ES2134164B1 - Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares. - Google Patents

Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares.

Info

Publication number
ES2134164B1
ES2134164B1 ES009702565A ES9702565A ES2134164B1 ES 2134164 B1 ES2134164 B1 ES 2134164B1 ES 009702565 A ES009702565 A ES 009702565A ES 9702565 A ES9702565 A ES 9702565A ES 2134164 B1 ES2134164 B1 ES 2134164B1
Authority
ES
Spain
Prior art keywords
solar cells
quality control
spectroscopy
analysis
computerized method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES009702565A
Other languages
English (en)
Other versions
ES2134164A1 (es
Inventor
Vazquez Jose Javier Laserna
Jimenez Francisco Martin
Sander Pots
Nunez Montserrat Hidalgo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universidad de Malaga
Original Assignee
Universidad de Malaga
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universidad de Malaga filed Critical Universidad de Malaga
Priority to ES009702565A priority Critical patent/ES2134164B1/es
Publication of ES2134164A1 publication Critical patent/ES2134164A1/es
Application granted granted Critical
Publication of ES2134164B1 publication Critical patent/ES2134164B1/es
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

Método computerizado de análisis mediante espectroscopia de plasmas producidos por láser para el control de calidad de células solares. Mediante este método, un potente láser de nitrógeno es enfocado sobre el material a analizar y, como resultado de la interacción con la muestra, una pequeña cantidad es vaporizada (ablación), formándose sobre la superficie del sólido un plasma de elevada temperatura y gran densidad electrónica. La resolución espectral de la luz emitida por el plasma, utilizando como detector un dispositivo de acoplamiento de carga bidimensional, proporciona información acerca de la composición química del material ablacionado, simultáneamente en superficie (técnica de mapeo) y en profundidad (perfiles de profundidad). Esta técnica es de utilidad para el control de calidad en la industria de la tecnología fotovoltaica y es aplicable tanto al material base como a los distintos estados de elaboración de la oblea durante la fabricación de células solares fotovoltaicas.
ES009702565A 1997-12-10 1997-12-10 Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares. Expired - Fee Related ES2134164B1 (es)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES009702565A ES2134164B1 (es) 1997-12-10 1997-12-10 Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES009702565A ES2134164B1 (es) 1997-12-10 1997-12-10 Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares.

Publications (2)

Publication Number Publication Date
ES2134164A1 ES2134164A1 (es) 1999-09-16
ES2134164B1 true ES2134164B1 (es) 2000-05-16

Family

ID=8301454

Family Applications (1)

Application Number Title Priority Date Filing Date
ES009702565A Expired - Fee Related ES2134164B1 (es) 1997-12-10 1997-12-10 Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares.

Country Status (1)

Country Link
ES (1) ES2134164B1 (es)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2384303A (en) * 2001-09-24 2003-07-23 Pure Wafer Ltd Detection of metals in semiconductor wafers
FR3087049A1 (fr) * 2018-10-08 2020-04-10 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de determination de la technologie d'une cellule photovoltaique, procede de tri, procede de recyclage et dispositif associes

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1395994A1 (ru) * 1985-08-07 1988-05-15 Московский Инженерно-Физический Институт Фотоэлектрический спектрометр микрочастиц
JPH0224535A (ja) * 1988-07-12 1990-01-26 Canon Inc 粒子解析装置
IT1249939B (it) * 1991-06-28 1995-03-30 Cselt Centro Studi Lab Telecom Sistema di spettroscopia ad alta risoluzione.
US5569916A (en) * 1992-07-09 1996-10-29 Agency Of Industrial Science & Technology, Ministry Of International Trade & Industry Electron spectroscopy apparatus
JP3646134B2 (ja) * 1996-01-22 2005-05-11 独立行政法人産業技術総合研究所 光電子分光装置

Also Published As

Publication number Publication date
ES2134164A1 (es) 1999-09-16

Similar Documents

Publication Publication Date Title
US7931850B2 (en) Nanometer-scale ablation using focused, coherent extreme ultraviolet/soft x-ray light
Vadillo et al. Applications of laser-induced breakdown spectrometry (LIBS) in surface analysis
ES2348676T3 (es) Fuente de luz extendida y modulable electricamente y dispositivo de medicion para caracterizar un semiconductor que comprende una fuente de dichas caracteristicas.
JPH07198610A (ja) アルゴン存在下でのレーザにより発生したプラズマでの光学発光分光測定法による元素分析方法
Okoshi et al. Femtosecond laser ablation of frozen acetone for deposition of diamond-like carbon films
US6414320B1 (en) Composition analysis by scanning femtosecond laser ultraprobing (CASFLU).
Gilgenbach et al. Laser diagnostic experiments on KrF laser ablation plasma‐plume dynamics relevant to manufacturing applications
ES2134164B1 (es) Metodo computerizado de analisis mediante espectroscopia de plasmas producidos por laser para el control de calidad de celulas solares.
US7163442B2 (en) Method of making micro titer plates and micro titer plates made thereby
Mitra et al. Determination of laser ablation threshold of Teflon at different harmonics of Nd: YAG laser using photothermal deflection technique
KR20120112586A (ko) 도핑 반도체 물질용 시스템 및 방법
Walser et al. Dynamics of photoexcited states and charge carriers in organic thin films: Alq3
JP2000208798A (ja) 薄膜構成体の加工方法
Oki et al. UV-laser ablation spectroscopy in element analysis of solid surface
JPH0688149B2 (ja) 光加工方法
US12152971B2 (en) Device for producing gaseous CO2 from carbonates for isotopic analysis (δ13C and δ18O) in situ, and associated method
Srinivasan Pulsed ultraviolet laser interactions with organic polymers—dependence of mechanism upon laser power
Akberdin et al. High power THz applications on the NovoFEL
Wang et al. Physical experiments on the HEAVEN-I KrF laser facility
Zhao et al. Development of wide bandgap semiconductor photonic device structures by excimer laser micromachining
Khan et al. High speed, high energy automated machining of hardwoods by using a carbon dioxide laser: ALPS
KR100843468B1 (ko) 다광자 공초점 레이저 주사현미경
Yoshioka et al. CW-laser induced modification in glasses by laser backside irradiation (LBI)
Okoshi et al. Deposition of carbon thin films by free electron laser
Arjavalingam et al. Compact laser source for metal deposition

Legal Events

Date Code Title Description
EC2A Search report published

Date of ref document: 19990916

Kind code of ref document: A1

Effective date: 19990916

FD2A Announcement of lapse in spain

Effective date: 20180326