ES2030138T3 - Dispositivo para la comprobacion por todos sus lados mediante rayos x de un neumatico de automovil apoyado en forma giratoria, durante un giro del neumatico. - Google Patents

Dispositivo para la comprobacion por todos sus lados mediante rayos x de un neumatico de automovil apoyado en forma giratoria, durante un giro del neumatico.

Info

Publication number
ES2030138T3
ES2030138T3 ES198888118097T ES88118097T ES2030138T3 ES 2030138 T3 ES2030138 T3 ES 2030138T3 ES 198888118097 T ES198888118097 T ES 198888118097T ES 88118097 T ES88118097 T ES 88118097T ES 2030138 T3 ES2030138 T3 ES 2030138T3
Authority
ES
Spain
Prior art keywords
tyre
tire
image
diode
omnidirectional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES198888118097T
Other languages
English (en)
Inventor
Horst Steffel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SPEZIALMASCHINENBAU STEFFEL GmbH and Co KG
Original Assignee
SPEZIALMASCHINENBAU STEFFEL GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=6339614&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ES2030138(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by SPEZIALMASCHINENBAU STEFFEL GmbH and Co KG filed Critical SPEZIALMASCHINENBAU STEFFEL GmbH and Co KG
Application granted granted Critical
Publication of ES2030138T3 publication Critical patent/ES2030138T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G01N23/185—Investigating the presence of flaws defects or foreign matter in tyres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00—Testing of vehicles
    • G01M17/007—Wheeled or endless-tracked vehicles
    • G01M17/02—Tyres
    • G01M17/028—Tyres using X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/627—Specific applications or type of materials tyres

Landscapes

  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

DISPOSITIVIO PARA COMPROBACION POR RAYOS X DE TODAS PARTES DE UN NEUMATICO DEL VEHICULO APOYADO GIRATORIAMENTE DURANTE UN GIRO DEL NEUMATICO, QUE EN EL ESPACIO ENCERRADO EN EL NEUMATICO CERCA DE SU PARTE INTERIOR ABIERTA ESTA COLOCADO DE TAL MODO QUE DESDE SU RADIACION SE ATRAVIESA LAS PAREDES EXTERIORES Y LA SUPERFICIE DEL NEUMATICO DESDE EL INTERIOR HACIA EL EXTERIOR, ADEMAS CON DISPOSITIVOS RECEPTORES EN FORMA DE TRES COLOCACIONES LINEARES DE DIODOS SENSIBLES A LA LUZ QUE ESTAN COLOCADOS PARALELAMENTE AL EJE O PARALELAMENTE AL DIAMETRO MAS PROXIMO, CON LO QUE EN LAS COLOCACIONES DE DIODOS ESTA COLOCADO UN DISPOSITIVO DE EXPLORACION QUE EXPLORA LOS DIODOS CON UNA FRECUENCIA DE EXPLORACION DADA Y QUE DA SEÑALES DE SALIDA DE LOS DIODOS EN UN ALMACEN Y CON LO QUE ESTA PREVISTO UN DISPOSITIVO DE TRANSMISION DE IMAGEN COMPUESTA DE PUNTOS DE IMAGEN INDIVIDUALES PARA PRODUCCION DE UNA LINEA DE IMAGEN POR SECUENCIA DE EXPLORACION PARA COLOCACION DE DIODOS.
ES198888118097T 1987-11-02 1988-10-31 Dispositivo para la comprobacion por todos sus lados mediante rayos x de un neumatico de automovil apoyado en forma giratoria, durante un giro del neumatico. Expired - Lifetime ES2030138T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19873737159 DE3737159A1 (de) 1987-11-02 1987-11-02 Vorrichtung zur allseitigen roentgenpruefung eines drehbar abgestuetzten kraftfahrzeugreifens waehrend einer reifenumdrehung

Publications (1)

Publication Number Publication Date
ES2030138T3 true ES2030138T3 (es) 1992-10-16

Family

ID=6339614

Family Applications (1)

Application Number Title Priority Date Filing Date
ES198888118097T Expired - Lifetime ES2030138T3 (es) 1987-11-02 1988-10-31 Dispositivo para la comprobacion por todos sus lados mediante rayos x de un neumatico de automovil apoyado en forma giratoria, durante un giro del neumatico.

Country Status (5)

Country Link
US (1) US5083306A (es)
EP (1) EP0315099B1 (es)
AT (1) ATE72332T1 (es)
DE (2) DE3737159A1 (es)
ES (1) ES2030138T3 (es)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0440847B1 (de) * 1990-02-06 1994-05-11 Spezialmaschinenbau Steffel GmbH & Co. KG Vorrichtung zur Röntgenprüfung eines Kraftfahrzeugreifens
US5737383A (en) * 1995-04-24 1998-04-07 The Yokohama Rubber Co. Ltd. Method and apparatus for automatically testing tire
DE59813129D1 (de) * 1997-06-10 2005-12-01 Beissbarth Gmbh Verfahren und Vorrichtung zum Prüfen von Reifen
DE59805066D1 (de) * 1997-06-10 2002-09-12 Beissbarth Gmbh Reifenprüfverfahren und -vorrichtung
KR100302061B1 (ko) * 1998-06-12 2001-09-22 신형인 타이어 사이드월 부위의 풋 프린트 형상 측정법 및 그 장치
EP1650557A1 (de) * 2004-10-20 2006-04-26 Collmann GmbH & Co. Spezialmaschinenbau KG Röntgenprüfverfahren und Röntgenprüfvorrichtung für Reifen
JP4684063B2 (ja) * 2005-09-22 2011-05-18 株式会社ブリヂストン タイヤｘ線撮影装置およびタイヤのｘ線撮影方法
DE102011009127A1 (de) * 2011-01-21 2012-07-26 Yxlon International Gmbh Räderprüfung mit zwei Detektoren
DE102013001456B3 (de) 2013-01-28 2014-05-15 Yxlon International Gmbh Verfahren zur Kalibrierung einer Röntgenprüfanlage für einen Reifentyp sowie Verfahren zur Prüfung der Lage von Cords in einem Reifen
FR3013907B1 (fr) 2013-11-27 2016-01-01 Michelin & Cie Systeme de lecture dynamique de donnees de transpondeurs
FR3013870B1 (fr) * 2013-11-27 2016-01-01 Michelin & Cie Systeme de lecture dynamique de donnees de transpondeurs
CN105793697B (zh) * 2013-12-03 2018-10-19 横滨橡胶株式会社 轮胎检查方法及其装置
US10810564B2 (en) * 2015-11-09 2020-10-20 Bridgestone Americas Tire Operations, Llc Tire selection decision support system and method
CN105445298B (zh) * 2015-12-11 2019-03-22 邬金阳 一种基于x射线线阵的轮胎检测系统
US20230316396A1 (en) * 2022-03-30 2023-10-05 John Woodard Trading System and Method for Commodity Distribution

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3873837A (en) * 1970-12-07 1975-03-25 Picker Corp Tire inspection apparatus
US3766387A (en) * 1972-07-11 1973-10-16 Us Navy Nondestructive test device using radiation to detect flaws in materials
DE2239003C3 (de) 1972-08-08 1978-11-09 Collmann Gmbh & Co Spezialmaschinenbau Kg, 2400 Luebeck Vorrichtung zur allseitigen Röntgenprüfung eines drehbar abgestutzten Kraftfahrzeugreifens
DE2262982C3 (de) * 1972-12-19 1979-06-13 Werner Dipl.-Phys. Dr. 3008 Garbsen Krebs Reifenprüf gerät
US3934144A (en) 1974-04-11 1976-01-20 United States Steel Corporation X-ray machine for rapid and precise inspection of mixed sizes of pneumatic tires
JPS5594241A (en) * 1979-01-11 1980-07-17 Hitachi Medical Corp Xxray transverse layer device
DE2920051C2 (de) * 1979-05-18 1984-04-19 Philips Patentverwaltung Gmbh, 2000 Hamburg Röntgengerät zur Ermittlung der Absorptionsverteilung in einem ebenen Untersuchungsbereich
DE3113440A1 (de) * 1981-04-03 1982-11-11 Philips Patentverwaltung Gmbh, 2000 Hamburg "verfahren zur ueberpruefung von gleichartigen objekten auf fehler"
DE3149705A1 (de) * 1981-12-15 1983-07-21 Siemens AG, 1000 Berlin und 8000 München "rotierendes detektorsystem mit kuehlmittelvorrat"
JPS60236632A (ja) * 1984-05-10 1985-11-25 株式会社東芝 第４世代ｃｔ装置
DE3530938A1 (de) * 1985-08-29 1987-03-12 Heimann Gmbh Gepaeckpruefanlage
FR2587804B1 (fr) * 1985-09-23 1988-06-17 Commissariat Energie Atomique Systeme de controle au defile, de pieces, par un rayonnement penetrant
DE3536374A1 (de) * 1985-10-11 1987-04-16 Siemens Ag Durchlichtverfahren zur gehaeuse- und bauteilevermessung
US4809314A (en) * 1986-02-25 1989-02-28 General Electric Company Method of aligning a linear array X-ray detector
DE8707038U1 (de) * 1987-05-15 1988-09-15 Siemens AG, 1000 Berlin und 8000 München Computertomograph
DE8715213U1 (de) * 1987-11-02 1988-01-14 Spezialmaschinenbau Steffel GmbH & Co KG, 2418 Ratzeburg Vorrichtung zur allseitigen Röntgenprüfung eines drehbar abgestützten Kraftfahrzeugreifens während einer Reifenumdrehung

Also Published As

Publication number Publication date
DE3868225D1 (de) 1992-03-12
ATE72332T1 (de) 1992-02-15
DE3737159C2 (es) 1990-03-29
DE3737159A1 (de) 1989-05-11
EP0315099A3 (en) 1990-05-02
EP0315099B1 (de) 1992-01-29
US5083306A (en) 1992-01-21
EP0315099A2 (de) 1989-05-10

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