EP4241350A4 - Dispositif laser et son procédé de fabrication - Google Patents
Dispositif laser et son procédé de fabricationInfo
- Publication number
- EP4241350A4 EP4241350A4 EP21888158.9A EP21888158A EP4241350A4 EP 4241350 A4 EP4241350 A4 EP 4241350A4 EP 21888158 A EP21888158 A EP 21888158A EP 4241350 A4 EP4241350 A4 EP 4241350A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- laser device
- manufacturing same
- manufacturing
- same
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/11—Comprising a photonic bandgap structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/185—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only horizontal cavities, e.g. horizontal cavity surface-emitting lasers [HCSEL]
- H01S5/187—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only horizontal cavities, e.g. horizontal cavity surface-emitting lasers [HCSEL] using Bragg reflection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2018—Optical confinement, e.g. absorbing-, reflecting- or waveguide-layers
- H01S5/2031—Optical confinement, e.g. absorbing-, reflecting- or waveguide-layers characterized by special waveguide layers, e.g. asymmetric waveguide layers or defined bandgap discontinuities
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2054—Methods of obtaining the confinement
- H01S5/2081—Methods of obtaining the confinement using special etching techniques
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/17—Semiconductor lasers comprising special layers
- H01S2301/176—Specific passivation layers on surfaces other than the emission facet
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0233—Mounting configuration of laser chips
- H01S5/0234—Up-side down mountings, e.g. Flip-chip, epi-side down mountings or junction down mountings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04252—Electrodes, e.g. characterised by the structure characterised by the material
- H01S5/04253—Electrodes, e.g. characterised by the structure characterised by the material having specific optical properties, e.g. transparent electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04254—Electrodes, e.g. characterised by the structure characterised by the shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04256—Electrodes, e.g. characterised by the structure characterised by the configuration
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04256—Electrodes, e.g. characterised by the structure characterised by the configuration
- H01S5/04257—Electrodes, e.g. characterised by the structure characterised by the configuration having positive and negative electrodes on the same side of the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2018—Optical confinement, e.g. absorbing-, reflecting- or waveguide-layers
- H01S5/2027—Reflecting region or layer, parallel to the active layer, e.g. to modify propagation of the mode in the laser or to influence transverse modes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2054—Methods of obtaining the confinement
- H01S5/2059—Methods of obtaining the confinement by means of particular conductivity zones, e.g. obtained by particle bombardment or diffusion
- H01S5/2068—Methods of obtaining the confinement by means of particular conductivity zones, e.g. obtained by particle bombardment or diffusion obtained by radiation treatment or annealing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3211—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/341—Structures having reduced dimensionality, e.g. quantum wires
- H01S5/3412—Structures having reduced dimensionality, e.g. quantum wires quantum box or quantum dash
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Geometry (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US202063111065P | 2020-11-08 | 2020-11-08 | |
| US17/241,584 US12068575B2 (en) | 2020-04-29 | 2021-04-27 | Laser device and method of manufacturing the same |
| PCT/CN2021/100962 WO2022095455A1 (fr) | 2020-11-08 | 2021-06-18 | Dispositif laser et son procédé de fabrication |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP4241350A1 EP4241350A1 (fr) | 2023-09-13 |
| EP4241350A4 true EP4241350A4 (fr) | 2025-05-21 |
Family
ID=81457482
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP21888158.9A Pending EP4241350A4 (fr) | 2020-11-08 | 2021-06-18 | Dispositif laser et son procédé de fabrication |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP4241350A4 (fr) |
| TW (2) | TWI830021B (fr) |
| WO (1) | WO2022095455A1 (fr) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI830021B (zh) * | 2020-11-08 | 2024-01-21 | 富昱晶雷射科技股份有限公司 | 光子晶體面射型雷射 |
| CN115579734B (zh) * | 2022-10-14 | 2024-07-02 | 江苏华兴激光科技有限公司 | 一种红光激光芯片的制作方法 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020173089A1 (en) * | 2001-03-26 | 2002-11-21 | Gazillion Bits, Inc. | Vertical cavity surface emitting laser with buried dielectric distributed bragg reflector |
| JP2006128548A (ja) * | 2004-11-01 | 2006-05-18 | Seiko Epson Corp | 面発光型半導体レーザおよびその製造方法、光モジュール、並びに、光伝達装置 |
| US20080240193A1 (en) * | 2007-03-26 | 2008-10-02 | Kyoto University | Two-dimensional photonic crystal surface-emitting laser |
| US20100103972A1 (en) * | 2007-03-23 | 2010-04-29 | Sumitomo Electric Industries, Ltd. | Photonic crystal laser and method of manufacturing photonic crystal laser |
| CN103107482A (zh) * | 2013-01-29 | 2013-05-15 | 中国科学院半导体研究所 | 单模光子晶体垂直腔面发射激光器及其制备方法 |
| US20170070026A1 (en) * | 2015-09-08 | 2017-03-09 | Fuji Xerox Co., Ltd. | Method of manufacturing optical semiconductor element |
| US10340659B1 (en) * | 2018-06-14 | 2019-07-02 | Conary Enterprise Co., Ltd. | Electronically pumped surface-emitting photonic crystal laser |
| US20200303896A1 (en) * | 2019-03-18 | 2020-09-24 | Ricoh Company, Ltd. | Optical device, lighting apparatus, measuring apparatus, part-inspecting apparatus, robot, electronic device, and movable object |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11637409B2 (en) * | 2017-03-27 | 2023-04-25 | Hamamatsu Photonics K.K. | Semiconductor light-emitting module and control method therefor |
| JP6951890B2 (ja) * | 2017-07-10 | 2021-10-20 | 浜松ホトニクス株式会社 | 半導体レーザ素子 |
| TWI698057B (zh) * | 2018-02-13 | 2020-07-01 | 國立交通大學 | 具有透明導電層之二維光子晶體面射型雷射 |
| TWM569067U (zh) * | 2018-05-21 | 2018-10-21 | 智林企業股份有限公司 | Electrically excited photonic crystal surface-emitting laser element |
| CN110535033B (zh) * | 2018-05-24 | 2021-05-25 | 智林企业股份有限公司 | 电激发光子晶体面射型雷射元件 |
| TWM588387U (zh) * | 2019-07-02 | 2019-12-21 | 智林企業股份有限公司 | 具有檢光結構之電激發光子晶體面射型雷射元件 |
| TWI830021B (zh) * | 2020-11-08 | 2024-01-21 | 富昱晶雷射科技股份有限公司 | 光子晶體面射型雷射 |
-
2021
- 2021-05-05 TW TW110116186A patent/TWI830021B/zh active
- 2021-05-05 TW TW110205046U patent/TWM627153U/zh unknown
- 2021-06-18 EP EP21888158.9A patent/EP4241350A4/fr active Pending
- 2021-06-18 WO PCT/CN2021/100962 patent/WO2022095455A1/fr not_active Ceased
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020173089A1 (en) * | 2001-03-26 | 2002-11-21 | Gazillion Bits, Inc. | Vertical cavity surface emitting laser with buried dielectric distributed bragg reflector |
| JP2006128548A (ja) * | 2004-11-01 | 2006-05-18 | Seiko Epson Corp | 面発光型半導体レーザおよびその製造方法、光モジュール、並びに、光伝達装置 |
| US20100103972A1 (en) * | 2007-03-23 | 2010-04-29 | Sumitomo Electric Industries, Ltd. | Photonic crystal laser and method of manufacturing photonic crystal laser |
| US20080240193A1 (en) * | 2007-03-26 | 2008-10-02 | Kyoto University | Two-dimensional photonic crystal surface-emitting laser |
| CN103107482A (zh) * | 2013-01-29 | 2013-05-15 | 中国科学院半导体研究所 | 单模光子晶体垂直腔面发射激光器及其制备方法 |
| US20170070026A1 (en) * | 2015-09-08 | 2017-03-09 | Fuji Xerox Co., Ltd. | Method of manufacturing optical semiconductor element |
| US10340659B1 (en) * | 2018-06-14 | 2019-07-02 | Conary Enterprise Co., Ltd. | Electronically pumped surface-emitting photonic crystal laser |
| US20200303896A1 (en) * | 2019-03-18 | 2020-09-24 | Ricoh Company, Ltd. | Optical device, lighting apparatus, measuring apparatus, part-inspecting apparatus, robot, electronic device, and movable object |
Non-Patent Citations (2)
| Title |
|---|
| KRISHNAMOORTHY A V ET AL: "VERTICAL-CAVITY SURFACE-EMITTING LASERS FLIP-CHIP BONDED TO GIGABIT-PER-SECOND CMOS CIRCUITS", IEEE PHOTONICS TECHNOLOGY LETTERS, IEEE, USA, vol. 11, no. 1, 1 January 1999 (1999-01-01), pages 128 - 130, XP000801407, ISSN: 1041-1135, DOI: 10.1109/68.736418 * |
| See also references of WO2022095455A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| EP4241350A1 (fr) | 2023-09-13 |
| TW202220316A (zh) | 2022-05-16 |
| WO2022095455A1 (fr) | 2022-05-12 |
| TWM627153U (zh) | 2022-05-21 |
| TWI830021B (zh) | 2024-01-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
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| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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| STAA | Information on the status of an ep patent application or granted ep patent |
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| 17P | Request for examination filed |
Effective date: 20230310 |
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| AK | Designated contracting states |
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| DAV | Request for validation of the european patent (deleted) | ||
| DAX | Request for extension of the european patent (deleted) | ||
| RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01S 5/34 20060101ALI20241112BHEP Ipc: H01S 5/187 20060101ALI20241112BHEP Ipc: H01S 5/32 20060101ALI20241112BHEP Ipc: H01S 5/11 20210101ALI20241112BHEP Ipc: H01S 5/10 20210101ALI20241112BHEP Ipc: H01S 5/20 20060101ALI20241112BHEP Ipc: H01S 5/183 20060101AFI20241112BHEP |
|
| A4 | Supplementary search report drawn up and despatched |
Effective date: 20250417 |
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| RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01S 5/34 20060101ALI20250411BHEP Ipc: H01S 5/187 20060101ALI20250411BHEP Ipc: H01S 5/32 20060101ALI20250411BHEP Ipc: H01S 5/11 20210101ALI20250411BHEP Ipc: H01S 5/10 20210101ALI20250411BHEP Ipc: H01S 5/20 20060101ALI20250411BHEP Ipc: H01S 5/183 20060101AFI20250411BHEP |