EP2648290A4 - TERRAHERTZ ELECTROMAGNETIC WAVE CONVERSION DEVICE - Google Patents

TERRAHERTZ ELECTROMAGNETIC WAVE CONVERSION DEVICE

Info

Publication number
EP2648290A4
EP2648290A4 EP10860400.0A EP10860400A EP2648290A4 EP 2648290 A4 EP2648290 A4 EP 2648290A4 EP 10860400 A EP10860400 A EP 10860400A EP 2648290 A4 EP2648290 A4 EP 2648290A4
Authority
EP
European Patent Office
Prior art keywords
terrahertz
electromagnetic wave
conversion device
wave conversion
electromagnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP10860400.0A
Other languages
German (de)
French (fr)
Other versions
EP2648290A1 (en
Inventor
Taiichi Otsuji
Viacheslav Popov
Wojciech Knap
Yahya Moubarak Meziani
Nina Diakonova
Dominique Coquillat
Frederic Teppe
Denis Fateev
Perez Jesus Enrique Velazquez
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Universite de Montpellier
Tohoku University NUC
Original Assignee
Centre National de la Recherche Scientifique CNRS
Universite de Montpellier
Tohoku University NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Universite de Montpellier, Tohoku University NUC filed Critical Centre National de la Recherche Scientifique CNRS
Publication of EP2648290A1 publication Critical patent/EP2648290A1/en
Publication of EP2648290A4 publication Critical patent/EP2648290A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/40FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
    • H10D30/47FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having two-dimensional [2D] charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
    • H10D30/471High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT]
    • H10D30/475High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs
    • H10D30/4755High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs having wide bandgap charge-carrier supplying layers, e.g. modulation doped HEMTs such as n-AlGaAs/GaAs HEMTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/20Electrodes characterised by their shapes, relative sizes or dispositions 
    • H10D64/27Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
    • H10D64/311Gate electrodes for field-effect devices
    • H10D64/411Gate electrodes for field-effect devices for FETs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/28Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
    • H10F30/282Insulated-gate field-effect transistors [IGFET], e.g. MISFET [metal-insulator-semiconductor field-effect transistor] phototransistors
EP10860400.0A 2010-12-03 2010-12-03 TERRAHERTZ ELECTROMAGNETIC WAVE CONVERSION DEVICE Withdrawn EP2648290A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2010/007074 WO2012073298A1 (en) 2010-12-03 2010-12-03 Terahertz electromagnetic wave conversion device

Publications (2)

Publication Number Publication Date
EP2648290A1 EP2648290A1 (en) 2013-10-09
EP2648290A4 true EP2648290A4 (en) 2014-06-18

Family

ID=46171286

Family Applications (1)

Application Number Title Priority Date Filing Date
EP10860400.0A Withdrawn EP2648290A4 (en) 2010-12-03 2010-12-03 TERRAHERTZ ELECTROMAGNETIC WAVE CONVERSION DEVICE

Country Status (4)

Country Link
US (1) US9018683B2 (en)
EP (1) EP2648290A4 (en)
JP (1) JP5747420B2 (en)
WO (1) WO2012073298A1 (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101521116B1 (en) 2014-02-24 2015-05-19 국립대학법인 울산과학기술대학교 산학협력단 Method for estimating performace of plasma wave transistor
JP6222734B2 (en) * 2014-03-14 2017-11-01 日本電信電話株式会社 Variable frequency filter
US9297638B1 (en) * 2014-10-21 2016-03-29 Sandia Corporation Two-path plasmonic interferometer with integrated detector
JP6437571B2 (en) * 2014-12-30 2018-12-12 ユニスト(ウルサン ナショナル インスティテュート オブ サイエンス アンド テクノロジー) Electromagnetic wave oscillator, plasma wave power extractor and electromagnetic wave detector
JP6299665B2 (en) * 2015-04-30 2018-03-28 三菱電機株式会社 Field effect transistor
CN105336809B (en) * 2015-11-09 2017-10-20 中国工程物理研究院电子工程研究所 Terahertz wave detector with array conductive channel structure
US10684320B2 (en) 2015-12-31 2020-06-16 Unist (Ulsan National Institute Of Science And Technology) Performance evaluation method of suspended channel plasma wave transistor
KR101777929B1 (en) 2015-12-31 2017-09-13 울산과학기술원 Method for estimating performace of suspended channel plasma wave transistor
WO2018063291A1 (en) * 2016-09-30 2018-04-05 Intel Corporation Single-flipped resonator devices with 2deg bottom electrode
US11218144B2 (en) 2019-09-12 2022-01-04 Vishay-Siliconix, LLC Semiconductor device with multiple independent gates
TWI803845B (en) * 2021-03-24 2023-06-01 新唐科技股份有限公司 Semiconductor structure
CN113257910B (en) * 2021-05-11 2023-01-03 华南师范大学 Comb-type gate structure HEMT radio frequency device and preparation method thereof
EP4723176A1 (en) 2023-05-31 2026-04-08 Tohoku University Frequency down-conversion device and communication device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006030608A1 (en) * 2004-09-13 2006-03-23 Kyushu Institute Of Technology Terahertz electromagnetic wave radiation element and its manufacturing method
JP2009224467A (en) * 2008-03-14 2009-10-01 Tohoku Univ Electromagnetic wave radiation element

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006030608A1 (en) * 2004-09-13 2006-03-23 Kyushu Institute Of Technology Terahertz electromagnetic wave radiation element and its manufacturing method
EP1804347A1 (en) * 2004-09-13 2007-07-04 Kyushu Institute of Technology Terahertz electromagnetic wave radiation element and its manufacturing method
JP2009224467A (en) * 2008-03-14 2009-10-01 Tohoku Univ Electromagnetic wave radiation element

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
D. COQUILLAT ET AL.: "Room temperature detection of sub-terahertz radiation in double-grating-gate transistors", OPTICS EXPRESS, vol. 18, no. 6, 15 March 2010 (2010-03-15), pages 6024 - 6032, XP002723604 *
IRINA KHMYROVA ET AL.: "Analysis of terahertz plasma resonances in structures with two-dimensional electron systems periodically modulated by interdigitated gate", JOURNAL OF APPLIED PHYSICS, vol. 108, 074511, 8 October 2010 (2010-10-08), pages 074511-1 - 074511-6, XP002723605 *
MEZIANI Y M ET AL: "Room temperature generation of terahertz radiation from dual grating gate HEMTâ s", INFRARED, MILLIMETER AND TERAHERTZ WAVES, 2008. IRMMW-THZ 2008. 33RD INTERNATIONAL CONFERENCE ON, 15 September 2008 (2008-09-15), IEEE, PISCATAWAY, NJ, USA, pages 1 - 2, XP031397941, ISBN: 978-1-4244-2119-0 *
See also references of WO2012073298A1 *

Also Published As

Publication number Publication date
JP5747420B2 (en) 2015-07-15
US20130277716A1 (en) 2013-10-24
EP2648290A1 (en) 2013-10-09
WO2012073298A1 (en) 2012-06-07
US9018683B2 (en) 2015-04-28
JPWO2012073298A1 (en) 2014-05-19

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Owner name: TOHOKU UNIVERSITY

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