EP2073242A2 - Tube, notamment tube électronique - Google Patents

Tube, notamment tube électronique Download PDF

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Publication number
EP2073242A2
EP2073242A2 EP08169844A EP08169844A EP2073242A2 EP 2073242 A2 EP2073242 A2 EP 2073242A2 EP 08169844 A EP08169844 A EP 08169844A EP 08169844 A EP08169844 A EP 08169844A EP 2073242 A2 EP2073242 A2 EP 2073242A2
Authority
EP
European Patent Office
Prior art keywords
tube
temperature
sensor
electrodes
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP08169844A
Other languages
German (de)
English (en)
Other versions
EP2073242A3 (fr
Inventor
Oliver Heuermann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Siemens Corp
Original Assignee
Siemens AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG, Siemens Corp filed Critical Siemens AG
Publication of EP2073242A2 publication Critical patent/EP2073242A2/fr
Publication of EP2073242A3 publication Critical patent/EP2073242A3/fr
Withdrawn legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
    • H01J1/02—Main electrodes
    • H01J1/13—Solid thermionic cathodes
    • H01J1/135—Circuit arrangements therefor, e.g. for temperature control
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J23/00—Details of transit-time tubes of the types covered by group H01J25/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J23/00—Details of transit-time tubes of the types covered by group H01J25/00
    • H01J23/34—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

Definitions

  • the invention relates to an improved tube, in particular an electron tube, and an improved system for controlling the electrodes and / or the heating of a tube and for determining the life of a tube.
  • Electronic tubes particularly vacuum electron tubes, have a limited life, as is well known.
  • An important factor influencing the service life is the emissivity of the cathode.
  • the emissivity of the cathode deteriorates steadily in the operation of a tube with directly or indirectly heated cathode by evaporation of the electron-emitting material. This degradation can be expressed, for example, by the filament evaporation rate or Barium Evaporation Rate (Barium Evaporation Rate).
  • EP 0 339 714 A1 called: tensile stress of the cathode wire, length of the cathode wire, spectrum and intensity of the emitted electromagnetic radiation, number of emitted electrons per unit time and their velocity distribution and the electrical resistance of the cathode wire.
  • JP 09245712 A suggests to avoid blown cathode wires to monitor the voltage drop across the cathode and to regulate the drive voltage accordingly.
  • the problem with these solutions is that the determination of the temperature of the cathode wire is only indirectly via the detour of a measurement of a different physical size. As with every measurement, specific inaccuracies of the respective measurement occur. In addition still occur modeling inaccuracies, for example, can be closed only error-prone to the temperature of a determined with low relative error electrical resistance of a cathode wire. This follows from the mere fact that tubes have manufacturing tolerances, for example, the diameter or the length of the cathode wire. In the case of indirectly heated cathodes, the temperature of the heating wire is first determined from the resistance measurement and then the (erroneous) assumption is made that the cathode temperature is identical or deviates by an empirically determined value. Furthermore, environmental influences and aging phenomena have a negative effect on the precision of the indirect temperature determination.
  • a tube in particular an electron tube, with an evacuated or gas-filled region in which one or more electrodes and means for measuring the temperature of one of the electrodes are arranged.
  • the means, which are arranged in the evacuated or gas-filled region of the tube, for measuring the electrode temperature comprise a pyrometric sensor.
  • the sensor or an optical element upstream of the sensor is protected by a shutter which is opened and / or closed electronically or electromechanically can.
  • the invention further relates to a system comprising such a tube having a controller with means for detecting an electrode temperature measurement.
  • a controller may be provided which detects an impending end of life of the tube by continuous evaluation of the electrode temperature and the tube supplied heating power and signals to an operator and / or a maintenance center.
  • a controller may be provided, which additionally or alternatively continuously evaluates the electrode temperature and has means for driving the electrodes and / or an electrode heater, wherein the control of the electrodes and / or the electrode heating takes place so that the electrode temperature corresponds to a desired value ,
  • the advantage of the present invention is the fact that with relatively little effort, a precise determination of the electrode temperature of an electronic tube can be done. As a result, on the one hand the life of the tube can be predicted more accurately. On the other hand, by monitoring the electrode temperature and corresponding activation of the electrodes and / or the electrode heating, it is possible to keep the electrode temperature exactly at a desired value (nominal value). This is advantageous because, for example, in a klystron, exceeding the nominal surface temperature of 890 ° C by only 50K results in an undesirable doubling of the barium evaporation rate.
  • Fig. 1 shows the gun area of a klystron 100.
  • a klystron is an electron tube that exploits the transit time of the electrons to generate or amplify high-frequency signals.
  • a housing 120 made of non-conductive, temperature-resistant material, for example ceramic or glass, encloses an evacuated area 110, in which a cathode with a cathode surface 140 is arranged, which is heated by a heater 130.
  • a means 150 for temperature measurement here comprising a sensor body 160 with closure 170 and electrical connections 180.
  • an anode 190 of the electron tube 100 is shown.
  • Fig. 2 shows with further details the means 150 for temperature measurement.
  • This is comprised of the tube housing 120 and consists of the sensor body 160, which may optionally be associated with an optical element 162, for example a lens, in order to achieve a better focus on the area to be detected.
  • an optical element 162 for example a lens
  • a so-called central shutter 170 is used to protect the surface of the optical sensor 160 and the lens 162, respectively.
  • the central closure consists of several curved steel plates, which are pivoted about fixed pivot points out of the beam path. Such central closures are known from the photo camera technology and available in high quantities at low prices.
  • the shutter also called shutter
  • a shutter 170 is also a disc with an opening which rotates when actuated and the beam path to the sensor 160 releases.
  • the control of the closure 170 is electromechanical, wherein the necessary electrical energy is supplied via electrical connections 184.
  • the signal generated by the sensor 160 is provided at further terminals 182.
  • the integrated optical measuring arrangement 150 is used to determine the evaporation rate in the tube 100, by means of which periodically a surface temperature measurement of cathode or anode (for example, in X-ray tubes is the anode temperature of great interest) performed becomes.
  • the direct measurement of the actual surface temperature can effectively realize a heating control.
  • the senor 160 is a photosemiconductor. Temperatures above about 700 ° C can be measured pyrometrically with photodiodes in the visible spectral range. Pyrometers are units that include the sensor 160 and an evaluation unit - not shown. Pyrometers are used for non-contact temperature measurement of temperatures between -50 ° C and + 4000 ° C. In most cases, the reception wavelength range of high-temperature pyrometers is determined by the photoreceiver used: the lowest reception wavelength of silicon photodiodes is z. B. about 1.1 microns. A body with a temperature of 3000 K has its radiation maximum here, but temperatures can be measured as low as about 700 ° C.
  • the surface temperatures of Klystron, Magnetron, Thyratron and Accelerator are 890 ° C to 1050 ° C, depending on the cathode type used (oxide or impregnated).
  • the surface temperature of the tungsten heating wire in X-ray tubes is about 2000 ° C.
  • the present invention makes possible a more reliable lifetime prediction with at the same time minimally higher costs for the integrated optical measuring arrangement. Slowly approaching failures can be detected as the temperature reached decreases while the heating power supplied remains the same. Integration of the evaluation into the higher-level control of the overall system allows service messages to be issued before the system fails and produces expensive downtime (so-called predictive maintenance). about the rate of evaporation so determined and the amount of barium available in the cathode from the beginning can be used to calculate an arcing probability.
  • the present invention allows a targeted lifetime extension of the electron tube 100.
  • the exact measurement of the surface temperature of the state (electron emission at currently supplied heating power) of the cathode can be determined and from an accurate heating control can be derived.
  • the consequence of accurate heater control is the significant increase in tube life.
  • the period duration ie the frequency with which the shutter 170 is opened and a temperature measurement is carried out, can be set.
  • the period duration will be in the range of seconds or less, however, for the life-time prediction a period in the minute or even hour range may be sufficient.
  • the present invention is not limited to the described embodiments. Rather, it is applicable to all types of tubes, preferably those tubes whose failure - as in the medical field - cause high costs by stoppage of an expensive overall system, such as X-ray tubes or tubes of the type Thyratron, Klystron, Magnetron, or Accelerator.
  • the present invention is applicable to both evacuated and gas-filled tubes, as well as to tubes that are not strictly referred to as electron tubes, such as because, as in a thyratron, ions act as carriers.

Landscapes

  • Physical Vapour Deposition (AREA)
  • Discharge Heating (AREA)
  • X-Ray Techniques (AREA)
  • Measurement Of Radiation (AREA)
EP08169844A 2007-12-21 2008-11-25 Tube, notamment tube électronique Withdrawn EP2073242A3 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102007062054A DE102007062054B4 (de) 2007-12-21 2007-12-21 Röhre, insbesondere Elektronenröhre, mit Mitteln zur Messung der Elektrodentemperatur und Schutz hierfür

Publications (2)

Publication Number Publication Date
EP2073242A2 true EP2073242A2 (fr) 2009-06-24
EP2073242A3 EP2073242A3 (fr) 2010-01-13

Family

ID=40328647

Family Applications (1)

Application Number Title Priority Date Filing Date
EP08169844A Withdrawn EP2073242A3 (fr) 2007-12-21 2008-11-25 Tube, notamment tube électronique

Country Status (4)

Country Link
US (1) US20090167133A1 (fr)
EP (1) EP2073242A3 (fr)
CN (1) CN101504900A (fr)
DE (1) DE102007062054B4 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022229005A1 (fr) * 2021-04-28 2022-11-03 Koninklijke Philips N.V. Systèmes et procédés pour améliorer une prédiction de défaillance de filament de tube à rayons x

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009034646A1 (de) * 2009-07-24 2010-09-16 Siemens Aktiengesellschaft Strahlkopf
CN109769310A (zh) * 2017-11-10 2019-05-17 庄品洋 一种真空管音色微控装置和真空管音响功放系统
US20230154720A1 (en) * 2021-11-16 2023-05-18 Nuflare Technology, Inc. Method for estimating cathode lifetime of electron gun, and electron beam writing apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4708677A (en) 1985-12-27 1987-11-24 Itt Electro Optical Products, A Division Of Itt Corporation Method of measuring the temperature of a photocathode
EP0339714A1 (fr) 1988-04-20 1989-11-02 Koninklijke Philips Electronics N.V. Dispositif de tube électronique et tube électronique
JPH09245712A (ja) 1996-03-13 1997-09-19 Mitsubishi Electric Corp 陰極加熱監視装置およびその監視方法
DE19956391A1 (de) 1999-11-24 2001-05-31 Nobile Ag Verfahren und Vorschaltgerät zum Starten und Betreiben einer Leuchtstofflampe

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB411891A (en) * 1932-12-09 1934-06-11 Victor Henry Gilbert Improvements relating to pyrometers and like instruments
GB1157194A (en) * 1967-04-05 1969-07-02 Hirst Microwave Heating Ltd Magnetron Temperature Control
GB1196103A (en) * 1968-02-02 1970-06-24 Ass Elect Ind Improvements relating to Electron Guns
DE2312336A1 (de) * 1973-03-13 1974-09-19 Philips Patentverwaltung Anordnung zur messung der anodentemperatur einer roentgenroehre
JPS5721100A (en) * 1980-07-14 1982-02-03 Toshiba Corp X-ray generator
US5274305A (en) * 1991-12-04 1993-12-28 Gte Products Corporation Low pressure mercury discharge lamp with thermostatic control of mercury vapor pressure
WO1999020988A1 (fr) * 1997-10-20 1999-04-29 Texaco Development Corporation Appareil pour mesurer la temperature a l'interieur de reacteurs
US6512816B1 (en) * 2001-10-09 2003-01-28 Koninklijke Philips Electronics, N.V. Temperature clock for x-ray tubes
US7161312B2 (en) * 2003-08-14 2007-01-09 Sluggo Lighting Ltd. Distributed fluorescent light control system
FR2880510B1 (fr) * 2005-01-03 2007-03-16 Gen Electric Procede et systeme de regulation de courant de tube a rayon x
JP2007073395A (ja) * 2005-09-08 2007-03-22 Tokyo Electron Ltd マグネトロンの制御方法、マグネトロンの寿命判定方法、マイクロ波発生装置、マグネトロンの寿命判定装置、処理装置及び記憶媒体
CN101410928B (zh) * 2006-03-29 2010-11-03 皇家飞利浦电子股份有限公司 X射线焦斑温度的双色高温测量

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4708677A (en) 1985-12-27 1987-11-24 Itt Electro Optical Products, A Division Of Itt Corporation Method of measuring the temperature of a photocathode
EP0339714A1 (fr) 1988-04-20 1989-11-02 Koninklijke Philips Electronics N.V. Dispositif de tube électronique et tube électronique
JPH09245712A (ja) 1996-03-13 1997-09-19 Mitsubishi Electric Corp 陰極加熱監視装置およびその監視方法
DE19956391A1 (de) 1999-11-24 2001-05-31 Nobile Ag Verfahren und Vorschaltgerät zum Starten und Betreiben einer Leuchtstofflampe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022229005A1 (fr) * 2021-04-28 2022-11-03 Koninklijke Philips N.V. Systèmes et procédés pour améliorer une prédiction de défaillance de filament de tube à rayons x
US12507336B2 (en) 2021-04-28 2025-12-23 Koninklijke Philips N.V. Systems and methods to improve X-ray tube filament failure prediction

Also Published As

Publication number Publication date
EP2073242A3 (fr) 2010-01-13
US20090167133A1 (en) 2009-07-02
DE102007062054B4 (de) 2010-04-08
CN101504900A (zh) 2009-08-12
DE102007062054A1 (de) 2009-07-02

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