ES2119362T3 - Fabricacion de particulas que presentan una dimension uniforme de puntos cuanticos. - Google Patents
Fabricacion de particulas que presentan una dimension uniforme de puntos cuanticos.Info
- Publication number
- ES2119362T3 ES2119362T3 ES95900856T ES95900856T ES2119362T3 ES 2119362 T3 ES2119362 T3 ES 2119362T3 ES 95900856 T ES95900856 T ES 95900856T ES 95900856 T ES95900856 T ES 95900856T ES 2119362 T3 ES2119362 T3 ES 2119362T3
- Authority
- ES
- Spain
- Prior art keywords
- particles
- drops
- metal compound
- size
- manufacture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F9/00—Making metallic powder or suspensions thereof
- B22F9/16—Making metallic powder or suspensions thereof using chemical processes
- B22F9/18—Making metallic powder or suspensions thereof using chemical processes with reduction of metal compounds
- B22F9/24—Making metallic powder or suspensions thereof using chemical processes with reduction of metal compounds starting from liquid metal compounds, e.g. solutions
- B22F9/26—Making metallic powder or suspensions thereof using chemical processes with reduction of metal compounds starting from liquid metal compounds, e.g. solutions using gaseous reductors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B19/00—Selenium; Tellurium; Compounds thereof
- C01B19/007—Tellurides or selenides of metals
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B21/00—Nitrogen; Compounds thereof
- C01B21/06—Binary compounds of nitrogen with metals, with silicon, or with boron, or with carbon, i.e. nitrides; Compounds of nitrogen with more than one metal, silicon or boron
- C01B21/0632—Binary compounds of nitrogen with metals, with silicon, or with boron, or with carbon, i.e. nitrides; Compounds of nitrogen with more than one metal, silicon or boron with gallium, indium or thallium
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G11/00—Compounds of cadmium
- C01G11/02—Sulfides
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G21/00—Compounds of lead
- C01G21/21—Sulfides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/04—Coating on selected surface areas, e.g. using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4486—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by producing an aerosol and subsequent evaporation of the droplets or particles
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/26—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using liquid deposition
- H10P14/265—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using liquid deposition using solutions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3414—Deposited materials, e.g. layers characterised by the chemical composition being group IIIA-VIA materials
- H10P14/3421—Arsenides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3424—Deposited materials, e.g. layers characterised by the chemical composition being Group IIB-VIA materials
- H10P14/3428—Sulfides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3451—Structure
- H10P14/3452—Microstructure
- H10P14/3461—Nanoparticles
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/80—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70
- C01P2002/84—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70 by UV- or VIS- data
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/51—Particles with a specific particle size distribution
- C01P2004/52—Particles with a specific particle size distribution highly monodisperse size distribution
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/60—Particles characterised by their size
- C01P2004/64—Nanometer sized, i.e. from 1-100 nanometer
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Nanotechnology (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Composite Materials (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Luminescent Compositions (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Manufacture Of Metal Powder And Suspensions Thereof (AREA)
- Processing And Handling Of Plastics And Other Materials For Molding In General (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Semiconductor Lasers (AREA)
Abstract
PARTICULAS DE TAMAÑO DESEADO CRISTALITOS CERO-DIMENSIONALES DE UN METAL O COMPUESTO DE METAL QUE SE FABRICAN MEDIANTE UN METODO QUE PROPORCIONA UNA SOLUCION EN UN SOLVENTE EVAPORABLE EN UNA CONCENTRACION PREDETERMINADA DE UN METAL ELEGIDO, Y QUE FORMA GOTAS DE LA SOLUCION CON UN TAMAÑO PREDETERMINADO SUSTANCIALMENTE UNIFORME. LAS GOTAS SE PONEN ENTONCES EN CONTACTO CON UN REAGENTE DE FASE GASEOSA FORMANDO ASI LAS PARTICULAS DE COMPUESTO DE METAL DESEADAS. EL SOLVENTE PUEDE EXTRAERSE ANTES, DURANTE O DESPUES DEL CONTACTO DE LAS GOTAS CON EL REAGENTE DE FASE GASEOSA. LAS PARTICULAS DE TAMAÑO DESEADO DEL COMPUESTO DE METAL ASI FORMADAS SE DEPOSITAN SOBRE UN SUSTRATO. ESTAS PUEDEN CONTENERSE DENTRO DE UN POLIMERO COMO UNA PELICULA. MEDIANTE EL CONTROL DE LA CONCENTRACION DE LA SOLUCION Y DEL TAMAÑO DE LAS GOTAS, EL TAMAÑO DE LAS PARTICULAS PUEDE CONTROLARSE ESTRECHAMENTE.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB939323498A GB9323498D0 (en) | 1993-11-15 | 1993-11-15 | Making particles of uniform size |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2119362T3 true ES2119362T3 (es) | 1998-10-01 |
Family
ID=10745177
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES95900856T Expired - Lifetime ES2119362T3 (es) | 1993-11-15 | 1994-11-15 | Fabricacion de particulas que presentan una dimension uniforme de puntos cuanticos. |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US5906670A (es) |
| EP (1) | EP0729394B1 (es) |
| JP (1) | JPH11514492A (es) |
| AT (1) | ATE168605T1 (es) |
| AU (1) | AU1031295A (es) |
| CA (1) | CA2176569A1 (es) |
| DE (1) | DE69411945T2 (es) |
| ES (1) | ES2119362T3 (es) |
| GB (1) | GB9323498D0 (es) |
| WO (1) | WO1995013891A1 (es) |
Families Citing this family (69)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6116184A (en) * | 1996-05-21 | 2000-09-12 | Symetrix Corporation | Method and apparatus for misted liquid source deposition of thin film with reduced mist particle size |
| US5997642A (en) * | 1996-05-21 | 1999-12-07 | Symetrix Corporation | Method and apparatus for misted deposition of integrated circuit quality thin films |
| US6607829B1 (en) | 1997-11-13 | 2003-08-19 | Massachusetts Institute Of Technology | Tellurium-containing nanocrystalline materials |
| US6207392B1 (en) | 1997-11-25 | 2001-03-27 | The Regents Of The University Of California | Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
| US6426513B1 (en) * | 1998-09-18 | 2002-07-30 | Massachusetts Institute Of Technology | Water-soluble thiol-capped nanocrystals |
| US6271130B1 (en) * | 1998-11-25 | 2001-08-07 | The University Of Chicago | Semiconductor assisted metal deposition for nanolithography applications |
| DE60027576T2 (de) * | 1999-08-17 | 2007-05-03 | Luminex Corp., Austin | Verkapselung von fluoreszierenden partikeln |
| US6585947B1 (en) | 1999-10-22 | 2003-07-01 | The Board Of Trustess Of The University Of Illinois | Method for producing silicon nanoparticles |
| US6743406B2 (en) | 1999-10-22 | 2004-06-01 | The Board Of Trustees Of The University Of Illinois | Family of discretely sized silicon nanoparticles and method for producing the same |
| US6984842B1 (en) | 1999-10-25 | 2006-01-10 | The Board Of Trustees Of The University Of Illinois | Silicon nanoparticle field effect transistor and transistor memory device |
| US6571028B1 (en) | 2000-03-21 | 2003-05-27 | Evident Technologies | Optical switch having a saturable absorber |
| US7465540B2 (en) | 2000-09-21 | 2008-12-16 | Luminex Corporation | Multiple reporter read-out for bioassays |
| EP1545705A4 (en) | 2000-11-16 | 2010-04-28 | Microspherix Llc | FLEXIBLE AND / OR ELASTIC BRACHYTHERAPY SEED OR STRAND |
| US6534782B1 (en) * | 2000-11-22 | 2003-03-18 | Battelle Memorial Institute | Structure having spatially separated photo-excitable electron-hole pairs and method of manufacturing same |
| US6697548B2 (en) | 2000-12-18 | 2004-02-24 | Evident Technologies | Fabry-perot opitcal switch having a saturable absorber |
| US6679938B1 (en) * | 2001-01-26 | 2004-01-20 | University Of Maryland | Method of producing metal particles by spray pyrolysis using a co-solvent and apparatus therefor |
| US6410934B1 (en) * | 2001-02-09 | 2002-06-25 | The Board Of Trustees Of The University Of Illinois | Silicon nanoparticle electronic switches |
| US7110640B2 (en) | 2001-07-19 | 2006-09-19 | Evident Technologies | Reconfigurable optical add/drop filter |
| US6700771B2 (en) * | 2001-08-30 | 2004-03-02 | Micron Technology, Inc. | Decoupling capacitor for high frequency noise immunity |
| EP1436844B1 (en) | 2001-09-05 | 2016-03-23 | Rensselaer Polytechnic Institute | Passivated nanoparticles, method of fabrication thereof, and devices incorporating nanoparticles |
| US6992298B2 (en) * | 2001-11-21 | 2006-01-31 | The Board Of Trustees Of The University Of Illinois | Coated spherical silicon nanoparticle thin film UV detector with UV response and method of making |
| US20030106488A1 (en) * | 2001-12-10 | 2003-06-12 | Wen-Chiang Huang | Manufacturing method for semiconductor quantum particles |
| US6623559B2 (en) * | 2001-12-10 | 2003-09-23 | Nanotek Instruments, Inc. | Method for the production of semiconductor quantum particles |
| JP3701622B2 (ja) * | 2002-03-27 | 2005-10-05 | 日立ソフトウエアエンジニアリング株式会社 | 半導体ナノ粒子蛍光試薬及び蛍光測定方法 |
| DE10214019A1 (de) * | 2002-03-30 | 2003-10-16 | Detlef Mueller-Schulte | Lumineszierende, sphärische, nicht autofluoreszierende Silicagel-Partikel mit veränderbaren Emissionsintensitäten und -frequenzen |
| JP3847677B2 (ja) * | 2002-07-23 | 2006-11-22 | 日立ソフトウエアエンジニアリング株式会社 | 半導体ナノ粒子、その製造方法、及び半導体ナノ粒子蛍光試薬 |
| JP2004077389A (ja) * | 2002-08-21 | 2004-03-11 | Hitachi Software Eng Co Ltd | 半導体ナノ粒子を含む機能性蛍光試薬 |
| JP4263581B2 (ja) * | 2002-10-30 | 2009-05-13 | ハンヤン ハク ウォン カンパニー,リミテッド | 金属薄膜または金属粉末を利用した金属酸化物量子点形成方法 |
| JP4133280B2 (ja) * | 2002-12-09 | 2008-08-13 | アルプス電気株式会社 | 機能性多層膜 |
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| EP1738378A4 (en) | 2004-03-18 | 2010-05-05 | Nanosys Inc | NANOFIBRE SURFACE BASED CAPACITORS |
| US7459015B2 (en) * | 2004-04-16 | 2008-12-02 | Birla Research Institute For Applied Sciences | Process for the preparation of a cellulose solution for spinning of fibres, filaments or films therefrom |
| CN1969190A (zh) | 2004-04-20 | 2007-05-23 | 爱默蕾大学 | 多峰性纳米结构,其制造方法以及其使用方法 |
| WO2006003584A2 (en) * | 2004-06-28 | 2006-01-12 | Koninklijke Philips Electronics, N.V. | Field-effect transistors fabricated by wet chemical deposition |
| US7405002B2 (en) * | 2004-08-04 | 2008-07-29 | Agency For Science, Technology And Research | Coated water-soluble nanoparticles comprising semiconductor core and silica coating |
| US7534489B2 (en) * | 2004-09-24 | 2009-05-19 | Agency For Science, Technology And Research | Coated composites of magnetic material and quantum dots |
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| US20060213779A1 (en) * | 2005-03-23 | 2006-09-28 | The Board Of Trustees Of The University Of Illinois And The University Of Jordan | Silicon nanoparticle formation by electrodeposition from silicate |
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| DE102006060366B8 (de) | 2006-12-16 | 2013-08-01 | Helmholtz-Zentrum Berlin Für Materialien Und Energie Gmbh | Verfahren zur Herstellung von von einer Matrix abgedeckten Quantenpunkten |
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| KR101865888B1 (ko) | 2009-09-09 | 2018-06-08 | 삼성전자주식회사 | 나노입자들을 포함하는 입자, 그의 용도, 및 방법 |
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| WO2012021516A2 (en) | 2010-08-09 | 2012-02-16 | The Trustees Of The University Of Pennsylvania | Nanoparticle-oligonucletide hybrid structures and methods of use thereof |
| KR101546937B1 (ko) | 2012-04-04 | 2015-08-25 | 삼성전자 주식회사 | 백라이트 유닛용 필름 및 이를 포함하는 백라이트 유닛과 액정 디스플레이 장치 |
| CN103489962B (zh) * | 2013-10-07 | 2017-01-04 | 复旦大学 | 大面积制备半导体量子点的方法 |
| US9943845B2 (en) * | 2015-10-28 | 2018-04-17 | The Johns Hopkins University | Detector and method for detecting an agent in an aerosol |
| CN112657565B (zh) * | 2020-12-17 | 2022-08-19 | 京东方科技集团股份有限公司 | 微流控通道及其控制方法、微流控芯片和分析装置 |
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| FR1172947A (fr) * | 1956-04-10 | 1959-02-17 | Sherritt Gordon Mines Ltd | Procédé de fabrication de poudres métalliques composites |
| FR2389929A1 (en) * | 1977-05-06 | 1978-12-01 | Canon Kk | Crystalline cadmium sulphide for electrophotography, prodn. - by reacting cadmium sulphate and low concn. hydrochloric acid with hydrogen sulphide in presence of impurities |
| DE2853931A1 (de) * | 1978-12-14 | 1980-06-19 | Dornier System Gmbh | Verfahren zur herstellung metallischer pulver |
| US4331707A (en) * | 1980-10-15 | 1982-05-25 | Exxon Research & Engineering Co. | Process for thin film deposition of cadmium sulfide |
| JPS58217407A (ja) * | 1982-06-08 | 1983-12-17 | Canon Inc | 光導電性硫セレン化カドミウムの製造方法 |
| GB2196650A (en) * | 1986-10-27 | 1988-05-05 | Prutec Ltd | Cadmium sulphide solar cells |
| GB2248456A (en) * | 1990-09-12 | 1992-04-08 | Philips Electronic Associated | A method of growing III-V compound semiconductor material on a substrate |
| FR2678855A1 (fr) * | 1991-07-08 | 1993-01-15 | Centre Nat Rech Scient | Procede de preparation d'une dispersion de particules metalliques, solution collouidale, film ou feuil solide obtenus. |
| US5260957A (en) * | 1992-10-29 | 1993-11-09 | The Charles Stark Draper Laboratory, Inc. | Quantum dot Laser |
-
1993
- 1993-11-15 GB GB939323498A patent/GB9323498D0/en active Pending
-
1994
- 1994-11-15 ES ES95900856T patent/ES2119362T3/es not_active Expired - Lifetime
- 1994-11-15 CA CA002176569A patent/CA2176569A1/en not_active Abandoned
- 1994-11-15 AT AT95900856T patent/ATE168605T1/de not_active IP Right Cessation
- 1994-11-15 AU AU10312/95A patent/AU1031295A/en not_active Abandoned
- 1994-11-15 JP JP7514293A patent/JPH11514492A/ja not_active Ceased
- 1994-11-15 WO PCT/GB1994/002514 patent/WO1995013891A1/en not_active Ceased
- 1994-11-15 EP EP95900856A patent/EP0729394B1/en not_active Expired - Lifetime
- 1994-11-15 US US08/648,025 patent/US5906670A/en not_active Expired - Fee Related
- 1994-11-15 DE DE69411945T patent/DE69411945T2/de not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| WO1995013891A1 (en) | 1995-05-26 |
| US5906670A (en) | 1999-05-25 |
| DE69411945T2 (de) | 1998-11-26 |
| EP0729394A1 (en) | 1996-09-04 |
| EP0729394B1 (en) | 1998-07-22 |
| CA2176569A1 (en) | 1995-05-26 |
| GB9323498D0 (en) | 1994-01-05 |
| JPH11514492A (ja) | 1999-12-07 |
| AU1031295A (en) | 1995-06-06 |
| ATE168605T1 (de) | 1998-08-15 |
| DE69411945D1 (de) | 1998-08-27 |
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