EP1772874A3 - Brennpunktorientierte Blende - Google Patents

Brennpunktorientierte Blende Download PDF

Info

Publication number
EP1772874A3
EP1772874A3 EP06121864A EP06121864A EP1772874A3 EP 1772874 A3 EP1772874 A3 EP 1772874A3 EP 06121864 A EP06121864 A EP 06121864A EP 06121864 A EP06121864 A EP 06121864A EP 1772874 A3 EP1772874 A3 EP 1772874A3
Authority
EP
European Patent Office
Prior art keywords
focal point
radiation
oriented aperture
point oriented
periodic movement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP06121864A
Other languages
English (en)
French (fr)
Other versions
EP1772874A2 (de
EP1772874B1 (de
Inventor
Dr. Rer. Nat. Kurt Osterloh
Prof. Dr. Uwe Ewert
Heinz-Jürgen KNISCHEK
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bundesanstalt fuer Materialforschung und Pruefung
Original Assignee
Bundesanstalt fuer Materialforschung und Pruefung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bundesanstalt fuer Materialforschung und Pruefung filed Critical Bundesanstalt fuer Materialforschung und Pruefung
Publication of EP1772874A2 publication Critical patent/EP1772874A2/de
Publication of EP1772874A3 publication Critical patent/EP1772874A3/de
Application granted granted Critical
Publication of EP1772874B1 publication Critical patent/EP1772874B1/de
Not-in-force legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Beam Exposure (AREA)
  • Powder Metallurgy (AREA)
  • Surgical Instruments (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Gas Separation By Absorption (AREA)

Abstract

Um eine brennpunktorientierte Blende (100) anzugeben, welche insbesondere für hochenergetische Strahlung vorgesehen ist und welche ein schnelles Versetzen der Richtung eines Strahles, welcher durch einen Brennpunkt verläuft, ermöglicht, ist vorgesehen, dass ein Absorptionselement (10) eine periodische Bewegung ausführen kann und derart geformt ist, dass in jeder während der periodischen Bewegung eingenommenen Lage höchstens eine Richtung (18) existiert mit der Eigenschaft, dass Strahlung, insbesondere Strahlung einer bestimmten Strahlart, welche auf einem durch einen Brennpunkt (16) verlaufenden Strahl auf die brennpunktorientierte Blende (100) fällt, im Wesentlichen durchgelassen wird, wenn der Strahl im Wesentlichen in besagter Richtung (18) verläuft, und sonst im Wesentlichen absorbiert wird.
EP06121864A 2005-10-06 2006-10-06 Brennpunktorientierte Blende Not-in-force EP1772874B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102005048519A DE102005048519A1 (de) 2005-10-06 2005-10-06 Brennpunktorientierte Blende

Publications (3)

Publication Number Publication Date
EP1772874A2 EP1772874A2 (de) 2007-04-11
EP1772874A3 true EP1772874A3 (de) 2007-08-22
EP1772874B1 EP1772874B1 (de) 2009-01-14

Family

ID=37769388

Family Applications (1)

Application Number Title Priority Date Filing Date
EP06121864A Not-in-force EP1772874B1 (de) 2005-10-06 2006-10-06 Brennpunktorientierte Blende

Country Status (3)

Country Link
EP (1) EP1772874B1 (de)
AT (1) ATE421151T1 (de)
DE (2) DE102005048519A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10082473B2 (en) 2015-07-07 2018-09-25 General Electric Company X-ray filtration

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007057261B3 (de) * 2007-11-26 2009-08-06 BAM Bundesanstalt für Materialforschung und -prüfung Vorrichtung und Verfahren zur Herstellung von Schlitzblenden
DE102009021750B4 (de) * 2009-05-12 2013-01-17 BAM Bundesanstalt für Materialforschung und -prüfung Schwenkbar bewegliche Schlitzblendenvorrichtung
ATE545935T1 (de) 2009-12-08 2012-03-15 Bam Bundesanstalt Matforschung Asymmetrische schlitzblende sowie vorrichtung und verfahren zur herstellung derselben
WO2011115930A2 (en) * 2010-03-14 2011-09-22 Rapiscan Systems, Inc. Personnel screening system
GB2494963B (en) * 2010-03-14 2017-02-22 Rapiscan Systems Inc Multiple screen detection systems
CN102565110B (zh) * 2010-12-31 2015-04-01 同方威视技术股份有限公司 一种背散射成像用射线束的扫描装置和方法
CN103728326A (zh) * 2010-12-31 2014-04-16 同方威视技术股份有限公司 一种背散射成像用射线束的扫描装置和方法
CN103776847B (zh) * 2012-10-24 2016-04-27 清华大学 射线发射装置和成像系统
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
AU2015353439A1 (en) 2014-11-25 2017-06-29 Rapiscan Systems, Inc. Intelligent security management system
DE102015008272A1 (de) 2015-06-18 2016-12-22 Kurt Osterloh Schlitzblendensystem für bildgebende Verfahren mit harter Strahlung
DE102016004624A1 (de) 2016-04-13 2017-10-19 Kurt Osterloh Das Gammaauge: Ein Gerät zur Abbildung hochenergetisch strahlender Objekte
CN105810281A (zh) * 2016-05-03 2016-07-27 北京华力兴科技发展有限责任公司 斩波器和背散射成像装置
EP3520120A4 (de) 2016-09-30 2020-07-08 American Science & Engineering, Inc. Röntgenstrahlenquelle zur zweidimensionalen abtaststrahlbildgebung
DE102017005302A1 (de) 2017-05-30 2018-12-06 Kurt Osterloh Gestaltung einer Gammakamera mit einem rotierenden Kollimator zur Darstellung strahlender Objekte
CN113936838B (zh) * 2021-10-11 2023-09-26 散裂中子源科学中心 一种两级定位中子光阑切换机构

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4031401A (en) * 1975-03-14 1977-06-21 American Science & Engineering, Inc. Radiant energy imaging scanning
JPS5293384A (en) * 1976-01-31 1977-08-05 Shimadzu Corp Radiation collimeter for segmental scanning
EP0074021A1 (de) * 1981-09-07 1983-03-16 Siemens Aktiengesellschaft Röntgenuntersuchungsgerät
EP0311177A2 (de) * 1987-10-05 1989-04-12 Philips Patentverwaltung GmbH Anordnung zur Untersuchung eines Körpers mit einer Strahlenquelle
EP0357146A2 (de) * 1988-09-01 1990-03-07 Philips Patentverwaltung GmbH Anordnung zur Erzeugung eines Röntgen- oder Gammastrahls mit geringem Querschnitt und veränderlicher Richtung
EP0389033A2 (de) * 1989-03-18 1990-09-26 Philips Patentverwaltung GmbH Anordnung zur Erzeugung eines Röntgen- oder Gammastrahls mit geringem Querschnitt und veränderbarer Lage
FR2790100A1 (fr) * 1999-02-24 2000-08-25 Commissariat Energie Atomique Detecteur bidimensionnel de rayonnements ionisants et procede de fabrication de ce detecteur
WO2002082065A2 (en) * 2001-04-03 2002-10-17 Koninklijke Philips Electronics N.V. Computed tomography apparatus

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4031401A (en) * 1975-03-14 1977-06-21 American Science & Engineering, Inc. Radiant energy imaging scanning
JPS5293384A (en) * 1976-01-31 1977-08-05 Shimadzu Corp Radiation collimeter for segmental scanning
EP0074021A1 (de) * 1981-09-07 1983-03-16 Siemens Aktiengesellschaft Röntgenuntersuchungsgerät
EP0311177A2 (de) * 1987-10-05 1989-04-12 Philips Patentverwaltung GmbH Anordnung zur Untersuchung eines Körpers mit einer Strahlenquelle
EP0357146A2 (de) * 1988-09-01 1990-03-07 Philips Patentverwaltung GmbH Anordnung zur Erzeugung eines Röntgen- oder Gammastrahls mit geringem Querschnitt und veränderlicher Richtung
EP0389033A2 (de) * 1989-03-18 1990-09-26 Philips Patentverwaltung GmbH Anordnung zur Erzeugung eines Röntgen- oder Gammastrahls mit geringem Querschnitt und veränderbarer Lage
FR2790100A1 (fr) * 1999-02-24 2000-08-25 Commissariat Energie Atomique Detecteur bidimensionnel de rayonnements ionisants et procede de fabrication de ce detecteur
US20050092928A1 (en) * 1999-02-24 2005-05-05 Commissariat A L'energie Atomique Bidimensional detector of ionizing radiation and manufacturing process for this detector
WO2002082065A2 (en) * 2001-04-03 2002-10-17 Koninklijke Philips Electronics N.V. Computed tomography apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10082473B2 (en) 2015-07-07 2018-09-25 General Electric Company X-ray filtration

Also Published As

Publication number Publication date
ATE421151T1 (de) 2009-01-15
EP1772874A2 (de) 2007-04-11
DE102005048519A1 (de) 2007-04-19
EP1772874B1 (de) 2009-01-14
DE502006002637D1 (de) 2009-03-05

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