EP2359122A4 - Système et procédé d inspection - Google Patents

Système et procédé d inspection Download PDF

Info

Publication number
EP2359122A4
EP2359122A4 EP09794834.3A EP09794834A EP2359122A4 EP 2359122 A4 EP2359122 A4 EP 2359122A4 EP 09794834 A EP09794834 A EP 09794834A EP 2359122 A4 EP2359122 A4 EP 2359122A4
Authority
EP
European Patent Office
Prior art keywords
inspection system
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP09794834.3A
Other languages
German (de)
English (en)
Other versions
EP2359122A2 (fr
Inventor
Stanley P. Johnson
Lawrence J. ZAGORSKY
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Quest Metrology LLC
Original Assignee
Quest Metrology LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US12/383,141 external-priority patent/US8035094B2/en
Application filed by Quest Metrology LLC filed Critical Quest Metrology LLC
Publication of EP2359122A2 publication Critical patent/EP2359122A2/fr
Publication of EP2359122A4 publication Critical patent/EP2359122A4/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2425—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures of screw-threads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
EP09794834.3A 2008-07-10 2009-07-10 Système et procédé d inspection Withdrawn EP2359122A4 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13448708P 2008-07-10 2008-07-10
US12/383,141 US8035094B2 (en) 2002-06-17 2009-03-20 Methods for measuring at least one physical characteristic of a component
PCT/US2009/004030 WO2010005591A2 (fr) 2008-07-10 2009-07-10 Système et procédé d'inspection

Publications (2)

Publication Number Publication Date
EP2359122A2 EP2359122A2 (fr) 2011-08-24
EP2359122A4 true EP2359122A4 (fr) 2017-03-29

Family

ID=41507641

Family Applications (1)

Application Number Title Priority Date Filing Date
EP09794834.3A Withdrawn EP2359122A4 (fr) 2008-07-10 2009-07-10 Système et procédé d inspection

Country Status (3)

Country Link
EP (1) EP2359122A4 (fr)
JP (1) JP2012504223A (fr)
WO (1) WO2010005591A2 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2392895B1 (fr) * 2010-06-01 2013-03-06 Tenaris Connections Ltd. Procédé et dispositif de mesure de paramètres de filetage avec revêtement de surface
ITRN20110031A1 (it) * 2011-05-03 2012-11-04 Vici & C S R L Metodo di determinazione optoelettronica di parametri di filettatura
CN104459936B (zh) * 2014-12-11 2017-01-18 北京空间机电研究所 一种大口径反射镜组件微应力装配方法
EP3324194B1 (fr) * 2016-11-22 2019-06-26 Anton Paar GmbH Espace d'imagerie entre un échantillon et une sonde d'un microscope à sonde de balayage en vue latérale sensiblement horizontale
CN110849287B (zh) * 2019-11-27 2021-05-25 陕西理工大学 一种机器视觉螺纹牙型角补偿方法
JP2021116473A (ja) * 2020-01-27 2021-08-10 三菱マテリアル株式会社 錫又は錫合金電解めっき液、バンプの形成方法、及び回路基板の製造方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006153809A (ja) * 2004-12-01 2006-06-15 Mitsubishi Nuclear Fuel Co Ltd 内面検査装置及び缶内面検査装置
US20080043252A1 (en) * 2006-06-27 2008-02-21 Parlour Noel S Internal and external measuring device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3009253A (en) * 1959-08-14 1961-11-21 Bror W Swanson Thread comparator
JPS5811804A (ja) * 1981-07-14 1983-01-22 Sumitomo Metal Ind Ltd ネジ形状測定方法及び装置
US4644394A (en) * 1985-12-31 1987-02-17 Dale Reeves Apparatus for inspecting an externally threaded surface of an object
US5521707A (en) * 1991-08-21 1996-05-28 Apeiron, Inc. Laser scanning method and apparatus for rapid precision measurement of thread form
US6055329A (en) * 1994-06-09 2000-04-25 Sherikon, Inc. High speed opto-electronic gage and method for gaging
US5646724A (en) * 1995-08-18 1997-07-08 Candid Logic, Inc. Threaded parts inspection device
US6111601A (en) * 1995-12-11 2000-08-29 Adachi; Yoshi Non-contacting laser gauge for qualifying screw fasteners and the like
US6683995B2 (en) * 1999-12-23 2004-01-27 Eastman Kodak Company Method and apparatus for correcting large defects in digital images
NL1014067C2 (nl) * 2000-01-12 2001-07-16 Reginald Ir Galestien Een methode voor het meten van parameters van inwendige en uitwendige schroefdraad en soortgelijke groeven met behulp van wigtasters.
US7777209B2 (en) * 2002-06-17 2010-08-17 Johnson Stanley P Product inspection system and a method for implementing same
US7453583B2 (en) * 2004-02-20 2008-11-18 International Business Machines Corporation Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty
US7684054B2 (en) * 2006-08-25 2010-03-23 Gii Acquisition, Llc Profile inspection system for threaded and axial components

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006153809A (ja) * 2004-12-01 2006-06-15 Mitsubishi Nuclear Fuel Co Ltd 内面検査装置及び缶内面検査装置
US20080043252A1 (en) * 2006-06-27 2008-02-21 Parlour Noel S Internal and external measuring device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PFEIFER T ET AL: "BERUHRUNGSLOSE OPTISCHE INNENGEWINDEMESSUNG", TR TRANSFER: EUROPAEISCHE INDUSTRIE- UND HANDELSZEITUNG, HALLWAG AG, CH, vol. 81, no. 4, 27 January 1989 (1989-01-27), pages 52 - 55,57, XP000046253, ISSN: 1023-0823 *

Also Published As

Publication number Publication date
JP2012504223A (ja) 2012-02-16
WO2010005591A2 (fr) 2010-01-14
WO2010005591A3 (fr) 2011-07-14
EP2359122A2 (fr) 2011-08-24

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Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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17P Request for examination filed

Effective date: 20110207

AK Designated contracting states

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Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: JOHNSON THREAD-VIEW SYSTEMS LLC

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: QUEST METROLOGY GROUP, LLC

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: QUEST METROLOGY, LLC

DAX Request for extension of the european patent (deleted)
A4 Supplementary search report drawn up and despatched

Effective date: 20170301

RIC1 Information provided on ipc code assigned before grant

Ipc: G01B 11/12 20060101ALI20170222BHEP

Ipc: G01N 21/954 20060101ALI20170222BHEP

Ipc: G01N 21/88 20060101ALI20170222BHEP

Ipc: G01B 11/24 20060101AFI20170222BHEP

Ipc: G01N 21/95 20060101ALI20170222BHEP

STAA Information on the status of an ep patent application or granted ep patent

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18W Application withdrawn

Effective date: 20170911