ES2068831T3 - Proceso de prueba para dispositivos electronicos. - Google Patents

Proceso de prueba para dispositivos electronicos.

Info

Publication number
ES2068831T3
ES2068831T3 ES88308151T ES88308151T ES2068831T3 ES 2068831 T3 ES2068831 T3 ES 2068831T3 ES 88308151 T ES88308151 T ES 88308151T ES 88308151 T ES88308151 T ES 88308151T ES 2068831 T3 ES2068831 T3 ES 2068831T3
Authority
ES
Spain
Prior art keywords
electronic devices
test process
check
movement
check points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES88308151T
Other languages
English (en)
Inventor
Joseph Michael Moran
Thomas Cutler Russell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Inc
Original Assignee
AT&T Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Inc filed Critical AT&T Inc
Application granted granted Critical
Publication of ES2068831T3 publication Critical patent/ES2068831T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

UNOS DISPOSITIVOS ELECTRONICOS, COMO UN CIRCUITO INTEGRADO HIBRIDO QUE TIENE PUNTOS DE COMPROBACION SEPARADOS A MENOS DE 1250 (MU)M, SON EVALUADOS EFICAZMENTE UTILIZANDO UN PROCESO DE DOS SONDAS. EN ESTE PROCESO LAS SONDAS SON DESPLAZADAS ENTRE PUNTOS DE COMPROBACION MEDIANTE UN PATRON DE DESPLAZAMIENTO QUE REDUCE LA DISTANCIA DEL MOVIMIENTO CON TOTAL INDEPENDENCIA DE CUALQUIER ORDEN IMPUESTA POR LAS PROPIAS REDES O POR LAS COMPROBACIONES A HACER. ADEMAS, LA COMPROBACION SE HACE DE TAL FORMA QUE EL TIEMPO DE MOVIMIENTO ES EL FACTOR LIMITE.
ES88308151T 1987-09-21 1988-09-02 Proceso de prueba para dispositivos electronicos. Expired - Lifetime ES2068831T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US9919687A 1987-09-21 1987-09-21

Publications (1)

Publication Number Publication Date
ES2068831T3 true ES2068831T3 (es) 1995-05-01

Family

ID=22273479

Family Applications (1)

Application Number Title Priority Date Filing Date
ES88308151T Expired - Lifetime ES2068831T3 (es) 1987-09-21 1988-09-02 Proceso de prueba para dispositivos electronicos.

Country Status (6)

Country Link
EP (1) EP0309109B1 (es)
JP (1) JPH0660923B2 (es)
KR (1) KR890005531A (es)
CA (1) CA1308816C (es)
DE (1) DE3853327T2 (es)
ES (1) ES2068831T3 (es)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005311009A (ja) * 2004-04-21 2005-11-04 Kokusai Electric Alhpa Co Ltd 半導体ウェーハ抵抗率測定装置
JP2008191064A (ja) * 2007-02-07 2008-08-21 Produce:Kk アクティブプローブを備えた電気特性検査装置
JP5752466B2 (ja) * 2011-04-06 2015-07-22 日置電機株式会社 基板検査装置
CN109848075B (zh) * 2018-12-25 2024-06-18 东莞市奥海科技股份有限公司 带机械手的ate测试设备及其控制方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3787768A (en) * 1970-12-25 1974-01-22 Matsushita Electric Industrial Co Ltd Inspection apparatus for printed circuit boards
US4242751A (en) * 1978-08-28 1980-12-30 Genrad, Inc. Automatic fault-probing method and apparatus for checking electrical circuits and the like
US4471298A (en) * 1981-12-11 1984-09-11 Cirdyne, Inc. Apparatus for automatically electrically testing printed circuit boards
US4565966A (en) * 1983-03-07 1986-01-21 Kollmorgen Technologies Corporation Method and apparatus for testing of electrical interconnection networks
US4709366A (en) * 1985-07-29 1987-11-24 John Fluke Mfg. Co., Inc. Computer assisted fault isolation in circuit board testing

Also Published As

Publication number Publication date
JPH0660923B2 (ja) 1994-08-10
DE3853327T2 (de) 1995-08-24
EP0309109A3 (en) 1991-02-27
DE3853327D1 (de) 1995-04-20
CA1308816C (en) 1992-10-13
EP0309109B1 (en) 1995-03-15
EP0309109A2 (en) 1989-03-29
KR890005531A (ko) 1989-05-15
JPH0290071A (ja) 1990-03-29

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