EP2183568A2 - Dispositif de detection heterodyne pour l'imagerie d'un objet par retroinjection - Google Patents
Dispositif de detection heterodyne pour l'imagerie d'un objet par retroinjectionInfo
- Publication number
- EP2183568A2 EP2183568A2 EP08850857A EP08850857A EP2183568A2 EP 2183568 A2 EP2183568 A2 EP 2183568A2 EP 08850857 A EP08850857 A EP 08850857A EP 08850857 A EP08850857 A EP 08850857A EP 2183568 A2 EP2183568 A2 EP 2183568A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- laser cavity
- wavelength
- signal
- original
- progressive signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 44
- 238000003384 imaging method Methods 0.000 title claims abstract description 20
- 238000002347 injection Methods 0.000 title abstract 2
- 239000007924 injection Substances 0.000 title abstract 2
- 230000000750 progressive effect Effects 0.000 claims abstract description 29
- 230000004048 modification Effects 0.000 claims abstract description 10
- 238000012986 modification Methods 0.000 claims abstract description 10
- 230000003287 optical effect Effects 0.000 claims description 21
- 230000010355 oscillation Effects 0.000 claims description 15
- 239000007787 solid Substances 0.000 claims description 3
- 230000009466 transformation Effects 0.000 claims description 3
- 238000006073 displacement reaction Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 230000001131 transforming effect Effects 0.000 claims description 2
- 238000006243 chemical reaction Methods 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 238000005259 measurement Methods 0.000 description 8
- 239000013307 optical fiber Substances 0.000 description 7
- 230000001360 synchronised effect Effects 0.000 description 6
- 230000008901 benefit Effects 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 230000010349 pulsation Effects 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- KWMNWMQPPKKDII-UHFFFAOYSA-N erbium ytterbium Chemical compound [Er].[Yb] KWMNWMQPPKKDII-UHFFFAOYSA-N 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000000386 microscopy Methods 0.000 description 1
- 238000004651 near-field scanning optical microscopy Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q20/00—Monitoring the movement or position of the probe
- G01Q20/02—Monitoring the movement or position of the probe by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
- G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
Definitions
- the invention relates to a detection device for imaging an object.
- the invention also relates to a detection method for imaging an object.
- the far-field detection devices for the imaging of an object
- the near-field detection devices it is known that the advantage of the detection devices in the near field is to allow the observation of objects of small size, notably smaller than the dimension defined by the Rayleigh criterion.
- a detection device for imaging an object comprising: a laser cavity arranged to emit an original luminous signal at an original wavelength towards the object so as to generate a evanescent wave on the surface of the object; transforming means arranged to transform the evanescent wave into a progressive signal having an output wavelength; - Rejection means arranged to inject the progressive signal into the laser cavity so as to generate disturbances within the laser cavity between the progressive signal and the original light signal;
- detection means arranged to detect the disturbances so as to determine at least one physical characteristic of the object.
- the reinjection into the laser cavity makes it possible to use the cavity as an interferometer, and the disturbances generated in the cavity are used to measure an amplitude of the evanescent waves and thus makes it possible to obtain a measurement of the characteristics of the object. .
- the disturbance detection is a homodyne detection for determining the amplitude of the evanescent waves.
- the problem solved by the invention is to improve the measurement of the evanescent wave generated on the surface of the object in a detection device for imaging an object.
- the problem solved by the invention is to be able to measure the phase of the evanescent wave generated on the surface of the object in a detection device for imaging an object.
- the detection device for the imaging of an object described above comprises wavelength modification means arranged so that the wavelength of the progressive signal injected into the laser cavity different from the original wavelength.
- the generation of heterodyne beats makes it possible to obtain a better contrast on the detection of the amplitude and the phase of the evanescent wave. It therefore allows measurements on the evanescent wave, even if the intensity of the evanescent wave collected is low.
- the laser cavity may be arranged to emit the light signal of orig ine in the infrared.
- the generation of the original light signal in the infrared has the advantage of allowing the use of highly developed standard telecommunication components.
- optical fiber components are common in this wavelength range.
- this wavelength range is easily accessible with conventional interferometric arrangements.
- the wavelength modification means comprise at least one acousto-optic modulator.
- the or each acousto-optic modulator has a preferred offset frequency and the combination of these accumulated offsets allows adjustment on the resulting offset to excite the relaxation oscillations of the reinjected laser.
- the device may comprise a first optical isolator positioned in the path of the original light signal so as to avoid propagation of a parasitic reflected optical signal towards the laser cavity.
- a first optical isolator positioned in the path of the original light signal so as to avoid propagation of a parasitic reflected optical signal towards the laser cavity.
- the device further comprises a second optical isolator positioned in the progressive signal path.
- the transformation means comprise a microtip.
- the invention also relates to a microscope comprising a detection device for imaging an object as described above.
- the invention also relates to a detection method for the imaging of an object comprising steps in which: a laser cavity emits a thin signal of origin at a wavelength of origin to the object so as to generate an evanescent wave on the surface of the object;
- the evanescent wave is transformed into a progressive signal;
- the progressive signal is injected into the laser cavity so as to generate disturbances within the laser cavity between the progressive signal and the original light signal;
- FIG. 3 represents a detection device for imaging an object according to another embodiment of the invention.
- the arrow in the optical isolator 6 indicates the direction of propagation of the laser beam 3 imposed by the optical isolator 6.
- the laser beam 3 is then transmitted to a device The acousto-optic modulator base 7, for example by means of a lens 8.
- the wavelength of the laser beam 3 is shifted to obtain a signal 9 of long wavelength ⁇ 2 , different from the wavelength ⁇ i.
- the signal 9 is transmitted to an object 10.
- the object 10 is for example a silica prism.
- the signal 9 When the signal 9 is injected on one side of the prism 10, it undergoes a total reflection on the hypotenuse of the prism 10 since the angle of incidence is greater than a limit angle of total reflection.
- the limiting angle is equal to 43.8 °.
- an evanescent wave is generated on the illuminated surface of the prism 10.
- the evanescent wave is uniform on the illuminated surface and its amplitude decreases exponentially beyond the silica / air interface perpendicular to the surface of the premium. It is possible to control the depth of penetration of the evanescent wave by adjusting the angle of incidence beyond the limit angle of total reflection.
- the progressive signal collected by the microtip 11 is then fed back to the laser cavity 2 by means of an optical fiber 12 also comprising an optical isolator 13.
- the signal photodetected by the photodiode 15 is demodulated at the heterodyne shift frequency determined from the wavelength difference ⁇ 2 - ⁇ -
- a synchronous detection HF 16 performs this demodulation, which provides information on both the amplitude and the phase of the optical signal taken at a point area by the microtip 1 1. In order to be able to visualize the results obtained, synchronous detection 16 can be connected to a digital oscilloscope 17.
- FIG. 2 a comparison between the theoretical variation of amplitude and phase with the variation of the amplitude and the phase of the signal detected on a plane dioptre corresponding to the surface of the prism 10 and obtained thanks to the device 1 previously described.
- the synchronous detection HF 16 is set so as to output two quadrature signals X and Y respectively corresponding to R.cos values.
- the feedback is such that it excites the relaxation oscillations, which generates disturbances in the form of beats within the laser cavity 2.
- These beats are used by the synchronous detection 16 to obtain the amplitude characteristics. and phase of the prism 10.
- a gain factor K of the order of 1 million (10 6 ) is obtained compared to a simple feedback without frequency shift.
- This gain factor K is substantially equal to the ratio between the radiative lifetime of the emitter level of the amplifying medium of the laser cavity 2 and the lifetime of the photons in the laser cavity 2.
- Such a gain factor makes it possible to obtain a better contrast of the disturbances induced by the feedback in the laser cavity 2, and therefore a better sensitivity of the detection of the characteristics of the object 10 and a better imaging of this object.
- a detection of the evanescent wave in transmission following the passage of the laser beam 3 by the prism 10 has been used.
- FIG. 3 there is shown an embodiment of the invention in reflection.
- the signal 9 of wavelength ⁇ 2 thus generated is sent via an objective 8 to the object 10 that is to be imaged.
- an evanescent wave is generated.
- This evanescent wave is diffused by a microtip 11 in the form of a reflected signal 20.
- This reflected signal 20 again undergoes a shift of ⁇ at the passage through the acousto-optical modulator device 7, and is reinjected into the laser cavity 2 so as to generate beats within the laser cavity 2.
- the output signal of the laser is then transmitted by a separate channel to a photodetector 15 connected to a synchronous detection.
- the synchronous detection 16 makes it possible to detect the beats induced in the laser cavity 2 so as to determine the characteristics of the object 10.
- the intensity of these beats has the following form:
- ⁇ / 2.K ⁇ I ref .I s . cos ( ⁇ + ⁇ s)
- K is a value representing the gain provided by the feedback
- the re f is the intensity of the reference signal from the laser 2
- Is is the intensity of the evanescent wave signal collected and then reinjected into the laser
- ⁇ s is the phase of this signal.
- the gain factor K can then be of the order of 1 million (10 6 ).
- the gain factor K is equal to 1 for a standard interferometric device of the Mach-Zender or Michelson type with frequency offset for the heterodyne detection. On the contrary, for reinjection devices, it can reach this value of 1 million depending on the laser cavity used.
- a laser source has been described in the form of a diode-pumped solid-state laser cavity.
- a built-in microlaser or a DFB fiber laser while maintaining the same order of magnitude on the gain in sensitivity.
- a laser source emitting in the near-infrared range and in particular at a wavelength of 1.535 micrometers, has been described above.
- This range of wavelengths has the advantage of allowing measurements in transmission and to be well suitable for optical fiber components used in telecommunications.
- other ranges of wavelengths and other laser sources may be used.
- a device based on acousto-optical modulators 7 comprising two acousto-optical modulators positioned in the path of the original light signal, before the lens 8. It is understood that one or both modulators modulators can be positioned after the object 10, in the path of the progressive signal. According to this variant, the frequency modification function of the acousto-optical modulators is maintained independently of their position.
- the previously described detection device associated with scanning means for the microtip as mentioned above can advantageously be used in a SNOM-type microscope for Scanning Near Field Optical Microscopy, or evanescent field detection microscopy.
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0706185A FR2920538B1 (fr) | 2007-09-04 | 2007-09-04 | Dispositif de detection heterodyne pour l'imagerie d'un objet par retroinjection |
| PCT/FR2008/001226 WO2009063145A2 (fr) | 2007-09-04 | 2008-09-03 | Dispositif de detection heterodyne pour l'imagerie d'un objet par retroinjection |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP2183568A2 true EP2183568A2 (fr) | 2010-05-12 |
Family
ID=38740464
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP08850857A Withdrawn EP2183568A2 (fr) | 2007-09-04 | 2008-09-03 | Dispositif de detection heterodyne pour l'imagerie d'un objet par retroinjection |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8654340B2 (fr) |
| EP (1) | EP2183568A2 (fr) |
| JP (2) | JP2010538287A (fr) |
| FR (1) | FR2920538B1 (fr) |
| WO (1) | WO2009063145A2 (fr) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012166572A1 (fr) | 2011-05-27 | 2012-12-06 | Imra America, Inc. | Systèmes à peigne de fréquences optiques compacts |
| US11522901B2 (en) | 2016-09-23 | 2022-12-06 | OPSWAT, Inc. | Computer security vulnerability assessment |
| US9749349B1 (en) | 2016-09-23 | 2017-08-29 | OPSWAT, Inc. | Computer security vulnerability assessment |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2769091A1 (fr) * | 1997-09-30 | 1999-04-02 | Univ Joseph Fourier | Detecteur optique actif |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4947034A (en) * | 1989-04-28 | 1990-08-07 | International Business Machines Corporation | Apertureless near field optical microscope |
| JPH0711629B2 (ja) * | 1989-09-04 | 1995-02-08 | 新技術事業団 | 光走査トンネル顕微鏡 |
| JP2941911B2 (ja) * | 1990-03-27 | 1999-08-30 | 科学技術振興事業団 | 反射型光走査トンネル顕微鏡 |
| JPH07110206A (ja) * | 1993-10-08 | 1995-04-25 | Brother Ind Ltd | 光ヘテロダイン干渉計 |
| US5371588A (en) * | 1993-11-10 | 1994-12-06 | University Of Maryland, College Park | Surface profile and material mapper using a driver to displace the sample in X-Y-Z directions |
| JPH07167608A (ja) * | 1993-12-15 | 1995-07-04 | Hitachi Ltd | 干渉計及び光走査型トンネル顕微鏡 |
| JPH08136216A (ja) * | 1994-09-13 | 1996-05-31 | Olympus Optical Co Ltd | 光位置変位センサ |
| US5835199A (en) * | 1996-05-17 | 1998-11-10 | Coherent Technologies | Fiber-based ladar transceiver for range/doppler imaging with frequency comb generator |
| JPH1019508A (ja) * | 1996-07-02 | 1998-01-23 | Nikon Corp | 光波干渉測定装置および屈折率変動測定系 |
| FR2785045B1 (fr) | 1998-10-23 | 2001-01-19 | Centre Nat Rech Scient | Integration monolithique d'un systeme de detection pour la microscopie en champ proche base sur la reinjection optique dans un laser a cavite verticale emettant par la surface |
| JP4370032B2 (ja) * | 2000-01-06 | 2009-11-25 | オリンパス株式会社 | 近接場光学顕微鏡装置 |
| EP1307714A4 (fr) * | 2000-07-12 | 2007-04-04 | Macquarie Res Ltd | Detection optique heterodyne en spectroscopie optique de ringdown de cavite |
| JP4298233B2 (ja) * | 2002-07-30 | 2009-07-15 | キヤノン株式会社 | 近接場光源装置、該近接場光源装置を有する光ヘッド、露光装置、顕微鏡装置 |
| US7075058B2 (en) * | 2003-03-28 | 2006-07-11 | The United States Of America As Represented By The United States Department Of Energy | Photothermal imaging scanning microscopy |
| US7400797B2 (en) * | 2004-10-06 | 2008-07-15 | Corning Incorporated | Transverse closed-loop resonator |
-
2007
- 2007-09-04 FR FR0706185A patent/FR2920538B1/fr active Active
-
2008
- 2008-09-03 US US12/675,693 patent/US8654340B2/en not_active Expired - Fee Related
- 2008-09-03 JP JP2010523559A patent/JP2010538287A/ja active Pending
- 2008-09-03 EP EP08850857A patent/EP2183568A2/fr not_active Withdrawn
- 2008-09-03 WO PCT/FR2008/001226 patent/WO2009063145A2/fr not_active Ceased
-
2014
- 2014-09-16 JP JP2014187963A patent/JP2015042982A/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2769091A1 (fr) * | 1997-09-30 | 1999-04-02 | Univ Joseph Fourier | Detecteur optique actif |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2015042982A (ja) | 2015-03-05 |
| WO2009063145A3 (fr) | 2009-07-16 |
| WO2009063145A2 (fr) | 2009-05-22 |
| JP2010538287A (ja) | 2010-12-09 |
| FR2920538A1 (fr) | 2009-03-06 |
| FR2920538B1 (fr) | 2009-11-20 |
| US8654340B2 (en) | 2014-02-18 |
| US20110211197A1 (en) | 2011-09-01 |
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