ES2006049A6 - Un aparato y un metodo para inspeccionar la integridad electronica de una union o junta de soldadura expuesta. - Google Patents
Un aparato y un metodo para inspeccionar la integridad electronica de una union o junta de soldadura expuesta.Info
- Publication number
- ES2006049A6 ES2006049A6 ES888800093A ES8800093A ES2006049A6 ES 2006049 A6 ES2006049 A6 ES 2006049A6 ES 888800093 A ES888800093 A ES 888800093A ES 8800093 A ES8800093 A ES 8800093A ES 2006049 A6 ES2006049 A6 ES 2006049A6
- Authority
- ES
- Spain
- Prior art keywords
- solder joints
- circuit board
- heating
- pulse
- simultaneous testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910000679 solder Inorganic materials 0.000 title abstract 7
- 238000010438 heat treatment Methods 0.000 abstract 4
- 230000010355 oscillation Effects 0.000 abstract 3
- 230000003252 repetitive effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
SE TRATA DE UN SISTEMA PARA INSPECCIONAR LA INTEGRIDAD ELECTRONICA DE LAS JUNTAS O UNIONES DE SOLDADURA <BLANDA> MEDIANTE CALENTAMIENTO REPETITIVO (POR IMPULSOS) DE LAS JUNTAS DE SOLDADURA CON ENERGIA RADIANTE Y DETERMINANDO LA OSCILACION DE TEMPERATURA DE LAS JUNTAS DE SOLDADURA ASI CALENTADAS POR IMPULSOS, MIDIENDO PARA ELLO LAS EMISIONES DE RAYOS INFRARROJOS PROCEDENTES DE LAS JUNTAS DE SOLDADURA DURANTE LOS PERIODOS DE CALENTAMIENTO Y DE AUSENCIA DE CALENTAMIENTO. PARA MAYOR VENTAJA, LAS JUNTAS DE SOLDADURA EXPUESTAS DE UNA PLACA DE CIRCUITOS PUEDEN SER PROBADAS O ENSAYADAS TODAS DE UNA VEZ, CALENTANDO POR IMPULSOS LA PLACA ENTERA DE CIRCUITOS. LA OSCILACION DE TEMPERATURA DE CADA JUNTA PUEDE SER COMPARADA CON LAS OSCILACIONES DE TEMPERATURA DE UNAS JUNTAS DE SOLDADURA STANDAR CORRESPONDIENTES, DE BUENA INTEGRIDED ELECTRONICA CONOCIDA, EN PLACAS DE CIRCUITOS QUE FUNCIONAN ADECUADAMENTE.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/004,009 US4792683A (en) | 1987-01-16 | 1987-01-16 | Thermal technique for simultaneous testing of circuit board solder joints |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2006049A6 true ES2006049A6 (es) | 1989-04-01 |
Family
ID=21708691
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES888800093A Expired ES2006049A6 (es) | 1987-01-16 | 1988-01-15 | Un aparato y un metodo para inspeccionar la integridad electronica de una union o junta de soldadura expuesta. |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4792683A (es) |
| JP (1) | JPS6446638A (es) |
| ES (1) | ES2006049A6 (es) |
| GB (1) | GB2199942B (es) |
| IL (1) | IL85007A (es) |
Families Citing this family (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1286724C (en) * | 1986-03-27 | 1991-07-23 | Richard Ralph Goulette | Method and apparatus for monitoring electromagnetic emission levels |
| DE3820862A1 (de) * | 1988-06-21 | 1989-12-28 | Soelter Hans Joachim Dipl Phys | Verfahren und vorrichtung zur kontaktlosen untersuchung von oberflaechen und inneren strukturen eines festen pruefkoerpers |
| FR2641870B1 (fr) * | 1989-01-19 | 1991-07-12 | Bull Sa | Procede pour le controle d'une carte de circuit imprime equipee, notamment le controle des soudures de la carte, et appareillage pour la mise en oeuvre de ce procede |
| US5208528A (en) * | 1989-01-19 | 1993-05-04 | Bull S.A. | Method for inspecting a populated printed circuit board, particularly for inspecting solder joints on the board and a system for working this method |
| US4944447A (en) * | 1989-03-29 | 1990-07-31 | Motorola, Inc. | Bonding verification process incorporating test patterns |
| DE3913474A1 (de) * | 1989-04-24 | 1990-10-25 | Siemens Ag | Photothermisches untersuchungsverfahren, einrichtung zu seiner durchfuehrung und verwendung des verfahrens |
| US5052816A (en) * | 1989-08-29 | 1991-10-01 | Denyo Kabushiki Kaisha | Junction inspection method and apparatus for electronic parts |
| FR2666420B1 (fr) * | 1990-09-05 | 1992-12-18 | Dassault Aviat | Dispositif pour envoyer un rayonnement infrarouge sur un objet pendant un intervalle de temps controle. |
| JP2788346B2 (ja) * | 1990-11-30 | 1998-08-20 | 株式会社東芝 | プリント配線板検査装置 |
| WO1992011541A1 (en) * | 1990-12-21 | 1992-07-09 | Huntron Instruments, Inc. | Image acquisition system for use with a printed circuit board test apparatus |
| US5250809A (en) * | 1992-01-24 | 1993-10-05 | Shuji Nakata | Method and device for checking joint of electronic component |
| DE4203272C2 (de) * | 1992-02-05 | 1995-05-18 | Busse Gerd Prof Dr Rer Nat Hab | Verfahren zur phasenempfindlichen Darstellung eines effektmodulierten Gegenstandes |
| US5246291A (en) * | 1992-06-01 | 1993-09-21 | Motorola, Inc. | Bond inspection technique for a semiconductor chip |
| US5302830A (en) * | 1993-03-05 | 1994-04-12 | General Research Corporation | Method for measuring thermal differences in infrared emissions from micro devices |
| US6183126B1 (en) * | 1994-04-11 | 2001-02-06 | The John Hopkins University | Method for nondestructive/noncontact microwave detection of electrical and magnetic property discontinuities in materials |
| GB9425232D0 (en) * | 1994-12-14 | 1995-02-08 | Secr Defence | Method of authenticating watermarked paper |
| US5733041A (en) * | 1995-10-31 | 1998-03-31 | General Electric Company | Methods and apparatus for electrical connection inspection |
| US6426484B1 (en) | 1996-09-10 | 2002-07-30 | Micron Technology, Inc. | Circuit and method for heating an adhesive to package or rework a semiconductor die |
| US5938956A (en) * | 1996-09-10 | 1999-08-17 | Micron Technology, Inc. | Circuit and method for heating an adhesive to package or rework a semiconductor die |
| FR2760529B1 (fr) * | 1997-03-05 | 1999-05-28 | Framatome Sa | Procede d'examen photothermique d'une piece |
| FR2760528B1 (fr) * | 1997-03-05 | 1999-05-21 | Framatome Sa | Procede et dispositif d'examen photothermique d'un materiau |
| US5864776A (en) * | 1997-08-27 | 1999-01-26 | Mitsubishi Electric America, Inc. | Apparatus and method for detecting an error in the placement of a lead frame on a surface of a die mold |
| US6140827A (en) | 1997-12-18 | 2000-10-31 | Micron Technology, Inc. | Method and apparatus for testing bumped die |
| US6072150A (en) * | 1998-05-27 | 2000-06-06 | Beamworks Ltd. | Apparatus and method for in-line soldering |
| DE19832833C2 (de) * | 1998-07-21 | 2002-01-31 | Fraunhofer Ges Forschung | Verfahren zur thermographischen Untersuchung eines Werkstückes und Vorrichtung hierfür |
| US6236044B1 (en) * | 1998-08-21 | 2001-05-22 | Trw Inc. | Method and apparatus for inspection of a substrate by use of a ring illuminator |
| US6294923B1 (en) * | 1998-12-07 | 2001-09-25 | Advanced Micro Devices, Inc. | Method and system for detecting faults utilizing an AC power supply |
| US6360935B1 (en) * | 1999-01-26 | 2002-03-26 | Board Of Regents Of The University Of Texas System | Apparatus and method for assessing solderability |
| US6394646B1 (en) | 1999-04-16 | 2002-05-28 | General Electric Company | Method and apparatus for quantitative nondestructive evaluation of metal airfoils using high resolution transient thermography |
| US6340817B1 (en) * | 1999-04-23 | 2002-01-22 | Creo S.R.L. | Inspection method for unpopulated printed circuit boards |
| US6367969B1 (en) * | 1999-07-21 | 2002-04-09 | General Electric Company | Synthetic reference thermal imaging method |
| US6367968B1 (en) * | 1999-07-21 | 2002-04-09 | General Electric Company | Thermal resonance imaging method |
| GB9924425D0 (en) * | 1999-10-16 | 1999-12-15 | British Aerospace | Material analysis |
| US6585146B2 (en) * | 2000-01-06 | 2003-07-01 | Thermal Wave Imaging, Inc. | Automated non-destructive weld evaluation method and apparatus |
| GB2358466A (en) * | 2000-01-18 | 2001-07-25 | Cindy Maria Marcella Motmans | Testing interconnections in an electronic circuit assembly by thermal conduction detection. |
| US6728653B1 (en) * | 2000-03-21 | 2004-04-27 | Unisys Corporation | Method for testing multi-chip packages |
| US6452180B1 (en) * | 2000-03-28 | 2002-09-17 | Advanced Micro Devices, Inc. | Infrared inspection for determining residual films on semiconductor devices |
| US6847900B2 (en) * | 2001-12-17 | 2005-01-25 | Agilent Technologies, Inc. | System and method for identifying solder joint defects |
| US20050169346A1 (en) * | 2004-01-29 | 2005-08-04 | Trw Automotive U.S. Llc | Method for monitoring quality of a transmissive laser weld |
| JP3775426B1 (ja) * | 2005-02-22 | 2006-05-17 | オムロン株式会社 | 半田材検査方法、半田材検査装置、制御プログラム、コンピュータ読み取り可能な記録媒体 |
| JP2006234635A (ja) * | 2005-02-25 | 2006-09-07 | Three M Innovative Properties Co | フレキシブルプリント配線板の接合部の非破壊検査方法 |
| US7409313B2 (en) * | 2005-12-16 | 2008-08-05 | General Electric Company | Method and apparatus for nondestructive evaluation of insulative coating |
| CN101460855B (zh) | 2006-06-02 | 2012-01-11 | 空中客车德国有限公司 | 用于检测导电连接的接触缺陷的测试设备及方法 |
| RU2419100C2 (ru) * | 2006-06-02 | 2011-05-20 | Эйрбас Дойчланд Гмбх | Испытательная аппаратура и способ обнаружения контактного дефекта токопроводного соединения |
| US7538938B2 (en) * | 2006-06-13 | 2009-05-26 | Uchicago Argonne, Llc | Optical filter for flash lamps in pulsed thermal imaging |
| DE102006061794B3 (de) * | 2006-12-21 | 2008-04-30 | Thermosensorik Gmbh | Verfahren zur automatischen Prüfung einer Schweißverbindung |
| US7845849B1 (en) * | 2008-04-15 | 2010-12-07 | Avaya Inc. | Testing BGA solder joints by localized pulsed-heat thermography |
| EP2743688B1 (en) * | 2012-12-17 | 2017-05-03 | Thermosensorik Gmbh | Method and system for the examination of a sample by means of thermography |
| EP2840387A1 (en) * | 2013-08-23 | 2015-02-25 | DCG Systems, Inc. | Lock-in thermography method and system for hot spot localization |
| DE102015207551A1 (de) * | 2015-04-24 | 2016-10-27 | Robert Bosch Gmbh | Vorrichtung und Verfahren zur photothermischen Qualitätskontrolle von Korngröße und Schichthaftung eines Bauteils |
| CN110621988A (zh) * | 2017-05-15 | 2019-12-27 | 三菱电机株式会社 | 缺陷检查装置以及缺陷检查方法 |
| CN110967376A (zh) * | 2019-12-13 | 2020-04-07 | 上海吉埃姆智能设备有限公司 | 一种焊接质量检测系统 |
| CN111639449B (zh) * | 2020-05-26 | 2023-04-21 | 东风小康汽车有限公司重庆分公司 | 焊点建模方法、装置及系统 |
| CN111735850B (zh) * | 2020-06-24 | 2022-08-23 | 哈尔滨工业大学 | 扫描式电路板焊点虚焊自动检测系统及检测方法 |
| CN115684270B (zh) * | 2022-11-02 | 2025-07-22 | 哈尔滨工业大学 | 高密度封装电路板焊点虚焊红外快速筛查系统和筛查方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3427861A (en) * | 1965-07-28 | 1969-02-18 | Automation Ind Inc | Nondestructive tester |
| SU396609A1 (ru) * | 1971-10-26 | 1973-08-29 | СПОСОБ КОНТРОЛЯ ФОРМЫ и РАЗМЕРОВ ЛИТОЙ ЗОНЫ ТОЧЕЧНЫХ СВАРНЫХ СОЕДИНЕНИЙ | |
| JPS4853784A (es) * | 1971-11-04 | 1973-07-28 | ||
| US3808439A (en) * | 1972-04-24 | 1974-04-30 | Us Army | Laser illumination thermal imaging device for nondestructive testing |
| US3803413A (en) * | 1972-05-01 | 1974-04-09 | Vanzetti Infrared Computer Sys | Infrared non-contact system for inspection of infrared emitting components in a device |
| US3868508A (en) * | 1973-10-30 | 1975-02-25 | Westinghouse Electric Corp | Contactless infrared diagnostic test system |
| US3991302A (en) * | 1974-11-22 | 1976-11-09 | Grumman Aerospace Corporation | Method for detecting and isolating faults in digital and analog circuits with multiple infrared scanning under conditions of different stimuli |
| US4240750A (en) * | 1978-10-02 | 1980-12-23 | Hurd William A | Automatic circuit board tester |
| DE3373018D1 (en) * | 1982-03-18 | 1987-09-17 | Atomic Energy Authority Uk | Transient thermography |
| US4481418A (en) * | 1982-09-30 | 1984-11-06 | Vanzetti Systems, Inc. | Fiber optic scanning system for laser/thermal inspection |
| US4647220A (en) * | 1984-07-09 | 1987-03-03 | Lockheed Corporation | Method of and apparatus for detecting corrosion utilizing infrared analysis |
-
1987
- 1987-01-16 US US07/004,009 patent/US4792683A/en not_active Expired - Lifetime
-
1988
- 1988-01-01 IL IL85007A patent/IL85007A/xx not_active IP Right Cessation
- 1988-01-05 GB GB8800085A patent/GB2199942B/en not_active Expired - Fee Related
- 1988-01-14 JP JP63006726A patent/JPS6446638A/ja active Pending
- 1988-01-15 ES ES888800093A patent/ES2006049A6/es not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| IL85007A0 (en) | 1988-06-30 |
| US4792683A (en) | 1988-12-20 |
| GB2199942B (en) | 1991-05-08 |
| IL85007A (en) | 1991-08-16 |
| GB8800085D0 (en) | 1988-02-10 |
| JPS6446638A (en) | 1989-02-21 |
| GB2199942A (en) | 1988-07-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FD1A | Patent lapsed |
Effective date: 19980504 |