EP3428664A4 - Leckstromberechnungsvorrichtung und leckstromberechnungsverfahren - Google Patents

Leckstromberechnungsvorrichtung und leckstromberechnungsverfahren Download PDF

Info

Publication number: EP3428664A4
Authority: EP; European Patent Office
Prior art keywords: leakage current; calculation device; current calculation; leakage; current
Prior art date: 2016-03-09
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

EP16893595.5A

Other languages

English (en)

French (fr)

Other versions

EP3428664A1 (de

EP3428664B1 (de

Inventor

Tsuyoshi Takeuchi

Takanori Kuwahara

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Omron Corp

Original Assignee

Omron Corp

Omron Tateisi Electronics Co

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2016-03-09

Filing date

2016-11-21

Publication date

2019-12-11

2016-11-21 Application filed by Omron Corp, Omron Tateisi Electronics Co filed Critical Omron Corp

2019-01-16 Publication of EP3428664A1 publication Critical patent/EP3428664A1/de

2019-12-11 Publication of EP3428664A4 publication Critical patent/EP3428664A4/de

2022-11-09 Application granted granted Critical

2022-11-09 Publication of EP3428664B1 publication Critical patent/EP3428664B1/de

Status Not-in-force legal-status Critical Current

2036-11-21 Anticipated expiration legal-status Critical

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
- G01R31/343—Testing dynamo-electric machines in operation
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16528—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values using digital techniques or performing arithmetic operations
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
- G01R23/20—Measurement of non-linear distortion
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Engineering & Computer Science (AREA)
Power Engineering (AREA)
Nonlinear Science (AREA)
Mathematical Physics (AREA)
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
Emergency Protection Circuit Devices (AREA)
Measurement Of Current Or Voltage (AREA)

EP16893595.5A 2016-03-09 2016-11-21 Leckstromberechnungsvorrichtung und leckstromberechnungsverfahren Not-in-force EP3428664B1 (de)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
JP2016046127A JP6477548B2 (ja)	2016-03-09	2016-03-09	漏洩電流算出装置および漏洩電流算出方法
PCT/JP2016/084416 WO2017154271A1 (ja)	2016-03-09	2016-11-21	漏洩電流算出装置および漏洩電流算出方法

Publications (3)

Publication Number	Publication Date
EP3428664A1 EP3428664A1 (de)	2019-01-16
EP3428664A4 true EP3428664A4 (de)	2019-12-11
EP3428664B1 EP3428664B1 (de)	2022-11-09

Family

ID=59790324

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
EP16893595.5A Not-in-force EP3428664B1 (de)	2016-03-09	2016-11-21	Leckstromberechnungsvorrichtung und leckstromberechnungsverfahren

Country Status (6)

Country	Link
US (1)	US10782359B2 (de)
EP (1)	EP3428664B1 (de)
JP (1)	JP6477548B2 (de)
KR (1)	KR102007909B1 (de)
CN (1)	CN107923936B (de)
WO (1)	WO2017154271A1 (de)

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* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
EP3370073B1 (de)	2017-03-01	2020-04-29	ABB Power Grids Switzerland AG	Verfahren und vorrichtung zur bestimmung der parameter kapazitiver komponenten
JP6460146B2 (ja)	2017-04-21	2019-01-30	オムロン株式会社	漏洩電流算出装置および漏洩電流算出方法
EP3748837B1 (de) *	2018-01-29	2023-10-11	Toshiba Mitsubishi-Electric Industrial Systems Corporation	Vorrichtung zur überwachung der isolationsverschlechterung und verfahren zur überwachung der isolationsverschlechterung
JP6922816B2 (ja) *	2018-03-29	2021-08-18	オムロン株式会社	絶縁計測装置及び絶縁計測方法
KR102124554B1 (ko) *	2019-01-25	2020-06-18	한국전기안전공사	실시간 원격 3상 전기설비의 활선상태 누전감시 장치 및 방법
DE102019107399A1 (de) *	2019-03-22	2020-09-24	Vega Grieshaber Kg	Feldgerät mit Überwachungsvorrichtung und Verfahren zum Betreiben eines Feldgerätes
JP7218239B2 (ja) *	2019-04-26	2023-02-06	株式会社日立製作所	電気機械の診断方法および診断装置、並びに回転電機
CN111768599B (zh) *	2020-07-08	2021-08-10	安徽先兆科技有限公司	Ac380v回路电气安全管控方法及系统
CN121721442B (zh) *	2026-02-26	2026-05-08	深圳艾为电气技术股份有限公司	基于车载充电器的绝缘检测方法、装置、设备及介质

Citations (2)

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JP2013170961A (ja) *	2012-02-22	2013-09-02	Sanwa Technology Research Institute	電力及び漏洩電流測定装置並びにその測定方法
JP5770903B1 (ja) *	2014-09-26	2015-08-26	タナシン電機株式会社	漏洩電流算出装置及び漏洩電流算出方法

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JPS53100350A (en)	1977-02-15	1978-09-01	Nifco Inc	Fastener for jointing two panels
US6421618B1 (en) *	1998-12-28	2002-07-16	General Electric Company	Incipient leakage current fault detection apparatus and method
WO2001079869A1 (en) *	2000-04-17	2001-10-25	Suparules Limited	Current measurement device
JP3652584B2 (ja)	2000-06-08	2005-05-25	光商工株式会社	低圧接地電路の漏電検出保護方法と装置
CN2502278Y (zh) *	2001-08-02	2002-07-24	南京普天通信股份有限公司	工频电流监测器
EP1855122B1 (de) *	2005-01-31	2011-12-28	Toyotsugu Atoji	Leckstrom-unterbrecher und verfahren
JP2007114190A (ja)	2005-09-20	2007-05-10	Daihen Corp	漏洩電流抵抗分検出方法及びその装置
CN1963539B (zh) *	2005-11-09	2011-03-09	李岩松	光学电流互感器及其测定电流的方法
JP2009115754A (ja) *	2007-11-09	2009-05-28	Sbc Co Ltd	電気機器における漏洩電流測定装置及び測定方法
CN101271130A (zh) *	2008-01-24	2008-09-24	武汉格蓝若光电互感器有限公司	点阵式霍尔电流传感器
JP5544517B2 (ja) *	2010-01-27	2014-07-09	株式会社三和技術総合研究所	電気機器おける漏洩電流測定装置及び測定方法
JP5618910B2 (ja) *	2011-06-01	2014-11-05	三菱電機株式会社	絶縁劣化監視システム
JP5942506B2 (ja) *	2012-03-15	2016-06-29	オムロン株式会社	漏電検出器
CN102739066B (zh) *	2012-06-20	2014-12-31	中国计量科学研究院	一种感应式电流电压变换器及实现高频电流测量的方法
JP5631444B1 (ja) *	2013-05-27	2014-11-26	タナシン電機株式会社	漏洩電流算出装置及び漏洩電流算出方法
JP5705382B1 (ja)	2013-11-22	2015-04-22	三菱電機株式会社	絶縁検出器及び電気機器

2016
- 2016-03-09 JP JP2016046127A patent/JP6477548B2/ja not_active Expired - Fee Related
- 2016-11-21 KR KR1020187004138A patent/KR102007909B1/ko active Active
- 2016-11-21 EP EP16893595.5A patent/EP3428664B1/de not_active Not-in-force
- 2016-11-21 US US15/751,468 patent/US10782359B2/en not_active Expired - Fee Related
- 2016-11-21 WO PCT/JP2016/084416 patent/WO2017154271A1/ja not_active Ceased
- 2016-11-21 CN CN201680047997.3A patent/CN107923936B/zh active Active

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2013170961A (ja) *	2012-02-22	2013-09-02	Sanwa Technology Research Institute	電力及び漏洩電流測定装置並びにその測定方法
JP5770903B1 (ja) *	2014-09-26	2015-08-26	タナシン電機株式会社	漏洩電流算出装置及び漏洩電流算出方法
EP3199959A1 (de) *	2014-09-26	2017-08-02	Tanashin Denki Co., Ltd.	Leckstromberechnungsvorrichtung und leckstromberechnungsverfahren

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2017154271A1 *

Also Published As

Publication number	Publication date
CN107923936B (zh)	2020-09-04
EP3428664A1 (de)	2019-01-16
US10782359B2 (en)	2020-09-22
WO2017154271A1 (ja)	2017-09-14
KR102007909B1 (ko)	2019-08-06
JP2017161362A (ja)	2017-09-14
EP3428664B1 (de)	2022-11-09
CN107923936A (zh)	2018-04-17
KR20180115663A (ko)	2018-10-23
US20200200832A1 (en)	2020-06-25
JP6477548B2 (ja)	2019-03-06

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