EP2816731A4 - INTEGRATED A / D CONVERTER AND CMOS IMAGE SENSOR - Google Patents

INTEGRATED A / D CONVERTER AND CMOS IMAGE SENSOR

Info

Publication number
EP2816731A4
EP2816731A4 EP13749907.5A EP13749907A EP2816731A4 EP 2816731 A4 EP2816731 A4 EP 2816731A4 EP 13749907 A EP13749907 A EP 13749907A EP 2816731 A4 EP2816731 A4 EP 2816731A4
Authority
EP
European Patent Office
Prior art keywords
converter
integrated
image sensor
cmos image
cmos
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP13749907.5A
Other languages
German (de)
French (fr)
Other versions
EP2816731A1 (en
Inventor
Masayuki Ikebe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hokkaido University NUC
Original Assignee
Hokkaido University NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hokkaido University NUC filed Critical Hokkaido University NUC
Publication of EP2816731A1 publication Critical patent/EP2816731A1/en
Publication of EP2816731A4 publication Critical patent/EP2816731A4/en
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/002—Provisions or arrangements for saving power, e.g. by allowing a sleep mode, using lower supply voltage for downstream stages, using multiple clock domains or by selectively turning on stages when needed
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H03M1/56—Input signal compared with linear ramp
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analogue/Digital Conversion (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
EP13749907.5A 2012-02-17 2013-02-15 INTEGRATED A / D CONVERTER AND CMOS IMAGE SENSOR Ceased EP2816731A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012033196 2012-02-17
PCT/JP2013/053734 WO2013122221A1 (en) 2012-02-17 2013-02-15 Integral a/d converter and cmos image sensor

Publications (2)

Publication Number Publication Date
EP2816731A1 EP2816731A1 (en) 2014-12-24
EP2816731A4 true EP2816731A4 (en) 2015-12-30

Family

ID=48984330

Family Applications (1)

Application Number Title Priority Date Filing Date
EP13749907.5A Ceased EP2816731A4 (en) 2012-02-17 2013-02-15 INTEGRATED A / D CONVERTER AND CMOS IMAGE SENSOR

Country Status (5)

Country Link
US (1) US9571113B2 (en)
EP (1) EP2816731A4 (en)
JP (1) JP6195161B2 (en)
KR (1) KR101932794B1 (en)
WO (1) WO2013122221A1 (en)

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KR101932794B1 (en) * 2012-02-17 2018-12-27 국립대학법인 홋가이도 다이가쿠 Integral a/d converter and cmos image sensor
JP5767287B2 (en) * 2013-09-13 2015-08-19 オリンパス株式会社 Imaging device
TWI648986B (en) * 2014-04-15 2019-01-21 Sony Corporation Image element, electronic equipment
US10154219B2 (en) 2014-08-20 2018-12-11 Sony Corporation Signal processing device, image pickup element, and electronic device
JP6371407B2 (en) 2014-11-12 2018-08-08 オリンパス株式会社 Time detection circuit, AD conversion circuit, and solid-state imaging device
US9592660B2 (en) * 2014-12-17 2017-03-14 Arevo Inc. Heated build platform and system for three dimensional printing methods
KR20160123708A (en) * 2015-04-17 2016-10-26 에스케이하이닉스 주식회사 Image sensing device
JP2016213549A (en) * 2015-04-30 2016-12-15 国立大学法人北海道大学 Digital circuit, A / D (Analog / Digital) conversion circuit, and digital signal processing method
US10263634B2 (en) 2015-08-19 2019-04-16 Kagoshima University Analog-digital converter
US9900538B2 (en) * 2016-05-18 2018-02-20 Semiconductor Components Industries, Llc Phase delay counting analog-to-digital converter circuitry
JP2018014630A (en) * 2016-07-21 2018-01-25 ソニーセミコンダクタソリューションズ株式会社 Solid state imaging device and electronic equipment
KR102514432B1 (en) 2016-09-19 2023-03-29 에스케이하이닉스 주식회사 Comparator and operating method, and cmos image sensor thereof using that
US10367519B2 (en) * 2017-10-11 2019-07-30 Tech Idea Co., Ltd. Time domain A/D converter group and sensor device using the same
JP6941890B2 (en) * 2017-10-11 2021-09-29 株式会社テックイデア Time domain A / D converter group and sensor device using this
JP6987603B2 (en) * 2017-10-26 2022-01-05 ブリルニクス シンガポール プライベート リミテッド Solid-state image sensor, solid-state image sensor driving method, and electronic equipment
JP7018293B2 (en) * 2017-11-06 2022-02-10 ブリルニクス シンガポール プライベート リミテッド Solid-state image sensor, solid-state image sensor driving method, and electronic equipment
CN108551344B (en) * 2018-03-29 2022-04-01 上海集成电路研发中心有限公司 Double-sampling analog-to-digital conversion circuit
WO2020124518A1 (en) * 2018-12-21 2020-06-25 深圳市汇顶科技股份有限公司 Analog-to-digital converter, image sensor and handheld apparatus
JP7333060B2 (en) 2019-09-26 2023-08-24 株式会社テックイデア image sensor
KR102856356B1 (en) 2019-10-21 2025-09-04 삼성전자주식회사 Analog digital converter including delay circuit and compensator, image sensor including the same, and operating method thereof
CN111416619B (en) * 2020-03-26 2023-02-03 中国科学院微电子研究所 Delay measurement circuit, delay measurement method, electronic equipment and chip
TWI733415B (en) * 2020-04-16 2021-07-11 瑞昱半導體股份有限公司 Phase locked loop device and clock generation method
JP2021175137A (en) * 2020-04-28 2021-11-01 ソニーセミコンダクタソリューションズ株式会社 Imaging apparatus
JP2022061162A (en) * 2020-10-06 2022-04-18 ソニーセミコンダクタソリューションズ株式会社 Control method of analog-to-digital conversion circuit, solid-state image sensor, and analog-to-digital conversion circuit
US11947672B2 (en) * 2021-03-02 2024-04-02 Nxp B.V. Voltage glitch detection circuit
CN113411524B (en) * 2021-06-08 2022-11-01 天津大学 Low-Power Column-Parallel Single-Slope Analog-to-Digital Converter for Image Sensors
US11444630B1 (en) * 2021-06-30 2022-09-13 Novatek Microelectronics Corp. Column analog-to-digital converter and local counting method thereof
TWI788951B (en) * 2021-08-13 2023-01-01 瑞昱半導體股份有限公司 Comparison control circuit, and analog-to-digital converter and low dropout regulator having the same
US12096149B2 (en) 2022-02-10 2024-09-17 Samsung Electronics Co., Ltd. Comparison circuit, and analog-to-digital converter and image sensor including the same
CN114726375A (en) * 2022-03-09 2022-07-08 北方广微科技有限公司 Analog-to-digital converter and control method thereof
JP7699172B2 (en) * 2023-07-28 2025-06-26 華邦電子股▲ふん▼有限公司 Control circuit and semiconductor memory device

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US20110187907A1 (en) * 2010-02-03 2011-08-04 Sony Corporation Duty correction circuit, delay locked loop circuit, column a/d converter, solid-state imaging device and camera system

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US20120244824A1 (en) * 2007-02-12 2012-09-27 Texas Instruments Incorporated Minimization of rms phase error in a phase locked loop by dithering of a frequency reference
US7671317B2 (en) * 2007-07-25 2010-03-02 Panasonic Corporation Physical quantity detecting apparatus and method for driving the same
US7863952B2 (en) * 2008-01-31 2011-01-04 International Business Machines Corporation Method and circuit for controlling clock frequency of an electronic circuit with noise mitigation
US8077069B2 (en) * 2009-01-20 2011-12-13 Marvell World Trade Ltd. Two-step subranging ADC architecture
JP2010225738A (en) * 2009-03-23 2010-10-07 Yamaha Corp Semiconductor integrated circuit
JP5372667B2 (en) * 2009-09-01 2013-12-18 オリンパス株式会社 AD converter and solid-state imaging device
JP5799531B2 (en) * 2010-04-30 2015-10-28 ソニー株式会社 A / D converter, A / D conversion method, solid-state imaging device, and camera system
JP5540901B2 (en) * 2010-06-01 2014-07-02 ソニー株式会社 Integrating A / D Converter, Integrating A / D Conversion Method, Solid-State Image Sensor, and Camera System
US8618854B2 (en) * 2010-10-15 2013-12-31 Qualcomm Incorporated Adaptive clock switching to capture asynchronous data within a phase-to-digital converter
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US8797194B2 (en) * 2012-06-20 2014-08-05 The Ohio State University Phase-based analog-to-digital conversion
JP5973321B2 (en) * 2012-10-30 2016-08-23 ルネサスエレクトロニクス株式会社 Solid-state image sensor

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US20100271525A1 (en) * 2009-04-24 2010-10-28 Sony Corporation Integrated AD converter, solid state imaging device, and camera system
US20110187907A1 (en) * 2010-02-03 2011-08-04 Sony Corporation Duty correction circuit, delay locked loop circuit, column a/d converter, solid-state imaging device and camera system

Non-Patent Citations (3)

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Title
MUUNG SHIN ET AL: "Column parallel single-slope ADC with time to digital converter for CMOS imager", ELECTRONICS, CIRCUITS, AND SYSTEMS (ICECS), 2010 17TH IEEE INTERNATIONAL CONFERENCE ON, IEEE, 12 December 2010 (2010-12-12), pages 863 - 866, XP031923091, ISBN: 978-1-4244-8155-2, DOI: 10.1109/ICECS.2010.5724649 *
NARAGHI S ET AL: "A 9-bit, 14 Î 1/4 W and 0.06 mm<{>2} Pulse Position Modulation ADC in 90 nm Digital CMOS", IEEE JOURNAL OF SOLID-STATE CIRCUITS, IEEE SERVICE CENTER, PISCATAWAY, NJ, USA, vol. 45, no. 9, 1 September 2010 (2010-09-01), pages 1870 - 1880, XP011317124, ISSN: 0018-9200, DOI: 10.1109/JSSC.2010.2050945 *
See also references of WO2013122221A1 *

Also Published As

Publication number Publication date
JPWO2013122221A1 (en) 2015-05-18
JP6195161B2 (en) 2017-09-13
US9571113B2 (en) 2017-02-14
KR101932794B1 (en) 2018-12-27
KR20140135191A (en) 2014-11-25
EP2816731A1 (en) 2014-12-24
WO2013122221A1 (en) 2013-08-22
US20150014517A1 (en) 2015-01-15

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