EP4623310A4 - Testsonde - Google Patents

Testsonde

Info

Publication number
EP4623310A4
EP4623310A4 EP23907793.6A EP23907793A EP4623310A4 EP 4623310 A4 EP4623310 A4 EP 4623310A4 EP 23907793 A EP23907793 A EP 23907793A EP 4623310 A4 EP4623310 A4 EP 4623310A4
Authority
EP
European Patent Office
Prior art keywords
test probe
probe
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP23907793.6A
Other languages
English (en)
French (fr)
Other versions
EP4623310A1 (de
Inventor
Sunghyun Cho
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leeno Industiral Inc
Original Assignee
Leeno Industiral Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leeno Industiral Inc filed Critical Leeno Industiral Inc
Publication of EP4623310A1 publication Critical patent/EP4623310A1/de
Publication of EP4623310A4 publication Critical patent/EP4623310A4/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
EP23907793.6A 2022-12-22 2023-12-21 Testsonde Pending EP4623310A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020220181541A KR102834383B1 (ko) 2022-12-22 2022-12-22 검사 프로브
PCT/KR2023/021234 WO2024136510A1 (en) 2022-12-22 2023-12-21 Test probe

Publications (2)

Publication Number Publication Date
EP4623310A1 EP4623310A1 (de) 2025-10-01
EP4623310A4 true EP4623310A4 (de) 2026-02-25

Family

ID=91589420

Family Applications (1)

Application Number Title Priority Date Filing Date
EP23907793.6A Pending EP4623310A4 (de) 2022-12-22 2023-12-21 Testsonde

Country Status (5)

Country Link
EP (1) EP4623310A4 (de)
KR (1) KR102834383B1 (de)
CN (1) CN120390880A (de)
TW (1) TWI893544B (de)
WO (1) WO2024136510A1 (de)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140320159A1 (en) * 2013-04-18 2014-10-30 Isc Co., Ltd. Probe member for pogo pin
JP2016038207A (ja) * 2014-08-05 2016-03-22 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． ポゴピン用プローブ部材

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101057371B1 (ko) * 2009-07-03 2011-08-17 리노공업주식회사 검사용 탐침 장치
KR101704712B1 (ko) * 2011-03-14 2017-02-08 리노공업주식회사 검사장치용 테스트 핀
KR101531043B1 (ko) * 2013-11-19 2015-06-24 (주)마이크로컨텍솔루션 포고 핀 및 그 제조방법
KR101492242B1 (ko) * 2014-07-17 2015-02-13 주식회사 아이에스시 검사용 접촉장치 및 전기적 검사소켓
JP2018009790A (ja) * 2016-07-11 2018-01-18 アルプス電気株式会社 スプリングコンタクトおよびスプリングコンタクトを使用したソケット
KR101901395B1 (ko) * 2017-02-17 2018-09-28 (주) 루켄테크놀러지스 프로브 핀 및 이의 제조 방법
KR101910063B1 (ko) 2017-05-18 2018-10-19 최귀환 검사장치용 프로브
KR102002036B1 (ko) * 2018-05-10 2019-07-22 (주)티에스이 컨택트 프로브 및 그 제조방법
JP7096095B2 (ja) * 2018-07-27 2022-07-05 株式会社エンプラス コンタクトピン及び電気部品用ソケット
KR102033135B1 (ko) 2019-05-08 2019-10-16 주식회사 제네드 프로브 핀
KR102216143B1 (ko) * 2019-12-24 2021-02-16 주식회사 아이에스시 검사용 탐침장치
KR102619576B1 (ko) * 2021-04-21 2023-12-29 리노공업주식회사 프로브 콘텍트
CN217639218U (zh) * 2022-03-14 2022-10-21 深圳市华荣发电子测试有限公司 一种能过大电流的探针结构

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140320159A1 (en) * 2013-04-18 2014-10-30 Isc Co., Ltd. Probe member for pogo pin
JP2016038207A (ja) * 2014-08-05 2016-03-22 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． ポゴピン用プローブ部材

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2024136510A1 *

Also Published As

Publication number Publication date
EP4623310A1 (de) 2025-10-01
WO2024136510A1 (en) 2024-06-27
CN120390880A (zh) 2025-07-29
TWI893544B (zh) 2025-08-11
KR102834383B1 (ko) 2025-07-15
TW202426929A (zh) 2024-07-01
KR20240099742A (ko) 2024-07-01

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