EP4040141A4 - Inspektionsvorrichtung - Google Patents

Inspektionsvorrichtung Download PDF

Info

Publication number
EP4040141A4
EP4040141A4 EP20868778.0A EP20868778A EP4040141A4 EP 4040141 A4 EP4040141 A4 EP 4040141A4 EP 20868778 A EP20868778 A EP 20868778A EP 4040141 A4 EP4040141 A4 EP 4040141A4
Authority
EP
European Patent Office
Prior art keywords
inspection device
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP20868778.0A
Other languages
English (en)
French (fr)
Other versions
EP4040141A1 (de
EP4040141B1 (de
Inventor
Ryota Hatano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ishida Co Ltd
Original Assignee
Ishida Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ishida Co Ltd filed Critical Ishida Co Ltd
Publication of EP4040141A1 publication Critical patent/EP4040141A1/de
Publication of EP4040141A4 publication Critical patent/EP4040141A4/de
Application granted granted Critical
Publication of EP4040141B1 publication Critical patent/EP4040141B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/618—Specific applications or type of materials food
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30168—Image quality inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Software Systems (AREA)
  • Quality & Reliability (AREA)
  • Toxicology (AREA)
  • Artificial Intelligence (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
EP20868778.0A 2019-09-24 2020-07-14 Inspektionsvorrichtung Active EP4040141B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019172807A JP7411984B2 (ja) 2019-09-24 2019-09-24 検査装置
PCT/JP2020/027339 WO2021059681A1 (ja) 2019-09-24 2020-07-14 検査装置

Publications (3)

Publication Number Publication Date
EP4040141A1 EP4040141A1 (de) 2022-08-10
EP4040141A4 true EP4040141A4 (de) 2023-10-04
EP4040141B1 EP4040141B1 (de) 2025-10-01

Family

ID=75157594

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20868778.0A Active EP4040141B1 (de) 2019-09-24 2020-07-14 Inspektionsvorrichtung

Country Status (6)

Country Link
US (1) US12013351B2 (de)
EP (1) EP4040141B1 (de)
JP (1) JP7411984B2 (de)
KR (1) KR102694246B1 (de)
CN (1) CN114467023B (de)
WO (1) WO2021059681A1 (de)

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58159245A (ja) * 1982-03-18 1983-09-21 Matsushita Electric Ind Co Ltd テ−プレコ−ダ
JP4184694B2 (ja) * 2002-04-05 2008-11-19 株式会社ブリヂストン タイヤのｘ線検査方法及びその装置
JP4669250B2 (ja) 2004-09-01 2011-04-13 株式会社イシダ Ｘ線検査装置
JP5041751B2 (ja) * 2006-07-24 2012-10-03 株式会社イシダ Ｘ線検査装置およびｘ線検査プログラム
JP2008241376A (ja) * 2007-03-27 2008-10-09 Hitachi Ltd Ｘ線ｃｔ画像再構成方法
JP5074998B2 (ja) 2008-04-24 2012-11-14 パナソニック株式会社 透明フィルムの外観検査方法およびその装置
WO2010032562A1 (ja) * 2008-09-18 2010-03-25 インターナショナル・ビジネス・マシーンズ・コーポレーション 検査対象物の欠陥の発見を支援するシステム及び方法
JP2010101692A (ja) 2008-10-22 2010-05-06 Kyodo Printing Co Ltd シート状物品の検査方法及びその検査装置
US8369632B2 (en) * 2009-04-08 2013-02-05 Olympus Corporation Image processing apparatus and imaging apparatus
DE102009032441B4 (de) * 2009-07-09 2016-06-09 Siemens Healthcare Gmbh Verfahren zur automatischen Bearbeitung eines Röntgenbildes, Röntgensystem und Computerprogrammprodukt
JP5555048B2 (ja) 2010-05-21 2014-07-23 アンリツ産機システム株式会社 Ｘ線検査装置
JP5848881B2 (ja) 2011-03-30 2016-01-27 アンリツインフィビス株式会社 Ｘ線異物検出装置
JP5453350B2 (ja) * 2011-06-23 2014-03-26 株式会社 システムスクエア 包装体の検査装置
JP6654397B2 (ja) * 2015-10-09 2020-02-26 株式会社イシダ Ｘ線検査装置
JP6647873B2 (ja) 2016-01-15 2020-02-14 株式会社イシダ 検査装置
JP6765036B2 (ja) * 2016-03-28 2020-10-07 パナソニックＩｐマネジメント株式会社 外観検査装置と外観検査方法
JP6775818B2 (ja) 2016-08-19 2020-10-28 株式会社イシダ Ｘ線検査装置
JP6387477B1 (ja) 2017-06-23 2018-09-05 株式会社Ｒｉｓｔ 検査装置、検査方法及び検査プログラム
KR102387529B1 (ko) 2018-02-14 2022-04-15 가부시끼가이샤 이시다 검사 장치

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
No further relevant documents disclosed *

Also Published As

Publication number Publication date
US20220365003A1 (en) 2022-11-17
CN114467023A (zh) 2022-05-10
JP2021050961A (ja) 2021-04-01
JP7411984B2 (ja) 2024-01-12
EP4040141A1 (de) 2022-08-10
US12013351B2 (en) 2024-06-18
KR20220062035A (ko) 2022-05-13
EP4040141B1 (de) 2025-10-01
CN114467023B (zh) 2025-11-07
KR102694246B1 (ko) 2024-08-09
WO2021059681A1 (ja) 2021-04-01

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