EP4705779A4 - TEST DEVICE - Google Patents

TEST DEVICE

Info

Publication number
EP4705779A4
EP4705779A4 EP24797294.6A EP24797294A EP4705779A4 EP 4705779 A4 EP4705779 A4 EP 4705779A4 EP 24797294 A EP24797294 A EP 24797294A EP 4705779 A4 EP4705779 A4 EP 4705779A4
Authority
EP
European Patent Office
Prior art keywords
test device
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP24797294.6A
Other languages
German (de)
French (fr)
Other versions
EP4705779A1 (en
Inventor
Jaehwan Jeong
Jaehun Kim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leeno Industiral Inc
Original Assignee
Leeno Industiral Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leeno Industiral Inc filed Critical Leeno Industiral Inc
Publication of EP4705779A1 publication Critical patent/EP4705779A1/en
Publication of EP4705779A4 publication Critical patent/EP4705779A4/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G01R1/06761—Material aspects related to layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0835—Testing shielding, e.g. for efficiency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
EP24797294.6A 2023-04-25 2024-04-01 TEST DEVICE Pending EP4705779A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020230054194A KR102933152B1 (en) 2023-04-25 2023-04-25 Test device
PCT/KR2024/004150 WO2024225632A1 (en) 2023-04-25 2024-04-01 Test device

Publications (2)

Publication Number Publication Date
EP4705779A1 EP4705779A1 (en) 2026-03-11
EP4705779A4 true EP4705779A4 (en) 2026-04-08

Family

ID=93256710

Family Applications (1)

Application Number Title Priority Date Filing Date
EP24797294.6A Pending EP4705779A4 (en) 2023-04-25 2024-04-01 TEST DEVICE

Country Status (6)

Country Link
EP (1) EP4705779A4 (en)
JP (1) JP2026512365A (en)
KR (1) KR102933152B1 (en)
CN (1) CN121002383A (en)
TW (1) TWI906806B (en)
WO (1) WO2024225632A1 (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170160310A1 (en) * 2013-12-17 2017-06-08 Keyssa, Inc. Waveguides for Capturing Close-Proximity Electromagnetic Radiation Transmitted by Wireless Chips During Testing on Automated Test Equipment (ATE)
US20180003754A1 (en) * 2016-06-29 2018-01-04 Infineon Technologies Ag Device, system and method for automatic test of integrated antennas
US20200141980A1 (en) * 2017-08-11 2020-05-07 Leeno Industrial Inc. Test device
US10884047B2 (en) * 2015-09-10 2021-01-05 Leeno Industrial Inc. Probe socket
EP3451001B1 (en) * 2017-08-29 2022-10-05 Mediatek Inc. Over the air wireless test system for testing microelectronic devices integrated with antenna
US20220357361A1 (en) * 2020-06-30 2022-11-10 Leeno Industrial Inc. Test socket and method of fabricating the same

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10114067B2 (en) * 2016-02-04 2018-10-30 Advantest Corporation Integrated waveguide structure and socket structure for millimeter waveband testing
CN107748298A (en) * 2017-10-13 2018-03-02 环旭电子股份有限公司 Test setup with built-in test antenna
JP7386327B2 (en) * 2019-08-28 2023-11-24 株式会社アドバンテスト Test equipment, automatic test equipment and method for testing a device under test comprising a circuit and an antenna coupled to the circuit
CN113075429A (en) * 2020-01-03 2021-07-06 迪科特测试科技(苏州)有限公司 Detection card, detection system and detection method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170160310A1 (en) * 2013-12-17 2017-06-08 Keyssa, Inc. Waveguides for Capturing Close-Proximity Electromagnetic Radiation Transmitted by Wireless Chips During Testing on Automated Test Equipment (ATE)
US10884047B2 (en) * 2015-09-10 2021-01-05 Leeno Industrial Inc. Probe socket
US20180003754A1 (en) * 2016-06-29 2018-01-04 Infineon Technologies Ag Device, system and method for automatic test of integrated antennas
US20200141980A1 (en) * 2017-08-11 2020-05-07 Leeno Industrial Inc. Test device
EP3451001B1 (en) * 2017-08-29 2022-10-05 Mediatek Inc. Over the air wireless test system for testing microelectronic devices integrated with antenna
US20220357361A1 (en) * 2020-06-30 2022-11-10 Leeno Industrial Inc. Test socket and method of fabricating the same

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2024225632A1 *

Also Published As

Publication number Publication date
JP2026512365A (en) 2026-04-15
KR102933152B1 (en) 2026-03-03
TWI906806B (en) 2025-12-01
WO2024225632A1 (en) 2024-10-31
KR20240157409A (en) 2024-11-01
EP4705779A1 (en) 2026-03-11
CN121002383A (en) 2025-11-21
TW202445156A (en) 2024-11-16

Similar Documents

Publication Publication Date Title
EP4209761C0 (en) MEASURING DEVICE
EP4257041A4 (en) MEASURING DEVICE
EP4252869C0 (en) HOOK-GRIP DEVICE
EP4512282A4 (en) MEASURING DEVICE
EP4215905A4 (en) INSPECTION DEVICE
DE102020116939A8 (en) test leak device
EP4306926C0 (en) Inhaler test device
EP4478025A4 (en) Stretching test device
EP4445833A4 (en) PULSEWAVE MEASURING DEVICE
EP4328571A4 (en) INSPECTION DEVICE
EP4403773A4 (en) TEST PROCEDURES
EP4368983C0 (en) MEASURING DEVICE
EP4495604A4 (en) INSPECTION DEVICE
EP4466482C0 (en) INSPECTION DEVICE
EP4589301A4 (en) ANALYSIS DEVICE
EP4465006A4 (en) VIBRATION TEST DEVICE
DK4246116T3 (en) TESTING APPARATUS
EP4350342A4 (en) ULTRASONIC TESTING DEVICE
EP4142308C0 (en) MEASURING DEVICE
EP4173562A4 (en) MEASURING DEVICE
PL4100837T3 (en) DEVICE TESTING SYSTEM
EP4705779A4 (en) TEST DEVICE
EP4495602A4 (en) TEST DEVICE
EP4517329A4 (en) TESTING DEVICE
EP4495605A4 (en) TESTING DEVICE

Legal Events

Date Code Title Description
STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE

PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE

17P Request for examination filed

Effective date: 20250912

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR

A4 Supplementary search report drawn up and despatched

Effective date: 20260310

RIC1 Information provided on ipc code assigned before grant

Ipc: G01R 29/08 20060101AFI20260304BHEP

Ipc: G01R 29/10 20060101ALI20260304BHEP

Ipc: G01R 1/067 20060101ALI20260304BHEP

Ipc: G01R 1/04 20060101ALI20260304BHEP