EP2684033A4 - Maschinensichtsystem zur qualitätskontrolle - Google Patents

Maschinensichtsystem zur qualitätskontrolle

Info

Publication number
EP2684033A4
EP2684033A4 EP12754525.9A EP12754525A EP2684033A4 EP 2684033 A4 EP2684033 A4 EP 2684033A4 EP 12754525 A EP12754525 A EP 12754525A EP 2684033 A4 EP2684033 A4 EP 2684033A4
Authority
EP
European Patent Office
Prior art keywords
quality control
vision system
machine vision
machine
quality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP12754525.9A
Other languages
English (en)
French (fr)
Other versions
EP2684033A2 (de
Inventor
Kosti Kannas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mapvision Ltd Oy
Original Assignee
Mapvision Ltd Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mapvision Ltd Oy filed Critical Mapvision Ltd Oy
Publication of EP2684033A2 publication Critical patent/EP2684033A2/de
Publication of EP2684033A4 publication Critical patent/EP2684033A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20021—Dividing image into blocks, subimages or windows
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
EP12754525.9A 2011-03-10 2012-03-05 Maschinensichtsystem zur qualitätskontrolle Withdrawn EP2684033A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20115241A FI20115241A0 (fi) 2011-03-10 2011-03-10 Konenäköjärjestelmä laadunvalvontaan
PCT/FI2012/050213 WO2012120192A2 (en) 2011-03-10 2012-03-05 Machine vision system for quality control

Publications (2)

Publication Number Publication Date
EP2684033A2 EP2684033A2 (de) 2014-01-15
EP2684033A4 true EP2684033A4 (de) 2014-10-01

Family

ID=43806452

Family Applications (1)

Application Number Title Priority Date Filing Date
EP12754525.9A Withdrawn EP2684033A4 (de) 2011-03-10 2012-03-05 Maschinensichtsystem zur qualitätskontrolle

Country Status (3)

Country Link
EP (1) EP2684033A4 (de)
FI (1) FI20115241A0 (de)
WO (1) WO2012120192A2 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3040782B1 (fr) * 2015-09-08 2017-09-01 Eurostat Group Dispositif et procede de controle d’une piece thermoformee

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3540288A1 (de) * 1985-06-21 1987-01-02 Matsushita Electric Works Ltd Anordnung und verfahren zur durchfuehrung von kontrollen an loetstellen
WO2001096839A1 (en) * 2000-06-14 2001-12-20 Teradyne, Inc. Optical inspection system
WO2006128317A1 (de) * 2005-06-03 2006-12-07 Elpatronic Ag Verfahren zur beleuchtung und beleuchtungsanordnung
WO2009094489A1 (en) * 2008-01-23 2009-07-30 Cyberoptics Corporation High speed optical inspection system with multiple illumination imagery
DE102010017316A1 (de) * 2009-06-24 2010-12-30 General Electric Company Schweißsteuerungssystem

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4863268A (en) * 1984-02-14 1989-09-05 Diffracto Ltd. Diffractosight improvements
ES2215208T3 (es) * 1996-10-10 2004-10-01 Elpatronic Ag Procedimiento y dispositivo para la verificacion optica de una costura de soldadura.
US6204469B1 (en) * 1999-03-04 2001-03-20 Honda Giken Kogyo Kabushiki Kaisha Laser welding system
FI20041414A0 (fi) * 2004-11-03 2004-11-03 Valtion Teknillinen Laserhitsausmenetelmä
WO2009122393A2 (en) * 2008-03-31 2009-10-08 Brightview Systems Ltd. A method and system for photovoltaic cell production yield enhancement

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3540288A1 (de) * 1985-06-21 1987-01-02 Matsushita Electric Works Ltd Anordnung und verfahren zur durchfuehrung von kontrollen an loetstellen
WO2001096839A1 (en) * 2000-06-14 2001-12-20 Teradyne, Inc. Optical inspection system
WO2006128317A1 (de) * 2005-06-03 2006-12-07 Elpatronic Ag Verfahren zur beleuchtung und beleuchtungsanordnung
WO2009094489A1 (en) * 2008-01-23 2009-07-30 Cyberoptics Corporation High speed optical inspection system with multiple illumination imagery
DE102010017316A1 (de) * 2009-06-24 2010-12-30 General Electric Company Schweißsteuerungssystem

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SCHREIBER D ET AL: "Online visual quality inspection for weld seams", THE INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, SPRINGER, BERLIN, DE, vol. 42, no. 5-6, 10 July 2008 (2008-07-10), pages 497 - 504, XP019700596, ISSN: 1433-3015 *

Also Published As

Publication number Publication date
WO2012120192A2 (en) 2012-09-13
FI20115241A0 (fi) 2011-03-10
EP2684033A2 (de) 2014-01-15
WO2012120192A3 (en) 2012-11-08

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Legal Events

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Effective date: 20140903

RIC1 Information provided on ipc code assigned before grant

Ipc: G01N 21/88 20060101AFI20140828BHEP

Ipc: G06T 7/00 20060101ALI20140828BHEP

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Effective date: 20150331