EP1842095A4 - Optisches mikroskop mit adaptiver abtastung - Google Patents

Optisches mikroskop mit adaptiver abtastung

Info

Publication number
EP1842095A4
EP1842095A4 EP05855789A EP05855789A EP1842095A4 EP 1842095 A4 EP1842095 A4 EP 1842095A4 EP 05855789 A EP05855789 A EP 05855789A EP 05855789 A EP05855789 A EP 05855789A EP 1842095 A4 EP1842095 A4 EP 1842095A4
Authority
EP
European Patent Office
Prior art keywords
optical microscope
scanning optical
adaptive scanning
adaptive
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP05855789A
Other languages
English (en)
French (fr)
Other versions
EP1842095A2 (de
Inventor
Benjamin Michael Potsaid
Yves Bellouard
John T Wen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rensselaer Polytechnic Institute
Original Assignee
Rensselaer Polytechnic Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rensselaer Polytechnic Institute filed Critical Rensselaer Polytechnic Institute
Publication of EP1842095A2 publication Critical patent/EP1842095A2/de
Publication of EP1842095A4 publication Critical patent/EP1842095A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Lenses (AREA)
EP05855789A 2005-01-27 2005-12-29 Optisches mikroskop mit adaptiver abtastung Withdrawn EP1842095A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US64757205P 2005-01-27 2005-01-27
PCT/US2005/047287 WO2006081031A2 (en) 2005-01-27 2005-12-29 Adaptive scanning optical microscope

Publications (2)

Publication Number Publication Date
EP1842095A2 EP1842095A2 (de) 2007-10-10
EP1842095A4 true EP1842095A4 (de) 2010-08-04

Family

ID=36740940

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05855789A Withdrawn EP1842095A4 (de) 2005-01-27 2005-12-29 Optisches mikroskop mit adaptiver abtastung

Country Status (5)

Country Link
EP (1) EP1842095A4 (de)
JP (1) JP2008529082A (de)
CN (1) CN100585449C (de)
IL (1) IL183131A0 (de)
WO (1) WO2006081031A2 (de)

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US7556378B1 (en) 2003-04-10 2009-07-07 Tsontcho Ianchulev Intraoperative estimation of intraocular lens power
ES2665536T3 (es) 2004-04-20 2018-04-26 Alcon Research, Ltd. Microscopio quirúrgico y sensor de frente de onda integrados
DE102006010767B4 (de) * 2006-03-08 2008-04-17 Carl Zeiss Surgical Gmbh Mikroskopiesystem
US8333474B2 (en) 2007-10-19 2012-12-18 Wavetec Vision Systems, Inc. Optical instrument alignment system
US7594729B2 (en) 2007-10-31 2009-09-29 Wf Systems, Llc Wavefront sensor
US8550624B2 (en) 2008-11-06 2013-10-08 Wavetec Vision Systems, Inc. Optical angular measurement system for ophthalmic applications and method for positioning of a toric intraocular lens with increased accuracy
US8876290B2 (en) 2009-07-06 2014-11-04 Wavetec Vision Systems, Inc. Objective quality metric for ocular wavefront measurements
EP2818130B1 (de) 2009-07-14 2017-09-27 WaveTec Vision Systems, Inc. Bestimmung der effektiven Linsenposition einer Intraokularlinse mit einer aphaken Brechkraft
CN102497833B (zh) 2009-07-14 2014-12-03 波技术视觉系统公司 眼科手术测量系统
EP2478328B1 (de) 2009-09-18 2016-07-27 Carl Zeiss SMT GmbH Verfahren zur messung einer form einer optischen fläche
JP2011095685A (ja) * 2009-11-02 2011-05-12 Sony Corp 顕微鏡システム及び顕微鏡システムの制御方法
JP5744450B2 (ja) * 2009-11-17 2015-07-08 キヤノン株式会社 撮像装置及びその制御方法
DE102012101778A1 (de) * 2012-03-02 2013-09-05 Leica Microsystems Cms Gmbh Scanmikroskopisches Verfahren und Scanmikroskop
JP5814855B2 (ja) * 2012-04-27 2015-11-17 株式会社日立ハイテクノロジーズ 荷電粒子線調整支援装置および方法
US9072462B2 (en) 2012-09-27 2015-07-07 Wavetec Vision Systems, Inc. Geometric optical power measurement device
TWI490542B (zh) * 2013-05-07 2015-07-01 Univ Nat Taiwan A scanning lens and an interference measuring device using the scanning lens
DE102014005880A1 (de) * 2014-04-17 2015-11-05 Carl Zeiss Ag Lichtrastermikroskop mit vereinfachter Optik, insbesondere mit veränderlicher Pupillenlage
DE102014112199B4 (de) * 2014-08-26 2024-10-10 Carl Zeiss Microscopy Gmbh Mikroskopisches Abbildungssystem
DE102014113908A1 (de) * 2014-09-25 2016-03-31 Carl Zeiss Ag Laserscansystem
DE102014017001A1 (de) * 2014-11-12 2016-05-12 Carl Zeiss Ag Mikroskop mit geringem Verzeichnungsfehler
CN104460007B (zh) * 2014-12-30 2017-02-01 哈尔滨工业大学 一种激光三倍频的空间强度整形方法
CN108351301B (zh) 2015-09-02 2021-03-09 英思克斯公司 用于彩色成像的系统和方法
CN105242397B (zh) * 2015-09-30 2017-10-27 深圳大学 一种相干自适应光学像差校正系统
WO2017079688A1 (en) * 2015-11-05 2017-05-11 Inscopix, Inc. Systems and methods for optogenetic imaging
US12251272B2 (en) 2015-11-05 2025-03-18 Inscopix, Inc. Systems and methods for optogenetic imaging using semi-kinematic coupling
CN106092518B (zh) * 2016-06-06 2017-09-05 北京理工大学 无限兼有限共轭差动探测寻焦光电像分析器及其方法
CN105910799B (zh) * 2016-06-06 2017-06-06 北京理工大学 无限兼有限共轭寻焦光电像分析器及其方法
CN106199751B (zh) * 2016-07-08 2019-03-01 中国科学院电子学研究所 太赫兹电控波束扫描光学链路
CN106680984B (zh) * 2016-12-16 2019-06-11 大连光耀辉科技有限公司 一种激光双通道同时输出设备和显微镜
CN106773024A (zh) * 2017-03-30 2017-05-31 中国检验认证集团检验有限公司 一种基于变形镜的变放大倍率光学成像技术
CN107063092B (zh) * 2017-06-05 2019-02-05 北京理工大学 一种大视场快速扫描的双光源同轴标定系统及调整方法
CN112782844B (zh) * 2021-01-12 2023-03-31 中国科学院光电技术研究所 一种自适应光学系统稳定闭环控制方法
JP7688847B2 (ja) * 2021-03-25 2025-06-05 株式会社ニコン 顕微鏡、観察方法、およびプログラム
NL2034478B1 (en) * 2023-03-30 2024-10-04 Univ Twente An aberration compensating unit and method, and a light optical device comprising such a unit.

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10038622A1 (de) * 2000-08-03 2002-02-21 Leica Microsystems Scan-Mikroskop,optische Anordnung und Verfahren zur Bildaufnahme in der Scan-Mikroskopie
US20020044332A1 (en) * 2000-10-04 2002-04-18 Johann Engelhardt Optical arrangement, and method for the deflection of light beams
WO2004025331A2 (en) * 2002-09-16 2004-03-25 Rensselaer Polytechnic Institute Microscope with extended field of vision
US20040184163A1 (en) * 2003-02-13 2004-09-23 Olympus Corporation Optical apparatus

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW538256B (en) * 2000-01-14 2003-06-21 Zeiss Stiftung Microlithographic reduction projection catadioptric objective
JP2004514943A (ja) * 2000-11-28 2004-05-20 カール・ツアイス・エスエムテイ・アーゲー １５７ｎｍリソグラフィ用の反射屈折投影系
JP2003057553A (ja) * 2001-08-09 2003-02-26 Olympus Optical Co Ltd 共焦点走査型顕微鏡
AU2003245458A1 (en) * 2002-06-12 2003-12-31 Advanced Research And Technology Institute, Inc. Method and apparatus for improving both lateral and axial resolution in ophthalmoscopy
US7339148B2 (en) * 2002-12-16 2008-03-04 Olympus America Inc. Confocal microscope
JP2004198492A (ja) * 2002-12-16 2004-07-15 Olympus Corp 蛍光顕微鏡
US7057806B2 (en) * 2003-05-09 2006-06-06 3M Innovative Properties Company Scanning laser microscope with wavefront sensor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10038622A1 (de) * 2000-08-03 2002-02-21 Leica Microsystems Scan-Mikroskop,optische Anordnung und Verfahren zur Bildaufnahme in der Scan-Mikroskopie
US20020044332A1 (en) * 2000-10-04 2002-04-18 Johann Engelhardt Optical arrangement, and method for the deflection of light beams
WO2004025331A2 (en) * 2002-09-16 2004-03-25 Rensselaer Polytechnic Institute Microscope with extended field of vision
US20040184163A1 (en) * 2003-02-13 2004-09-23 Olympus Corporation Optical apparatus

Also Published As

Publication number Publication date
CN100585449C (zh) 2010-01-27
JP2008529082A (ja) 2008-07-31
WO2006081031A3 (en) 2007-03-01
CN101116023A (zh) 2008-01-30
WO2006081031A2 (en) 2006-08-03
EP1842095A2 (de) 2007-10-10
IL183131A0 (en) 2007-09-20

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Legal Events

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Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

RIN1 Information on inventor provided before grant (corrected)

Inventor name: BELLOUARD, YVES

Inventor name: POTSAID, BENJAMIN, MICHAEL

Inventor name: WEN, JOHN, T.

DAX Request for extension of the european patent (deleted)
A4 Supplementary search report drawn up and despatched

Effective date: 20100702

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