ES2123147T3 - Metodo para el analisis quimico directo de metal fundido. - Google Patents

Metodo para el analisis quimico directo de metal fundido.

Info

Publication number
ES2123147T3
ES2123147T3 ES94922394T ES94922394T ES2123147T3 ES 2123147 T3 ES2123147 T3 ES 2123147T3 ES 94922394 T ES94922394 T ES 94922394T ES 94922394 T ES94922394 T ES 94922394T ES 2123147 T3 ES2123147 T3 ES 2123147T3
Authority
ES
Spain
Prior art keywords
pct
elements
metal bath
analyzed
gas layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES94922394T
Other languages
English (en)
Inventor
Torkild Eivindson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Elkem ASA
Original Assignee
Elkem ASA
Elkem Materials AS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elkem ASA, Elkem Materials AS filed Critical Elkem ASA
Application granted granted Critical
Publication of ES2123147T3 publication Critical patent/ES2123147T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20Metals
    • G01N33/205Metals in liquid state, e.g. molten metals

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

LA INVENCION SE REFIERE A UN METODO PARA EL ANALISIS CUANTITATIVO DE UNO O MAS ELEMENTOS EN UN BAÑO DE METAL FUNDIDO. SE ENFOCA LUZ DE UNA O MAS FUENTES DE LUZ CONTRA LA SUPERFICIE DEL BAÑO DE METAL FUNDIDO, Y SE REFLEJA DESDE DICHA SUPERFICIE A UN MONOCROMADOR O UN POLICROMADOR CONECTADO A DETECTORES PARA DETECTAR LUZ ABSORBIDA EN UNA CAPA DE GAS ASOCIADA CON EL METAL FUNDIDO CON UNA LONGITUD O LONGITUDES DE ONDA QUE SE CORRESPONDEN CON LOS ELEMENTOS A ANALIZAR. LAS SEÑALES DE ABSORCION SON PROPORCIONALES A LA DENSIDAD DE ATOMO O MOLECULAR DE LOS COMPONENTES A ANALIZAR, Y A UNA FUNCION DEL GROSOR DE LA CAPA DE GAS Y LA CONCENTRACION DE LOS ELEMENTOS EN EL BAÑO DE METAL FUNDIDO. LA CONCENTRACION DE LOS ELEMENTOS A ANALIZAR ES LA RELACION BASADA O CONOCIDA ENTRE LA SEÑAL DE ABSORCION, EL GROSOR DE LA CAPA DE GAS Y LA TEMPERATURA DEL BAÑO DE METAL FUNDIDO.
ES94922394T 1993-07-26 1994-06-21 Metodo para el analisis quimico directo de metal fundido. Expired - Lifetime ES2123147T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO932682A NO177875C (no) 1993-07-26 1993-07-26 Fremgangsmåte for direkte kjemisk analyse av smeltet metall

Publications (1)

Publication Number Publication Date
ES2123147T3 true ES2123147T3 (es) 1999-01-01

Family

ID=19896290

Family Applications (1)

Application Number Title Priority Date Filing Date
ES94922394T Expired - Lifetime ES2123147T3 (es) 1993-07-26 1994-06-21 Metodo para el analisis quimico directo de metal fundido.

Country Status (9)

Country Link
US (1) US5644401A (es)
EP (1) EP0711413B1 (es)
JP (1) JP2810790B2 (es)
AT (1) ATE170003T1 (es)
AU (1) AU7351694A (es)
DE (1) DE69412627T2 (es)
ES (1) ES2123147T3 (es)
NO (1) NO177875C (es)
WO (1) WO1995003546A1 (es)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001228083A (ja) * 2000-02-21 2001-08-24 Nkk Corp 溶融金属の直接分析方法
WO2001071320A1 (en) * 2000-03-24 2001-09-27 Nkk Corporation Method and apparatus for analyzing vaporized metal
DE10131684C1 (de) * 2001-06-29 2002-12-12 Zeiss Carl Jena Gmbh Vorrichtung und Verfahren zur ortsaufgelösten Messung einer Schichtdicke
CN105973872A (zh) * 2016-06-06 2016-09-28 中国科学技术大学 一种同时对熔融金属的元素含量和温度进行无接触测量的系统
CN107328760B (zh) * 2017-06-07 2020-09-25 长春工业大学 一种针对合金样品表面蒸汽对lips测量改进的方法
US10753878B2 (en) 2017-09-20 2020-08-25 Worcester Polytechnic Institute Molten metal inclusion testing
CN110044763B (zh) 2019-05-06 2022-05-13 浙江福达合金材料科技有限公司 一种高纯银锭中硝酸不溶物含量的检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2138540A1 (de) * 1971-08-02 1973-02-15 Hoesch Ag Kontinuierliche analyse von fluessigen metallbaedern
JPS5248829B2 (es) * 1973-08-13 1977-12-13
GB8322709D0 (en) * 1983-08-24 1983-09-28 British Steel Corp Analysis of materials
US4986658B1 (en) * 1989-04-21 1996-06-25 Univ Lehigh Transient spectroscopic method and apparatus for in-process analysis of molten metal
NO914112L (no) * 1989-04-21 1991-12-09 Lehigh Univ Office Of Research Transient spektroskopi-fremgangsmaate og anordning for analyse av smeltet metall under igangvaerende prosess
DE3919042A1 (de) * 1989-06-10 1990-12-13 Bodenseewerk Perkin Elmer Co Verfahren und vorrichtung zur analyse von festen substanzen auf quecksilber
US5106413A (en) * 1990-02-01 1992-04-21 Hitachi, Ltd. Measurement method, adjustment method and adjustment system for the concentrations of ingredients in electroless plating solution
GB2245058A (en) * 1990-05-18 1991-12-18 Sieger Ltd A gas detector

Also Published As

Publication number Publication date
NO177875B (no) 1995-08-28
JP2810790B2 (ja) 1998-10-15
JPH09500725A (ja) 1997-01-21
EP0711413B1 (en) 1998-08-19
WO1995003546A1 (en) 1995-02-02
ATE170003T1 (de) 1998-09-15
DE69412627D1 (de) 1998-09-24
DE69412627T2 (de) 1999-05-20
US5644401A (en) 1997-07-01
NO177875C (no) 1995-12-06
AU7351694A (en) 1995-02-20
NO932682L (no) 1995-01-27
EP0711413A1 (en) 1996-05-15
NO932682D0 (no) 1993-07-26

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