EP3671191A3 - Kalibrierverfahren und analysevorrichtung - Google Patents

Kalibrierverfahren und analysevorrichtung Download PDF

Info

Publication number: EP3671191A3
Authority: EP; European Patent Office
Prior art keywords: signal; calibration method; spectroscopic element; specimen; detector
Prior art date: 2018-12-18
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

EP19216693.2A

Other languages

English (en)

French (fr)

Other versions

EP3671191B1 (de

EP3671191A2 (de

Inventor

Takanori Murano

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Jeol Ltd

Original Assignee

Jeol Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2018-12-18

Filing date

2019-12-16

Publication date

2020-08-05

2019-12-16 Application filed by Jeol Ltd filed Critical Jeol Ltd

2020-06-24 Publication of EP3671191A2 publication Critical patent/EP3671191A2/de

2020-08-05 Publication of EP3671191A3 publication Critical patent/EP3671191A3/de

2023-07-12 Application granted granted Critical

2023-07-12 Publication of EP3671191B1 publication Critical patent/EP3671191B1/de

Status Active legal-status Critical Current

2039-12-16 Anticipated expiration legal-status Critical

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
- G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

Landscapes

Chemical & Material Sciences (AREA)
Physics & Mathematics (AREA)
Biochemistry (AREA)
Life Sciences & Earth Sciences (AREA)
Health & Medical Sciences (AREA)
Analytical Chemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Crystallography & Structural Chemistry (AREA)
Spectroscopy & Molecular Physics (AREA)
Dispersion Chemistry (AREA)
Analysing Materials By The Use Of Radiation (AREA)

EP19216693.2A 2018-12-18 2019-12-16 Kalibrierverfahren ausgeführt durch eine analysevorrichtung Active EP3671191B1 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP2018236568A JP6887982B2 (ja)	2018-12-18	2018-12-18	キャリブレーション方法および分析装置

Publications (3)

Publication Number	Publication Date
EP3671191A2 EP3671191A2 (de)	2020-06-24
EP3671191A3 true EP3671191A3 (de)	2020-08-05
EP3671191B1 EP3671191B1 (de)	2023-07-12

Family

ID=69147391

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
EP19216693.2A Active EP3671191B1 (de)	2018-12-18	2019-12-16	Kalibrierverfahren ausgeführt durch eine analysevorrichtung

Country Status (3)

Country	Link
US (1)	US11131638B2 (de)
EP (1)	EP3671191B1 (de)
JP (1)	JP6887982B2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP6962951B2 (ja) *	2019-03-08	2021-11-05	日本電子株式会社	分析装置およびスペクトル生成方法
JP7191901B2 (ja)	2020-07-27	2022-12-19	日本電子株式会社	試料分析装置及び方法
EP4006531B1 (de) *	2020-11-27	2023-04-26	JEOL Ltd.	Gerät und verfahren zur erkennung von röntgenstrahlen
CN116879324A (zh) *	2023-07-12	2023-10-13	四川赛康智能科技股份有限公司	采用高能射线对超特高压电力开关设备检测缺陷的方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS55129737A (en) *	1979-03-30	1980-10-07	Jeol Ltd	Analysis method by x-ray spectrometer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS52147489A (en) *	1976-06-02	1977-12-07	Erionikusu Kk	Method and device for analysis by wavelength diffusionntype xxray spectrometer
US5015069A (en) *	1989-02-17	1991-05-14	Linear Instruments	Off axis rotation of diffraction grating
JP2001356050A (ja) *	2000-06-14	2001-12-26	Toray Ind Inc	分光方法及びフィルムの製造方法
JP5576749B2 (ja)	2010-09-10	2014-08-20	日本電子株式会社	Ｘ線検出システム
WO2019064360A1 (ja) *	2017-09-27	2019-04-04	株式会社島津製作所	Ｘ線分光分析装置、及び該ｘ線分光分析装置を用いた化学状態分析方法

2018
- 2018-12-18 JP JP2018236568A patent/JP6887982B2/ja active Active
2019
- 2019-12-16 EP EP19216693.2A patent/EP3671191B1/de active Active
- 2019-12-17 US US16/716,859 patent/US11131638B2/en active Active

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS55129737A (en) *	1979-03-30	1980-10-07	Jeol Ltd	Analysis method by x-ray spectrometer

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
GANN E ET AL: "Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis", REVIEW OF SCIENTIFIC INSTRUMENTS, AIP, MELVILLE, NY, US, vol. 83, no. 4, 12 April 2012 (2012-04-12), pages 45110 - 45110, XP012162258, ISSN: 0034-6748, [retrieved on 20120412], DOI: 10.1063/1.3701831 *
LAPIERRE A ET AL: "Compact soft x-ray spectrometer for plasma diagnostics at the Heidelberg Electron Beam Ion Trap", REVIEW OF SCIENTIFIC INSTRUMENTS, AIP, MELVILLE, NY, US, vol. 78, no. 12, 7 December 2007 (2007-12-07), pages 123105 - 123105, XP012105550, ISSN: 0034-6748, DOI: 10.1063/1.2818808 *
PARK J ET AL: "Calibration of a flat field soft x-ray grating spectrometer for laser produced plasmas", REVIEW OF SCIENTIFIC INSTRUMENTS, AIP, MELVILLE, NY, US, vol. 81, no. 10, 26 October 2010 (2010-10-26), pages 10E319 - 10E319, XP012145746, ISSN: 0034-6748, DOI: 10.1063/1.3495790 *

Also Published As

Publication number	Publication date
EP3671191B1 (de)	2023-07-12
JP2020098156A (ja)	2020-06-25
US11131638B2 (en)	2021-09-28
JP6887982B2 (ja)	2021-06-16
EP3671191A2 (de)	2020-06-24
US20200191733A1 (en)	2020-06-18

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Publication	Publication Date	Title
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