ES2005632A6 - Un detector de sedimientos para un contador de particulas. - Google Patents

Un detector de sedimientos para un contador de particulas.

Info

Publication number
ES2005632A6
ES2005632A6 ES8702825A ES8702825A ES2005632A6 ES 2005632 A6 ES2005632 A6 ES 2005632A6 ES 8702825 A ES8702825 A ES 8702825A ES 8702825 A ES8702825 A ES 8702825A ES 2005632 A6 ES2005632 A6 ES 2005632A6
Authority
ES
Spain
Prior art keywords
voltage
debris
orifice
particle
comparator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES8702825A
Other languages
English (en)
Spanish (es)
Inventor
Ermi Roos
Wallace H Coulter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coulter Electronics Inc
Original Assignee
Coulter Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coulter Electronics Inc filed Critical Coulter Electronics Inc
Publication of ES2005632A6 publication Critical patent/ES2005632A6/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/131—Details
    • G01N15/132—Circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N2015/138—Detecting blocking debris

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Volume Flow (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)
ES8702825A 1986-10-03 1987-10-02 Un detector de sedimientos para un contador de particulas. Expired ES2005632A6 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/915,185 US4775833A (en) 1986-10-03 1986-10-03 Lodged debris detector for a particle analyzer

Publications (1)

Publication Number Publication Date
ES2005632A6 true ES2005632A6 (es) 1989-03-16

Family

ID=25435371

Family Applications (1)

Application Number Title Priority Date Filing Date
ES8702825A Expired ES2005632A6 (es) 1986-10-03 1987-10-02 Un detector de sedimientos para un contador de particulas.

Country Status (11)

Country Link
US (1) US4775833A (2)
EP (1) EP0285657A4 (2)
JP (1) JPH02503351A (2)
KR (1) KR880701879A (2)
CN (1) CN1012015B (2)
AU (1) AU601253B2 (2)
BR (1) BR8707488A (2)
CA (1) CA1279698C (2)
ES (1) ES2005632A6 (2)
NZ (1) NZ222026A (2)
WO (1) WO1988002486A1 (2)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5675517A (en) * 1995-04-25 1997-10-07 Systemix Fluorescence spectral overlap compensation for high speed flow cytometry systems
GB9624096D0 (en) * 1996-11-20 1997-01-08 Microbial Systems Ltd Apparatus and method of use thereof
US6418802B1 (en) 1996-11-21 2002-07-16 Michael Anthony Wood Particle sizing apparatus and method of use thereof
US5907240A (en) * 1997-05-12 1999-05-25 Cdc Technologies, Inc. Method and apparatus for cell differentiation by measuring apparent cell size, membrane integrity and intracellular complexity
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
US8146407B2 (en) * 2008-06-20 2012-04-03 Beckman Coulter, Inc. Particle counter with electronic detection of aperture blockage
JP5083287B2 (ja) * 2009-09-11 2012-11-28 セイコーエプソン株式会社 検出装置、物理量測定装置及び電子機器
US9768137B2 (en) 2012-04-30 2017-09-19 Taiwan Semiconductor Manufacturing Company, Ltd. Stud bump structure for semiconductor package assemblies
US9389164B2 (en) 2013-03-12 2016-07-12 Novelis Inc. Methods of and apparatus for measuring metal cleanliness
US10411682B2 (en) 2013-03-12 2019-09-10 Novelis Inc. Methods of and apparatus for determining particle inclusion and size in molten metal
CN104515725B (zh) * 2013-09-30 2017-08-22 深圳迈瑞生物医疗电子股份有限公司 一种识别异常粒子的方法和系统及其细胞分析仪
FR3034520B1 (fr) 2015-04-02 2020-02-14 Horiba Abx Sas Dispositif de comptage de particules
FR3058524B1 (fr) * 2016-11-07 2019-01-25 Institut National De La Sante Et De La Recherche Medicale Procede de caracterisation d'un echantillon sanguin

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3259842A (en) * 1959-08-19 1966-07-05 Coulter Electronics Particle analyzing device
US3259891A (en) * 1964-05-01 1966-07-05 Coulter Electronics Debris alarm
US3668531A (en) * 1966-02-23 1972-06-06 Coulter Electronics Pulse analyzing apparatus
CH566008A5 (2) * 1973-12-14 1975-08-29 Secheron Atel
US3938038A (en) * 1974-07-01 1976-02-10 Coulter Electronics, Inc. Method and apparatus for providing primary coincidence correction during particle analysis
US3987391A (en) * 1974-12-02 1976-10-19 Coulter Electronics, Inc. Method and apparatus for correcting total particle volume error due to particle coincidence
DE2929272A1 (de) * 1979-07-19 1981-02-12 Siemens Ag Ueberwachungseinrichtung fuer die spannungsbelastung eines kondensators
US4412175A (en) * 1981-04-30 1983-10-25 Coulter Electronics, Inc. Debris alarm
JPS5921220A (ja) * 1982-07-24 1984-02-03 三菱電機株式会社 過電圧保護継電装置
US4558310A (en) * 1982-09-29 1985-12-10 Mcallise Raymond J Current sensing device and monitor
JPS61124850A (ja) * 1984-11-21 1986-06-12 Eruma Kogaku Kk 超純水の不純物測定装置

Also Published As

Publication number Publication date
AU601253B2 (en) 1990-09-06
NZ222026A (en) 1990-03-27
EP0285657A4 (en) 1990-01-08
JPH0358660B2 (2) 1991-09-06
CN87106641A (zh) 1988-06-22
CN1012015B (zh) 1991-03-13
CA1279698C (en) 1991-01-29
BR8707488A (pt) 1988-12-06
JPH02503351A (ja) 1990-10-11
WO1988002486A1 (en) 1988-04-07
KR880701879A (ko) 1988-11-05
AU8325387A (en) 1988-04-21
US4775833A (en) 1988-10-04
EP0285657A1 (en) 1988-10-12

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Legal Events

Date Code Title Description
SA6 Expiration date (snapshot 920101)

Free format text: 2007-10-02