EP1969155A1 - Method for producing a ceramic oxide based coating conformable with the geometry of a substrate having raised designs - Google Patents
Method for producing a ceramic oxide based coating conformable with the geometry of a substrate having raised designsInfo
- Publication number
- EP1969155A1 EP1969155A1 EP06819672A EP06819672A EP1969155A1 EP 1969155 A1 EP1969155 A1 EP 1969155A1 EP 06819672 A EP06819672 A EP 06819672A EP 06819672 A EP06819672 A EP 06819672A EP 1969155 A1 EP1969155 A1 EP 1969155A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- solvent
- layer
- solution
- sol
- coating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 53
- 239000000919 ceramic Substances 0.000 title claims abstract description 23
- 238000000576 coating method Methods 0.000 title claims description 67
- 239000011248 coating agent Substances 0.000 title claims description 48
- 238000004519 manufacturing process Methods 0.000 title description 8
- 239000002243 precursor Substances 0.000 claims abstract description 72
- 238000000034 method Methods 0.000 claims abstract description 65
- 239000002904 solvent Substances 0.000 claims abstract description 56
- 238000000151 deposition Methods 0.000 claims abstract description 31
- 238000010438 heat treatment Methods 0.000 claims abstract description 25
- 229910052751 metal Inorganic materials 0.000 claims abstract description 25
- 239000002184 metal Substances 0.000 claims abstract description 25
- 125000001931 aliphatic group Chemical group 0.000 claims abstract description 13
- 238000007865 diluting Methods 0.000 claims abstract description 7
- 150000002739 metals Chemical class 0.000 claims abstract description 5
- 239000000243 solution Substances 0.000 claims description 88
- 239000011133 lead Substances 0.000 claims description 26
- 230000008021 deposition Effects 0.000 claims description 23
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims description 23
- 230000008569 process Effects 0.000 claims description 20
- 125000004432 carbon atom Chemical group C* 0.000 claims description 19
- 229910052752 metalloid Inorganic materials 0.000 claims description 17
- 238000001035 drying Methods 0.000 claims description 15
- 150000002738 metalloids Chemical class 0.000 claims description 15
- 238000000197 pyrolysis Methods 0.000 claims description 15
- 238000010790 dilution Methods 0.000 claims description 12
- 239000012895 dilution Substances 0.000 claims description 12
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 10
- -1 metalloid salt Chemical class 0.000 claims description 10
- 229910052574 oxide ceramic Inorganic materials 0.000 claims description 9
- 239000011224 oxide ceramic Substances 0.000 claims description 9
- 238000000280 densification Methods 0.000 claims description 8
- 150000004703 alkoxides Chemical class 0.000 claims description 7
- 125000000217 alkyl group Chemical group 0.000 claims description 6
- 125000003118 aryl group Chemical group 0.000 claims description 6
- 150000002894 organic compounds Chemical class 0.000 claims description 6
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 claims description 5
- 238000005524 ceramic coating Methods 0.000 claims description 5
- 150000001875 compounds Chemical class 0.000 claims description 5
- 229910052758 niobium Inorganic materials 0.000 claims description 5
- 239000010955 niobium Substances 0.000 claims description 5
- 229910052700 potassium Inorganic materials 0.000 claims description 5
- 239000011591 potassium Substances 0.000 claims description 5
- 229910052725 zinc Inorganic materials 0.000 claims description 5
- 239000011701 zinc Substances 0.000 claims description 5
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 4
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 4
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 4
- 239000011777 magnesium Substances 0.000 claims description 4
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 4
- 150000002902 organometallic compounds Chemical class 0.000 claims description 4
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 3
- 229910002113 barium titanate Inorganic materials 0.000 claims description 3
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 claims description 3
- 229910052797 bismuth Inorganic materials 0.000 claims description 3
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 3
- NKZSPGSOXYXWQA-UHFFFAOYSA-N dioxido(oxo)titanium;lead(2+) Chemical compound [Pb+2].[O-][Ti]([O-])=O NKZSPGSOXYXWQA-UHFFFAOYSA-N 0.000 claims description 3
- 229910052736 halogen Inorganic materials 0.000 claims description 3
- 150000002367 halogens Chemical class 0.000 claims description 3
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 claims description 3
- 229910052749 magnesium Inorganic materials 0.000 claims description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims description 2
- 125000003668 acetyloxy group Chemical group [H]C([H])([H])C(=O)O[*] 0.000 claims description 2
- 125000002252 acyl group Chemical group 0.000 claims description 2
- 229910052788 barium Inorganic materials 0.000 claims description 2
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims description 2
- 229910002115 bismuth titanate Inorganic materials 0.000 claims description 2
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 claims description 2
- 239000003446 ligand Substances 0.000 claims description 2
- 239000000178 monomer Substances 0.000 claims description 2
- 239000006104 solid solution Substances 0.000 claims description 2
- 150000002737 metalloid compounds Chemical class 0.000 claims 3
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 claims 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 claims 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims 1
- 125000004429 atom Chemical group 0.000 claims 1
- 229910052791 calcium Inorganic materials 0.000 claims 1
- 239000011575 calcium Substances 0.000 claims 1
- 229910052799 carbon Inorganic materials 0.000 claims 1
- 238000010791 quenching Methods 0.000 claims 1
- 230000000171 quenching effect Effects 0.000 claims 1
- 150000002009 diols Chemical class 0.000 abstract description 8
- 239000000470 constituent Substances 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 16
- 238000002360 preparation method Methods 0.000 description 15
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 15
- 239000010936 titanium Substances 0.000 description 12
- 239000000203 mixture Substances 0.000 description 10
- 229910052719 titanium Inorganic materials 0.000 description 10
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 8
- 239000012071 phase Substances 0.000 description 8
- 238000004821 distillation Methods 0.000 description 7
- 229910052726 zirconium Inorganic materials 0.000 description 7
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 6
- 229940046892 lead acetate Drugs 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- VXUYXOFXAQZZMF-UHFFFAOYSA-N titanium(IV) isopropoxide Chemical compound CC(C)O[Ti](OC(C)C)(OC(C)C)OC(C)C VXUYXOFXAQZZMF-UHFFFAOYSA-N 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 238000002425 crystallisation Methods 0.000 description 5
- 230000008025 crystallization Effects 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 238000005240 physical vapour deposition Methods 0.000 description 5
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 5
- 238000003756 stirring Methods 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- KQNKJJBFUFKYFX-UHFFFAOYSA-N acetic acid;trihydrate Chemical compound O.O.O.CC(O)=O KQNKJJBFUFKYFX-UHFFFAOYSA-N 0.000 description 4
- 238000000137 annealing Methods 0.000 description 4
- 229910052786 argon Inorganic materials 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 238000004377 microelectronic Methods 0.000 description 4
- 238000004528 spin coating Methods 0.000 description 4
- 229910052712 strontium Inorganic materials 0.000 description 4
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000003618 dip coating Methods 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 3
- 230000008020 evaporation Effects 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- XPGAWFIWCWKDDL-UHFFFAOYSA-N propan-1-olate;zirconium(4+) Chemical compound [Zr+4].CCC[O-].CCC[O-].CCC[O-].CCC[O-] XPGAWFIWCWKDDL-UHFFFAOYSA-N 0.000 description 3
- 238000010992 reflux Methods 0.000 description 3
- 230000005070 ripening Effects 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- 238000004626 scanning electron microscopy Methods 0.000 description 3
- 238000005507 spraying Methods 0.000 description 3
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 238000005119 centrifugation Methods 0.000 description 2
- 150000003841 chloride salts Chemical class 0.000 description 2
- 238000009833 condensation Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 239000002274 desiccant Substances 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
- 238000011010 flushing procedure Methods 0.000 description 2
- 238000001879 gelation Methods 0.000 description 2
- 229910052735 hafnium Inorganic materials 0.000 description 2
- 239000012456 homogeneous solution Substances 0.000 description 2
- 229910052747 lanthanoid Inorganic materials 0.000 description 2
- 229910000464 lead oxide Inorganic materials 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 229910001848 post-transition metal Inorganic materials 0.000 description 2
- 238000004151 rapid thermal annealing Methods 0.000 description 2
- 239000003507 refrigerant Substances 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- 229910052723 transition metal Inorganic materials 0.000 description 2
- 150000003624 transition metals Chemical class 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 229910052688 Gadolinium Inorganic materials 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 238000004566 IR spectroscopy Methods 0.000 description 1
- 229910012851 LiCoO 2 Inorganic materials 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 229910020684 PbZr Inorganic materials 0.000 description 1
- 229910052777 Praseodymium Inorganic materials 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- YPQJHZKJHIBJAP-UHFFFAOYSA-N [K].[Bi] Chemical compound [K].[Bi] YPQJHZKJHIBJAP-UHFFFAOYSA-N 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 150000001242 acetic acid derivatives Chemical class 0.000 description 1
- 239000002313 adhesive film Substances 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 150000003842 bromide salts Chemical class 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000002468 ceramisation Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000018044 dehydration Effects 0.000 description 1
- 238000006297 dehydration reaction Methods 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 150000004673 fluoride salts Chemical class 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 239000008240 homogeneous mixture Substances 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 150000004694 iodide salts Chemical class 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 230000005499 meniscus Effects 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 150000002823 nitrates Chemical class 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- 150000003891 oxalate salts Chemical class 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- ZDHURYWHEBEGHO-UHFFFAOYSA-N potassiopotassium Chemical compound [K].[K] ZDHURYWHEBEGHO-UHFFFAOYSA-N 0.000 description 1
- 230000002028 premature Effects 0.000 description 1
- 238000001314 profilometry Methods 0.000 description 1
- 239000011541 reaction mixture Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000000284 resting effect Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000003980 solgel method Methods 0.000 description 1
- 230000007928 solubilization Effects 0.000 description 1
- 238000005063 solubilization Methods 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 238000012916 structural analysis Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
- C23C18/1208—Oxides, e.g. ceramics
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1225—Deposition of multilayers of inorganic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/125—Process of deposition of the inorganic material
- C23C18/1254—Sol or sol-gel processing
Definitions
- the subject of the present invention is a process for producing a coating based on an oxide ceramic conforming to the geometry of a substrate having raised patterns, in particular micron-sized patterns.
- the general technical field of the invention can therefore be defined as that of ceramic coatings for subtrate.
- the coatings have, for example, the function of modifying the properties of a substrate, such as the mechanical properties, the thermal properties, the electrical properties and the chemical properties, the optical properties.
- Substrate coatings therefore find application in many fields such as microelectronics, optics or energy.
- the trend is to go to systems of increasingly smaller size, involving the implementation of relief structures to increase in particular the active surface of these structures.
- the realization of such structures requires knowing to coat them with thin ceramic layers, generally having dielectric properties.
- the trend is to go towards portable systems, whose size is a few millimeters and including components whose critical dimensions are of the order of 0 , 1 to 10 ⁇ m.
- Their manufacture requires the production of coatings on substrates of complex geometry, such as LiCoO 2 coatings acting as cathodes.
- the oxide coating deposition processes can be classified into two categories: namely, dry processes and wet processes.
- dry processes there is mainly a difference in the literature for substrates with micron units, chemical vapor deposition (known by the abbreviation CVD for "Chemical Vapor Deposition”), physical vapor deposition (known by the abbreviation PVD for "Physical Vapor Deposition”) of which a variant specific is ion implantation.
- CVD chemical vapor deposition
- PVD Physical vapor deposition
- Chemical vapor deposition is a method in which the volatile compounds of the material to be deposited are transformed into reactive species, such as radicals generated by microwaves, plasma torches, etc., thus forming a vapor phase, which reacts with the heated substrate to give a coating.
- the volatile compounds of the material to be deposited are optionally diluted in a carrier gas, such as dihydrogen.
- This method has a certain number of advantages among which one can cite a good selectivity of the deposits, a good adaptability in the chains of production.
- this method has the following drawbacks: the coatings obtained are not very dense;
- the coatings have poor sharpness at the edges of the relief patterns.
- a more advantageous method may be to achieve physical vapor deposition coatings, such as evaporation, spraying and ablation.
- evaporation consists of simply to evaporate or sublimate the material to be deposited in a vacuum crucible by heating it at high temperature. The evaporated material is deposited by condensation on the substrate to be coated and a layer is formed on the substrate.
- this method makes it possible to obtain denser layers, this method proves to be difficult to implement, because of the apparatus to be used, and of high cost, and does not ensure uniform layer thickness on substrates. with raised patterns.
- the coatings on substrates having micron-size patterns obtained by these techniques do not have a uniform thickness over the entire deposition length and, in particular, have excess thicknesses at the edges. patterns in relief. This can cause, when the substrates thus coated are intended to be used as electronic components, capacity variations as well as risks of breakdown at the edges of the raised patterns.
- the object of the invention is achieved by a method of producing an oxide ceramic coating conforming to the geometry of a substrate having relief patterns comprising:
- the precursor sol-gel solution of said ceramic is prepared by a process comprising successively the following steps: a) preparing a first solution by contacting the molecular precursor (s) with metals and / or metalloids intended to enter the constitution of the ceramic with a medium comprising a solvent comprising at least two -OH functions and optionally an aliphatic monoalcohol; (b) put at rest the solution obtained in (a) for a sufficient time necessary to obtain a solution having a substantially constant viscosity; c) diluting at a predetermined rate the solution obtained in b) with a solvent identical to that of step a) or a solvent miscible with the solvent used in step a) but different from this.
- miscible solvent means a solvent which can be mixed with the solvent comprising at least two -OH functions and, where appropriate, with the aliphatic monolalcohol, forming a homogeneous mixture, and this in all proportions at room temperature, that is to say at a temperature of the surrounding atmosphere, generally between 20 and 25 ° C.
- the method of the invention implementing sol-gel technology to form the deposition solution, has the following advantages:
- the method of the invention advantageously makes it possible to obtain coatings which comply with the geometry of the substrate, that is to say coatings having a substantially uniform thickness over the entire deposition length, in particular thanks to the stability properties of the sol-gel solution obtained prior to deposition.
- the oxide ceramics constituting the coating may be chosen from oxides with a perovskite structure such as lead zircono- titanate (known by the abbreviation PZT), barium titanate, barium titanate and strontium (known as BST), lead titanate, niobium and zinc (known as PZNT), zinc and lead niobate (known as PZN), magnesium niobate and lead (known as PMN), lead titanate (known as PT), potassium potassium niobate, bismuth potassium titanate (known as BKT), bismuth titanate and strontium (known by the abbreviation SBT), potassium tantalate (known as KLT), solid solutions of PMN and PT.
- PZT lead zircono- titanate
- BST barium titanate, barium titanate and strontium
- PZNT lead titanate
- PZNT zinc and lead niobate
- PMN magnesium niobate and lead
- PMN lead titanate
- the oxide ceramics constituting the coating may also be chosen from simple oxides, such as SiO 2 , HfO 2 , ZrO 2 , Al 2 O 3 and Ta 2 O 5 .
- the process of the invention comprises the preparation of a stable sol-gel solution.
- This preparation comprises, in a first step, bringing into contact one or more molecular precursors of metals and / or metalloids intended to enter the constitution of the ceramic with a medium comprising a solvent comprising at least two -OH functions and optionally an aliphatic monoalcohol.
- the metal may be selected from the group consisting of alkali metals, such as K, alkaline earth metals, such as Mg, transition metals, lanthanide metals and post-transition metals of columns IIIA and IVA of periodic classification of the elements.
- the transition metals can be selected from Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Cd, Hf, Ta, W, Re, Os, Ir, Pt.
- the lanthanide metals can be selected from La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Er, Yb.
- the post-transition metals can be chosen from the elements of group IIIA Al, Ga, In and T1 and the elements of group IVA Ge, Sn and Pb.
- the metalloids can be selected from Si, Se, Te.
- the molecular precursors of metal and / or metalloid may be in the form of inorganic metal or metalloid salts such as halides (fluorides, chlorides, bromides, iodides), nitrates or oxalates.
- the molecular precursors of metal and / or metalloid may also be in the form of organometallic compounds of metal or metalloid, such as alkoxides having the formula (RO) n M, wherein M denotes the metal or metalloid, n represents the number of ligands bound to M, this number also corresponding to the valence of M and R represents a linear or branched alkyl group which may contain from 1 to 10 carbon atoms or an aromatic group comprising from 4 to 14 carbon atoms, such as a phenyl group.
- the molecular precursors of metal or metalloid may also be in the form of organometallic compounds of formula: in which: M represents a metal or a metalloid;
- X represents a hydrolyzable group chosen from halogen, acrylate, acetoxy and acyl groups, OR 'with R' representing a linear or branched alkyl group, which may comprise from 1 to 10 carbon atoms or an aromatic group comprising from 4 to 14; carbon atoms, such as a phenyl group;
- R 1 represents a non-hydrolyzable group selected from alkyl groups, linear or branched, which may comprise from 1 to 10 carbon atoms, optionally perfluorinated, the aromatic groups may comprise from 4 to 14 carbon atoms; y and z are integers selected so that (y + z) is equal to valence M.
- the first solution of step a) may contain, in addition, one or more compounds polymerizable, such as ethylenic monomers, such as styrene.
- the precursors The molecular molecules to be used for the preparation of the sol-gel solutions are respectively lead molecular precursors, zirconium molecular precursors and titanium molecular precursors.
- organic lead salts such as acetates
- lead inorganic salts such as chlorides or organometallic compounds of lead such as alkoxides containing a number of carbon atoms may be used as lead precursors. ranging from 1 to 4.
- the lead precursor used is a hydrated organic salt such as lead acetate trihydrate.
- This precursor has the advantage of being stable, very common and cheap. However, when using such a hydrated precursor, it is preferable to dehydrate the latter. In fact, the presence of water during the mixing of the sol-gel solutions with one another can lead to premature hydrolysis of the metal precursors followed by polymerization and thus to a sol-gel solution that is unstable over time.
- the dehydration of the lead acetate trihydrate can be carried out by distillation of the latter in the solvent comprising at least two -OH functions used to effect the mixing of the sol-gel solutions.
- the titanium precursors are alkoxides, such as titanium isopropoxide.
- zirconium precursors are preferably alkoxides, such as zirconium n-propoxide.
- the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of barium, molecular precursors of strontium and molecular precursors of titanium.
- the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of lead, zirconium molecular precursors, molecular precursors of niobium and molecular precursors of titanium.
- the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of lead, molecular precursors of magnesium, and molecular precursors of niobium.
- the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of lead, molecular precursors of titanium.
- the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of bismuth, molecular precursors of potassium, and titanium molecular precursors.
- the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of strontium, molecular precursors of bismuth, molecular precursors of titanium.
- the molecular precursors to be used for the preparation of the sol-gel solution are precursors, respectively. silicon, hafnium, tantalum, zirconium or aluminum.
- the precursors as mentioned above are brought into contact with a medium comprising a solvent comprising at least two -OH functions and optionally an aliphatic monoalcohol.
- the solvent comprising at least two -OH functions used in step a) and optionally c) may be an alkylene glycol having a number of carbon atoms ranging from 2 to 5. This type of solvent contributes to facilitating the solubilization of precursors and, in addition, acts as a stabilizing agent of the sol-gel solution.
- a solvent comprising at least two -OH functions that can be used is ethylene glycol or even diethanolamine.
- the medium of step a) may also comprise an aliphatic monoalcohol, which may, for example, comprise from 1 to 6 carbon atoms.
- An aliphatic monoalcohol comprising from 1 to 6 carbon atoms can also be used as dilution solvent in step c).
- a aliphatic monoalcohol mention may be made of n-propanol.
- the bringing into contact may consist in preparing a first sol-gel solution based on lead in a diol solvent, by dissolving a molecular precursor based on lead in this diol solvent, to which is added a second mixed sol-gel solution based on titanium and zirconium, said mixed sol-gel solution being prepared by dissolving a molecular precursor based on zirconium and a molecular precursor based on titanium in the same diol or in a solvent compatible with said diol, namely a solvent miscible with said diol, as is the case of aliphatic monoalcohols such as propanol.
- the lead sol-gel solution is preferably initially in excess of 10% with respect to the stoichiometry.
- the mixture of said sol-gel solutions can then be refluxed, with stirring, at a temperature close to the boiling temperature of the reaction mixture. Reflux makes it possible, advantageously, to homogenize the sol-gel solutions mixed with each other.
- the sol-gel solution obtained at the end of step a the sol-gel solution is quenched, in accordance with the invention, for a suitable time until a solution having a viscosity is obtained. substantially constant.
- step b) is preferably carried out at room temperature, for example, for a period ranging from one week to 4 months.
- the precursors of solubilized metals and / or metalloids condense to a state of equilibrium.
- This condensation results in an increase in the viscosity of the sol-gel solution, until reaching a substantially constant value as a function of time, when the equilibrium state is reached.
- the solution prepared in a) is placed at rest, generally at room temperature and in the absence of any heating.
- the viscosity of the solution is measured at regular intervals.
- the solution is diluted at a predetermined rate of dilution (step c). This dilution rate will be chosen by those skilled in the art according to the envisaged use of the sol-gel solution, and in particular according to the desired coating thickness after deposition and treatment of such a solution on a substrate and also according to the technique. deposit .
- This dilution may consist in diluting the sol-gel solution obtained after step b) by a dilution factor ranging from 1 to 20.
- the dilution solvent must be miscible with the solvent for preparing the solution of step a). It may be identical to the solvent comprising at least two -OH functions for preparing the sol-gel solution of step a) or be another solvent comprising at least two -OH functions.
- This alternative, consisting of using a solvent comprising at least two -OH functions identical to or different from that used in the context of step a), is especially preferably chosen, when the deposition technique is spin coating. Examples of solvents comprising at least two possible OH functions are ethylene glycol and propylene glycol.
- the solvent may be different from a solvent used in step a) and chosen, for example, from solvents having a lower viscosity than that of the solvent used in step a).
- Solvents corresponding to this specification are, for example, aliphatic monoalcohols comprising from 1 to 6 carbon atoms as defined above.
- the sol-gel solution is deposited on a substrate in the form of a layer.
- This deposit can be performed by any technique to obtain a deposit in the form of thin layers.
- the thicknesses of thin layers deposited, according to the invention can range from 1 to 500 nm.
- the deposition can be done according to one of the following techniques: - soaking-withdrawal (known under the English terminology “dip-coating”);
- centrifugal coating (known under the terminology “spin-coating”); laminar coating (known under the terminology “laminar-flow-coating or meniscus coating”); spraying (known under the terminology “spray-coating”);
- the deposition will be achieved by the technique of soaking-withdrawal (commonly called “dip-coating” in English) or by the technique of spin coating (commonly called “spin-coating” in English). These techniques facilitate, in particular, precise control of the thicknesses of deposited layers.
- the substrate is immersed in the sol-gel solution prepared beforehand and then removed at a suitable speed to obtain a conformal deposit, as defined above.
- the advantage of this technique is that several substrates can be processed at the same time, which allows a gain in productivity.
- the substrate for depositing is plated on a rotating support. Then, a volume of sol-gel solution is deposited to cover said substrate. The centrifugal force spreads said solution in the form of a thin layer. The thickness of the layer is in particular a function of the centrifugation speed and the concentration of the solution.
- the dilution solvent used in step c) will preferably be a solvent comprising at least two -OH functions identical to that used in step a) or optionally another solvent comprising at least two -OH functions.
- the substrate for depositing is a substrate comprising raised patterns, for example of micrometric size. It is specified that, by micrometric size patterns, is generally meant relief patterns having dimensions (such as height, width) ranging from 1 to 100 microns, these patterns being spaced equally by a distance of 1 at 100 ⁇ m.
- These relief patterns may be in particular in the form of trenches, for example of parallelepipedal shape, having, for example, a depth, a height and a size spacing micrometric.
- This substrate may be in the form of a silicon wafer, optionally covered with a metallization layer, when the application domain is microelectronics.
- the method of the invention comprises a heat treatment of the deposited layer (s) so as to transform them into the desired ceramic.
- This heat treatment can take place in different ways, depending on whether the method of the invention comprises the deposition of one or more layers.
- this heat treatment comprises:
- each layer deposited deposited, so as to gel the layer and optionally to remove a part of the solvent
- a relaxation step of each deposited layer so as to eliminate the stresses generated during the shrinkage of the layer; possibly a step of densification of the layer or set of deposited layers.
- the heat treatment can be limited to a simple drying step, if it is sufficient to obtain a ceramization of the layer. This is particularly the case of single oxide layers, such as SiO 2 , HfO 2 , Ta 2 O 5 , ZrO 2 or Al 2 O 3 .
- the heat treatment generally requires a drying step, a pyrolysis step, a relaxation step and a densification step.
- each deposited solution layer undergoes, according to the invention, a step consisting of a step of drying the deposited layer so as to ensure gelation of the layer.
- This step is intended to ensure the evaporation of part of the solvent of step a) and a part of the dilution solvent and optionally secondary products, such as esters, resulting from the reactions between the metal precursors.
- the sol-gel solution deposited is transformed into a gel layer of constant thickness adhering to the surface of the substrate.
- the temperature and time effective for gelation can be readily determined by those skilled in the art using, for example, UV-visible spectrometry techniques.
- the drying step according to the invention can be carried out at ambient temperature for a duration ranging from 1 to 10 minutes.
- this deposition step will consist in resting for a suitable duration the layer, just after the deposition, so that it dries.
- This drying step may also be carried out at a temperature ranging from 40 to 8O 0 C, for example, by making use of a hot plate. In this case, this step will be qualified, in the experimental part, of prepyrolysis step.
- each layer After drying, each layer generally undergoes a pyrolysis step carried out at a temperature and time effective to completely remove organic compounds from the deposited layer and in particular the solvents for preparing and diluting the sol-gel solution and the compounds generated by the reaction of the molecular precursors with each other.
- the effective temperature and time can be easily determined by those skilled in the art through techniques such as IR spectroscopy (Infra ⁇ red).
- the pyrolysis time for a given temperature corresponds to a duration that makes it possible to obtain a constant layer thickness.
- the layer thickness is controlled, for example, by profilometry techniques.
- the pyrolysis step is stopped to obtain a layer homogeneous in thickness and free of organic compounds.
- this pyrolysis step can be carried out at a temperature ranging from about 300 to about 400 ° C., preferably from 350 ° C. and 37O 0 C, and for a time ranging from about 5 minutes to 10 minutes.
- each deposited layer can be brought to undergo a relaxation step, in order to release the stresses generated during the shrinkage of the layer, in particular those accumulated at the level of the relief patterns.
- shrinkage is meant the reduction of the dimensions of the deposited layer, after drying and optionally pyrolysis thereof.
- This step can be carried out by maintaining the deposited layer at a temperature slightly higher than the pyrolysis temperature, for example greater than 10 to 30 ° C., for a duration ranging from 10 to 30 minutes.
- the relaxation temperature is greater than 10 to 30 ° C. at the pyrolysis temperature, but should preferably not exceed 400 ° C., so as to avoid formation. of a pyrochlore phase.
- the deposited layer or all of the deposited layers may be subjected to a densification (or annealing) step at a time and a temperature effective to allow the crystallization of the deposited layer or of all the deposited layers.
- the crystallization of the layer corresponds to obtaining a layer of stabilized thickness and crystallized structure, of the perovskite type.
- the temperature and the annealing time are chosen so as to obtain this crystallization, easily verifiable by structural analysis, such as X-ray diffraction analysis.
- the densification is carried out at a temperature ranging from about 500 to about 800 ° C. for a duration of between about 30 seconds and about 1 hour, in particular from 1 minute to 10 minutes.
- the annealing can be performed by different techniques.
- the annealing is carried out by a rapid heating mode, obtained, for example, with the technique of "rapid thermal annealing” (commonly referred to by the abbreviation RTA for "Rapid Thermal Annealing” or RTP for "Rapid Thermal Process” ).
- RTA rapid thermal annealing
- the thermal coatings are homogeneous, continuous, conform to the geometry of the substrate and strongly adhere to the substrate.
- the compliance factor defined by the ratio of the thicknesses at the bottom of the patterns and at the top or on the flanks of the patterns, is close to 1. This result, added to the simplicity of implementation of the sol-gel technique, its cost and its productivity gain augurs favorably for the use of such a process in the industrial environment.
- the deposition steps of the sol-gel solution and heat treatment can be repeated one or more times, until a coating having the desired thickness, for example a thickness ranging from 30 to 200 nm, is obtained.
- This coating method finds its application in particular for the production of electronic components, such as capacities ranging from 100 nF / mm 2 to 1 ⁇ F / mm 2 .
- the single figure illustrates a cross-section of a portion of a substrate having lined trench patterns and illustrating the magnitudes necessary to determine compliance factors.
- the conformity of the coating with respect to the geometry of the substrate is determined by the compliance factors (b / a) and (b / c), for which:
- - c corresponds to the thickness of the coating at half height on the side of the trench.
- the substrate is firstly cleaved after heat treatment along the desired line of observation and then the interface coating / substrate is observed by scanning electron microscopy.
- the patterns used in this example are trenches 1 ⁇ m deep, 2 ⁇ m wide and spaced 2 ⁇ m apart.
- a solution comprising a lead precursor is prepared. To do this, 751 g (1.98 mol) of lead acetate trihydrate and 330.2 g of ethylene glycol are weighed into a flask surmounted by a distillation assembly. The mixture is homogenized for 30 minutes at
- the recovered distillate has a lead concentration of the order of 2.05 mol / kg.
- a refrigerant surmounted by a desiccant is installed on the assembly.
- the mixture is refluxed for 2 hours (101 ° C.). After refluxing, the solution obtained has a concentration in mass equivalent PZT of the order of 26%.
- the solution is then stored at room temperature during its ripening phase. It is diluted after one week of curing by addition of methanol, so as to obtain a solution having a concentration of 15% by mass equivalent PZT.
- the viscosity then obtained is of the order of 3 mPa.s. Dilution stabilizes the viscosity of the solution for several months.
- the substrate is a silicon wafer 6 inches in diameter, covered with a layer of silica obtained by thermal oxidation. It is metallized by sputtering with a platinum layer with a thickness of the order of 100 nm.
- the surface of the wafer has relief patterns of the trench type, the depth of which is 1 ⁇ m and the width is of the order of one micrometer.
- the diluted solution prepared beforehand is deposited by soaking-withdrawal on the wafer. More specifically, the wafer, whose back side has been protected by an adhesive film, is placed one minute in the sol-gel solution and then removed at a shrinkage speed adjusted between 2 and 10 cm. . min "1 Once the wafer is removed from the treatment bath, it is subjected to a heat treatment
- This heat treatment comprises the following steps:. a first step called" prepyrolysis "of heating the wafer on a hotplate for a time ranging from 2 to 10 min at a temperature of 50 ° C., this step being intended to reduce the drying time compared with a conventional drying at ambient temperature, a pyrolysis step at a temperature of 36 ° C.
- a relaxation step at a temperature of 39O 0 C for a period ranging from 10 to 20 minutes intended to allow relaxation of the stresses generated during removal of the PZT film;
- a densification step at a temperature of 600 ° C. for a period ranging from 5 to 10 minutes intended to crystallize the film in a perovskite phase.
- the deposition / substrate interface is observed by scanning electron microscopy. For this, the sample is cleaved after heat treatment along the desired line of observation.
- the thickness of the coating was evaluated at 90 nm with compliance factors (b / a) equal to 1.4 and (b / c) equal to 1.3.
- the patterns used in this example are trenches 1 ⁇ m deep, 2 ⁇ m wide and spaced 2 ⁇ m apart.
- a solution comprising a lead precursor is prepared. To do this, 751 g (1.98 mol) of lead acetate trihydrate and 330.2 g of ethylene glycol are weighed into a flask surmounted by a distillation assembly. The mixture is homogenized for 30 minutes at 70 ° C. so as to allow complete dissolution of the lead acetate. Then the temperature of the homogeneous solution is increased to dehydrate the lead precursor by distillation. During the distillation, the solution turns yellow. The recovered distillate has a lead concentration of the order of 2.05 mol / kg.
- the substrate is a silicon wafer 6 inches in diameter, covered with a layer of silica obtained by thermal oxidation. It is metallized by sputtering with a platinum layer with a thickness of the order of 100 nm.
- the surface of the wafer has relief patterns of the trench type, the depth of which is 1 ⁇ m and the width is of the order of one micrometer.
- the diluted solution prepared beforehand is filtered at 0.2 ⁇ m and is deposited by centrifugal coating on the wafer.
- the rotational speed is set to 4500 tr.min "1 After deposition, the layer subjected to the following heat treatment:.
- Prepyrolysis of heating the hot plate wafer for a period ranging from 2 to 10 min at a temperature of 50 ° C., this step being intended to reduce the drying time compared with conventional drying at room temperature;
- a pyrolysis step at a temperature of 36O 0 C for 5 to 10 minutes, this step being intended to eliminate the residues of organic compounds and to initiate the crystallization phase without trapping residues.
- the deposition followed by a heat treatment as mentioned above is repeated 6 times.
- the wafer coated with 6 layers undergoes a final heat treatment comprising:
- a relaxation step at a temperature of 39 ° C. for a duration ranging from 10 to 20 minutes, this step being intended to allow a relaxation of the stresses generated during the shrinkage of the PZT film; a densification step at a temperature of 600 0 C for 5 to 10 minutes to crystallize the film in a perovskite phase.
- the deposition / substrate interface is observed by scanning electron microscopy. For this, the sample is cleaved after heat treatment along the desired line of observation.
- the thickness of the coating was evaluated at
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Abstract
Description
PROCEDE DE REALISATION D'UN REVETEMENT A BASE D'UNE PROCESS FOR MAKING A COATING BASED ON A
CERAMIQUE OXYDE CONFORME A LA GEOMETRIE D'UN SUBSTRATOXIDE CERAMIC CONFORMING TO THE GEOMETRY OF A SUBSTRATE
PRESENTANT DES MOTIFS EN RELIEFPRESENTING REASONS FOR RELIEF
DESCRIPTIONDESCRIPTION
DOMAINE TECHNIQUETECHNICAL AREA
La présente invention a pour objet un procédé de réalisation d'un revêtement à base d'une céramique oxyde conforme à la géométrie d'un substrat présentant des motifs en relief, en particulier des motifs de taille micronique.The subject of the present invention is a process for producing a coating based on an oxide ceramic conforming to the geometry of a substrate having raised patterns, in particular micron-sized patterns.
Le domaine technique général de l'invention peut donc être défini comme celui des revêtements en céramique pour subtrat.The general technical field of the invention can therefore be defined as that of ceramic coatings for subtrate.
Les revêtements ont, par exemple, pour fonction de modifier les propriétés d'un substrat, telles que les propriétés mécaniques, les propriétés thermiques, les propriétés électriques et les propriétés chimiques, les propriétés optiques.The coatings have, for example, the function of modifying the properties of a substrate, such as the mechanical properties, the thermal properties, the electrical properties and the chemical properties, the optical properties.
Les revêtements de substrat trouvent donc leur application dans de nombreux domaines tels que la microélectronique, l'optique ou encore l'énergie. Ainsi, dans le domaine de la microélectronique, la tendance est d'aller vers des systèmes de taille de plus en plus réduite, impliquant la mise en œuvre de structures en relief pour augmenter notamment la surface active de ces structures. La réalisation de telles structures nécessite de savoir les revêtir par des couches minces céramiques, présentant généralement des propriétés diélectriques. Dans le domaine de l'énergie, en particulier celui des piles à combustible, la tendance est d'aller vers des systèmes portatifs, dont l'encombrement est de quelques millimètres et comprenant des composants dont les dimensions critiques sont de l'ordre de 0,1 à 10 μm. Leur fabrication nécessite la réalisation de revêtements sur des substrats de géométrie complexe, tels que des revêtements en LiCoO2 faisant office de cathode. Enfin, dans le domaine de l'optique, en particulier dans les systèmes photoniques, la tendance est également à la miniaturisation, notamment, des réseaux de diffraction. Ces réseaux de diffraction se présentent généralement, dans les systèmes photoniques, sous forme de tunnels présentant à leur surface des motifs de taille micronique. La réalisation de revêtements en céramique sur ces systèmes contribue généralement à apporter une meilleure résistance à ces systèmes optiques. Que ce soit dans le domaine de la microélectronique, de l'énergie et de l'optique, les revêtements en céramique se doivent de présenter une épaisseur uniforme sur les substrats sur lesquels ils sont déposés, et ce de manière à assurer une uniformité des propriétés apportées par ces revêtements.Substrate coatings therefore find application in many fields such as microelectronics, optics or energy. Thus, in the field of microelectronics, the trend is to go to systems of increasingly smaller size, involving the implementation of relief structures to increase in particular the active surface of these structures. The realization of such structures requires knowing to coat them with thin ceramic layers, generally having dielectric properties. In the field of energy, in particular that of fuel cells, the trend is to go towards portable systems, whose size is a few millimeters and including components whose critical dimensions are of the order of 0 , 1 to 10 μm. Their manufacture requires the production of coatings on substrates of complex geometry, such as LiCoO 2 coatings acting as cathodes. Finally, in the field of optics, particularly in photonic systems, the trend is also towards miniaturization, in particular of diffraction gratings. These diffraction gratings are generally in the photonic systems, in the form of tunnels having on their surface micron-sized patterns. The production of ceramic coatings on these systems generally contributes to providing better resistance to these optical systems. Whether in the field of microelectronics, energy and optics, ceramic coatings must have a uniform thickness on the substrates on which they are deposited, so as to ensure uniformity of properties. brought by these coatings.
Les procédés de dépôt de revêtement d' oxyde peuvent être classés en deux catégories : à savoir, d'une part, les procédés par voie sèche et, d'autre part, les procédés par voie humide. Par voie sèche, on distingue principalement dans la littérature, pour les dépôts de revêtements sur des substrats à motifs microniques, le dépôt chimique en phase vapeur (connu sous l'abréviation CVD pour « Chemical Vapor Déposition ») , le dépôt physique en phase vapeur (connu sous l'abréviation PVD pour « Physical Vapor Déposition ») dont une variante spécifique est l'implantation ionique.The oxide coating deposition processes can be classified into two categories: namely, dry processes and wet processes. In the dry mode, there is mainly a difference in the literature for substrates with micron units, chemical vapor deposition (known by the abbreviation CVD for "Chemical Vapor Deposition"), physical vapor deposition (known by the abbreviation PVD for "Physical Vapor Deposition") of which a variant specific is ion implantation.
Le dépôt chimique en phase vapeur est une méthode dans laquelle les composés volatils du matériau à déposer sont transformés en espèces réactives, telles que des radicaux générés par micro-ondes, par torches à plasma...etc, formant ainsi une phase vapeur, qui réagit avec le substrat chauffé, pour donner un revêtement. Les composés volatils du matériau à déposer sont éventuellement dilués dans un gaz porteur, tel que du dihydrogène . Cette méthode présente un certain nombre d'avantages parmi lesquels on peut citer une bonne sélectivité des dépôts, une bonne adaptabilité dans les chaînes de production. Toutefois, cette méthode présente les inconvénients suivants : - les revêtements obtenus sont peu denses ;Chemical vapor deposition is a method in which the volatile compounds of the material to be deposited are transformed into reactive species, such as radicals generated by microwaves, plasma torches, etc., thus forming a vapor phase, which reacts with the heated substrate to give a coating. The volatile compounds of the material to be deposited are optionally diluted in a carrier gas, such as dihydrogen. This method has a certain number of advantages among which one can cite a good selectivity of the deposits, a good adaptability in the chains of production. However, this method has the following drawbacks: the coatings obtained are not very dense;
- ils sont souvent contaminés par des gaz très réactifs issus de la réaction chimique (hydrogène, halogènes) ;they are often contaminated by very reactive gases resulting from the chemical reaction (hydrogen, halogens);
- ils présentent une mauvaise adhérence au substrat ; les revêtements présentent une mauvaise acuité au niveau des arêtes des motifs en relief.they have poor adhesion to the substrate; the coatings have poor sharpness at the edges of the relief patterns.
Une méthode plus avantageuse peut consister à réaliser les revêtements par dépôt physique en phase vapeur, tels que l' évaporation, la pulvérisation et l'ablation. Par exemple, l' évaporation consiste simplement à évaporer ou sublimer le matériau à déposer dans un creuset sous vide en le chauffant à haute température. Le matériau évaporé est déposé par condensation sur le substrat à recouvrir et une couche est formée sur le substrat. Bien que cette méthode permette d'obtenir des couches plus denses, cette méthode se révêle être difficile à mettre en œuvre, de par l'appareillage à utiliser, et de coût élevé, et n'assure pas une épaisseur de couches uniforme sur des substrats présentant des motifs en relief.A more advantageous method may be to achieve physical vapor deposition coatings, such as evaporation, spraying and ablation. For example, evaporation consists of simply to evaporate or sublimate the material to be deposited in a vacuum crucible by heating it at high temperature. The evaporated material is deposited by condensation on the substrate to be coated and a layer is formed on the substrate. Although this method makes it possible to obtain denser layers, this method proves to be difficult to implement, because of the apparatus to be used, and of high cost, and does not ensure uniform layer thickness on substrates. with raised patterns.
En résumé, que ce soit par CVD ou PVD, les revêtements sur des substrats présentant des motifs de taille micronique obtenus par ces techniques ne présentent pas une épaisseur uniforme sur toute la longueur de dépôt et présentent, en particulier, des surépaisseurs au niveau des arêtes des motifs en relief. Ceci peut engendrer, lorsque les substrats ainsi revêtus sont destinés à être utilisés comme composants électroniques, des variations de capacité ainsi que des risques de claquage au niveau des arêtes des motifs en relief.In summary, whether by CVD or PVD, the coatings on substrates having micron-size patterns obtained by these techniques do not have a uniform thickness over the entire deposition length and, in particular, have excess thicknesses at the edges. patterns in relief. This can cause, when the substrates thus coated are intended to be used as electronic components, capacity variations as well as risks of breakdown at the edges of the raised patterns.
Certains auteurs ont utilisé le procédé sol- gel pour constituer des solutions de dépôt pour des substrats présentant des motifs en relief (Journal of the European Ceramic Society, 199, 18(3), p.255-260Some authors have used the sol-gel process to form deposition solutions for substrates with raised patterns (Journal of the European Ceramic Society, 199, 18 (3), p.255-260
[1] ; Journal of Materials Research, 2003, 18(5) ; p.1259-1265 [2]). Toutefois, il s'agit dans ces documents de réaliser des moulages (c'est-à-dire l'empreinte négative) du substrat et en aucun cas de réaliser un revêtement d'épaisseur uniforme épousant la forme du substrat. II existe ainsi un véritable besoin concernant un procédé de réalisation d'un revêtement conforme à la géométrie d'un substrat présentant des motifs en relief, qui ne présente pas les inconvénients rencontrés dans l'art antérieur avec les techniques par voie sèche.[1] Journal of Materials Research, 2003, 18 (5); p.1259-1265 [2]). However, it is in these documents to make moldings (that is to say the negative impression) of the substrate and in no case to achieve a coating of uniform thickness conforming to the shape of the substrate. There is thus a real need for a method of producing a coating conforming to the geometry of a substrate having patterns in relief, which does not have the disadvantages encountered in the prior art with dry techniques.
EXPOSÉ DE L'INVENTIONSTATEMENT OF THE INVENTION
Le but de l'invention est atteint par un procédé de réalisation d'un revêtement en céramique oxyde conforme à la géométrie d'un substrat présentant des motifs en relief comprenant :The object of the invention is achieved by a method of producing an oxide ceramic coating conforming to the geometry of a substrate having relief patterns comprising:
- une étape de dépôt sur ledit substrat d'une couche de solution sol-gel précurseur de ladite céramique ; - une étape de traitement thermique de ladite couche en vue de la transformer en ladite céramique ; lesdites étapes étant éventuellement répétées une ou plusieurs fois, caractérisé en ce que la solution sol-gel précurseur de ladite céramique est préparée par un procédé comprenant successivement les étapes suivantes : a) préparer une première solution par mise en contact du ou des précurseurs moléculaires de métaux et/ou métalloïdes destinés à entrer dans la constitution de la céramique avec un milieu comprenant un solvant comprenant au moins deux fonctions -OH et éventuellement un monoalcool aliphatique ; b) mettre au repos la solution obtenue en a) pendant un temps suffisant nécessaire à l'obtention d'une solution présentant une viscosité sensiblement constante ; c) diluer à un taux prédéterminé la solution obtenue en b) avec un solvant identique à celui de l'étape a) ou un solvant miscible avec le solvant utilisé dans l'étape a) mais différent de celui-ci .a step of depositing on said substrate a sol-gel solution layer precursor of said ceramic; a step of heat treatment of said layer in order to transform it into said ceramic; said steps being optionally repeated one or more times, characterized in that the precursor sol-gel solution of said ceramic is prepared by a process comprising successively the following steps: a) preparing a first solution by contacting the molecular precursor (s) with metals and / or metalloids intended to enter the constitution of the ceramic with a medium comprising a solvent comprising at least two -OH functions and optionally an aliphatic monoalcohol; (b) put at rest the solution obtained in (a) for a sufficient time necessary to obtain a solution having a substantially constant viscosity; c) diluting at a predetermined rate the solution obtained in b) with a solvent identical to that of step a) or a solvent miscible with the solvent used in step a) but different from this.
Selon l'invention, par solvant miscible, on entend, un solvant qui peut se mélanger au solvant comprenant au moins deux fonctions -OH et le cas échéant au monolalcool aliphatique en formant un mélange homogène, et ceci en toutes proportions à température ambiante, c'est-à-dire à une température de l'atmosphère environnante, généralement comprise entre 20 et 250C.According to the invention, the term "miscible solvent" means a solvent which can be mixed with the solvent comprising at least two -OH functions and, where appropriate, with the aliphatic monolalcohol, forming a homogeneous mixture, and this in all proportions at room temperature, that is to say at a temperature of the surrounding atmosphere, generally between 20 and 25 ° C.
Le procédé de l'invention, mettant en œuvre la technologie sol-gel pour constituer la solution de dépôt, présente les avantages suivants :The method of the invention, implementing sol-gel technology to form the deposition solution, has the following advantages:
- il permet de réaliser des revêtements sur des surfaces complexes de tailles diverses et sans nécessiter d'équipement lourd ;it makes it possible to produce coatings on complex surfaces of various sizes and without the need for heavy equipment;
- il permet d'obtenir des dépôts homogènes en composition;it makes it possible to obtain homogeneous deposits in composition;
- du fait que le mélange des espèces se déroule à l'échelle moléculaire, il est possible de réaliser facilement par ce procédé des oxydes complexes comportant, par exemple, trois éléments ou plus et de contrôler la stoechiométrie .since the mixture of species takes place on a molecular scale, complex oxides comprising, for example, three or more elements and controlling stoichiometry can be easily produced by this process.
De plus, le procédé de l'invention permet avantageusement d'obtenir des revêtements conformes à la géométrie du substrat, c'est-à-dire des revêtements présentant une épaisseur sensiblement uniforme sur toute la longueur de dépôt grâce notamment aux propriétés de stabilité de la solution sol-gel obtenue préalablement au dépôt.In addition, the method of the invention advantageously makes it possible to obtain coatings which comply with the geometry of the substrate, that is to say coatings having a substantially uniform thickness over the entire deposition length, in particular thanks to the stability properties of the sol-gel solution obtained prior to deposition.
Selon l'invention, les céramiques oxydes constituant le revêtement peuvent être choisies parmi les oxydes à structure pérovskite tels que le zircono- titanate de plomb (connu sous l'abréviation PZT), le titanate de baryum, le titanate de baryum et de strontium (connu sous l'abréviation BST), le titanate de plomb, de niobium et de zinc (connu sous l'abréviation PZNT), le niobate de zinc et de plomb (connu sous l'abréviation PZN), le niobate de magnésium et de plomb (connu sous l'abréviation PMN), le titanate de plomb (connu sous l'abréviation PT), le niobate de potassium et de calcium, le titanate de bismuth et de potassium (connu sous l'abréviation BKT), le titanate de bismuth et de strontium (connu sous l'abréviation SBT) , le tantalate de potassium (connu sous l'abréviation KLT), les solutions solides de PMN et PT.According to the invention, the oxide ceramics constituting the coating may be chosen from oxides with a perovskite structure such as lead zircono- titanate (known by the abbreviation PZT), barium titanate, barium titanate and strontium ( known as BST), lead titanate, niobium and zinc (known as PZNT), zinc and lead niobate (known as PZN), magnesium niobate and lead (known as PMN), lead titanate (known as PT), potassium potassium niobate, bismuth potassium titanate (known as BKT), bismuth titanate and strontium (known by the abbreviation SBT), potassium tantalate (known as KLT), solid solutions of PMN and PT.
Les céramiques oxydes constituant le revêtement peuvent être également choisies parmi les oxydes simples, tels que SiO2, HfO2, ZrO2, Al2O3 et Ta2O5.The oxide ceramics constituting the coating may also be chosen from simple oxides, such as SiO 2 , HfO 2 , ZrO 2 , Al 2 O 3 and Ta 2 O 5 .
Ainsi, le procédé de l'invention comprend, la préparation d'une solution sol-gel stable. Cette préparation comprend, dans un premier temps, la mise en contact d'un ou plusieurs précurseurs moléculaires de métaux et/ou métalloïdes destinés à entrer dans la constitution de la céramique avec un milieu comprenant un solvant comprenant au moins deux fonctions -OH et éventuellement un monoalcool aliphatique.Thus, the process of the invention comprises the preparation of a stable sol-gel solution. This preparation comprises, in a first step, bringing into contact one or more molecular precursors of metals and / or metalloids intended to enter the constitution of the ceramic with a medium comprising a solvent comprising at least two -OH functions and optionally an aliphatic monoalcohol.
Le métal peut être choisi dans un groupe constitué par les métaux alcalins, tels que K, les métaux alcalino-terreux, tels que Mg, les métaux de transition, les métaux lanthanides et les métaux dits post-transitionnels des colonnes IIIA et IVA de la classification périodique des éléments. Les métaux de transition peuvent être choisis parmi Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Cd, Hf, Ta, W, Re, Os, Ir, Pt. Les métaux lanthanides peuvent être choisis parmi La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Er, Yb. Les métaux post-transitionnels peuvent être choisis parmi les éléments du groupe IIIA Al, Ga, In et Tl et les éléments du groupe IVA Ge, Sn et Pb.The metal may be selected from the group consisting of alkali metals, such as K, alkaline earth metals, such as Mg, transition metals, lanthanide metals and post-transition metals of columns IIIA and IVA of periodic classification of the elements. The transition metals can be selected from Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Cd, Hf, Ta, W, Re, Os, Ir, Pt. The lanthanide metals can be selected from La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Er, Yb. The post-transition metals can be chosen from the elements of group IIIA Al, Ga, In and T1 and the elements of group IVA Ge, Sn and Pb.
Les métalloïdes peuvent être choisis parmi Si, Se, Te.The metalloids can be selected from Si, Se, Te.
Les précurseurs moléculaires de métal et/ou de métalloïde peuvent se présenter sous forme de sels inorganiques de métal ou métalloïde tels que des halogénures (fluorures, chlorures, bromures, iodures) , des nitrates ou des oxalates. Les précurseurs moléculaires de métal et/ou de métalloïde peuvent se présenter également sous forme de composés organométalliques de métal ou métalloïde, tels que des alcoxydes répondant à la formule (RO)nM, dans laquelle M désigne le métal ou le métalloïde, n représente le nombre de ligands liés à M, ce nombre correspondant également à la valence de M et R représente un groupe alkyle, linéaire ou ramifié, pouvant comporter de 1 à 10 atomes de carbone ou un groupe aromatique comprenant de 4 à 14 atomes de carbone, tel qu'un groupe phényle. Les précurseurs moléculaires de métal ou de métalloïde peuvent se présenter également sous forme de composés organométalliques de formule : dans laquelle : - M représente un métal ou un métalloïde ;The molecular precursors of metal and / or metalloid may be in the form of inorganic metal or metalloid salts such as halides (fluorides, chlorides, bromides, iodides), nitrates or oxalates. The molecular precursors of metal and / or metalloid may also be in the form of organometallic compounds of metal or metalloid, such as alkoxides having the formula (RO) n M, wherein M denotes the metal or metalloid, n represents the number of ligands bound to M, this number also corresponding to the valence of M and R represents a linear or branched alkyl group which may contain from 1 to 10 carbon atoms or an aromatic group comprising from 4 to 14 carbon atoms, such as a phenyl group. The molecular precursors of metal or metalloid may also be in the form of organometallic compounds of formula: in which: M represents a metal or a metalloid;
- X représente un groupe hydrolysable choisi parmi les groupes halogène, acrylate, acétoxy, acyle, OR' avec R' représentant un groupe alkyle, linéaire ou ramifié, pouvant comporter de 1 à 10 atomes de carbone ou un groupe aromatique comprenant de 4 à 14 atomes de carbone, tel qu'un groupe phényle ;X represents a hydrolyzable group chosen from halogen, acrylate, acetoxy and acyl groups, OR 'with R' representing a linear or branched alkyl group, which may comprise from 1 to 10 carbon atoms or an aromatic group comprising from 4 to 14; carbon atoms, such as a phenyl group;
- R1 représente un groupe non hydrolysable choisi parmi les groupes alkyles, linéaires ou ramifiés, pouvant comprendre de 1 à 10 atomes de carbone, éventuellement perfluorés, les groupes aromatiques pouvant comprendre de 4 à 14 atomes de carbone ; y et z sont des entiers choisis de manière à ce que (y+z) soit égale à la valence M. En plus des précurseurs moléculaires susmentionnés, la première solution de l'étape a) peut contenir, en outre, un ou plusieurs composés polymérisables, tels que des monomères éthyléniques, comme le styrène. Ainsi, lorsque le revêtement que l'on veut réaliser est un revêtement en PZT, les précurseurs moléculaires à utiliser pour la préparation des solutions sol-gel sont respectivement des précurseurs moléculaires de plomb, des précurseurs moléculaires de zirconium et des précurseurs moléculaires de titane. A titre d'exemple, on peut utiliser comme précurseur de plomb des sels organiques de plomb tels que des acétates, des sels minéraux de plomb tels que des chlorures ou encore des composés organométalliques du plomb comme des alcoolates comportant un nombre d'atomes de carbone allant de 1 à 4. De préférence, le précurseur de plomb utilisé est un sel organique hydraté tel que l'acétate de plomb trihydraté. Ce précurseur présente l'avantage d'être stable, très courant et bon marché. Toutefois, lors de l'utilisation d'un tel précurseur hydraté, il est préférable de procéder à une déshydratation de ce dernier. En effet, la présence d'eau lors du mélange des solutions sol-gel entre eux peut entraîner une hydrolyse prématurée des précurseurs métalliques suivie d'une polymérisation et donc une solution sol-gel instable dans le temps.- R 1 represents a non-hydrolyzable group selected from alkyl groups, linear or branched, which may comprise from 1 to 10 carbon atoms, optionally perfluorinated, the aromatic groups may comprise from 4 to 14 carbon atoms; y and z are integers selected so that (y + z) is equal to valence M. In addition to the aforementioned molecular precursors, the first solution of step a) may contain, in addition, one or more compounds polymerizable, such as ethylenic monomers, such as styrene. Thus, when the coating that one wants to achieve is a PZT coating, the precursors The molecular molecules to be used for the preparation of the sol-gel solutions are respectively lead molecular precursors, zirconium molecular precursors and titanium molecular precursors. By way of example, organic lead salts such as acetates, lead inorganic salts such as chlorides or organometallic compounds of lead such as alkoxides containing a number of carbon atoms may be used as lead precursors. ranging from 1 to 4. Preferably, the lead precursor used is a hydrated organic salt such as lead acetate trihydrate. This precursor has the advantage of being stable, very common and cheap. However, when using such a hydrated precursor, it is preferable to dehydrate the latter. In fact, the presence of water during the mixing of the sol-gel solutions with one another can lead to premature hydrolysis of the metal precursors followed by polymerization and thus to a sol-gel solution that is unstable over time.
Par exemple, la déshydratation de l'acétate de plomb trihydraté peut s'effectuer par distillation de ce dernier dans le solvant comprenant au moins deux fonctions -OH utilisé pour effectuer le mélange des solutions sol-gel.For example, the dehydration of the lead acetate trihydrate can be carried out by distillation of the latter in the solvent comprising at least two -OH functions used to effect the mixing of the sol-gel solutions.
De préférence, les précurseurs de titane sont des alcoxydes, tels que l' isopropoxyde de titane. De même, les précurseurs de zirconium sont préférablement des alcoxydes, tels que le n-propoxyde de zirconium. Lorsque que le revêtement que l'on veut obtenir est un revêtement en BST, les précurseurs moléculaires à utiliser pour la préparation de la solution sol-gel sont respectivement des précurseurs moléculaires de baryum, des précurseurs moléculaires de strontium et des précurseurs moléculaires de titane.Preferably, the titanium precursors are alkoxides, such as titanium isopropoxide. Likewise, zirconium precursors are preferably alkoxides, such as zirconium n-propoxide. When the coating to be obtained is a BST coating, the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of barium, molecular precursors of strontium and molecular precursors of titanium.
Lorsque que le revêtement que l'on veut obtenir est un revêtement en PZNT, les précurseurs moléculaires à utiliser pour la préparation de la solution sol-gel sont respectivement des précurseurs moléculaires de plomb, des précurseurs moléculaires de zirconium, des précurseurs moléculaires de niobium et des précurseurs moléculaires de titane.When the coating that is to be obtained is a PZNT coating, the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of lead, zirconium molecular precursors, molecular precursors of niobium and molecular precursors of titanium.
Lorsque que le revêtement que l'on veut obtenir est un revêtement en PMN, les précurseurs moléculaires à utiliser pour la préparation de la solution sol-gel sont respectivement des précurseurs moléculaires de plomb, des précurseurs moléculaires de magnésium, des précurseurs moléculaires de niobium. Lorsque que le revêtement que l'on veut obtenir est un revêtement en PT, les précurseurs moléculaires à utiliser pour la préparation de la solution sol-gel sont respectivement des précurseurs moléculaires de plomb, des précurseurs moléculaires de titane.When the coating that is to be obtained is a PMN coating, the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of lead, molecular precursors of magnesium, and molecular precursors of niobium. When the coating that is to be obtained is a PT coating, the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of lead, molecular precursors of titanium.
Lorsque que le revêtement que l'on veut obtenir est un revêtement en BKT, les précurseurs moléculaires à utiliser pour la préparation de la solution sol-gel sont respectivement des précurseurs moléculaires de bismuth, des précurseurs moléculaires de potassium, des précurseurs moléculaires de titane. Lorsque que le revêtement que l'on veut obtenir est un revêtement en SBT, les précurseurs moléculaires à utiliser pour la préparation de la solution sol-gel sont respectivement des précurseurs moléculaires de strontium, des précurseurs moléculaires de bismuth, des précurseurs moléculaires de titane.When the coating that is to be obtained is a BKT coating, the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of bismuth, molecular precursors of potassium, and titanium molecular precursors. When the coating that is to be obtained is a coating of SBT, the molecular precursors to be used for the preparation of the sol-gel solution are respectively molecular precursors of strontium, molecular precursors of bismuth, molecular precursors of titanium.
Lorsque le revêtement que l'on veut obtenir est un revêtement en SiO2, HfO2, Ta2O5, ZrO2 ou Al2O3, les précurseurs moléculaires à utiliser pour la préparation de la solution sol-gel sont respectivement des précurseurs moléculaires de silicium, de hafnium, de tantale, de zirconium ou d'aluminium.When the coating that is to be obtained is a coating of SiO 2 , HfO 2 , Ta 2 O 5 , ZrO 2 or Al 2 O 3 , the molecular precursors to be used for the preparation of the sol-gel solution are precursors, respectively. silicon, hafnium, tantalum, zirconium or aluminum.
Les précurseurs tels que mentionnés ci- dessus sont mis en contact avec un milieu comprenant un solvant comprenant au moins deux fonctions -OH et éventuellement un monoalcool aliphatique.The precursors as mentioned above are brought into contact with a medium comprising a solvent comprising at least two -OH functions and optionally an aliphatic monoalcohol.
Le solvant comprenant au moins deux fonctions -OH utilisé dans l'étape a) et éventuellement c) peut être un alkylène glycol, ayant un nombre d'atomes de carbone allant de 2 à 5. Ce type de solvant contribue à faciliter la solubilisation des précurseurs et, de plus, joue un rôle d'agent stabilisant de la solution sol-gel. Un solvant comprenant au moins deux fonctions -OH pouvant être utilisé est l'éthylène glycol ou encore la diéthanolamine .The solvent comprising at least two -OH functions used in step a) and optionally c) may be an alkylene glycol having a number of carbon atoms ranging from 2 to 5. This type of solvent contributes to facilitating the solubilization of precursors and, in addition, acts as a stabilizing agent of the sol-gel solution. A solvent comprising at least two -OH functions that can be used is ethylene glycol or even diethanolamine.
En complément du solvant comprenant au moins deux fonctions -OH, le milieu de l'étape a) peut comprendre également un monoalcool aliphatique, pouvant, par exemple, comprendre de 1 à 6 atomes de carbone. Un monoalcool aliphatique comprenant de 1 à 6 atomes de carbone peut être également utilisé comme solvant de dilution dans l'étape c) . A titre d'exemple de monoalcool aliphatique, on peut citer le n-propanol. La mise en contact des précurseurs moléculaires avec le milieu comprenant un solvant comprenant au moins deux fonctions -OH peut se faire de différentes façons et dépendra de la nature des précurseurs, l'essentiel étant d'obtenir une solution sol-gel d'aspect homogène.In addition to the solvent comprising at least two -OH functions, the medium of step a) may also comprise an aliphatic monoalcohol, which may, for example, comprise from 1 to 6 carbon atoms. An aliphatic monoalcohol comprising from 1 to 6 carbon atoms can also be used as dilution solvent in step c). As an example of an aliphatic monoalcohol, mention may be made of n-propanol. The contacting of the molecular precursors with the medium comprising a solvent comprising at least two -OH functions can be carried out in different ways and will depend on the nature of the precursors, the essential point being to obtain a sol-gel solution of homogeneous appearance. .
Par exemple, lorsque la solution sol-gel est précurseur d'une céramique PZT, la mise en contact peut consister à préparer une première solution sol-gel à base de plomb dans un solvant diol, par dissolution d'un précurseur moléculaire à base de plomb dans ce solvant diol, auquel on ajoute une deuxième solution sol-gel mixte à base de titane et de zirconium, ladite solution sol-gel mixte pouvant être préparée par dissolution d'un précurseur moléculaire à base de zirconium et d'un précurseur moléculaire à base de titane dans le même diol ou dans un solvant compatible avec ledit diol, à savoir un solvant miscible avec ledit diol, comme c'est le cas des monoalcools aliphatiques tels que le propanol. On précise, que la solution sol-gel à base de plomb est, de préférence, initialement en excès de 10 % par rapport à la stoechiométrie . Le mélange desdites solutions sol-gel peut être ensuite porté à reflux, sous agitation, à une température avoisinant la température d'ébullition du mélange réactionnel. Le reflux permet d'assurer, avantageusement, une homogénéisation des solutions sol- gel mélangés entre elles. Une fois la solution sol-gel obtenue à l'issue de l'étape a), la solution sol-gel est mise au repos, conformément à l'invention, pendant un temps adéquat jusqu'à obtention d'une solution présentant une viscosité sensiblement constante. Généralement, l'étape b) est réalisée, de préférence, à température ambiante, par exemple, pendant une durée pouvant s'échelonner d'une semaine à 4 mois. Pendant cette phase dite de mûrissement, les précurseurs de métaux et/ou de métalloïdes solubilisés condensent jusqu'à un état d'équilibre. Cette condensation se traduit par une augmentation de la viscosité de la solution sol-gel, jusqu'à atteindre une valeur sensiblement constante en fonction du temps, lorsque l'état d'équilibre est atteint. En pratique, la solution préparée en a) est placée au repos, généralement, à température ambiante et en l'absence de tout chauffage. Parallèlement, la viscosité de la solution est mesurée à intervalles réguliers. Une fois que celle-ci présente une viscosité sensiblement constante, atteinte généralement au bout d'une période allant de 1 semaine à 4 mois, la solution est diluée selon un taux prédéterminé de dilution (étape c) . Ce taux de dilution sera choisi par l'homme du métier selon l'utilisation envisagée de la solution sol-gel, et notamment selon l'épaisseur de revêtement souhaité après dépôt et traitement d'une telle solution sur un substrat et également selon la technique de dépôt .For example, when the sol-gel solution is a precursor of a PZT ceramic, the bringing into contact may consist in preparing a first sol-gel solution based on lead in a diol solvent, by dissolving a molecular precursor based on lead in this diol solvent, to which is added a second mixed sol-gel solution based on titanium and zirconium, said mixed sol-gel solution being prepared by dissolving a molecular precursor based on zirconium and a molecular precursor based on titanium in the same diol or in a solvent compatible with said diol, namely a solvent miscible with said diol, as is the case of aliphatic monoalcohols such as propanol. It is specified that the lead sol-gel solution is preferably initially in excess of 10% with respect to the stoichiometry. The mixture of said sol-gel solutions can then be refluxed, with stirring, at a temperature close to the boiling temperature of the reaction mixture. Reflux makes it possible, advantageously, to homogenize the sol-gel solutions mixed with each other. Once the sol-gel solution obtained at the end of step a), the sol-gel solution is quenched, in accordance with the invention, for a suitable time until a solution having a viscosity is obtained. substantially constant. Generally, step b) is preferably carried out at room temperature, for example, for a period ranging from one week to 4 months. During this so-called ripening phase, the precursors of solubilized metals and / or metalloids condense to a state of equilibrium. This condensation results in an increase in the viscosity of the sol-gel solution, until reaching a substantially constant value as a function of time, when the equilibrium state is reached. In practice, the solution prepared in a) is placed at rest, generally at room temperature and in the absence of any heating. In parallel, the viscosity of the solution is measured at regular intervals. Once it has a substantially constant viscosity, usually reached after a period of 1 week to 4 months, the solution is diluted at a predetermined rate of dilution (step c). This dilution rate will be chosen by those skilled in the art according to the envisaged use of the sol-gel solution, and in particular according to the desired coating thickness after deposition and treatment of such a solution on a substrate and also according to the technique. deposit .
Cette dilution peut consister à diluer la solution sol-gel obtenue à l'issue de l'étape b) par un facteur de dilution s' échelonnant de 1 à 20. Selon l'invention, le solvant de dilution doit être miscible avec le solvant de préparation de la solution de l'étape a) . Il peut être identique au solvant comprenant au moins deux fonctions -OH de préparation de la solution sol-gel de l'étape a) ou être un autre solvant comprenant au moins deux fonctions -OH. Cette alternative, consistant à utiliser un solvant comprenant au moins deux fonctions -OH identique ou différent de celui utilisé dans le cadre de l'étape a), est notamment choisie préférentiellement , lorsque la technique de dépôt est l'enduction centrifuge. Des exemples de solvants comprenant au moins deux fonctions -OH envisageables sont l'éthylène glycol, le propylène glycol. Le solvant peut être différent d'un solvant utilisé dans l'étape a) et choisi par exemple, parmi les solvants présentant une viscosité plus faible que celle du solvant utilisée dans l'étape a). Des solvants répondant à cette spécification sont, par exemple, des monoalcools aliphatiques comprenant de 1 à 6 atomes de carbone tels que définis ci-dessus. En particulier, il est avantageux d'utiliser, comme solvant de dilution, un solvant présentant une viscosité plus faible que celle du solvant utilisé dans l'étape a), afin d'obtenir des revêtements conformes, lorsque la technique de dépôt utilisée est le trempage-retrait.This dilution may consist in diluting the sol-gel solution obtained after step b) by a dilution factor ranging from 1 to 20. According to the invention, the dilution solvent must be miscible with the solvent for preparing the solution of step a). It may be identical to the solvent comprising at least two -OH functions for preparing the sol-gel solution of step a) or be another solvent comprising at least two -OH functions. This alternative, consisting of using a solvent comprising at least two -OH functions identical to or different from that used in the context of step a), is especially preferably chosen, when the deposition technique is spin coating. Examples of solvents comprising at least two possible OH functions are ethylene glycol and propylene glycol. The solvent may be different from a solvent used in step a) and chosen, for example, from solvents having a lower viscosity than that of the solvent used in step a). Solvents corresponding to this specification are, for example, aliphatic monoalcohols comprising from 1 to 6 carbon atoms as defined above. In particular, it is advantageous to use, as a diluting solvent, a solvent having a lower viscosity than that of the solvent used in step a), in order to obtain conformal coatings, when the deposition technique used is the dip coating.
Une fois préparée, la solution sol-gel est déposée sur un substrat sous forme d'une couche.Once prepared, the sol-gel solution is deposited on a substrate in the form of a layer.
Ce dépôt peut être effectué par toute technique permettant d'obtenir un dépôt sous forme de couches minces. Les épaisseurs de couches minces déposées, selon l'invention, peuvent aller de 1 à 500 nm.This deposit can be performed by any technique to obtain a deposit in the form of thin layers. The thicknesses of thin layers deposited, according to the invention, can range from 1 to 500 nm.
Le dépôt peut se faire selon l'une des techniques suivantes : - le trempage-retrait (connu sous la terminologie anglaise « dip-coating ») ;The deposition can be done according to one of the following techniques: - soaking-withdrawal (known under the English terminology "dip-coating");
- l'enduction centrifuge (connue sous la terminologie anglaise « spin-coating ») ; l'enduction laminaire (connue sous la terminologie anglaise « laminar-flow-coating ou meniscus coating ») ; la pulvérisation (connue sous la terminologie anglaise « spray-coating ») ;centrifugal coating (known under the terminology "spin-coating"); laminar coating (known under the terminology "laminar-flow-coating or meniscus coating"); spraying (known under the terminology "spray-coating");
Toutefois, de préférence, le dépôt sera réalisé par la technique du trempage-retrait (appelée communément « dip-coating » en anglais) ou encore par la technique de l'enduction centrifuge (appelée communément « spin-coating » en anglais) . Ces techniques facilitent, notamment, un contrôle précis des épaisseurs de couches déposées.However, preferably, the deposition will be achieved by the technique of soaking-withdrawal (commonly called "dip-coating" in English) or by the technique of spin coating (commonly called "spin-coating" in English). These techniques facilitate, in particular, precise control of the thicknesses of deposited layers.
En ce qui concerne la technique de trempage-retrait, le substrat est plongé dans la solution sol-gel préparée préalablement puis retiré à une vitesse appropriée pour obtenir un dépôt conforme, tel que défini ci-dessus. L'avantage de cette technique est que plusieurs substrats peuvent être traités en même temps, ce qui permet un gain de productivité. En ce qui concerne la technique de l'enduction centrifuge, le substrat destiné au dépôt est plaqué sur un support tournant. Ensuite, l'on dépose un volume de solution sol-gel permettant de recouvrir ledit substrat. La force centrifuge étale ladite solution sous forme d'une couche mince. L'épaisseur de la couche est notamment fonction de la vitesse de centrifugation et de la concentration de la solution. Le paramètre de la concentration de la solution étant fixé, l'homme du métier peut aisément choisir une vitesse de centrifugation voulue pour une épaisseur de couche désirée. Comme mentionné plus haut, dans le cas de l'utilisation de la technique d'enduction centrifuge, le solvant de dilution utilisée dans l'étape c) sera, de préférence, un solvant comprenant au moins deux fonctions -OH identique à celui utilisé dans l'étape a) ou éventuellement un autre solvant comprenant au moins deux fonctions -OH.With regard to the soaking-shrinking technique, the substrate is immersed in the sol-gel solution prepared beforehand and then removed at a suitable speed to obtain a conformal deposit, as defined above. The advantage of this technique is that several substrates can be processed at the same time, which allows a gain in productivity. With regard to the technique of the centrifugal coating, the substrate for depositing is plated on a rotating support. Then, a volume of sol-gel solution is deposited to cover said substrate. The centrifugal force spreads said solution in the form of a thin layer. The thickness of the layer is in particular a function of the centrifugation speed and the concentration of the solution. Since the parameter of the concentration of the solution is fixed, the person skilled in the art can easily choose a desired centrifugation speed for a desired layer thickness. As mentioned above, in the case of the use of the centrifugal coating technique, the dilution solvent used in step c) will preferably be a solvent comprising at least two -OH functions identical to that used in step a) or optionally another solvent comprising at least two -OH functions.
Selon l'invention, le substrat destiné au dépôt est un substrat comportant des motifs en relief, par exemple de taille micrométrique. On précise que, par motifs de taille micrométrique, on entend, généralement, des motifs en relief présentant des dimensions (telles que la hauteur, la largeur) allant de 1 à 100 μm, ces motifs étant espacées également d'une distance allant de 1 à 100 μm.According to the invention, the substrate for depositing is a substrate comprising raised patterns, for example of micrometric size. It is specified that, by micrometric size patterns, is generally meant relief patterns having dimensions (such as height, width) ranging from 1 to 100 microns, these patterns being spaced equally by a distance of 1 at 100 μm.
Ces motifs en relief peuvent se présenter notamment sous forme de tranchées, par exemple de forme parallélépipédique, présentant, par exemple, une profondeur, une hauteur et un espacement de taille micrométriques. Ce substrat peut se présenter sous forme d'une tranche (ou wafer) de silicium, recouverte éventuellement d'une couche de métallisation, lorsque le domaine d'application est la microélectronique.These relief patterns may be in particular in the form of trenches, for example of parallelepipedal shape, having, for example, a depth, a height and a size spacing micrometric. This substrate may be in the form of a silicon wafer, optionally covered with a metallization layer, when the application domain is microelectronics.
Une fois que le dépôt de la solution sol- gel est effectué sur une face du substrat, le procédé de l'invention comprend un traitement thermique de la ou les couches déposées, de manière à les transformer en la céramique souhaitée. Ce traitement thermique peut se dérouler de différentes manières, selon que le procédé de l'invention comprend le dépôt d'une ou plusieurs couches.Once the deposition of the sol-gel solution is carried out on one side of the substrate, the method of the invention comprises a heat treatment of the deposited layer (s) so as to transform them into the desired ceramic. This heat treatment can take place in different ways, depending on whether the method of the invention comprises the deposition of one or more layers.
De manière générale, ce traitement thermique comprend :In general, this heat treatment comprises:
- une étape de séchage de chaque couche déposée, de façon à gélifier la couche et éventuellement à éliminer une partie du solvant ;a step of drying each layer deposited, so as to gel the layer and optionally to remove a part of the solvent;
- éventuellement, une étape de pyrolyse de chaque couche déposée, de façon à éliminer les composés organiques de la couche ;optionally, a step of pyrolysis of each layer deposited, so as to remove the organic compounds from the layer;
- éventuellement, une étape de relaxation de chaque couche déposée, de façon à éliminer les contraintes générées lors du rétreint de la couche ; - éventuellement une étape de densification de la couche ou de l'ensemble des couches déposées.- Optionally, a relaxation step of each deposited layer, so as to eliminate the stresses generated during the shrinkage of the layer; possibly a step of densification of the layer or set of deposited layers.
Le traitement thermique peut se limiter à une simple étape de séchage, si celle-ci suffit pour obtenir une céramisation de la couche. C'est notamment le cas des couches en oxyde simple, tel que SiO2, HfO2, Ta2O5, ZrO2 ou Al2O3. Pour les couches à base d' oxydes de structure pérovskite, le traitement thermique nécessite généralement une étape de séchage, une étape de pyrolyse, une étape de relaxation et une étape de densification .The heat treatment can be limited to a simple drying step, if it is sufficient to obtain a ceramization of the layer. This is particularly the case of single oxide layers, such as SiO 2 , HfO 2 , Ta 2 O 5 , ZrO 2 or Al 2 O 3 . For oxide layers of perovskite structure, the heat treatment generally requires a drying step, a pyrolysis step, a relaxation step and a densification step.
Ainsi, chaque couche de solution déposée subit, selon l'invention, une étape consistant en une étape de séchage de la couche déposée de manière à assurer une gélification de la couche. Cette étape est destinée à assurer l' évaporation d'une partie du solvant de l'étape a) et d'une partie du solvant de dilution et éventuellement des produits secondaires, tels que des esters, issus des réactions entre les précurseurs métalliques. A l'issue de cette étape, la solution sol-gel déposée est transformée en une couche de gel d'épaisseur constante adhérant à la surface du substrat. La température et la durée efficaces pour assurer la gélification peuvent être déterminées aisément, par l'homme du métier, à l'aide, par exemple, de techniques de spectrométrie UV-visible.Thus, each deposited solution layer undergoes, according to the invention, a step consisting of a step of drying the deposited layer so as to ensure gelation of the layer. This step is intended to ensure the evaporation of part of the solvent of step a) and a part of the dilution solvent and optionally secondary products, such as esters, resulting from the reactions between the metal precursors. At the end of this step, the sol-gel solution deposited is transformed into a gel layer of constant thickness adhering to the surface of the substrate. The temperature and time effective for gelation can be readily determined by those skilled in the art using, for example, UV-visible spectrometry techniques.
Par exemple, l'étape de séchage, selon l'invention, peut être effectuée à température ambiante pour une durée allant de 1 à 10 minutes. En d'autres termes, cette étape de dépôt consistera à mettre au repos pendant une durée appropriée la couche, juste après le dépôt, pour qu'elle sèche. Cette étape de séchage peut être également effectuée à une température allant de 40 à 8O0C, par exemple, en faisant usage d'une plaque chauffante. Dans ce cas, cette étape sera qualifiée, dans la partie expérimentale, d'étape de prépyrolyse .For example, the drying step according to the invention can be carried out at ambient temperature for a duration ranging from 1 to 10 minutes. In other words, this deposition step will consist in resting for a suitable duration the layer, just after the deposition, so that it dries. This drying step may also be carried out at a temperature ranging from 40 to 8O 0 C, for example, by making use of a hot plate. In this case, this step will be qualified, in the experimental part, of prepyrolysis step.
Après séchage, chaque couche subit généralement une étape de pyrolyse effectuée à une température et une durée efficaces pour éliminer totalement des composés organiques de la couche déposée et en particulier les solvants de préparation et de dilution de la solution sol-gel et les composés générés par la réaction des précurseurs moléculaires entre eux. La température et durée efficaces peuvent être déterminées aisément par l'homme du métier grâce à des techniques telles que la spectroscopie IR (Infra¬ rouge) .After drying, each layer generally undergoes a pyrolysis step carried out at a temperature and time effective to completely remove organic compounds from the deposited layer and in particular the solvents for preparing and diluting the sol-gel solution and the compounds generated by the reaction of the molecular precursors with each other. The effective temperature and time can be easily determined by those skilled in the art through techniques such as IR spectroscopy (Infra ¬ red).
La durée de pyrolyse pour une température donnée, correspond à une durée permettant l'obtention d'une épaisseur de couche constante. L'épaisseur de couche est contrôlée, par exemple, par des techniques de profilométrie . L'étape de pyrolyse est arrêtée à l'obtention d'une couche homogène en épaisseur et exempt de composés organiques.The pyrolysis time for a given temperature corresponds to a duration that makes it possible to obtain a constant layer thickness. The layer thickness is controlled, for example, by profilometry techniques. The pyrolysis step is stopped to obtain a layer homogeneous in thickness and free of organic compounds.
Par exemple, lorsque la couche déposée (ou l'ensemble des couches déposées) est précurseur d'une céramique PZT, cette étape de pyrolyse peut s'effectuer à une température allant d'environ 300 à environ 4000C, de préférence entre 350 et 37O0C, et pour une durée allant d'environ 5 minutes à 10 minutes.For example, when the deposited layer (or all of the deposited layers) is a precursor of a PZT ceramic, this pyrolysis step can be carried out at a temperature ranging from about 300 to about 400 ° C., preferably from 350 ° C. and 37O 0 C, and for a time ranging from about 5 minutes to 10 minutes.
Après l'étape de pyrolyse, chaque couche déposée peut être amenée à subir une étape de relaxation, afin de libérer les contraintes générées lors du rétreint de la couche, en particulier celles accumulées au niveau des motifs en relief. On précise que, par rétreint, on entend la diminution des dimensions de la couche déposée, après séchage et éventuellement pyrolyse de celle-ci. Cette étape peut être mise en œuvre en maintenant la couche déposée à une température légèrement supérieure à la température de pyrolyse, par exemple supérieure de 10 à 3O0C, pendant une durée pouvant aller de 10 à 30 minutes.After the pyrolysis step, each deposited layer can be brought to undergo a relaxation step, in order to release the stresses generated during the shrinkage of the layer, in particular those accumulated at the level of the relief patterns. We need that by shrinkage is meant the reduction of the dimensions of the deposited layer, after drying and optionally pyrolysis thereof. This step can be carried out by maintaining the deposited layer at a temperature slightly higher than the pyrolysis temperature, for example greater than 10 to 30 ° C., for a duration ranging from 10 to 30 minutes.
Par exemple, lorsque la couche est précurseur d'une céramique PZT, la température de relaxation est supérieure de 10 à 3O0C à la température de pyrolyse mais ne doit, de préférence, pas dépasser 4000C, de sorte à éviter la formation d'une phase pyrochlore .For example, when the layer is a precursor of a PZT ceramic, the relaxation temperature is greater than 10 to 30 ° C. at the pyrolysis temperature, but should preferably not exceed 400 ° C., so as to avoid formation. of a pyrochlore phase.
Enfin, la couche déposée ou l'ensemble des couches déposées peut être soumis à une étape de densification (ou recuit) à une durée et une température efficaces pour permettre la cristallisation de la couche déposée ou de l'ensemble des couches déposées. La cristallisation de la couche correspond à l'obtention d'une couche d'épaisseur stabilisée et de structure cristallisée, du type pérovskite. La température et la durée de recuit sont choisies de manière à obtenir cette cristallisation, vérifiable aisément par analyse structurale, telle que l'analyse par diffraction des rayons X.Finally, the deposited layer or all of the deposited layers may be subjected to a densification (or annealing) step at a time and a temperature effective to allow the crystallization of the deposited layer or of all the deposited layers. The crystallization of the layer corresponds to obtaining a layer of stabilized thickness and crystallized structure, of the perovskite type. The temperature and the annealing time are chosen so as to obtain this crystallization, easily verifiable by structural analysis, such as X-ray diffraction analysis.
De préférence, la densification est effectuée à une température allant d'environ 500 à environ 8000C pour une durée comprise entre environ 30 secondes et environ 1 heure, en particulier de 1 minute à 10 minutes. Le recuit peut être effectué par différentes techniques. De préférence, le recuit est réalisé par un mode de chauffage rapide, obtenu, par exemple, avec la technique du « recuit thermique rapide » (communément désigné par l'abréviation RTA pour « Rapid Thermal Annealing » ou RTP pour « Rapid Thermal Process ») .Preferably, the densification is carried out at a temperature ranging from about 500 to about 800 ° C. for a duration of between about 30 seconds and about 1 hour, in particular from 1 minute to 10 minutes. The annealing can be performed by different techniques. Preferably, the annealing is carried out by a rapid heating mode, obtained, for example, with the technique of "rapid thermal annealing" (commonly referred to by the abbreviation RTA for "Rapid Thermal Annealing" or RTP for "Rapid Thermal Process" ).
Après ce traitement thermique, les revêtements thermiques sont homogènes, continus, conformes à la géométrie du substrat et adhèrent fortement au substrat.After this heat treatment, the thermal coatings are homogeneous, continuous, conform to the geometry of the substrate and strongly adhere to the substrate.
Le facteur de conformité, défini par le rapport des épaisseurs au fond des motifs et au sommet ou sur les flancs des motifs est proche de 1. Ce résultat, ajouté à la simplicité de mise en œuvre de la technique sol-gel, son coût et son gain de productivité augure favorablement de l'utilisation d'un tel procédé dans le milieu industriel.The compliance factor, defined by the ratio of the thicknesses at the bottom of the patterns and at the top or on the flanks of the patterns, is close to 1. This result, added to the simplicity of implementation of the sol-gel technique, its cost and its productivity gain augurs favorably for the use of such a process in the industrial environment.
Les étapes de dépôt de la solution sol-gel et de traitement thermique peuvent être réitérées une ou plusieurs fois, jusqu'à l'obtention d'un revêtement présentant l'épaisseur désirée, par exemple, une épaisseur allant de 30 à 200 nm.The deposition steps of the sol-gel solution and heat treatment can be repeated one or more times, until a coating having the desired thickness, for example a thickness ranging from 30 to 200 nm, is obtained.
Ce procédé de revêtement trouve son application en particulier pour la réalisation de composants électroniques, tels que des capacités pouvant aller de 100 nF/mm2 à 1 μF/mm2.This coating method finds its application in particular for the production of electronic components, such as capacities ranging from 100 nF / mm 2 to 1 μF / mm 2 .
L' invention va maintenant être décrite par rapport aux exemples suivants donnés à titre illustratif et non limitatif. BRÈVE DESCRIPTION DES DESSINSThe invention will now be described with reference to the following examples given for illustrative and not limiting. BRIEF DESCRIPTION OF THE DRAWINGS
La figure unique illustre une coupe transversale d'une partie d'un substrat présentant des motifs sous forme de tranchées muni d'un revêtement et illustrant les grandeurs nécessaires à la détermination des facteurs de conformité.The single figure illustrates a cross-section of a portion of a substrate having lined trench patterns and illustrating the magnitudes necessary to determine compliance factors.
EXPOSÉ DÉTAILLÉ DE MODES DE RÉALISATION PARTICULIERSDETAILED PRESENTATION OF PARTICULAR EMBODIMENTS
Les exemples qui suivent illustrent, dans un premier temps, la préparation de solutions sol-gel utilisées pour la réalisation de revêtements conformes, puis dans un deuxième temps, la réalisation de revêtements conformes sur des substrats présentant des motifs en relief sous forme de tranchées.The examples which follow illustrate, first of all, the preparation of sol-gel solutions used for the production of conformal coatings, and secondly, the production of conformal coatings on substrates having relief patterns in the form of trenches.
La conformité du revêtement par rapport à la géométrie du substrat est déterminée par les facteurs de conformité (b/a) et (b/c) , pour lesquels :The conformity of the coating with respect to the geometry of the substrate is determined by the compliance factors (b / a) and (b / c), for which:
- a correspond à l'épaisseur du revêtement au sommet de la tranchée ;- a corresponds to the thickness of the coating at the top of the trench;
- b correspond à l'épaisseur du revêtement au fond de la tranchée ;- b corresponds to the thickness of the coating at the bottom of the trench;
- c correspond à l'épaisseur du revêtement à mi- hauteur sur le flanc de la tranchée.- c corresponds to the thickness of the coating at half height on the side of the trench.
Ces grandeurs a, b et c sont représentées sur la figure 1. Plus les facteurs de conformité (b/a) et (b/c) s'approchent de 1, plus la conformité du revêtement est considérée comme idéale.These magnitudes a, b and c are shown in FIG. 1. As the compliance factors (b / a) and (b / c) approach 1, the conformity of the coating is considered ideal.
De manière pratique, pour déterminer ces facteurs de conformité, le substrat est, dans un premier temps, clivé après traitement thermique selon la ligne d'observation voulue puis l'interface revêtement/substrat est observée par microscopie électronique à balayage.In practice, to determine these compliance factors, the substrate is firstly cleaved after heat treatment along the desired line of observation and then the interface coating / substrate is observed by scanning electron microscopy.
EXEMPLE 1EXAMPLE 1
Dans cet exemple est décrit le protocole expérimental de préparation d'une solution sol-gel précurseur d'une céramique zircono-titanate de plombIn this example, the experimental protocol for the preparation of a precursor sol-gel solution of a lead zirconium titanate ceramic is described.
(PZT) ainsi que le procédé de dépôt par trempage- retrait de cette solution sur des wafers de silicium métallisés dont la surface présente des motifs micrométriques en relief dans le but d'obtenir des revêtements parfaitement conformes à la géométrie du substrat. Les motifs utilisés dans cet exemple sont des tranchées de 1 μm de profondeur, 2 μm de large et espacées de 2 μm.(PZT) as well as the method of deposition by soaking-removal of this solution on metallized silicon wafers whose surface has micrometric patterns in relief in order to obtain coatings perfectly in accordance with the geometry of the substrate. The patterns used in this example are trenches 1 μm deep, 2 μm wide and spaced 2 μm apart.
a) Préparation de la solution sol-gel à composition a) Preparation of the sol-gel solution
Dans un premier temps, il est procédé à la préparation d'une solution comprenant un précurseur de plomb. Pour ce faire, dans un ballon surmonté d'un montage de distillation, on pèse 751 g (1,98 mol) d'acétate de plomb trihydraté et 330,2 g d' éthylène glycol. Le mélange est homogénéisé pendant 30 minutes àInitially, a solution comprising a lead precursor is prepared. To do this, 751 g (1.98 mol) of lead acetate trihydrate and 330.2 g of ethylene glycol are weighed into a flask surmounted by a distillation assembly. The mixture is homogenized for 30 minutes at
7O0C de manière à permettre une dissolution complète de l'acétate de plomb. Puis la température de la solution homogène est augmentée pour déshydrater le précurseur de plomb par distillation. Au cours de la distillation, la solution jaunit. Le distillât récupéré a une concentration en plomb de l'ordre de 2,05 mol/kg.70 ° C. so as to allow complete dissolution of the lead acetate. Then the temperature of the homogeneous solution is increased to dehydrate the lead precursor by distillation. During the distillation, the solution turns yellow. The recovered distillate has a lead concentration of the order of 2.05 mol / kg.
Sous balayage d'argon et sous agitation, 225,1 g (0,792 mol) d' isopropoxyde de titane sont agités à 264 g de 1-propanol. Toujours dans les mêmes conditions, sont ensuite ajoutés 401,5 g (0,858 mol) de propoxyde de zirconium à 70% dans du 1-propanol puis 458,7 g d' éthylène glycol. Le mélange est laissé sous agitation pendant 20 minutes à température ambiante. Dans un tricol, on verse 883 g (1,815 mol) de la solution d' alcoxyde de plomb préalablement préparée, soit un excès de 10 % pour pallier la perte en oxyde de plomb lors du traitement thermique. Sous courant d'argon, la solution Ti/Zr est rapidement ajoutée dans le tricol sous forte agitation (600 tours/min) . A la fin d'addition, un réfrigérant surmonté d'une garde dessicante est installé sur le montage. Le mélange est mis à reflux pendant 2 heures (1010C) . Après reflux, la solution obtenue présente une concentration en équivalent massique PZT de l'ordre de 26%.Under argon flushing and stirring, 225.1 g (0.792 mol) of titanium isopropoxide was stirred at 264 g of 1-propanol. Under the same conditions, 401.5 g (0.858 mol) of 70% zirconium propoxide in 1-propanol and 458.7 g of ethylene glycol are then added. The mixture is stirred for 20 minutes at room temperature. In a tricolor, 883 g (1.815 mol) of the previously prepared lead alkoxide solution is poured, ie a 10% excess to compensate for the loss of lead oxide during the heat treatment. Under an argon flow, the Ti / Zr solution is rapidly added to the tricol with vigorous stirring (600 rpm). At the end of the addition, a refrigerant surmounted by a desiccant is installed on the assembly. The mixture is refluxed for 2 hours (101 ° C.). After refluxing, the solution obtained has a concentration in mass equivalent PZT of the order of 26%.
La solution est ensuite conservée à température ambiante pendant sa phase de mûrissement. Elle est diluée au bout d'une semaine de mûrissement par ajout de méthanol, de manière à obtenir une solution présentant une concentration de 15% en équivalent massique PZT. La viscosité alors obtenue est de l'ordre de 3 mPa.s. La dilution permet de stabiliser la viscosité de la solution pendant plusieurs mois.The solution is then stored at room temperature during its ripening phase. It is diluted after one week of curing by addition of methanol, so as to obtain a solution having a concentration of 15% by mass equivalent PZT. The viscosity then obtained is of the order of 3 mPa.s. Dilution stabilizes the viscosity of the solution for several months.
b) Dépôt d'un revêtement conforme sur le substrat. Le substrat est un wafer de silicium de 6 pouces de diamètre, recouvert d'une couche de silice obtenue par oxydation thermique. Il est métallisé par pulvérisation avec une couche de platine d'une épaisseur de l'ordre de 100 nm. La surface du wafer présente des motifs en relief du type tranchées, dont la profondeur est de 1 μm et la largeur est de l'ordre du micromètre.b) Deposition of a conformal coating on the substrate. The substrate is a silicon wafer 6 inches in diameter, covered with a layer of silica obtained by thermal oxidation. It is metallized by sputtering with a platinum layer with a thickness of the order of 100 nm. The surface of the wafer has relief patterns of the trench type, the depth of which is 1 μm and the width is of the order of one micrometer.
La solution diluée préparée préalablement est déposée par trempage-retrait sur le wafer. Plus précisément, le wafer, dont la face arrière a été protégée par un film adhésif, est placé une minute dans la solution sol-gel puis retiré à une vitesse de retrait ajustée entre 2 et 10 cm. min"1. Une fois que le wafer est retiré du bain de traitement, il est soumis à un traitement thermique. Ce traitement thermique comprend les étapes suivantes : une première étape dite de « prépyrolyse », consistant à chauffer le wafer sur plaque chauffante pendant une durée allant de 2 à 10 min à une température de 5O0C, cette étape étant destinée à réduire le temps de séchage par rapport à un séchage classique à température ambiante ; - une étape de pyrolyse à une température de 36O0C pendant 5 à 10 minutes, cette étape étant destinée à éliminer les résidus de composés organiques et à amorcer la phase de cristallisation sans piéger de résidus ; - une étape de relaxation à une température de 39O0C pendant une durée allant de 10 à 20 minutes destinée à permettre un relâchement des contraintes générées lors du retrait du film PZT ; une étape de densification à une température de 6000C pendant une durée allant de 5 à 10 minutes destinée à cristalliser le film dans une phase pérovskite .The diluted solution prepared beforehand is deposited by soaking-withdrawal on the wafer. More specifically, the wafer, whose back side has been protected by an adhesive film, is placed one minute in the sol-gel solution and then removed at a shrinkage speed adjusted between 2 and 10 cm. . min "1 Once the wafer is removed from the treatment bath, it is subjected to a heat treatment This heat treatment comprises the following steps:. a first step called" prepyrolysis "of heating the wafer on a hotplate for a time ranging from 2 to 10 min at a temperature of 50 ° C., this step being intended to reduce the drying time compared with a conventional drying at ambient temperature, a pyrolysis step at a temperature of 36 ° C. for 5 at 10 minutes, this step being intended to eliminate the residues of organic compounds and to initiate the crystallization phase without trapping residues - a relaxation step at a temperature of 39O 0 C for a period ranging from 10 to 20 minutes intended to allow relaxation of the stresses generated during removal of the PZT film; a densification step at a temperature of 600 ° C. for a period ranging from 5 to 10 minutes intended to crystallize the film in a perovskite phase.
Pour caractériser la conformité du dépôt à la surface du wafer, l'interface dépôt/substrat est observée par microscopie électronique à balayage. Pour cela, l'échantillon est clivé après traitement thermique selon la ligne d'observation voulue.To characterize the conformity of the deposit on the surface of the wafer, the deposition / substrate interface is observed by scanning electron microscopy. For this, the sample is cleaved after heat treatment along the desired line of observation.
L'épaisseur du revêtement a été évaluée à 90 nm avec des facteurs de conformité (b/a) égal à 1,4 et (b/c) égal à 1,3.The thickness of the coating was evaluated at 90 nm with compliance factors (b / a) equal to 1.4 and (b / c) equal to 1.3.
EXEMPLE 2EXAMPLE 2
Dans cet exemple est décrit le protocole expérimental de préparation d'une solution sol-gel précurseur d'une céramique zircono-titanate de plombIn this example, the experimental protocol for the preparation of a precursor sol-gel solution of a lead zirconium titanate ceramic is described.
(PZT) ainsi que le procédé de dépôt par enduction centrifuge de cette solution sur des wafers de silicium métallisés dont la surface présente des motifs micrométriques en 3 dimensions dans le but d'obtenir des revêtements parfaitement conformes à la géométrie du substrat. Les motifs utilisés dans cet exemple sont des tranchées de 1 μm de profondeur, 2 μm de large et espacées de 2 μm.(PZT) as well as the centrifugal coating deposition method of this solution on metallized silicon wafers whose surface has micrometric 3-dimensional patterns in order to obtain coatings perfectly in accordance with the geometry of the substrate. The patterns used in this example are trenches 1 μm deep, 2 μm wide and spaced 2 μm apart.
a) Préparation de la solution sol-gel à composition nominale PbZr0, 52Ti0, 48C>3 Dans un premier temps, il est procédé à la préparation d'une solution comprenant un précurseur de plomb. Pour ce faire, dans un ballon surmonté d'un montage de distillation, on pèse 751 g (1,98 mol) d'acétate de plomb trihydraté et 330,2 g d' éthylène glycol. Le mélange est homogénéisé pendant 30 minutes à 7O0C de manière à permettre une dissolution complète de l'acétate de plomb. Puis la température de la solution homogène est augmentée pour déshydrater le précurseur de plomb par distillation. Au cours de la distillation, la solution jaunit. Le distillât récupéré a une concentration en plomb de l'ordre de 2,05 mol/kg.a) Preparation of the sol-gel solution with nominal composition PbZr 0 , 52Ti 0 , 4 8 C> 3 Initially, a solution comprising a lead precursor is prepared. To do this, 751 g (1.98 mol) of lead acetate trihydrate and 330.2 g of ethylene glycol are weighed into a flask surmounted by a distillation assembly. The mixture is homogenized for 30 minutes at 70 ° C. so as to allow complete dissolution of the lead acetate. Then the temperature of the homogeneous solution is increased to dehydrate the lead precursor by distillation. During the distillation, the solution turns yellow. The recovered distillate has a lead concentration of the order of 2.05 mol / kg.
Sous balayage d'argon et sous agitation, 225,1 g (0,792 mol) d' isopropoxyde de titane sont ajoutés à 264 g de 1-propanol. Toujours dans les mêmes conditions, sont ensuite ajoutés 401,5 g (0,858 mol) de propoxyde de zirconium à 70% dans du 1-propanol puis 458,7 g d' éthylène glycol. Le mélange est laissé sous agitation pendant 20 minutes à température ambiante.Under argon flushing and stirring, 225.1 g (0.792 mol) of titanium isopropoxide are added to 264 g of 1-propanol. Under the same conditions, 401.5 g (0.858 mol) of 70% zirconium propoxide in 1-propanol and 458.7 g of ethylene glycol are then added. The mixture is stirred for 20 minutes at room temperature.
Dans un tricol, on verse 883 g (1,815 mol) de la solution d' alcoxyde de plomb préalablement préparée, soit un excès de 10 % pour pallier la perte en oxyde de plomb lors du traitement thermique. Sous courant d'argon, la solution Ti/Zr est rapidement ajoutée dans le tricol sous forte agitation (600 tours/min) . A la fin d'addition, un réfrigérant surmonté d'une garde dessicante est installé sur le montage. Le mélange est mis à reflux pendant 2 heures (1010C) . Après reflux, la solution obtenue présente une concentration en équivalent massique PZT de l'ordre de 26%. La solution est ensuite conservée à température ambiante pendant sa phase de mûrissement.In a tricolor, 883 g (1.815 mol) of the previously prepared lead alkoxide solution is poured, ie a 10% excess to compensate for the loss of lead oxide during the heat treatment. Under an argon flow, the Ti / Zr solution is rapidly added to the tricol with vigorous stirring (600 rpm). At the end of the addition, a refrigerant surmounted by a desiccant is installed on the assembly. The mixture is refluxed for 2 hours (101 ° C.). After refluxing, the solution obtained has a concentration in mass equivalent PZT of the order of 26%. The solution is then stored at room temperature during its ripening phase.
Elle est diluée au bout d'une semaine de mûrissement par ajout d' éthylène glycol, de manière à obtenir une solution présentant une concentration de 10% en équivalent massique PZT. La viscosité alors obtenue est de l'ordre de 25 mPa.s. La dilution permet de stabiliser la viscosité de la solution pendant plusieurs mois.It is diluted after one week of curing by adding ethylene glycol, so as to obtain a solution having a concentration of 10% by mass equivalent PZT. The viscosity then obtained is of the order of 25 mPa.s. Dilution stabilizes the viscosity of the solution for several months.
b) Dépôt d'un revêtement conforme sur le substratb) Deposition of a conformal coating on the substrate
Le substrat est un wafer de silicium de 6 pouces de diamètre, recouvert d'une couche de silice obtenue par oxydation thermique. Il est métallisé par pulvérisation avec une couche de platine d'une épaisseur de l'ordre de 100 nm. La surface du wafer présente des motifs en relief du type tranchées, dont la profondeur est de 1 μm et la largeur est de l'ordre du micromètre.The substrate is a silicon wafer 6 inches in diameter, covered with a layer of silica obtained by thermal oxidation. It is metallized by sputtering with a platinum layer with a thickness of the order of 100 nm. The surface of the wafer has relief patterns of the trench type, the depth of which is 1 μm and the width is of the order of one micrometer.
La solution diluée préparée préalablement est filtrée à 0,2 μm et est déposée par enduction centrifuge sur le wafer. La vitesse de rotation est réglée à 4500 tr.min"1. Après dépôt, la couche subit le traitement thermique suivant : une première étape dite deThe diluted solution prepared beforehand is filtered at 0.2 μm and is deposited by centrifugal coating on the wafer. The rotational speed is set to 4500 tr.min "1 After deposition, the layer subjected to the following heat treatment:. A first said stage
« prépyrolyse », consistant à chauffer le wafer sur plaque chauffante pendant une durée allant de 2 à 10 min à une température de 5O0C, cette étape étant destinée à réduire le temps de séchage par rapport à un séchage classique à température ambiante ;"Prepyrolysis" of heating the hot plate wafer for a period ranging from 2 to 10 min at a temperature of 50 ° C., this step being intended to reduce the drying time compared with conventional drying at room temperature;
- une étape de pyrolyse à une température de 36O0C pendant 5 à 10 minutes, cette étape étant destinée à éliminer les résidus de composés organiques et à amorcer la phase de cristallisation sans piéger de résidus .a pyrolysis step at a temperature of 36O 0 C for 5 to 10 minutes, this step being intended to eliminate the residues of organic compounds and to initiate the crystallization phase without trapping residues.
Le dépôt suivi d'un traitement thermique tel que mentionné ci-dessus est réitéré 6 fois. Le wafer revêtu de 6 couches subit un traitement thermique final comprenant :The deposition followed by a heat treatment as mentioned above is repeated 6 times. The wafer coated with 6 layers undergoes a final heat treatment comprising:
- une étape de relaxation à une température de 39O0C pendant une durée allant de 10 à 20 minutes, cette étape étant destinée à permettre un relâchement des contraintes générées lors du rétreint du film PZT ; une étape de densification à une température de 6000C pendant 5 à 10 minutes destinée à cristalliser le film dans une phase pérovskite.a relaxation step at a temperature of 39 ° C. for a duration ranging from 10 to 20 minutes, this step being intended to allow a relaxation of the stresses generated during the shrinkage of the PZT film; a densification step at a temperature of 600 0 C for 5 to 10 minutes to crystallize the film in a perovskite phase.
Pour caractériser la conformité du dépôt à la surface du wafer, l'interface dépôt/substrat est observée par microscopie électronique à balayage. Pour cela, l'échantillon est clivé après traitement thermique selon la ligne d'observation voulue.To characterize the conformity of the deposit on the surface of the wafer, the deposition / substrate interface is observed by scanning electron microscopy. For this, the sample is cleaved after heat treatment along the desired line of observation.
L'épaisseur du revêtement a été évaluée àThe thickness of the coating was evaluated at
90 nm avec des facteurs de conformité (b/a) égal à 1,4 et (b/c) égal à 1,3. 90 nm with compliance factors (b / a) equal to 1.4 and (b / c) equal to 1.3.
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| Application Number | Priority Date | Filing Date | Title |
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| FR0553554A FR2893611B1 (en) | 2005-11-23 | 2005-11-23 | PROCESS FOR PRODUCING A COATING BASED ON OXIDE CERAMIC COMPRISING THE GEOMETRY OF A SUBSTRATE HAVING RELIEF PATTERNS |
| PCT/EP2006/068767 WO2007060180A1 (en) | 2005-11-23 | 2006-11-22 | Method for producing a ceramic oxide based coating conformable with the geometry of a substrate having raised designs |
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| FR2967992B1 (en) | 2010-11-26 | 2015-05-29 | Commissariat Energie Atomique | SOIL PREPARATION OF STABLE METAL OXIDES USEFUL IN THE MANUFACTURE OF THIN FILMS WITH OPTICAL AND ABRASION RESISTANT PROPERTIES |
| FR2981064B1 (en) | 2011-10-07 | 2014-11-28 | Commissariat Energie Atomique | PROCESS FOR PREPARING A MATERIAL ON A SUBSTRATE BY SOL-GEL PATH |
| CN103693682A (en) * | 2014-01-07 | 2014-04-02 | 哈尔滨工业大学 | Synthetic method of ZnTiO3 porous nanomaterial |
| EP2947178A1 (en) | 2014-05-21 | 2015-11-25 | IMEC vzw | Conformal coating on three-dimensional substrates |
| US9443782B1 (en) * | 2015-08-11 | 2016-09-13 | Freescale Semiconductor, Inc. | Method of bond pad protection during wafer processing |
| FR3045036B1 (en) * | 2015-12-15 | 2017-12-22 | Commissariat Energie Atomique | PROCESS FOR THE PREPARATION OF A SOL-GEL SOLUTION USED FOR THE PREPARATION OF A BARIUM TITANATE DOPED BY HAFNIUM AND / OR AT LEAST ONE LANTHANIDE ELEMENT |
| CN111908833B (en) * | 2020-07-22 | 2021-11-02 | 电子科技大学 | A kind of preparation method of lead zirconate titanate aerogel composite coating |
| CN114293179B (en) * | 2021-12-08 | 2024-02-06 | 重庆材料研究院有限公司 | Preparation method of hafnium oxide coating for noble metal thermocouple |
| US20250043428A1 (en) * | 2023-08-04 | 2025-02-06 | Wolverine Advanced Materials, Llc | Nanoceramic coatings for metal substrates and method of forming same |
| CN117776710B (en) * | 2023-12-29 | 2026-03-17 | 陕西科技大学 | A three-layer varistor ceramic containing only a single double Schottky grain boundary barrier, its sol-gel preparation method and application. |
| CN118546548A (en) * | 2024-05-14 | 2024-08-27 | 郑州大学 | Low-thermal-conductivity high-temperature-resistant nano layered calcium niobate thermal-insulation coating with ordered structure and preparation method thereof |
| CN118724615A (en) * | 2024-06-21 | 2024-10-01 | 杭州而然科技有限公司 | A method, product and application of preparing strontium titanate modified layer on zirconium oxide surface based on impregnation-heat treatment method |
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| FR2829757B1 (en) * | 2001-09-20 | 2004-07-09 | Commissariat Energie Atomique | PROCESS FOR PREPARING A STABLE LEAD ZIRCONO-TITANATE SOIL AND PROCESS FOR PREPARING FILMS THEREFROM |
| KR100486727B1 (en) * | 2002-11-14 | 2005-05-03 | 삼성전자주식회사 | Fabrication method of planar lens |
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| US20080292790A1 (en) | 2008-11-27 |
| JP5208758B2 (en) | 2013-06-12 |
| ES2393204T3 (en) | 2012-12-19 |
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| FR2893611A1 (en) | 2007-05-25 |
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