EP2648290A4 - TERRAHERTZ ELECTROMAGNETIC WAVE CONVERSION DEVICE - Google Patents
TERRAHERTZ ELECTROMAGNETIC WAVE CONVERSION DEVICEInfo
- Publication number
- EP2648290A4 EP2648290A4 EP10860400.0A EP10860400A EP2648290A4 EP 2648290 A4 EP2648290 A4 EP 2648290A4 EP 10860400 A EP10860400 A EP 10860400A EP 2648290 A4 EP2648290 A4 EP 2648290A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- terrahertz
- electromagnetic wave
- conversion device
- wave conversion
- electromagnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/47—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having two-dimensional [2D] charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
- H10D30/471—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT]
- H10D30/475—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs
- H10D30/4755—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs having wide bandgap charge-carrier supplying layers, e.g. modulation doped HEMTs such as n-AlGaAs/GaAs HEMTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions
- H10D64/27—Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
- H10D64/311—Gate electrodes for field-effect devices
- H10D64/411—Gate electrodes for field-effect devices for FETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
- H10F30/282—Insulated-gate field-effect transistors [IGFET], e.g. MISFET [metal-insulator-semiconductor field-effect transistor] phototransistors
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2010/007074 WO2012073298A1 (en) | 2010-12-03 | 2010-12-03 | Terahertz electromagnetic wave conversion device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP2648290A1 EP2648290A1 (en) | 2013-10-09 |
| EP2648290A4 true EP2648290A4 (en) | 2014-06-18 |
Family
ID=46171286
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP10860400.0A Withdrawn EP2648290A4 (en) | 2010-12-03 | 2010-12-03 | TERRAHERTZ ELECTROMAGNETIC WAVE CONVERSION DEVICE |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9018683B2 (en) |
| EP (1) | EP2648290A4 (en) |
| JP (1) | JP5747420B2 (en) |
| WO (1) | WO2012073298A1 (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101521116B1 (en) | 2014-02-24 | 2015-05-19 | 국립대학법인 울산과학기술대학교 산학협력단 | Method for estimating performace of plasma wave transistor |
| JP6222734B2 (en) * | 2014-03-14 | 2017-11-01 | 日本電信電話株式会社 | Variable frequency filter |
| US9297638B1 (en) * | 2014-10-21 | 2016-03-29 | Sandia Corporation | Two-path plasmonic interferometer with integrated detector |
| JP6437571B2 (en) * | 2014-12-30 | 2018-12-12 | ユニスト(ウルサン ナショナル インスティテュート オブ サイエンス アンド テクノロジー) | Electromagnetic wave oscillator, plasma wave power extractor and electromagnetic wave detector |
| JP6299665B2 (en) * | 2015-04-30 | 2018-03-28 | 三菱電機株式会社 | Field effect transistor |
| CN105336809B (en) * | 2015-11-09 | 2017-10-20 | 中国工程物理研究院电子工程研究所 | Terahertz wave detector with array conductive channel structure |
| US10684320B2 (en) | 2015-12-31 | 2020-06-16 | Unist (Ulsan National Institute Of Science And Technology) | Performance evaluation method of suspended channel plasma wave transistor |
| KR101777929B1 (en) | 2015-12-31 | 2017-09-13 | 울산과학기술원 | Method for estimating performace of suspended channel plasma wave transistor |
| WO2018063291A1 (en) * | 2016-09-30 | 2018-04-05 | Intel Corporation | Single-flipped resonator devices with 2deg bottom electrode |
| US11218144B2 (en) | 2019-09-12 | 2022-01-04 | Vishay-Siliconix, LLC | Semiconductor device with multiple independent gates |
| TWI803845B (en) * | 2021-03-24 | 2023-06-01 | 新唐科技股份有限公司 | Semiconductor structure |
| CN113257910B (en) * | 2021-05-11 | 2023-01-03 | 华南师范大学 | Comb-type gate structure HEMT radio frequency device and preparation method thereof |
| EP4723176A1 (en) | 2023-05-31 | 2026-04-08 | Tohoku University | Frequency down-conversion device and communication device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006030608A1 (en) * | 2004-09-13 | 2006-03-23 | Kyushu Institute Of Technology | Terahertz electromagnetic wave radiation element and its manufacturing method |
| JP2009224467A (en) * | 2008-03-14 | 2009-10-01 | Tohoku Univ | Electromagnetic wave radiation element |
-
2010
- 2010-12-03 US US13/991,407 patent/US9018683B2/en not_active Expired - Fee Related
- 2010-12-03 WO PCT/JP2010/007074 patent/WO2012073298A1/en not_active Ceased
- 2010-12-03 JP JP2012546581A patent/JP5747420B2/en not_active Expired - Fee Related
- 2010-12-03 EP EP10860400.0A patent/EP2648290A4/en not_active Withdrawn
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006030608A1 (en) * | 2004-09-13 | 2006-03-23 | Kyushu Institute Of Technology | Terahertz electromagnetic wave radiation element and its manufacturing method |
| EP1804347A1 (en) * | 2004-09-13 | 2007-07-04 | Kyushu Institute of Technology | Terahertz electromagnetic wave radiation element and its manufacturing method |
| JP2009224467A (en) * | 2008-03-14 | 2009-10-01 | Tohoku Univ | Electromagnetic wave radiation element |
Non-Patent Citations (4)
| Title |
|---|
| D. COQUILLAT ET AL.: "Room temperature detection of sub-terahertz radiation in double-grating-gate transistors", OPTICS EXPRESS, vol. 18, no. 6, 15 March 2010 (2010-03-15), pages 6024 - 6032, XP002723604 * |
| IRINA KHMYROVA ET AL.: "Analysis of terahertz plasma resonances in structures with two-dimensional electron systems periodically modulated by interdigitated gate", JOURNAL OF APPLIED PHYSICS, vol. 108, 074511, 8 October 2010 (2010-10-08), pages 074511-1 - 074511-6, XP002723605 * |
| MEZIANI Y M ET AL: "Room temperature generation of terahertz radiation from dual grating gate HEMTâ s", INFRARED, MILLIMETER AND TERAHERTZ WAVES, 2008. IRMMW-THZ 2008. 33RD INTERNATIONAL CONFERENCE ON, 15 September 2008 (2008-09-15), IEEE, PISCATAWAY, NJ, USA, pages 1 - 2, XP031397941, ISBN: 978-1-4244-2119-0 * |
| See also references of WO2012073298A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| JP5747420B2 (en) | 2015-07-15 |
| US20130277716A1 (en) | 2013-10-24 |
| EP2648290A1 (en) | 2013-10-09 |
| WO2012073298A1 (en) | 2012-06-07 |
| US9018683B2 (en) | 2015-04-28 |
| JPWO2012073298A1 (en) | 2014-05-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| 17P | Request for examination filed |
Effective date: 20130701 |
|
| AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
| RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: TOHOKU UNIVERSITY Owner name: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS Owner name: UNIVERSITE MONTPELLIER 2 |
|
| DAX | Request for extension of the european patent (deleted) | ||
| RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 29/778 20060101AFI20140429BHEP |
|
| A4 | Supplementary search report drawn up and despatched |
Effective date: 20140520 |
|
| RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 29/778 20060101AFI20140512BHEP |
|
| 17Q | First examination report despatched |
Effective date: 20170410 |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
| 18D | Application deemed to be withdrawn |
Effective date: 20170822 |