EP3308149C0 - Sensor zur zerstörungsfreien charakterisierung von objekten - Google Patents

Sensor zur zerstörungsfreien charakterisierung von objekten

Info

Publication number
EP3308149C0
EP3308149C0 EP16728345.6A EP16728345A EP3308149C0 EP 3308149 C0 EP3308149 C0 EP 3308149C0 EP 16728345 A EP16728345 A EP 16728345A EP 3308149 C0 EP3308149 C0 EP 3308149C0
Authority
EP
European Patent Office
Prior art keywords
objects
sensor
destructive characterization
destructive
characterization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
EP16728345.6A
Other languages
English (en)
French (fr)
Other versions
EP3308149A1 (de
EP3308149B1 (de
Inventor
Noël Deferm
Tom Redant
Wim Dehaene
Patrick Reynaert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hammer-Ims
Original Assignee
Hammer-Ims
Hammer Ims
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hammer-Ims, Hammer Ims filed Critical Hammer-Ims
Publication of EP3308149A1 publication Critical patent/EP3308149A1/de
Application granted granted Critical
Publication of EP3308149C0 publication Critical patent/EP3308149C0/de
Publication of EP3308149B1 publication Critical patent/EP3308149B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N21/8915—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined non-woven textile material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8983—Irregularities in textured or patterned surfaces, e.g. textiles, wood for testing textile webs, i.e. woven material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34—Paper
    • G01N33/346—Paper sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/36—Textiles
    • G01N33/367—Fabric or woven textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8917—Paper, also ondulated

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Textile Engineering (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Wood Science & Technology (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP16728345.6A 2015-06-12 2016-06-13 Sensor zur zerstörungsfreien charakterisierung von objekten Active EP3308149B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB1510234.6A GB201510234D0 (en) 2015-06-12 2015-06-12 Sensor for non-destructive characterization of objects
PCT/EP2016/063484 WO2016198690A1 (en) 2015-06-12 2016-06-13 Sensor for non-destructive characterization of objects

Publications (3)

Publication Number Publication Date
EP3308149A1 EP3308149A1 (de) 2018-04-18
EP3308149C0 true EP3308149C0 (de) 2023-11-15
EP3308149B1 EP3308149B1 (de) 2023-11-15

Family

ID=53784544

Family Applications (1)

Application Number Title Priority Date Filing Date
EP16728345.6A Active EP3308149B1 (de) 2015-06-12 2016-06-13 Sensor zur zerstörungsfreien charakterisierung von objekten

Country Status (5)

Country Link
US (1) US10429322B2 (de)
EP (1) EP3308149B1 (de)
JP (1) JP6778257B2 (de)
GB (1) GB201510234D0 (de)
WO (1) WO2016198690A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10281318B1 (en) 2017-03-31 2019-05-07 SolveTech, lnc. In line web process measurement apparatus and method
US11237103B2 (en) 2018-05-31 2022-02-01 Socovar Sec Electronic device testing system, electronic device production system including same and method of testing an electronic device
CN110346378B (zh) * 2019-07-24 2024-05-14 浙江欧视电科技有限公司 一种全自动aoi检测设备
US11756157B2 (en) * 2020-03-27 2023-09-12 Battelle Memorial Institute Multimodal inspection system
CN112067631A (zh) * 2020-08-13 2020-12-11 德州职业技术学院（德州市技师学院） 玻璃质量检测装置
EP4470763A4 (de) * 2022-01-25 2025-04-23 Panasonic Intellectual Property Management Co., Ltd. Grüne kompakte formvorrichtung
CN115296394B (zh) * 2022-09-28 2022-12-16 深圳市兴晟图信息技术有限公司 不间断电源设备
ES2971548B2 (es) * 2022-11-02 2024-11-25 Senstile S L Dispositivo y método para la obtención de la huella digital y caracterización de tejidos
US12372476B2 (en) * 2022-11-11 2025-07-29 Honeywell International Inc. Compact-cross direction C-frame scanner
PL4462072T3 (pl) * 2023-05-11 2025-10-20 Sikora Ag Urządzenie pomiarowe i sposób pomiaru parametru geometrycznego przedmiotu

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4326163A (en) 1980-01-30 1982-04-20 Brooke Robert L High speed bulk grain moisture measurement apparatus
JPH0714870Y2 (ja) * 1986-02-18 1995-04-10 新王子製紙株式会社 シート状物の高周波特性測定装置
US4812739A (en) 1986-09-15 1989-03-14 Swanson Claude V Apparatus and method for using microwave radiation to measure water content of a fluid
JP3156184B2 (ja) * 1991-04-02 2001-04-16 テキサコ・デベロップメント・コーポレーション 二重周波数マイクロ波による含水率測定手段及び方法
EP0746078B1 (de) * 1995-05-31 2002-09-18 Kabushiki Kaisha Meidensha Verfahren und Vorrichtung zum Detektieren des Islanding-Betriebes eines verteilten Generators
US5886534A (en) 1995-10-27 1999-03-23 The University Of Chicago Millimeter wave sensor for on-line inspection of thin sheet dielectrics
JP3458675B2 (ja) * 1997-10-27 2003-10-20 松下電工株式会社 マイクロ波を用いたボード状建材の含水率測定方法
JP3799524B2 (ja) * 2001-06-27 2006-07-19 株式会社東北テクノアーチ マイクロ波非破壊評価装置
US6784671B2 (en) * 2002-02-04 2004-08-31 Mississippi State University Moisture and density detector (MDD)
JP2007528585A (ja) * 2003-06-13 2007-10-11 株式会社荏原製作所 測定装置
EP1853900A1 (de) * 2005-02-18 2007-11-14 Food Radar System in Sweden AB System und verfahren zum nachweis von fremdobjekten in einem produkt
US20060208194A1 (en) * 2005-03-18 2006-09-21 Voith Paper Patent Gmbh Microwave mass measuring device and process
US7408268B1 (en) * 2005-08-04 2008-08-05 Magnetek, S.P.A. Anti-islanding method and system for distributed power generation systems
US20090275814A1 (en) * 2006-06-12 2009-11-05 Mitsubishi Electric Corporation System and method for measuring constituent concentration
US8314391B2 (en) 2007-12-31 2012-11-20 Honeywell Asca Inc. Controlling the bends in a fiber optic cable to eliminate measurement error in a scanning terahertz sensor
GB0810512D0 (en) * 2008-06-10 2008-07-09 Rolls Royce Plc An electrical generator network and a local electrical system
DE102011002413A1 (de) 2011-01-04 2012-07-05 Robert Bosch Gmbh THz Bildgebung mit kombiniertem Empfang aus Korrelation und Überlagerung

Also Published As

Publication number Publication date
GB201510234D0 (en) 2015-07-29
EP3308149A1 (de) 2018-04-18
WO2016198690A1 (en) 2016-12-15
JP6778257B2 (ja) 2020-10-28
US10429322B2 (en) 2019-10-01
US20180180557A1 (en) 2018-06-28
EP3308149B1 (de) 2023-11-15
JP2018517155A (ja) 2018-06-28

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