EP2573589A3 - Bildsensor und Röntgenbildabtastungsmodul damit - Google Patents

Bildsensor und Röntgenbildabtastungsmodul damit Download PDF

Info

Publication number
EP2573589A3
EP2573589A3 EP12185127.3A EP12185127A EP2573589A3 EP 2573589 A3 EP2573589 A3 EP 2573589A3 EP 12185127 A EP12185127 A EP 12185127A EP 2573589 A3 EP2573589 A3 EP 2573589A3
Authority
EP
European Patent Office
Prior art keywords
terminal
same
sensing module
module including
image sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP12185127.3A
Other languages
English (en)
French (fr)
Other versions
EP2573589B1 (de
EP2573589A2 (de
Inventor
Sang-Wook Han
Hyun-Sik Kim
Gyu-Hyeong Cho
Chang-Jung Kim
Jae-Chul Park
Young-Hun Sung
Young Kim
Jun-hyeok Yamg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Korea Advanced Institute of Science and Technology KAIST
Original Assignee
Samsung Electronics Co Ltd
Korea Advanced Institute of Science and Technology KAIST
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd, Korea Advanced Institute of Science and Technology KAIST filed Critical Samsung Electronics Co Ltd
Publication of EP2573589A2 publication Critical patent/EP2573589A2/de
Publication of EP2573589A3 publication Critical patent/EP2573589A3/de
Application granted granted Critical
Publication of EP2573589B1 publication Critical patent/EP2573589B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/12—Arrangements for detecting or locating foreign bodies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/15—Charge-coupled device [CCD] image sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Medical Informatics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Surgery (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
  • Amplifiers (AREA)
  • Solid State Image Pick-Up Elements (AREA)
EP12185127.3A 2011-09-23 2012-09-20 Bildsensor und Röntgenbildabtastungsmodul damit Active EP2573589B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020110096371A KR101842259B1 (ko) 2011-09-23 2011-09-23 이미지 센서 및 이를 포함하는 엑스-레이 이미지 센싱 모듈

Publications (3)

Publication Number Publication Date
EP2573589A2 EP2573589A2 (de) 2013-03-27
EP2573589A3 true EP2573589A3 (de) 2015-06-03
EP2573589B1 EP2573589B1 (de) 2019-11-20

Family

ID=47221933

Family Applications (1)

Application Number Title Priority Date Filing Date
EP12185127.3A Active EP2573589B1 (de) 2011-09-23 2012-09-20 Bildsensor und Röntgenbildabtastungsmodul damit

Country Status (5)

Country Link
US (1) US9086494B2 (de)
EP (1) EP2573589B1 (de)
JP (1) JP2013070372A (de)
KR (1) KR101842259B1 (de)
CN (1) CN103022066A (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5858652B2 (ja) * 2011-06-08 2016-02-10 キヤノン株式会社 固体撮像装置及び固体撮像装置の駆動方法
US20130301799A1 (en) * 2012-05-14 2013-11-14 Samsung Electronics Co., Ltd. X-ray imaging apparatus and control method therefor
KR20150053159A (ko) 2013-11-07 2015-05-15 삼성전자주식회사 서로 다른 시점에 입력된 전하 패킷에 기초하여 전압을 획득하는 방법 및 장치
JP2017050577A (ja) * 2014-01-21 2017-03-09 パナソニックＩｐマネジメント株式会社 固体撮像装置
JP2016092470A (ja) 2014-10-30 2016-05-23 ソニー株式会社 撮像素子、および、撮像装置
US12401911B2 (en) 2014-11-07 2025-08-26 Duelight Llc Systems and methods for generating a high-dynamic range (HDR) pixel stream
US12401912B2 (en) 2014-11-17 2025-08-26 Duelight Llc System and method for generating a digital image
US9380208B1 (en) * 2015-04-13 2016-06-28 Omnivision Technologies, Inc. Image sensor power supply rejection ratio noise reduction through ramp generator
US12445736B2 (en) 2015-05-01 2025-10-14 Duelight Llc Systems and methods for generating a digital image
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
US9571775B1 (en) * 2015-11-16 2017-02-14 Omnivision Technologies, Inc. Image sensor power supply rejection ratio improvement through ramp generator in continuous time readout circuitry
US10677942B2 (en) 2016-02-01 2020-06-09 Shenzhen Xpectvision Technology Co., Ltd. X-ray detectors capable of managing charge sharing
KR101985378B1 (ko) * 2017-05-02 2019-06-10 주식회사 레이 치아 촬영용 엑스레이 촬영기
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
CN108768327B (zh) * 2018-05-30 2022-04-19 湖南国科微电子股份有限公司 运算放大器
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
CN111225166B (zh) * 2020-03-02 2021-11-19 上海集成电路研发中心有限公司 一种高动态范围的图像传感器读出电路及读出方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5751189A (en) * 1995-10-03 1998-05-12 Omnivision Technologies, Inc. Charge amplifier for MOS imaging array and method of making same
US6163029A (en) * 1997-09-22 2000-12-19 Kabushiki Kaisha Toshiba Radiation detector, radiation detecting method and X-ray diagnosing apparatus with same radiation detector
WO2010090135A1 (ja) * 2009-02-03 2010-08-12 浜松ホトニクス株式会社 信号処理装置および光検出装置
US20100329425A1 (en) * 2009-06-24 2010-12-30 Jianjun Guo Readout electronics for photon counting and energy discriminating detectors

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4529965A (en) * 1983-05-03 1985-07-16 Racal Data Communications Switched-capacitor circuit analog-to-digital converter
JP3146716B2 (ja) * 1993-02-10 2001-03-19 富士電機株式会社 光電変換回路
US5363055A (en) * 1993-03-15 1994-11-08 General Electric Company Photodiode preamplifier with programmable gain amplification
US7173230B2 (en) * 2001-09-05 2007-02-06 Canesta, Inc. Electromagnetic wave detection arrangement with capacitive feedback
JP4216141B2 (ja) 2002-08-27 2009-01-28 シャープ株式会社 電荷検出回路、および、その回路定数設計方法
JP4343068B2 (ja) 2004-09-07 2009-10-14 シャープ株式会社 電荷検出回路およびそれを備えた画像センサ
JP5317388B2 (ja) * 2005-09-30 2013-10-16 キヤノン株式会社 放射線撮像装置、放射線撮像システム及びプログラム
JP4882652B2 (ja) * 2006-10-06 2012-02-22 ソニー株式会社 固体撮像装置、固体撮像装置の駆動方法および撮像装置
US8159286B2 (en) * 2007-10-08 2012-04-17 General Electric Company System and method for time-to-voltage conversion with lock-out logic
KR101448151B1 (ko) 2008-02-21 2014-10-13 삼성전자주식회사 상호연관 이중 샘플링 회로
JP2010034813A (ja) 2008-07-29 2010-02-12 Victor Co Of Japan Ltd 固体撮像素子のｃｄｓ回路
US8440957B2 (en) * 2009-02-25 2013-05-14 Bart Dierickx Counting pixel with good dynamic range properties
US8039811B1 (en) * 2009-12-04 2011-10-18 X-Scan Imaging Corporation CMOS time delay integration sensor for X-ray imaging applications

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5751189A (en) * 1995-10-03 1998-05-12 Omnivision Technologies, Inc. Charge amplifier for MOS imaging array and method of making same
US6163029A (en) * 1997-09-22 2000-12-19 Kabushiki Kaisha Toshiba Radiation detector, radiation detecting method and X-ray diagnosing apparatus with same radiation detector
WO2010090135A1 (ja) * 2009-02-03 2010-08-12 浜松ホトニクス株式会社 信号処理装置および光検出装置
EP2395566A1 (de) * 2009-02-03 2011-12-14 Hamamatsu Photonics K.K. Signalverarbeitungsvorrichtung und fotodetektor
US20100329425A1 (en) * 2009-06-24 2010-12-30 Jianjun Guo Readout electronics for photon counting and energy discriminating detectors

Also Published As

Publication number Publication date
CN103022066A (zh) 2013-04-03
JP2013070372A (ja) 2013-04-18
US20130075608A1 (en) 2013-03-28
EP2573589B1 (de) 2019-11-20
EP2573589A2 (de) 2013-03-27
KR101842259B1 (ko) 2018-03-27
US9086494B2 (en) 2015-07-21
KR20130032644A (ko) 2013-04-02

Similar Documents

Publication Publication Date Title
EP2573589A3 (de) Bildsensor und Röntgenbildabtastungsmodul damit
WO2008102649A1 (ja) 撮像装置および表示装置
EP2645707A3 (de) Erhöhung des dynamischen Bereichs für einen Röntgenbildsensor
EP2728840A3 (de) Elektronische Vorrichtung und Verfahren zur Spracherkennung
EP2648333A3 (de) Sensorverstärkungsanordnung und Verfahren zur Verstärkung eines Sensorsignals
JP2010213097A5 (de)
EP2230832A3 (de) Festkörperabbildungsvorrichtung, Ansteuerungsverfahren und elektronische Vorrichtung
EP2388599A3 (de) Motorstromerfassungs-IC und Motorstromdetektor oder Motorsteuervorrichtung, der bzw. die den IC verwendet
EP2574043A3 (de) Ladungsmessung mit Mehrfachverstärkung in Bildsensoren
EP2711815A3 (de) Positionsbestimmungsvorrichtung
EP2773104A3 (de) Strahlungsabbildungsvorrichtung und Abbildungssystem
EP2778865A3 (de) Eingangssteuerverfahren und elektronische Vorrichtung zur Unterstützung davon
EP2363788A3 (de) Koordinateneingabevorrichtung und Anzeigevorrichtung damit
EP2728455A3 (de) Mobiles Endgerät und Steuerungsverfahren dafür
GB201200761D0 (en) Improvements in or relating to image sensors
EP2592825A3 (de) Halbleiterabbildungsvorrichtung
JP2013065969A5 (de)
EP2562556A3 (de) Magnetischer Sensor mit niedrigem elektrischem Versatz
EP2385359A3 (de) Arrayelement für eine Temperatursensor-Arrayschaltung, Temperatursensor-Arrayschaltung mit dem Arrayelement und AM-EWOD-Vorrichtung mit der Temperatursensor-Arrayschaltung
EP2424094A3 (de) Ladepumpe mit Rampenratensteuerung
WO2013060348A8 (de) Elektronisches gerät, insbesondere mobiltelefon, zur strahlungsdetektion
EP2405525A3 (de) Batteriepack mit erhöhter Ladefunktion und Verfahren dazu
EP2194390A3 (de) Integriertes Sensorarray mit Versatzverringerung
EP2709276A3 (de) Signalverstärkungsschaltung und Signalverstärkungbestimmungsschaltung mit der Signalverstärkungsschaltung
EP2469997A3 (de) Elektronische Vorrichtung

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

AX Request for extension of the european patent

Extension state: BA ME

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

AX Request for extension of the european patent

Extension state: BA ME

RIC1 Information provided on ipc code assigned before grant

Ipc: G01T 1/17 20060101ALI20150430BHEP

Ipc: G01T 1/24 20060101AFI20150430BHEP

17P Request for examination filed

Effective date: 20151203

RBV Designated contracting states (corrected)

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: EXAMINATION IS IN PROGRESS

17Q First examination report despatched

Effective date: 20180716

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: GRANT OF PATENT IS INTENDED

INTG Intention to grant announced

Effective date: 20190401

GRAJ Information related to disapproval of communication of intention to grant by the applicant or resumption of examination proceedings by the epo deleted

Free format text: ORIGINAL CODE: EPIDOSDIGR1

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: EXAMINATION IS IN PROGRESS

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: GRANT OF PATENT IS INTENDED

INTC Intention to grant announced (deleted)
INTG Intention to grant announced

Effective date: 20190709

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE PATENT HAS BEEN GRANTED

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

REG Reference to a national code

Ref country code: CH

Ref legal event code: EP

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

REG Reference to a national code

Ref country code: DE

Ref legal event code: R096

Ref document number: 602012065771

Country of ref document: DE

REG Reference to a national code

Ref country code: AT

Ref legal event code: REF

Ref document number: 1204804

Country of ref document: AT

Kind code of ref document: T

Effective date: 20191215

REG Reference to a national code

Ref country code: NL

Ref legal event code: FP

REG Reference to a national code

Ref country code: LT

Ref legal event code: MG4D

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: LV

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: SE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: BG

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20200220

Ref country code: LT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: NO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20200220

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20200221

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: HR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: RS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: IS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20200320

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: AL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: RO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: CZ

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: EE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20200412

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

REG Reference to a national code

Ref country code: AT

Ref legal event code: MK05

Ref document number: 1204804

Country of ref document: AT

Kind code of ref document: T

Effective date: 20191120

REG Reference to a national code

Ref country code: DE

Ref legal event code: R097

Ref document number: 602012065771

Country of ref document: DE

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: SM

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: NL

Payment date: 20200821

Year of fee payment: 9

26N No opposition filed

Effective date: 20200821

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20200824

Year of fee payment: 9

Ref country code: DE

Payment date: 20200820

Year of fee payment: 9

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: AT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: PL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: MC

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

REG Reference to a national code

Ref country code: BE

Ref legal event code: MM

Effective date: 20200930

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20200920

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20200930

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: BE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20200930

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20200930

Ref country code: IE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20200920

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20200930

REG Reference to a national code

Ref country code: DE

Ref legal event code: R119

Ref document number: 602012065771

Country of ref document: DE

REG Reference to a national code

Ref country code: NL

Ref legal event code: MM

Effective date: 20211001

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20210920

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: TR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: MT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

Ref country code: CY

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20211001

Ref country code: MK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20191120

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20210920

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20220401