EP1799402A4 - Verfahren und vorrichtung zur verbesserten chemisch-mechanischen planarisierung - Google Patents
Verfahren und vorrichtung zur verbesserten chemisch-mechanischen planarisierungInfo
- Publication number
- EP1799402A4 EP1799402A4 EP05808056A EP05808056A EP1799402A4 EP 1799402 A4 EP1799402 A4 EP 1799402A4 EP 05808056 A EP05808056 A EP 05808056A EP 05808056 A EP05808056 A EP 05808056A EP 1799402 A4 EP1799402 A4 EP 1799402A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- chemical mechanical
- mechanical planarization
- improved chemical
- improved
- planarization
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US61694404P | 2004-10-06 | 2004-10-06 | |
| US63925704P | 2004-12-27 | 2004-12-27 | |
| PCT/US2005/035979 WO2006042010A1 (en) | 2004-10-06 | 2005-10-05 | Method and apparatus for improved chemical mechanical planarization |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP1799402A1 EP1799402A1 (de) | 2007-06-27 |
| EP1799402A4 true EP1799402A4 (de) | 2009-12-16 |
Family
ID=36148660
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP05808056A Withdrawn EP1799402A4 (de) | 2004-10-06 | 2005-10-05 | Verfahren und vorrichtung zur verbesserten chemisch-mechanischen planarisierung |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP1799402A4 (de) |
| JP (1) | JP5025478B2 (de) |
| KR (1) | KR101165114B1 (de) |
| TW (1) | TWI270438B (de) |
| WO (1) | WO2006042010A1 (de) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2318180A1 (de) | 2008-06-26 | 2011-05-11 | 3M Innovative Properties Company | Polierscheibe mit porösen elementen und verfahren zur herstellung und verwendung derselben |
| EP2323808B1 (de) * | 2008-07-18 | 2015-09-30 | 3M Innovative Properties Company | Polierkissen mit schwimmenden elementen und herstellungs- und verwendungsverfahren dafür |
| JP5551479B2 (ja) * | 2010-03-19 | 2014-07-16 | ニッタ・ハース株式会社 | 研磨装置、研磨パッドおよび研磨情報管理システム |
| US9751189B2 (en) * | 2014-07-03 | 2017-09-05 | Applied Materials, Inc. | Compliant polishing pad and polishing module |
| US11192215B2 (en) * | 2017-11-16 | 2021-12-07 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad with pad wear indicator |
| US11325221B2 (en) * | 2017-11-16 | 2022-05-10 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad with multipurpose composite window |
| JP7010166B2 (ja) * | 2018-07-24 | 2022-01-26 | 株式会社Sumco | ワークの両面研磨装置および両面研磨方法 |
| CN109616412A (zh) * | 2018-12-14 | 2019-04-12 | 大连理工大学 | 一种光化学与机械抛光相结合的半导体晶片加工方法 |
| JP7317440B2 (ja) * | 2019-04-15 | 2023-07-31 | 株式会社ディスコ | ドレッシング工具 |
| KR102570825B1 (ko) * | 2020-07-16 | 2023-08-28 | 한국생산기술연구원 | 다공성 돌출 패턴을 포함하는 연마 패드 및 이를 포함하는 연마 장치 |
| US20230398659A1 (en) * | 2022-06-09 | 2023-12-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Polishing Pad for Chemical Mechanical Polishing and Method |
| CN115365922B (zh) * | 2022-10-24 | 2023-02-28 | 西安奕斯伟材料科技有限公司 | 研磨轮、研磨设备及硅片 |
| CN116276337B (zh) * | 2023-04-23 | 2023-11-07 | 南京茂莱光学科技股份有限公司 | 一种高平整度平面玻璃加工方法及加工装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9309972D0 (en) * | 1993-05-14 | 1993-06-30 | De Beers Ind Diamond | Tool insert |
| US5795218A (en) * | 1996-09-30 | 1998-08-18 | Micron Technology, Inc. | Polishing pad with elongated microcolumns |
| JPH10225864A (ja) * | 1997-02-17 | 1998-08-25 | Sony Corp | 研磨パッドとその製造方法並びにその研磨パッドを用いたウエハの研磨方法 |
| JP2000158327A (ja) * | 1998-12-02 | 2000-06-13 | Rohm Co Ltd | 化学的機械的研磨用研磨布およびそれを用いた化学的機械的研磨装置 |
| US20020077037A1 (en) * | 1999-05-03 | 2002-06-20 | Tietz James V. | Fixed abrasive articles |
| US6962524B2 (en) * | 2000-02-17 | 2005-11-08 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US6612916B2 (en) * | 2001-01-08 | 2003-09-02 | 3M Innovative Properties Company | Article suitable for chemical mechanical planarization processes |
| JP2003103470A (ja) * | 2001-09-28 | 2003-04-08 | Dainippon Printing Co Ltd | 研磨層に凹部を有する研磨シート |
| JP4165118B2 (ja) * | 2002-05-14 | 2008-10-15 | ソニー株式会社 | 研磨装置、研磨部材厚さ検出方法および研磨部材厚さ検出装置 |
-
2005
- 2005-10-05 WO PCT/US2005/035979 patent/WO2006042010A1/en not_active Ceased
- 2005-10-05 KR KR1020077010346A patent/KR101165114B1/ko not_active Expired - Fee Related
- 2005-10-05 JP JP2007535807A patent/JP5025478B2/ja not_active Expired - Fee Related
- 2005-10-05 EP EP05808056A patent/EP1799402A4/de not_active Withdrawn
- 2005-10-06 TW TW094135023A patent/TWI270438B/zh not_active IP Right Cessation
Non-Patent Citations (1)
| Title |
|---|
| No further relevant documents disclosed * |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI270438B (en) | 2007-01-11 |
| WO2006042010A1 (en) | 2006-04-20 |
| TW200626291A (en) | 2006-08-01 |
| EP1799402A1 (de) | 2007-06-27 |
| KR20070057271A (ko) | 2007-06-04 |
| KR101165114B1 (ko) | 2012-07-12 |
| JP2008516452A (ja) | 2008-05-15 |
| JP5025478B2 (ja) | 2012-09-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| 17P | Request for examination filed |
Effective date: 20070427 |
|
| AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR |
|
| DAX | Request for extension of the european patent (deleted) | ||
| A4 | Supplementary search report drawn up and despatched |
Effective date: 20091116 |
|
| RIC1 | Information provided on ipc code assigned before grant |
Ipc: B24B 37/04 20060101AFI20091110BHEP Ipc: B24D 11/00 20060101ALI20091110BHEP |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN |
|
| 18W | Application withdrawn |
Effective date: 20110411 |