EP4576162A1 - Procédé d'extraction et d'utilisation de nuages d'ions à résolution temporelle à partir d'un ensemble de données spectrométriques - Google Patents

Procédé d'extraction et d'utilisation de nuages d'ions à résolution temporelle à partir d'un ensemble de données spectrométriques Download PDF

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Publication number
EP4576162A1
EP4576162A1 EP23218927.4A EP23218927A EP4576162A1 EP 4576162 A1 EP4576162 A1 EP 4576162A1 EP 23218927 A EP23218927 A EP 23218927A EP 4576162 A1 EP4576162 A1 EP 4576162A1
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EP
European Patent Office
Prior art keywords
intensity values
intensity
group
event
ion cloud
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP23218927.4A
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German (de)
English (en)
Inventor
Cedric David KOOLEN
Sven R.J. Koolen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ecole Polytechnique Federale de Lausanne EPFL
Eidgenoessische Materialpruefungs und Forschungsanstalt
Original Assignee
Ecole Polytechnique Federale de Lausanne EPFL
Eidgenoessische Materialpruefungs und Forschungsanstalt
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Filing date
Publication date
Application filed by Ecole Polytechnique Federale de Lausanne EPFL, Eidgenoessische Materialpruefungs und Forschungsanstalt filed Critical Ecole Polytechnique Federale de Lausanne EPFL
Priority to EP23218927.4A priority Critical patent/EP4576162A1/fr
Priority to PCT/IB2024/061863 priority patent/WO2025133766A1/fr
Publication of EP4576162A1 publication Critical patent/EP4576162A1/fr
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement

Definitions

  • ion clouds are generated by the atomisation and ionisation of particles and/or cells that are spatially correlated and therefore, temporally correlated.
  • These ion plumes or 'particle/cell events' are substantially higher than the background and can be distinguished from the background by deploying an appropriate algorithm to the ICP-MS raw data, to determine the ion intensity as a function of time, obtained by an ion detector of the ICP-MS system.

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
EP23218927.4A 2023-12-20 2023-12-20 Procédé d'extraction et d'utilisation de nuages d'ions à résolution temporelle à partir d'un ensemble de données spectrométriques Pending EP4576162A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP23218927.4A EP4576162A1 (fr) 2023-12-20 2023-12-20 Procédé d'extraction et d'utilisation de nuages d'ions à résolution temporelle à partir d'un ensemble de données spectrométriques
PCT/IB2024/061863 WO2025133766A1 (fr) 2023-12-20 2024-11-26 Procédé d'extraction et d'utilisation de nuages d'ions à résolution temporelle à partir d'un ensemble de données spectrométriques

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP23218927.4A EP4576162A1 (fr) 2023-12-20 2023-12-20 Procédé d'extraction et d'utilisation de nuages d'ions à résolution temporelle à partir d'un ensemble de données spectrométriques

Publications (1)

Publication Number Publication Date
EP4576162A1 true EP4576162A1 (fr) 2025-06-25

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Family Applications (1)

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EP23218927.4A Pending EP4576162A1 (fr) 2023-12-20 2023-12-20 Procédé d'extraction et d'utilisation de nuages d'ions à résolution temporelle à partir d'un ensemble de données spectrométriques

Country Status (2)

Country Link
EP (1) EP4576162A1 (fr)
WO (1) WO2025133766A1 (fr)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140299763A1 (en) 2006-08-15 2014-10-09 Fluidigm Canada Inc. Apparatus for elemental analysis of particles by mass spectrometry
US20150235833A1 (en) * 2014-02-14 2015-08-20 Perkinelmer Health Sciences, Inc. Systems and Methods for Automated Analysis of Output In Single Particle Inductively Coupled Plasma Mass Spectrometry and Similar Data Sets
WO2015122920A1 (fr) 2014-02-14 2015-08-20 Perkinelmer Health Sciences, Inc. Systèmes et procédés d'analyse automatique de sortie de spectrométrie de masse à plasma à couplage inductif à particule unique et d'ensembles de données similaires
US11075066B2 (en) 2018-10-26 2021-07-27 Agilent Technologies, Inc. Automated detection of nanoparticles using single-particle inductively coupled plasma mass spectrometry (SP-ICP-MS)
WO2023095020A1 (fr) * 2021-11-26 2023-06-01 Ecole Polytechnique Federale De Lausanne (Epfl) Procédé de granulométrie et de comptage de particules à spectrométrie de masse à plasma à couplage inductif de particule unique, système, programme informatique et support de données lisible par ordinateur

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140299763A1 (en) 2006-08-15 2014-10-09 Fluidigm Canada Inc. Apparatus for elemental analysis of particles by mass spectrometry
US20150235833A1 (en) * 2014-02-14 2015-08-20 Perkinelmer Health Sciences, Inc. Systems and Methods for Automated Analysis of Output In Single Particle Inductively Coupled Plasma Mass Spectrometry and Similar Data Sets
WO2015122920A1 (fr) 2014-02-14 2015-08-20 Perkinelmer Health Sciences, Inc. Systèmes et procédés d'analyse automatique de sortie de spectrométrie de masse à plasma à couplage inductif à particule unique et d'ensembles de données similaires
US11075066B2 (en) 2018-10-26 2021-07-27 Agilent Technologies, Inc. Automated detection of nanoparticles using single-particle inductively coupled plasma mass spectrometry (SP-ICP-MS)
WO2023095020A1 (fr) * 2021-11-26 2023-06-01 Ecole Polytechnique Federale De Lausanne (Epfl) Procédé de granulométrie et de comptage de particules à spectrométrie de masse à plasma à couplage inductif de particule unique, système, programme informatique et support de données lisible par ordinateur

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
ANAL. CHEM., vol. 81, no. 16, 2009, pages 6813 - 6822
ANAL. CHEM., vol. 83, no. 24, 2011, pages 9361 - 9369
HENDRIKS ET AL.: "Performance of Sp-ICP-TOFMS with Signal Distributions Fitted to a Compound Poisson Model", J. ANAL. AT. SPECTROM, vol. 34, no. 9, 2019, pages 1900 - 1909, XP093102669, DOI: 10.1039/C9JA00186G
J. ANAL. AT. SPECTROM, vol. 28, no. 2, 2013, pages 226 - 233
MONTAÑO MANUEL D ET AL: "Single Particle ICP-MS: Advances toward routine analysis of nanomaterials", ANALYTICAL AND BIOANALYTICAL CHEMISTRY, SPRINGER BERLIN HEIDELBERG, BERLIN/HEIDELBERG, vol. 408, no. 19, 23 June 2016 (2016-06-23), pages 5053 - 5074, XP035992049, ISSN: 1618-2642, [retrieved on 20160623], DOI: 10.1007/S00216-016-9676-8 *
STEVE WILBUR ET AL: "Characterization of nanoparticles in aqueous samples by ICP-MS White paper Authors", ARGILENT TECHNOLOGIES, 31 July 2017 (2017-07-31), pages 1 - 10, XP055652992, Retrieved from the Internet <URL:https://www.agilent.com/cs/library/whitepaper/public/ICP-MS_5991-5516EN-nanoparticles.pdf> [retrieved on 20191216] *

Also Published As

Publication number Publication date
WO2025133766A1 (fr) 2025-06-26

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