| US7091605B2 (en) * | 2001-09-21 | 2006-08-15 | Eastman Kodak Company | Highly moisture-sensitive electronic device element and method for fabrication |
| US7153717B2 (en) * | 2000-05-30 | 2006-12-26 | Ic Mechanics Inc. | Encapsulation of MEMS devices using pillar-supported caps |
| US7008812B1 (en) * | 2000-05-30 | 2006-03-07 | Ic Mechanics, Inc. | Manufacture of MEMS structures in sealed cavity using dry-release MEMS device encapsulation |
| DE10054484A1 (de) * | 2000-11-03 | 2002-05-08 | Bosch Gmbh Robert | Mikromechanisches Bauelement und entsprechendes Herstellungsverfahren |
| AUPR245301A0 (en) * | 2001-01-10 | 2001-02-01 | Silverbrook Research Pty Ltd | An apparatus (WSM06) |
| US6785458B2 (en) * | 2001-02-11 | 2004-08-31 | Georgia Tech Research Corporation | Guided-wave optical interconnections embedded within a microelectronic wafer-level batch package |
| JP2002287043A (ja) * | 2001-03-27 | 2002-10-03 | Seiko Epson Corp | 微細構造体および微細構造体の製造方法 |
| FI114755B (fi) * | 2001-10-01 | 2004-12-15 | Valtion Teknillinen | Menetelmä ontelorakenteen muodostamiseksi SOI-kiekolle sekä SOI-kiekon ontelorakenne |
| WO2003050854A2 (en) * | 2001-12-12 | 2003-06-19 | The Pennsylvania State University | Chemical reactor templates: sacrificial layer fabrication and template use |
| US7045459B2 (en) * | 2002-02-19 | 2006-05-16 | Northrop Grumman Corporation | Thin film encapsulation of MEMS devices |
| JP2006506236A (ja) * | 2002-05-07 | 2006-02-23 | カリフォルニア インスティチュート オブ テクノロジー | 微小機械エネルギー、力及び質量の真空ベースセンサに使用する装置と方法 |
| US6953985B2 (en) * | 2002-06-12 | 2005-10-11 | Freescale Semiconductor, Inc. | Wafer level MEMS packaging |
| DE10227615A1 (de) * | 2002-06-20 | 2004-01-15 | Infineon Technologies Ag | Schicht-Anordnung und Verfahren zum Herstellen einer Schicht-Anordnung |
| JP4574145B2 (ja) * | 2002-09-13 | 2010-11-04 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | エアギャップ形成 |
| AU2003286572A1 (en) * | 2002-10-23 | 2004-05-13 | Rutgers, The State University Of New Jersey | Processes for hermetically packaging wafer level microscopic structures |
| US6979872B2 (en) * | 2003-05-13 | 2005-12-27 | Rockwell Scientific Licensing, Llc | Modules integrating MEMS devices with pre-processed electronic circuitry, and methods for fabricating such modules |
| US6936491B2 (en) * | 2003-06-04 | 2005-08-30 | Robert Bosch Gmbh | Method of fabricating microelectromechanical systems and devices having trench isolated contacts |
| US7078796B2 (en) * | 2003-07-01 | 2006-07-18 | Freescale Semiconductor, Inc. | Corrosion-resistant copper bond pad and integrated device |
| US7335972B2 (en) * | 2003-11-13 | 2008-02-26 | Sandia Corporation | Heterogeneously integrated microsystem-on-a-chip |
| US7936497B2 (en) * | 2004-09-27 | 2011-05-03 | Qualcomm Mems Technologies, Inc. | MEMS device having deformable membrane characterized by mechanical persistence |
| TWI302813B (en) * | 2006-01-11 | 2008-11-01 | Via Tech Inc | Circuit board and electronic assembly |
-
2005
- 2005-03-15 EP EP05725682A patent/EP1758814A4/de not_active Withdrawn
- 2005-03-15 CN CN2005800154193A patent/CN101094804B/zh not_active Expired - Fee Related
- 2005-03-15 KR KR1020067021362A patent/KR101335163B1/ko not_active Expired - Fee Related
- 2005-03-15 WO PCT/US2005/008664 patent/WO2005089348A2/en not_active Ceased
- 2005-03-15 US US10/534,956 patent/US8476096B2/en not_active Expired - Fee Related
- 2005-03-15 JP JP2007504046A patent/JP5133680B2/ja not_active Expired - Fee Related
-
2010
- 2010-06-10 US US12/797,649 patent/US8405170B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030183916A1 (en) * | 2002-03-27 | 2003-10-02 | John Heck | Packaging microelectromechanical systems |
Non-Patent Citations (2)
| Title |
|---|
| LEBOUITZ K S ET AL: "Vacuum encapsulation of resonant devices using permeable polysilicon", MICRO ELECTRO MECHANICAL SYSTEMS, 1999. MEMS '99. TWELFTH IEEE INTERNA TIONAL CONFERENCE ON ORLANDO, FL, USA 17-21 JAN. 1999, PISCATAWAY, NJ, USA,IEEE, US, 17 January 1999 (1999-01-17), pages 470 - 475, XP010321680, ISBN: 978-0-7803-5194-3 * |
| WU XIAOQUN ET AL.: "Fabrication of Microchannels using Polynorbonene photosensitive sacrificial materials", JOURNAL OF THE ELECTROCHEMICAL SOCIETY, vol. 150, no. 9, 30 July 2003 (2003-07-30), pages H205 - H213, XP002605445, DOI: 10.1149/1.1596955 * |
Also Published As
| Publication number | Publication date |
|---|---|
| US20100307786A1 (en) | 2010-12-09 |
| US8405170B2 (en) | 2013-03-26 |
| CN101094804A (zh) | 2007-12-26 |
| EP1758814A2 (de) | 2007-03-07 |
| CN101094804B (zh) | 2011-12-28 |
| WO2005089348A3 (en) | 2007-06-21 |
| KR101335163B1 (ko) | 2013-12-02 |
| JP2007529333A (ja) | 2007-10-25 |
| KR20070005674A (ko) | 2007-01-10 |
| HK1110061A1 (en) | 2008-07-04 |
| US20070273013A1 (en) | 2007-11-29 |
| US8476096B2 (en) | 2013-07-02 |
| JP5133680B2 (ja) | 2013-01-30 |
| WO2005089348A2 (en) | 2005-09-29 |
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| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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Kind code of ref document: A2 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR |
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| AX | Request for extension of the european patent |
Extension state: AL BA HR LV MK YU |
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| DAX | Request for extension of the european patent (deleted) | ||
| PUAK | Availability of information related to the publication of the international search report |
Free format text: ORIGINAL CODE: 0009015 |
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| RIC1 | Information provided on ipc code assigned before grant |
Ipc: B81C 1/00 20060101ALI20101018BHEP Ipc: B81B 7/00 20060101AFI20070117BHEP |
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| A4 | Supplementary search report drawn up and despatched |
Effective date: 20101111 |
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| 17Q | First examination report despatched |
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