ES2064095T3 - Conector electrico para banco de prueba. - Google Patents

Conector electrico para banco de prueba.

Info

Publication number
ES2064095T3
ES2064095T3 ES91906192T ES91906192T ES2064095T3 ES 2064095 T3 ES2064095 T3 ES 2064095T3 ES 91906192 T ES91906192 T ES 91906192T ES 91906192 T ES91906192 T ES 91906192T ES 2064095 T3 ES2064095 T3 ES 2064095T3
Authority
ES
Spain
Prior art keywords
connector
test bench
tested
electrical connector
assemblies
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES91906192T
Other languages
English (en)
Inventor
Henri Lebris
Patrick Sangleboeuf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FCI France SA
Original Assignee
Framatome Connectors France SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Framatome Connectors France SA filed Critical Framatome Connectors France SA
Application granted granted Critical
Publication of ES2064095T3 publication Critical patent/ES2064095T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S439/00—Electrical connectors
    • Y10S439/912—Electrical connectors with testing means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Connector Housings Or Holding Contact Members (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Manufacturing Of Electrical Connectors (AREA)

Abstract

EL CONECTOR ELECTRICO ESTA PREVISTO PARA SER CONECTADO TEMPORALMENTE AL CONECTOR QUE SE VA A PROBAR. PERMITE VERIFICAR LA CONTINUIDAD ELECTRICA DE MONTAJES O DE SUBMONTAJES, PARTICULARMENTE EN LA INDUSTRIA DEL AUTOMOVIL. EL CONECTOR DEL BANCO DE PRUEBAS COMPRENDE UN ENCHUFE REVESTIDO (18,20) PROVISTO DE MEDIOS PARA BLOQUEAR EL CONECTOR QUE SE VA A PROBAR. CONTIENE UNA PLACA AISLANTE (22) QUE EMPUJA ELASTICAMENTE HACIA ADELANTE PARA APOYARSE EN LA PARTE DELANTERA DEL CONECTOR A PROBAR Y ESTANDO LAS CLAVIJAS DE CONTACTO ELECTRICO (30) MONTADAS EN LA PLACA EMPUJADAS ELASTICAMENTE HACIA UNA POSICION DONDE SOBRESALEN UNA DETERMINADA DISTANCIA CON RESPECTO A LA PLACA.
ES91906192T 1990-03-02 1991-03-01 Conector electrico para banco de prueba. Expired - Lifetime ES2064095T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9002669A FR2659175B1 (fr) 1990-03-02 1990-03-02 Connecteur electrique pour banc de test.

Publications (1)

Publication Number Publication Date
ES2064095T3 true ES2064095T3 (es) 1995-01-16

Family

ID=9394329

Family Applications (1)

Application Number Title Priority Date Filing Date
ES91906192T Expired - Lifetime ES2064095T3 (es) 1990-03-02 1991-03-01 Conector electrico para banco de prueba.

Country Status (8)

Country Link
US (1) US5122070A (es)
EP (1) EP0471830B1 (es)
JP (1) JPH04507170A (es)
BR (1) BR9104810A (es)
DE (1) DE69104310T2 (es)
ES (1) ES2064095T3 (es)
FR (1) FR2659175B1 (es)
WO (1) WO1991013477A2 (es)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5436570A (en) * 1991-05-21 1995-07-25 Tan; Yin L. Burn-in test probe for fine-pitch packages with side contacts
DE4116457C1 (es) * 1991-05-21 1992-10-29 Helmut 7800 Freiburg De Lang-Dahlke
US5685734A (en) * 1992-07-27 1997-11-11 Hm Electronics, Inc. Universally adaptable electrical connector and method of using same
FR2726368B3 (fr) * 1994-11-02 1996-12-27 Amp France Appareil de controle de l'assemblage de bornes
US6146208A (en) * 1997-06-17 2000-11-14 Commscope Field connector adaptor
US6411112B1 (en) 1998-02-19 2002-06-25 International Business Machines Corporation Off-axis contact tip and dense packing design for a fine pitch probe
US6064195A (en) * 1998-05-11 2000-05-16 R-Tec Corporation Test probe positioning device
US6194904B1 (en) 1998-05-19 2001-02-27 R-Tec Corporation Socket test probe and method of making
US6441627B1 (en) * 1998-10-26 2002-08-27 Micron Technology, Inc. Socket test device for detecting characteristics of socket signals
JP3828697B2 (ja) * 1999-12-03 2006-10-04 矢崎総業株式会社 コネクタ導通検査具
US6861862B1 (en) 2003-03-17 2005-03-01 John O. Tate Test socket
JP2006294305A (ja) * 2005-04-06 2006-10-26 Sumitomo Wiring Syst Ltd コネクタの組付け構造
US7463042B2 (en) * 2005-06-30 2008-12-09 Northrop Grumman Corporation Connector probing system
JP2009128216A (ja) * 2007-11-26 2009-06-11 Yazaki Corp 導通検査治具、該導通検査治具を備えた導通検査装置、及び導通検査方法
CN102998563B (zh) * 2012-11-27 2015-02-18 河南中分仪器股份有限公司 隔离器检验装置
WO2015141597A1 (ja) * 2014-03-17 2015-09-24 株式会社リコー コネクタおよび該コネクタを備える電子機器
TWI699052B (zh) * 2019-05-01 2020-07-11 致茂電子股份有限公司 纜線連接器以及纜線連接系統

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4128739A (en) * 1977-09-13 1978-12-05 Communications Technology Corporation Front tap shoe for mounting on test block for telephone conductor pairs
DE2937035A1 (de) * 1979-09-13 1981-03-19 Uwe 7250 Leonberg Ahrendt Elektrischer stecker
DE3411101A1 (de) * 1984-03-26 1985-10-03 Siemens AG, 1000 Berlin und 8000 München Messadapter mit federnden kontaktelementen
DE3644154A1 (de) * 1986-12-23 1988-07-07 Grant Dr Boctor Adapter zur pruefung von leiterplatten
US5015946A (en) * 1990-02-26 1991-05-14 Tektronix, Inc. High density probe

Also Published As

Publication number Publication date
EP0471830A1 (fr) 1992-02-26
WO1991013477A3 (fr) 1991-10-17
FR2659175A1 (fr) 1991-09-06
DE69104310D1 (de) 1994-11-03
JPH04507170A (ja) 1992-12-10
US5122070A (en) 1992-06-16
FR2659175B1 (fr) 1992-06-19
WO1991013477A2 (fr) 1991-09-05
BR9104810A (pt) 1992-03-24
DE69104310T2 (de) 1995-02-16
EP0471830B1 (fr) 1994-09-28

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