EP2581377A4 - Hydrosilanderivat, verfahren zu seiner herstellung und verfahren zur herstellung einer siliciumhaltigen dünnschicht - Google Patents

Hydrosilanderivat, verfahren zu seiner herstellung und verfahren zur herstellung einer siliciumhaltigen dünnschicht

Info

Publication number
EP2581377A4
EP2581377A4 EP20110792310 EP11792310A EP2581377A4 EP 2581377 A4 EP2581377 A4 EP 2581377A4 EP 20110792310 EP20110792310 EP 20110792310 EP 11792310 A EP11792310 A EP 11792310A EP 2581377 A4 EP2581377 A4 EP 2581377A4
Authority
EP
European Patent Office
Prior art keywords
producing
thin film
same
containing thin
hydrosilane derivative
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP20110792310
Other languages
English (en)
French (fr)
Other versions
EP2581377A1 (de
EP2581377B1 (de
Inventor
Ken-Ichi Tada
Kohei Iwanaga
Toshiki Yamamoto
Atsushi Maniwa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sagami Chemical Research Institute
Tosoh Corp
Original Assignee
Sagami Chemical Research Institute
Tosoh Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sagami Chemical Research Institute, Tosoh Corp filed Critical Sagami Chemical Research Institute
Publication of EP2581377A1 publication Critical patent/EP2581377A1/de
Publication of EP2581377A4 publication Critical patent/EP2581377A4/de
Application granted granted Critical
Publication of EP2581377B1 publication Critical patent/EP2581377B1/de
Not-in-force legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
    • C07F7/02—Silicon compounds
    • C07F7/025—Silicon compounds without C-silicon linkages
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/34—Nitrides
    • C23C16/345—Silicon nitride
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40—Oxides
    • C23C16/401—Oxides containing silicon
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
    • H10P14/6326—Deposition processes
    • H10P14/6328—Deposition from the gas or vapour phase
    • H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/69—Inorganic materials
    • H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
    • H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
    • H10P14/69215—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material being a silicon oxide, e.g. SiO2
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/69—Inorganic materials
    • H10P14/694—Inorganic materials composed of nitrides
    • H10P14/6943—Inorganic materials composed of nitrides containing silicon
    • H10P14/69433—Inorganic materials composed of nitrides containing silicon the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Vapour Deposition (AREA)
  • Formation Of Insulating Films (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
EP11792310.2A 2010-06-10 2011-05-30 Hydrosilanderivat, verfahren zu seiner herstellung und verfahren zur herstellung einer siliciumhaltigen dünnschicht Not-in-force EP2581377B1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2010132539 2010-06-10
JP2010200542 2010-09-08
JP2010259888 2010-11-22
PCT/JP2011/062320 WO2011155353A1 (ja) 2010-06-10 2011-05-30 ヒドロシラン誘導体、その製造方法、及びケイ素含有薄膜の製造法

Publications (3)

Publication Number Publication Date
EP2581377A1 EP2581377A1 (de) 2013-04-17
EP2581377A4 true EP2581377A4 (de) 2014-03-05
EP2581377B1 EP2581377B1 (de) 2015-07-29

Family

ID=45097961

Family Applications (1)

Application Number Title Priority Date Filing Date
EP11792310.2A Not-in-force EP2581377B1 (de) 2010-06-10 2011-05-30 Hydrosilanderivat, verfahren zu seiner herstellung und verfahren zur herstellung einer siliciumhaltigen dünnschicht

Country Status (8)

Country Link
US (1) US9120825B2 (de)
EP (1) EP2581377B1 (de)
JP (1) JP5706755B2 (de)
KR (1) KR101768259B1 (de)
CN (1) CN103124734B (de)
SG (1) SG186235A1 (de)
TW (1) TWI520968B (de)
WO (1) WO2011155353A1 (de)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013177326A1 (en) * 2012-05-25 2013-11-28 Advanced Technology Materials, Inc. Silicon precursors for low temperature ald of silicon-based thin-films
US9796739B2 (en) * 2013-06-26 2017-10-24 Versum Materials Us, Llc AZA-polysilane precursors and methods for depositing films comprising same
TW201610204A (zh) 2014-07-26 2016-03-16 應用材料股份有限公司 矽碳氮氧化物的低溫分子層沉積
KR20170019668A (ko) * 2015-08-12 2017-02-22 (주)디엔에프 플라즈마 원자층 증착법을 이용한 실리콘 질화 박막의 제조방법
US11440929B2 (en) * 2018-06-19 2022-09-13 Versum Materials Us, Llc Bis(diazadiene)cobalt compounds, method of making and method of use thereof
JP6980624B2 (ja) * 2018-09-13 2021-12-15 株式会社Kokusai Electric 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム
KR102186868B1 (ko) * 2019-05-02 2020-12-04 (주)이지켐 신규한 실리콘 전구체 화합물 및 이를 이용한 실리콘 함유 박막의 제조방법
US12072140B2 (en) * 2020-12-30 2024-08-27 Whirlpool Corporation Insulation materials for a heat and sound insulated structure and methods of forming with a mold that is gas and liquid permeable
CN114181243B (zh) * 2021-12-01 2024-04-02 浙江皇马科技股份有限公司 一种甲基二甲氧基氢硅烷的制备方法
WO2023215440A1 (en) 2022-05-04 2023-11-09 Nexgen Oilfield Chemicals, Llc Compositions and methods for scavenging hydrogen sulfide

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5866471A (en) 1995-12-26 1999-02-02 Kabushiki Kaisha Toshiba Method of forming semiconductor thin film and method of fabricating solar cell
JP5040162B2 (ja) * 2006-04-27 2012-10-03 東ソー株式会社 アルケニル基含有有機シラン化合物から成るＳｉ含有膜形成材料およびその用途
US8318966B2 (en) 2006-06-23 2012-11-27 Praxair Technology, Inc. Organometallic compounds
JP2008007471A (ja) * 2006-06-30 2008-01-17 Mitsubishi Materials Corp 有機金属化学蒸着法用原料及び該原料を用いたシリコン含有膜の製造方法
US8101788B2 (en) * 2006-09-29 2012-01-24 Air Liquide Electronics U.S. Lp Silicon precursors and method for low temperature CVD of silicon-containing films
JP4836761B2 (ja) 2006-11-29 2011-12-14 株式会社日立国際電気 半導体デバイスの製造方法
WO2008128141A2 (en) * 2007-04-12 2008-10-23 Advanced Technology Materials, Inc. Zirconium, hafnuim, titanium, and silicon precursors for ald/cvd
JP2009045964A (ja) 2007-08-14 2009-03-05 Toyota Motor Corp 車両用空気調和装置及びその制御方法
WO2009045964A1 (en) 2007-10-01 2009-04-09 Applied Materials, Inc. Low temperature conformal oxide formation and applications
EP2194029A1 (de) 2008-10-29 2010-06-09 NGK Insulators, Ltd. Ferrit-Pulver und Verfahren zu dessen Herstellung
JP2010200542A (ja) 2009-02-26 2010-09-09 Toyota Motor Corp 自動車
JP2011112373A (ja) 2009-11-24 2011-06-09 Mitsubishi Electric Corp レーダ信号処理装置
JP5070475B2 (ja) 2010-08-27 2012-11-14 株式会社大一商会 遊技機

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
No further relevant documents disclosed *

Also Published As

Publication number Publication date
US20130123528A1 (en) 2013-05-16
TWI520968B (zh) 2016-02-11
CN103124734B (zh) 2015-07-15
CN103124734A (zh) 2013-05-29
KR20130112025A (ko) 2013-10-11
EP2581377A1 (de) 2013-04-17
EP2581377B1 (de) 2015-07-29
WO2011155353A1 (ja) 2011-12-15
KR101768259B1 (ko) 2017-08-14
JP5706755B2 (ja) 2015-04-22
JP2012126704A (ja) 2012-07-05
SG186235A1 (en) 2013-01-30
US9120825B2 (en) 2015-09-01
TW201213339A (en) 2012-04-01

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