EP4356083A4 - DEVICE FOR MEASURING SPECTRAL REFLECTANCE, IN PARTICULAR OF CONCAVE SPHERICAL MIRROR SURFACES, AND MEASURING METHOD ON THIS DEVICE - Google Patents

DEVICE FOR MEASURING SPECTRAL REFLECTANCE, IN PARTICULAR OF CONCAVE SPHERICAL MIRROR SURFACES, AND MEASURING METHOD ON THIS DEVICE

Info

Publication number
EP4356083A4
EP4356083A4 EP21945835.3A EP21945835A EP4356083A4 EP 4356083 A4 EP4356083 A4 EP 4356083A4 EP 21945835 A EP21945835 A EP 21945835A EP 4356083 A4 EP4356083 A4 EP 4356083A4
Authority
EP
European Patent Office
Prior art keywords
measuring
concave spherical
mirror surfaces
spherical mirror
spectral reflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP21945835.3A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP4356083A1 (en
Inventor
Miroslav PECH
Dusan MANDÁT
Miroslav Hrabovský
Petr Schovánek
Martin VACULA
Stanislav MICHAL
Miroslav PALATKA
Pavel Horváth
Ladislav Chytka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Palacky University Olomouc
Original Assignee
Palacky University Olomouc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Palacky University Olomouc filed Critical Palacky University Olomouc
Publication of EP4356083A1 publication Critical patent/EP4356083A1/en
Publication of EP4356083A4 publication Critical patent/EP4356083A4/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0254—Spectrometers, other than colorimeters, making use of an integrating sphere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005—Testing of reflective surfaces, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J2003/425—Reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP21945835.3A 2021-06-16 2021-06-16 DEVICE FOR MEASURING SPECTRAL REFLECTANCE, IN PARTICULAR OF CONCAVE SPHERICAL MIRROR SURFACES, AND MEASURING METHOD ON THIS DEVICE Pending EP4356083A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CZ2021/000026 WO2022262880A1 (en) 2021-06-16 2021-06-16 Device for the measurement of the spectral reflectance, in particular concave spherical mirror surfaces, and method of the measurement on this device

Publications (2)

Publication Number Publication Date
EP4356083A1 EP4356083A1 (en) 2024-04-24
EP4356083A4 true EP4356083A4 (en) 2025-03-05

Family

ID=84284021

Family Applications (1)

Application Number Title Priority Date Filing Date
EP21945835.3A Pending EP4356083A4 (en) 2021-06-16 2021-06-16 DEVICE FOR MEASURING SPECTRAL REFLECTANCE, IN PARTICULAR OF CONCAVE SPHERICAL MIRROR SURFACES, AND MEASURING METHOD ON THIS DEVICE

Country Status (3)

Country Link
EP (1) EP4356083A4 (cs)
CZ (1) CZ310311B6 (cs)
WO (1) WO2022262880A1 (cs)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1319531C (en) * 1986-04-23 1993-06-29 Gretagmacbeth, L.L.C. Remote spectrophotometer
CN107037007A (zh) * 2017-05-18 2017-08-11 北京奥博泰科技有限公司 一种带自动校准功能的玻璃反射比测量装置及方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006071510A (ja) * 2004-09-02 2006-03-16 Pentax Corp 反射率測定方法及び反射率測定装置
JP5370409B2 (ja) * 2011-05-18 2013-12-18 株式会社島津製作所 絶対反射測定装置
CN107132029B (zh) * 2017-05-12 2020-09-22 电子科技大学 一种同时测量高反射/高透射光学元件的反射率、透过率、散射损耗和吸收损耗的方法
CN107884368B (zh) * 2017-10-18 2020-12-04 湖南文理学院 一种光学测试系统和测试方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1319531C (en) * 1986-04-23 1993-06-29 Gretagmacbeth, L.L.C. Remote spectrophotometer
CN107037007A (zh) * 2017-05-18 2017-08-11 北京奥博泰科技有限公司 一种带自动校准功能的玻璃反射比测量装置及方法

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
See also references of WO2022262880A1 *
VICTOR R WEIDNER ET AL: "Spectral reflectance NBS SP 250-8", 1 July 1987 (1987-07-01), pages 1 - 152, XP061046704, Retrieved from the Internet <URL:https://nvlpubs.nist.gov/nistpubs/Legacy/SP/nbsspecialpublication250-8.pdf> [retrieved on 19870701], DOI: 10.6028/NBS.SP.250-8 *

Also Published As

Publication number Publication date
CZ2022204A3 (cs) 2022-12-07
WO2022262880A1 (en) 2022-12-22
EP4356083A1 (en) 2024-04-24
CZ310311B6 (cs) 2025-02-12

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