ES2074466T3 - Sonda de prueba para circuito electrico. - Google Patents

Sonda de prueba para circuito electrico.

Info

Publication number
ES2074466T3
ES2074466T3 ES89308768T ES89308768T ES2074466T3 ES 2074466 T3 ES2074466 T3 ES 2074466T3 ES 89308768 T ES89308768 T ES 89308768T ES 89308768 T ES89308768 T ES 89308768T ES 2074466 T3 ES2074466 T3 ES 2074466T3
Authority
ES
Spain
Prior art keywords
tubular housing
probe
retaining
disposed
sliding bearing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES89308768T
Other languages
English (en)
Inventor
Thomas D Coe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
QA Technology Co Inc
Original Assignee
QA Technology Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by QA Technology Co Inc filed Critical QA Technology Co Inc
Application granted granted Critical
Publication of ES2074466T3 publication Critical patent/ES2074466T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

SONDA ELECTRICA QUE REALIZA CONTACTOS EN CIRCUITOS ELECTRICOS DURANTE LA PRUEBA DE LOS MISMOS. ESTA FORMADA POR UN CUERPO TUBULAR (40) CON UN EXTREMO ABIERTO Y OTRO EXTREMO NORMALMENTE CERRADO, CON UNA PORCION PRINCIPAL QUE SE PROLONGA DESDE EL EXTREMO NORMALMENTE CERRADO HACIA EL EXTREMO ABIERTO Y UNA PARTE DE RETENCION Y DESLIZAMIENTO ADYACENTE AL EXTREMO ABIERTO Y CON UN DIAMETRO LIGERAMENTE INFERIOR AL DEL EXTREMO ABIERTO. UN PISTON CIRCULAR DE PRUEBA (12) SE ALOJA EN EL CUERPO TUBULAR Y ESTA FORMADO POR UNA PARTE INTERNA CILINDRICA (14) Y QUE SE DESLIZA POR LA PARTE PRINCIPAL DEL CUERPO TUBULAR, Y UNA PARTE EXTERNA CILINDRICA (18) DE UN DIAMETRO INFERIOR QUE LA PARTE INTERNA Y QUE FORMA UN REBORDE (20) CON LA PARTE INTERNA EN UN PUNTO DE ENCUENTRO. LA PARTE EXTERNA DEL PISTON PASA A TRAVES DE LA PARTE DE SOPORTE DE RETENCION Y DESLIZAMIENTO Y TIENE UN DIAMETRO EXTERNO QUE SE DESLIZA CON EL DIAMETRO INTERNO DE LA PARTE DE SOPORTE DE RETENCION Y DESLIZAMIENTO. UN RESORTE DEFORMABLE COMPRESIBLE (26) ESTA ALOJADO ENTRE EL EXTREMO NORMALMENTE CERRADO DEL CUERPO TUBULAR Y LA PARTE INTERNA DEL PISTON DE PRUEBA, COMPRIMIENDOLO PARA DESPLAZAR EL PISTON DE PRUEBA A UNA POSICION EXTENDIDA.
ES89308768T 1988-09-09 1989-08-30 Sonda de prueba para circuito electrico. Expired - Lifetime ES2074466T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07242786 US4885533B1 (en) 1988-09-09 1988-09-09 Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region

Publications (1)

Publication Number Publication Date
ES2074466T3 true ES2074466T3 (es) 1995-09-16

Family

ID=22916179

Family Applications (1)

Application Number Title Priority Date Filing Date
ES89308768T Expired - Lifetime ES2074466T3 (es) 1988-09-09 1989-08-30 Sonda de prueba para circuito electrico.

Country Status (8)

Country Link
US (1) US4885533B1 (es)
EP (1) EP0361689B1 (es)
JP (2) JP3266244B2 (es)
AT (1) ATE125365T1 (es)
CA (1) CA1309464C (es)
DE (1) DE68923517T2 (es)
ES (1) ES2074466T3 (es)
IE (1) IE67528B1 (es)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5982187A (en) * 1993-07-01 1999-11-09 Alphatest Corporation Resilient connector having a tubular spring
JP3659662B2 (ja) * 1993-12-24 2005-06-15 株式会社デンソー プローブコンタクト
US5484306A (en) * 1994-10-20 1996-01-16 Interconnect Devices Inc. Quick-connect terminal and receptacle
DE29519413U1 (de) * 1995-12-07 1996-01-25 TSK Prüfsysteme GmbH, 32457 Porta Westfalica Prüfstift
US6051982A (en) * 1996-08-02 2000-04-18 International Business Machines Corporation Electronic component test apparatus with rotational probe and conductive spaced apart means
US5804984A (en) * 1996-08-02 1998-09-08 International Business Machines Corporation Electronic component test apparatus with rotational probe
US5801544A (en) * 1997-01-16 1998-09-01 Delaware Capital Formation, Inc. Spring probe and method for biasing
US6104205A (en) * 1998-02-26 2000-08-15 Interconnect Devices, Inc. Probe with tab retainer
US6243655B1 (en) * 1998-08-05 2001-06-05 International Business Machines Corporation Circuit trace probe and method
US6172514B1 (en) * 1999-03-12 2001-01-09 Lucent Technologies Inc. Test probe retainer
US6570399B2 (en) * 2000-05-18 2003-05-27 Qa Technology Company, Inc. Test probe and separable mating connector assembly
US6424166B1 (en) * 2000-07-14 2002-07-23 David W. Henry Probe and test socket assembly
US6876530B2 (en) * 2001-01-12 2005-04-05 Qa Technology Company, Inc. Test probe and connector
ATE371196T1 (de) * 2002-03-05 2007-09-15 Rika Denshi America Inc Vorrichtung für eine schnittstelle zwischen elektronischen gehäusen und testgeräten
TWI233489B (en) * 2003-01-21 2005-06-01 Leeno Ind Inc Contact apparatus and test PCB including the contact apparatus used for testing microwave device, and manufacturing method of the test PCB
US7109732B2 (en) * 2003-07-31 2006-09-19 Endicott Interconnect Technologies, Inc. Electronic component test apparatus
JP2005116724A (ja) * 2003-10-07 2005-04-28 Renesas Technology Corp 半導体装置及びその製造方法
US20050184747A1 (en) * 2004-02-19 2005-08-25 Sanders David L. Spring plunger probe
US7259576B2 (en) * 2005-03-14 2007-08-21 Agilent Technologies, Inc. Method and apparatus for a twisting fixture probe for probing test access point structures
US7248065B2 (en) * 2005-04-22 2007-07-24 Hewlett-Packard Development Company, L.P. Arcuate blade probe
US7453278B2 (en) * 2005-04-22 2008-11-18 Hewlett-Packard Development Company, L.P. Methods of using a blade probe for probing a node of a circuit
US8253430B2 (en) * 2005-04-22 2012-08-28 Hewlett-Packard Development Company Circuit board testing using a probe
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
US20070084903A1 (en) * 2005-10-13 2007-04-19 Alexander Leon Pronged fork probe tip
US7279912B2 (en) * 2005-10-13 2007-10-09 Hewlett-Packard Development Company, L.P. Dual arcuate blade probe tip
ITGE20060052A1 (it) * 2006-05-05 2007-11-06 Hypertac S P A Contatto per connessioni elettriche od elettroniche.
US7616019B2 (en) * 2006-05-08 2009-11-10 Aspen Test Engineering, Inc. Low profile electronic assembly test fixtures
US20080143367A1 (en) * 2006-12-14 2008-06-19 Scott Chabineau-Lovgren Compliant electrical contact having maximized the internal spring volume
US7549884B2 (en) * 2007-01-29 2009-06-23 Samtec, Inc. Probe having a field-replaceable tip
US8410948B2 (en) * 2008-05-12 2013-04-02 John Vander Horst Recreational vehicle holding tank sensor probe
US8506307B2 (en) 2010-12-02 2013-08-13 Interconnect Devices, Inc. Electrical connector with embedded shell layer
USD699607S1 (en) * 2012-03-01 2014-02-18 Yamaichi Electronics Co., Ltd. Contact probe
JP6841518B2 (ja) * 2019-02-15 2021-03-10 株式会社サンケイエンジニアリング プローブユニット

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3182257A (en) * 1961-05-18 1965-05-04 Motorola Inc Electronic test probe
DE3045882A1 (de) * 1980-12-05 1982-07-08 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte oder einer entsprechenden elektronischen baugruppe mit kontaktstiften sowie kontaktstift dafuer
US4397519A (en) * 1981-05-12 1983-08-09 Pylon Company, Inc. Electrical contact construction
US4461993A (en) * 1981-09-21 1984-07-24 Everett/Charles, Inc. Low resistance electrical spring probe
US4504780A (en) * 1982-08-25 1985-03-12 Marsella John R Test probe
DE3410093A1 (de) * 1984-03-20 1985-10-03 Feinmetall Gmbh, 7033 Herrenberg Federkontaktstift und verfahren zu seiner herstellung
US4659987A (en) * 1985-03-25 1987-04-21 Qa Technology Company Electrical circuit test probe and connector
US4739259A (en) * 1986-08-01 1988-04-19 Tektronix, Inc. Telescoping pin probe

Also Published As

Publication number Publication date
DE68923517D1 (de) 1995-08-24
CA1309464C (en) 1992-10-27
US4885533A (en) 1989-12-05
JPH02108973A (ja) 1990-04-20
EP0361689B1 (en) 1995-07-19
DE68923517T2 (de) 1996-01-04
US4885533B1 (en) 1998-11-03
IE892762L (en) 1990-03-09
JP2002162414A (ja) 2002-06-07
IE67528B1 (en) 1996-04-03
JP3266244B2 (ja) 2002-03-18
ATE125365T1 (de) 1995-08-15
EP0361689A1 (en) 1990-04-04

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