ES2061011T3 - Interferometro de polarizacion. - Google Patents

Interferometro de polarizacion.

Info

Publication number
ES2061011T3
ES2061011T3 ES90901537T ES90901537T ES2061011T3 ES 2061011 T3 ES2061011 T3 ES 2061011T3 ES 90901537 T ES90901537 T ES 90901537T ES 90901537 T ES90901537 T ES 90901537T ES 2061011 T3 ES2061011 T3 ES 2061011T3
Authority
ES
Spain
Prior art keywords
double
refracting
wedges
parallel
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES90901537T
Other languages
English (en)
Inventor
Heinz Wagner
Martin Labhart
Ulrich Glaus
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BRAN and LUEBBE
Buehler AG
SPX Flow Technology Germany GmbH
Original Assignee
BRAN and LUEBBE
Buehler AG
Bran und Luebbe GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BRAN and LUEBBE, Buehler AG, Bran und Luebbe GmbH filed Critical BRAN and LUEBBE
Application granted granted Critical
Publication of ES2061011T3 publication Critical patent/ES2061011T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/447—Polarisation spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4537—Devices with refractive scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0261—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods polarised

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Polarising Elements (AREA)

Abstract

UN INTERFEROMETRO POLARIZADOR COMPRENDE UNA FUENTE DE LUZ (1), UN COLIMADOR (2), UN PRIMER ELEMENTO DE POLARIZACION (3), UN SISTEMA DE ELEMENTOS DE DOBLE REFRACCION (4, 5, 6) Y UN SEGUNDO ELEMENTO DE POLARIZACION, QUE POLARIZA LA LUZ QUE EMERGE DEL ELEMENTO DE DOBLE REFRACCION (4, 5, 6) Y LA CONDUCE HACIA UN DETECTOR DE FOTONES (8). EL ELEMENTO DE DOBLE REFRACCION (4, 5, 6) CONSISTE EN DOS CUÑAS OPTICAS (5, 6) QUE, JUNTAS, CONFORMAN UN PARALELEPIPEDO RECTO Y QUE ESTAN COLOCADAS DE TAL MODO QUE SE DESLIZAN UNA CONTRA OTRA A LO LARGO DE SUPERFICIES LATERALES CONTRAPUESTAS, Y EN UNA PLACA DE DOBLE REFRACCION (4) CON CARAS PARALELAS QUE ACTUA COMO COMPENSADOR. EL EJE OPTICO DEL COMPENSADOR (4) FORMA UN ANGULO FINITO CON LOS ANGULOS DE LAS DOS CUÑAS (5, 6). LOS EJES OPTICOS DE LOS DOS POLARIZADORES (3, 7) SE ENCUENTRAN RECIPROCAMENTE PERPENDICULARES O PARALELOS Y NO ESTAN ALINEADOS PARALELAMENTE A LOS EJES DE LAS DOS CUÑAS (5, 6) DEL ELEMENTO DE DOBLE REFRACCION (4, 5, 6).
ES90901537T 1989-03-03 1990-01-15 Interferometro de polarizacion. Expired - Lifetime ES2061011T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH80389 1989-03-03

Publications (1)

Publication Number Publication Date
ES2061011T3 true ES2061011T3 (es) 1994-12-01

Family

ID=4195552

Family Applications (1)

Application Number Title Priority Date Filing Date
ES90901537T Expired - Lifetime ES2061011T3 (es) 1989-03-03 1990-01-15 Interferometro de polarizacion.

Country Status (8)

Country Link
US (1) US5157458A (es)
EP (2) EP0605391A3 (es)
JP (1) JP2997312B2 (es)
AT (1) ATE111591T1 (es)
DE (1) DE59007132D1 (es)
DK (1) DK0427797T3 (es)
ES (1) ES2061011T3 (es)
WO (1) WO1990010191A1 (es)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0433008B1 (en) * 1989-12-11 1995-02-22 Konica Corporation Laser interferometric measuring apparatus
DE4016731C3 (de) * 1990-05-24 2001-04-26 Bruker Analytik Gmbh Fourierspektrometer
DE4104636A1 (de) * 1991-02-15 1992-08-20 Bran & Luebbe Polarisationsinterferometer mit schmalbandfilter
DE4113842A1 (de) * 1991-04-27 1992-11-05 Deutsche Forsch Luft Raumfahrt Verfahren und einrichtung zur messung und bestimmung einer wegdifferenz in interferometern nach michelson
JPH05172738A (ja) * 1991-12-24 1993-07-09 Jasco Corp 音響セル
CH683713A5 (de) * 1992-02-18 1994-04-29 Buehler Ag Verfahren und Vorrichtung zum Erfassen von Parametern von Stoffen.
US5418612A (en) * 1992-02-27 1995-05-23 Renishaw, Plc Method of and apparatus for determining surface contour of diffusely reflecting objects
US5347377A (en) * 1992-06-17 1994-09-13 Eastman Kodak Company Planar waveguide liquid crystal variable retarder
CN1034883C (zh) * 1993-03-12 1997-05-14 复旦大学 一种椭圆偏振光谱仪的设计方法
US5440388A (en) * 1993-08-02 1995-08-08 Erickson; Jon W. Chemical analysis and imaging by discrete fourier transform spectroscopy
DE19623206B4 (de) * 1996-06-11 2007-12-13 Richard Frisse Gmbh Verfahren zum Veredeln von Schokolademasse
DE19650507C1 (de) * 1996-10-30 1997-12-18 O K Tec Optik Keramik Technolo Interferometrische Meßanordnung
CZ284282B6 (cs) * 1996-11-04 1998-10-14 Petr Heřman Způsob určení spektrálního složení elektromagnetického záření a zařízení k jeho provádění
US6646743B2 (en) 1996-11-04 2003-11-11 Petr Herman Method and device for the spectral analysis of light
US6222632B1 (en) 1999-04-07 2001-04-24 Luxtron Corporation Polarization interferometer spectrometer with rotatable birefringent element
DE19944355B4 (de) * 1999-09-16 2004-11-18 Leica Microsystems Heidelberg Gmbh Optische Anordnung
US7408713B1 (en) * 2002-01-08 2008-08-05 Yung-Chieh Hsieh Step-phase interferometric optical interleaver
WO2003091765A1 (en) * 2002-04-26 2003-11-06 International Business Machines Corporation Polarizing beamsplitter
EP1482287A1 (de) * 2003-05-26 2004-12-01 Abb Research Ltd. Polarisations-Fourier-Spektrometer
EP1873692B1 (en) 2006-06-29 2011-12-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP5950939B2 (ja) 2010-12-29 2016-07-13 スリーエム イノベイティブ プロパティズ カンパニー 屈折型偏波変換器及び偏光色合成器
US20140185052A1 (en) * 2012-12-27 2014-07-03 Qiushui Chen Fourier-transform spectrometer and method
CN104568151B (zh) * 2013-10-15 2016-08-10 南京理工大学 一种基于对称楔形干涉腔的高光谱全偏振成像装置及方法
IT202300005346A1 (it) 2023-03-21 2024-09-21 Nireos S R L Apparato interferometrico

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3737235A (en) * 1972-02-10 1973-06-05 Cary Instruments Polarization interferometer with beam polarizing compensator
FR2300998A2 (fr) * 1975-02-11 1976-09-10 Anvar Dispositif pour la spectrometrie interferentielle a modulation selective
FR2340540A2 (fr) * 1976-02-05 1977-09-02 Anvar Dispositif pour la spectrometrie interferentielle a modulation selective
US4265540A (en) * 1979-10-01 1981-05-05 Laser Precision Corporation Refractively scanned interferometer
DD201191B1 (de) * 1981-09-24 1987-07-15 Ilmenau Tech Hochschule Kippinvariantes interferometer mit ebenen spiegeln
JPS59164925A (ja) * 1983-03-11 1984-09-18 Hitachi Ltd 屈折的走査法を用いた二光束干渉計
DE3542161A1 (de) * 1985-11-28 1987-06-04 Kayser Threde Gmbh Verfahren und vorrichtung zur reduktion der datenrate bei der fourierspektroskopie
DE3825683C1 (es) * 1988-07-28 1989-12-28 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch, De

Also Published As

Publication number Publication date
US5157458A (en) 1992-10-20
WO1990010191A1 (de) 1990-09-07
DK0427797T3 (da) 1994-10-17
JPH03504643A (ja) 1991-10-09
JP2997312B2 (ja) 2000-01-11
ATE111591T1 (de) 1994-09-15
EP0427797A1 (de) 1991-05-22
EP0427797B1 (de) 1994-09-14
EP0605391A2 (de) 1994-07-06
DE59007132D1 (de) 1994-10-20
EP0605391A3 (en) 1994-07-27

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