EP4362071A3 - Boîtier de semi-conducteur de niveau panneau et son procédé de fabrication - Google Patents
Boîtier de semi-conducteur de niveau panneau et son procédé de fabrication Download PDFInfo
- Publication number
- EP4362071A3 EP4362071A3 EP23206096.2A EP23206096A EP4362071A3 EP 4362071 A3 EP4362071 A3 EP 4362071A3 EP 23206096 A EP23206096 A EP 23206096A EP 4362071 A3 EP4362071 A3 EP 4362071A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- sidewall
- semiconductor package
- manufacturing
- insulating layer
- adhesive layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/014—Manufacture or treatment using batch processing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/38—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by treatments done after the formation of the materials
- H10P14/3802—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
- H10P14/3808—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth using laser beams
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/0198—Manufacture or treatment batch processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/019—Manufacture or treatment using temporary auxiliary substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/127—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed characterised by arrangements for sealing or adhesion
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7424—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used as a support during the manufacture of self-supporting substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
- H10W70/093—Connecting or disconnecting other interconnections thereto or therefrom, e.g. connecting bond wires or bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/932—Plan-view shape, i.e. in top view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9413—Dispositions of bond pads on encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/114—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
- H10W74/117—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations the substrate having spherical bumps for external connection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
- H10W74/142—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations exposing the passive side of the semiconductor body
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US202263419799P | 2022-10-27 | 2022-10-27 | |
| US18/489,746 US20240145258A1 (en) | 2022-10-27 | 2023-10-18 | Panel level semiconductor package and method of manufacturing the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP4362071A2 EP4362071A2 (fr) | 2024-05-01 |
| EP4362071A3 true EP4362071A3 (fr) | 2024-09-25 |
Family
ID=88558366
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP23206096.2A Withdrawn EP4362071A3 (fr) | 2022-10-27 | 2023-10-26 | Boîtier de semi-conducteur de niveau panneau et son procédé de fabrication |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US20240145258A1 (fr) |
| EP (1) | EP4362071A3 (fr) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1111662A2 (fr) * | 1999-12-22 | 2001-06-27 | General Electric Company | Dispositif et méthode pour l'alignement d'une puce semi-conductrice avec le métal d'interconnexion sur un substrat flexible, et produit ainsi obtenu |
| US20090236736A1 (en) * | 2006-08-04 | 2009-09-24 | Micron Technology, Inc. | Microelectronic devices and methods for manufacturing microelectronic devices |
| US20190139925A1 (en) * | 2017-11-03 | 2019-05-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | Package structure and manufacturing method thereof |
Family Cites Families (47)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR950012658B1 (ko) * | 1992-07-24 | 1995-10-19 | 삼성전자주식회사 | 반도체 칩 실장방법 및 기판 구조체 |
| US5936847A (en) * | 1996-05-02 | 1999-08-10 | Hei, Inc. | Low profile electronic circuit modules |
| US6548764B1 (en) * | 2000-06-07 | 2003-04-15 | Micron Technology, Inc. | Semiconductor packages and methods for making the same |
| US6964881B2 (en) * | 2002-08-27 | 2005-11-15 | Micron Technology, Inc. | Multi-chip wafer level system packages and methods of forming same |
| JP3534405B1 (ja) * | 2002-11-28 | 2004-06-07 | 鐘淵化学工業株式会社 | 耐熱性フレキシブル積層板の製造方法およびこれにより製造される耐熱性フレキシブル積層板 |
| US6841883B1 (en) * | 2003-03-31 | 2005-01-11 | Micron Technology, Inc. | Multi-dice chip scale semiconductor components and wafer level methods of fabrication |
| WO2004094499A1 (fr) * | 2003-04-18 | 2004-11-04 | Kaneka Corporation | Composition de resine thermodurcissable, corps multicouche a base de ladite resine et carte de circuits imprimes |
| US20050126706A1 (en) * | 2003-12-10 | 2005-06-16 | Bunch Richard D. | Non-corrosive low temperature liquid resist adhesive |
| JP4298559B2 (ja) * | 2004-03-29 | 2009-07-22 | 新光電気工業株式会社 | 電子部品実装構造及びその製造方法 |
| FI117369B (fi) * | 2004-11-26 | 2006-09-15 | Imbera Electronics Oy | Menetelmä elektroniikkamoduulin valmistamiseksi |
| FI122128B (fi) * | 2005-06-16 | 2011-08-31 | Imbera Electronics Oy | Menetelmä piirilevyrakenteen valmistamiseksi |
| FI119714B (fi) * | 2005-06-16 | 2009-02-13 | Imbera Electronics Oy | Piirilevyrakenne ja menetelmä piirilevyrakenteen valmistamiseksi |
| KR100660893B1 (ko) * | 2005-11-22 | 2006-12-26 | 삼성전자주식회사 | 정렬 마크막을 구비하는 반도체 소자 및 그 제조 방법 |
| US9093322B2 (en) * | 2007-07-13 | 2015-07-28 | Intel Mobile Communications GmbH | Semiconductor device |
| US7893545B2 (en) * | 2007-07-18 | 2011-02-22 | Infineon Technologies Ag | Semiconductor device |
| US7767496B2 (en) * | 2007-12-14 | 2010-08-03 | Stats Chippac, Ltd. | Semiconductor device and method of forming interconnect structure for encapsulated die having pre-applied protective layer |
| US9318441B2 (en) * | 2007-12-14 | 2016-04-19 | Stats Chippac, Ltd. | Semiconductor device and method of forming sacrificial adhesive over contact pads of semiconductor die |
| AT12316U1 (de) * | 2008-10-30 | 2012-03-15 | Austria Tech & System Tech | Verfahren zur integration eines elektronischen bauteils in eine leiterplatte |
| US8535978B2 (en) * | 2011-12-30 | 2013-09-17 | Deca Technologies Inc. | Die up fully molded fan-out wafer level packaging |
| US9754835B2 (en) * | 2010-02-16 | 2017-09-05 | Deca Technologies Inc. | Semiconductor device and method comprising redistribution layers |
| US8884431B2 (en) * | 2011-09-09 | 2014-11-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Packaging methods and structures for semiconductor devices |
| US8941222B2 (en) * | 2010-11-11 | 2015-01-27 | Advanced Semiconductor Engineering Inc. | Wafer level semiconductor package and manufacturing methods thereof |
| US8492203B2 (en) * | 2011-01-21 | 2013-07-23 | Stats Chippac, Ltd. | Semiconductor device and method for forming semiconductor package having build-up interconnect structure over semiconductor die with different CTE insulating layers |
| US9000584B2 (en) * | 2011-12-28 | 2015-04-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Packaged semiconductor device with a molding compound and a method of forming the same |
| US9111949B2 (en) * | 2012-04-09 | 2015-08-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods and apparatus of wafer level package for heterogeneous integration technology |
| US9620413B2 (en) * | 2012-10-02 | 2017-04-11 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of using a standardized carrier in semiconductor packaging |
| US9275925B2 (en) * | 2013-03-12 | 2016-03-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | System and method for an improved interconnect structure |
| US8987876B2 (en) * | 2013-03-14 | 2015-03-24 | General Electric Company | Power overlay structure and method of making same |
| US9978700B2 (en) * | 2014-06-16 | 2018-05-22 | STATS ChipPAC Pte. Ltd. | Method for building up a fan-out RDL structure with fine pitch line-width and line-spacing |
| US10269752B2 (en) * | 2014-09-15 | 2019-04-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package with UBM and methods of forming |
| US10147692B2 (en) * | 2014-09-15 | 2018-12-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package with UBM and methods of forming |
| US9999136B2 (en) * | 2014-12-15 | 2018-06-12 | Ge Embedded Electronics Oy | Method for fabrication of an electronic module and electronic module |
| US9439292B1 (en) * | 2015-03-06 | 2016-09-06 | Kinsus Interconnect Technology Corp. | Method for manufacturing a circuit board with buried element having high density pin count and the circuit board structure |
| DE102015122282A1 (de) * | 2015-12-18 | 2017-06-22 | Infineon Technologies Ag | Elektronisches Bauteil und Verfahren zu dessen Herstellung |
| US9806048B2 (en) * | 2016-03-16 | 2017-10-31 | Qualcomm Incorporated | Planar fan-out wafer level packaging |
| US10373931B2 (en) * | 2016-11-29 | 2019-08-06 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor package structure and method of manufacturing the same |
| US11232957B2 (en) * | 2017-11-29 | 2022-01-25 | Pep Inovation Pte. Ltd. | Chip packaging method and package structure |
| US12506055B2 (en) * | 2017-11-29 | 2025-12-23 | Pep Innovation Pte. Ltd. | Chip packaging method and chip structure |
| US11114315B2 (en) * | 2017-11-29 | 2021-09-07 | Pep Innovation Pte. Ltd. | Chip packaging method and package structure |
| US10515936B1 (en) * | 2018-06-25 | 2019-12-24 | Powertech Technology Inc. | Package structure and manufacturing method thereof |
| US10867925B2 (en) * | 2018-07-19 | 2020-12-15 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method for forming chip package structure |
| US11031289B2 (en) * | 2018-10-31 | 2021-06-08 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor package and methods of forming the same |
| KR102617086B1 (ko) * | 2018-11-15 | 2023-12-26 | 삼성전자주식회사 | Ubm을 포함하는 웨이퍼-레벨 반도체 패키지 |
| US11694967B2 (en) * | 2019-03-14 | 2023-07-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package structure and method of fabricating the same |
| US11233039B2 (en) * | 2019-08-29 | 2022-01-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor packages |
| US11609391B2 (en) * | 2020-05-19 | 2023-03-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor package and manufacturing method thereof |
| CN114512457B (zh) * | 2020-11-17 | 2025-10-03 | Pep创新私人有限公司 | 半导体结构及其制造方法 |
-
2023
- 2023-10-18 US US18/489,746 patent/US20240145258A1/en active Pending
- 2023-10-26 EP EP23206096.2A patent/EP4362071A3/fr not_active Withdrawn
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1111662A2 (fr) * | 1999-12-22 | 2001-06-27 | General Electric Company | Dispositif et méthode pour l'alignement d'une puce semi-conductrice avec le métal d'interconnexion sur un substrat flexible, et produit ainsi obtenu |
| US20090236736A1 (en) * | 2006-08-04 | 2009-09-24 | Micron Technology, Inc. | Microelectronic devices and methods for manufacturing microelectronic devices |
| US20190139925A1 (en) * | 2017-11-03 | 2019-05-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | Package structure and manufacturing method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| US20240145258A1 (en) | 2024-05-02 |
| EP4362071A2 (fr) | 2024-05-01 |
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